Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Product
Intel Atom® Embedded Controller
AMAX-5570E V2
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Optimized BIOS & Embedded OS for 1ms real-time control (Windows & Linux)Achieves 32-axis motion control with 500 μs EtherCAT cycle time under LinuxOPC UA and Modbus TCP/RTU as IT connectivity enabled by CODESYSEtherCAT, PROFINET, Ethernet I/P, and CANopen are OT connectivity feature enabled by CODESYSIntel Atom® quad-core x6414RE processorSystem I/O with 4 x GbE, 2 x USB, 2 x Isolated COM, 1 x HDMI, 1 x 5 pin terminal (dual power input)AMAX-5000 EtherCAT Slice I/O expansion and AMAX-5400 PCIe modules, optional for left side (max.2)iDAQ-964 modules, optional for left sideEMC compliance for energy management and Battery Energy Storage System (IEC-61000-4 Industrial requirement)
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Force Sensors
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Piezoelectric force sensors, respectively piezoelectric force transducers or load cells, are perfectly suited for the precise measurement of compressive and tensile forces, both in highly dynamic applications and in quasi-static processes. In universities and industry, for basic research or quality assurance: exact data is always essential in order to measure force characteristics and make processes more cost-effective. Thanks to their rugged design, piezoelectric force sensors from Kistler keep precise track of quasi-static and highly dynamic force processes, even when conditions are difficult. Our force sensors can also handle simultaneous measurements of multiple orthogonal force components.
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Digital Force Gauges
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Imada digital force gauges are highly accurate instruments that provide the precise force measurement required in quality testing that determines strength and/or functionality of a part or product. Digital gauges can be used for destructive or non-destructive force measurement applications and check both compression and tension (push or pull) forces. The high sampling rate of Imada digital gauges enables them to capture the peak force of destructive tests which occurs in milliseconds. Imada digital force gauges also feature selectable units: lbf, kgf and N and easy-to-program high/low setpoints for Go/No Go testing.
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Scanning Electron Microscopes
SEM
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Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
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Monocular Microscopes
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ACCU-SCOPE monocular microscopes use high-quality optics for bright, crisp images. Possibly the iconic and most recognized example of microscopes, monocular microscopes are compound microscopes with the outstanding feature of a single eyetube and eyepiece. Our monocular microscopes are durable and portable, making them favorites across a wide range of laboratories and educational environments including high schools, environmental science, and veterinary settings. ACCU-SCOPE monocular microscopes come with a standard selection of 4x, 10x and 40x DIN objectives (“DIN” is an international standard for type of thread and focal length). Depending on the series, 60x dry or 100x oil immersion objectives are available.
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Benchtop Thermal Forcing System
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Wewon Environmental Chambers Co, Ltd.
Benchtop thermal forcing system from Wewon Environmental Chambers Co., Ltd. has a mini body structure and affordable machine price. The machine can test a wide temperature range, Since no compressor is required for refrigeration, so the benchtop temperature forcing unit’s energy consumption is very low. The repeated resistance degree of the tested sample in the instantaneous extremely high temperature and extremely low temperature continuous environment can detect the chemical changes and physical damage caused by thermal expansion and cold contraction of the sample in the shortest time, so as to achieve the goal of confirming the quality of the tested sample.https://www.wewontech.com/benchtop-thermal-forcing-system/
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Force Tensiometers
Sigma 702
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The Sigma 702 is a standalone force tensiometer that provides accurate surface and interfacial tension measurements (Platinum Du Noüy ring, Platinum Wilhelmy Plate), manual determination of Critical Micelle Concentration (CMC) and density measurements. The open design and convenient control keyboard operations make these instruments easy to use without the need for an external computer.
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Electromagnetic Force Fatigue And Endurance Testing System
EMT Series
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High-speed repeated load tests can be carried out with a maximum velocity of 2 m/s, and maximum stroke of ±50 mm, using clean and quiet electromagnetic force as the driving power, without the use of oil. The test space is large so environmental tests can also be carried out using the constant temperature tank (option).
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Transmission Electron Microscope
TEM
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Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Ultraschallmikroskop And Scanning Acoustic Microscopes
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Microtronic Microelectronic Vertriebs GmbH
mage quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.Sonix has been the innovation leader since 1986. Today, the ECHO line of scanning acoustic microscopes sets the standard for package inspection speed and image quality, to help you keep pace with new packaging materials and difficult form factors. The ECHO platform will remain at the forefront as we continue to add features and enhance performance for years to come.
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Upright Microscopes
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ACCU-SCOPE upright microscopes deliver top quality optics for bright, crisp images. Sometimes referred to as compound microscopes, our upright microscopes are favorites across a wide range of laboratories including clinical, veterinary, pharmaceutical, research, university, and education. Some of the disciplines utilizing our upright microscopes include pathology, hematology, microbiology, cytology and histology. ACCU-SCOPE upright microscopes offer a selection of magnifications from ultra-low (e.g. 2X) to high power oil immersion (e.g. 100X). Our microscopes have a variety of options and accessories to perfectly fit your application including ergonomic viewing heads, trinocular heads for camera attachment, and an assortment of objectives. Common contrast methods used with our microscopes include brightfield, phase contrast, darkfield, Differential Interference Contrast (DIC) and fluorescence.
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Portable Video Microscope
Cl-1000
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Video microscope system ideal for installation site. Enables the user to inspect mounted connector endface from the other side of adapter.
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ThermalAir Series Temperature Forcing System
ThermalAir TA-3000B
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The ThermalAir TA-3000B high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -65°C to +225°C. Compact! Plus Performance!
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Digital Video Microscope
BVM-20102
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High-resolution CCD sensor, built-in analog/digital converter, analog and digital signal directly display on the screen, can also simultaneously display on TV and computer through corresponding interfaces; taking photo and video through software; easy operation, reducing user's fatigue and injury.
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Force Sensors In S-form For Pull/push Direction
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INELTA Sensorsysteme GmbH & Co. KG
With very small space requirement and high breaking force made from tempered stainless steel, suitable for measuring medium to high forces. Easy integration and mounting by threaded bores.
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Force Tensiometers
Sigma 703D
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Sigma 703D is a simple and robust digital force tensiometer for accurate measurement of surface and interfacial tension (Platinum Du Noüy ring, Platinum Wilhelmy Plate), and density. Manual measurement of Critical Micelle Concentration (CMC) can also be conducted.
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Scanning Electron Microscopes
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Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
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Stereo & Pocket Microscope
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A small microscope which is designed to be easily portable. In some cases, the microscope may literally fit in a pocket, while in other cases it may be more comfortably carried in a field bag or small carrying case.
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Fanless Desktop Network Appliance With Intel Atom® X7000 Series
FWA-T014
Network Appliance
Fanless desktop network appliance with Intel Atom® x7000 Series processors for SASE, SD-WAN, and uCPE edge deployment. for network security. Intel Atom® x7809C/x7405C/x7203C processors, Compact dimension with fan-less design.
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Product
Mechanical Force Gauges
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AMETEK Sensors, Test & Calibration
The mechanical force gauges from Chatillon offer high precision compression testing (Push) and tensile testing (Pull) at a low cost on a wide range of testing applications.
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High-Resolution Scanning Probe Microscope
SPM-8100FM
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The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
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Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Force Balanced Accelerometer
PA-23, PA-23BH, S-230
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The Geotech Model S-230 is a high resolution, 1-component, force balanced accelerometer capable of meeting the noise and stability requirements of the most demanding seismic studies. It features a very wide frequency response (DC to 90 Hz) and an internal calibration coil. Three S-230 accelerometers are packaged as a borehole 3-component unit (Model PA-23BH) and as a surface 3-component unit (Model PA-23). PA-23BH can be submerged up to 100 m depth.
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Roll Force Measurement
Millmate
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ABB’s Millmate roll force system is the perfect choice for measuring roll force in both hot rolling and cold rolling mills, thereby achieving correct roll gap settings and force distribution.The system is proven to be exceptionally robust and resilient to high forces as well as aggressive mill agents. The load cells are calibration free, can withstand overloads up to 7 times the nominal force, and have an impressive life length. The load cells come in different sizes from 0.1MN up to 60MN.
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Portable Measuring Microscope
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Opto's portable microscope is designed to handle even the most demanding on-site inspections. With its ergonomic design, robust construction and perfectly matched optics configuration, it is a precise and reliable tool.
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Inspection Microscope
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This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
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Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Surgical Microscopes
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The surgical microscopes of Leica Microsystems are exactly geared to the requirements of microsurgery. A compact optical unit delivers clear and sharply focused images and the modular system gives the surgeon optimum maneuverability.
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Stereo Microscope
Stemi 508
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Thanks to apochromatic optics you acquire high contrast images with color accuracy. With the 8:1 zoom you bring up smallest details. Stemi 508 offers an ergonomic viewing angle of 35° - stay relaxed even after hours of work.
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Wafer Cathodoluminescence Microscope
Säntis 300
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Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
