Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Product
Conductivity Type (P/N) Checker By Contact Thermo-electromotive Force Method (seebek Effect)
PN-12α
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*Thermo electrode and cold electrode is mounted detecting part of measuring probes*Possible to check most figure of sample such as single crystalline silicon wafer, bulk, ingot and so on*Please select from 2 types;1) 2 probe ver.(Hot probe, Cold probe),2) 1 probe ver.(Hot & Cold probe)
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Product
Measuring Microscopes, Image Processing
COMEF
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Optik Elektronik Gerätetechnik GmbH
Image processing system.
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Inverted Microscope Systems
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Below you can see examples types for an inverted microscope system created using our components. Typically these examples are for life science applications, however they can be used for industrial or material applications. Many other automated microscopy systems are possible using our components.
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Product
Force Tensiometer
K6
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Our Force Tensiometer – K6 is a robust and reliable manual instrument for measuring surface tension and interfacial tension using the ring method. As a quality product from our precision mechanical workshop, it produces fast, easy and accurate measurements for surfactant solutions and solvents.
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Force Gauge
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Shenzhen Graigar Technology Co.,Ltd.
A force gauge is a small measuring instrument used across all industries to measure the force during a push or pull test. Applications exist in research and development, laboratory, quality, production and field environment.
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Precise Temperature Forcing System
TA-5000A Series
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The ThermalAir TA-5000 Series of temperature forcing systems bring precise thermal testing capabilities directly to your test application, exactly localizing to where thermal conditioning temperature cycling is required. ThermalAir TA-5000 temperature systems provide flexible thermal test solutions for an array of products and technologies.
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Scanning Electron Microscope
E5620
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The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
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The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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Measuring Microscopes, Image Processing + Drawing Die And Wire Measurement
Easy Low Cost Wire Drawing Die Measuring Microscope
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Optik Elektronik Gerätetechnik GmbH
Simple optical measuring system for diameter and ovality of wire drawing dies with image processing software.
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Electron Microscope Analyzer
QUANTAX FlatQUAD
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QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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Intel Atom® Processor-Based Embedded IoT Gateway Platform
MXE-200i Series
IoT Gateway Platform
ADLINK's new Matrix MXE-200i series Embedded IoT Gateway Platform is based on the Intel Atom® SoC processor E3826 and has superior-class construction meeting a wide variety of specific industrial needs. Supporting Intel® IoT Gateway, with pre-loaded Wind RiverR IDP XT 2.0/3.1 enabling full IoT function, the MXE-200i series offers the most reliable Embedded IoT Gateway for use in harsh environments, compliant with industrial grade EMI/EMS (EN61000-6-4,61000-6-2), protecting customer assets and reducing TCO. Opposing conventional correlations between size and computing power, the MXE-200i series features large-scale performance in an ultra-compact package.
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Ergonomics Force Gauges
Series E
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Series E push / pull force gauges make job task analysis and ergonomics analysis simple and accurate, ideal for workplace design, strength assessment, and ergonomic studies. Series E presents the ergonomist and other professionals with a simple and economical testing solution. 100 lbF, 200 lbF and 500 lbF (500, 2,500, and 5,000 N) capacity force gauges are available, along with a wide range of attachments for various applications.
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Product
Tactile Pressure and Force Measurement
I-Scan® System
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This versatile tactile pressure measurement system is tailor-made by choosing from over 200 pressure sensors to meet your specific application requirements.
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Product
Thermal Microscope Stage For Large Petri Dish
TS-4LMP
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Thermal Microscope Stage For Large Petri Dish
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Product
Soldering Inspection Video Microscope
MS-1000
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The MS-1000 is a highly portable microscope for exclusive use with BGA, CSP, and QFP. It is highly efficient in inspecting portions which cannot be inspected by the X-ray inspection method.Specifically, it is efficient for inspecting the following conditions: fillets of soldered balls, melted condition of soldered parts, cracks, defective soldering, etc.
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Deep Ultraviolet Observation System for Microscope
U-UVF248
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Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
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Raman Microscopes
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Edinburgh Instruments has been providing high performance instrumentation in the Molecular Spectroscopy market for almost 50 years. Our Raman microscopes continue our commitment to offering the highest quality and sensitivity instruments. For further information on our Raman Microscopes, simply contact our sales team, sales@edinst.com, who will be delighted to help.
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Product
Coercive Force Meter
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The meter is mainly used in measuring the coercive force of magnetic components of relays and the mechanical energy meter compensation films, which is the essential instrument of manufacturers who are producing the relays and the energy meters, etc.
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Product
Quad-Core Intel® Atom™ Processor 3U CompactPCI® Card
MIC-3329
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The Advantech MIC-3329 is based on Intel® Atom™ technology, previously codenamed Baytrail and is designed to provide balanced performance and power efficiency. The MIC-3329 is a 3U CompactPCI® processor blade designed for dual-core Intel® Atom E3826/E3827 and quad-core Intel® Atom E3845 processors, and up to 4GB soldered DDR3L-1066/1333 ECC memory. It is available in single and dual slot form factor, offering a range of I/O functionality by XTM (8HP) & Rear I/O extensions. Front panel I/O on the single slot (4HP) provides 2 x RJ45 GbE ports (Switchable with RIO 4HP),1 x VGA port (Switchable with RIO 4HP), 1 x USB2.0 port and 1 x USB3.0 port. Front panel I/O on the second layer (XTM) provides 2 x COM ports (RS232/422/485), 1 x PS/2 KB/MS and 1 x Audio ports or 2 x M12 GbE ports, 1 x COM ports (RS232/422/485). The MIC-3329 provides an ideal solution for transportation, railway and factory automation applications. Its robust design from a layout and thermals perspective allows it to meet or exceed EN50155 and EN50121-4 using a very low TDP selection of 7W/8W/10W processors. Its low power consumption and industrial SoC features make the MIC-3329 a perfect fit for all fanless system applications.
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Product
Force Sensors, Controls & Switches
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Direct caliper motor/spindle integration for Brake by Wire systemsExtra-small form factor MSG sensors that weigh less than five gramsFacilitating system-level miniaturizationAdvanced button-type sensors designed to lower costs and improve accuracy
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Ergonomic Force Gauges
DMG Series
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AMETEK Sensors, Test & Calibration
The DMG ergonomic gauge lets you objectively measure manual muscle strength and functional task requirements for almost any application.
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Microscopic Probes
M12PP
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CAPRES M12PP Microscopic Twelve-Point Probes are specialized versions of the CAPRES Micro Multi-Point Probes. By using a dedicated 12-by-4 multiplexer, a total of 495 different pin-configurations can be obtained, each with different probe pitch. This is utilized in e.g. the CIPTech, where 8 or more combinations are used to obtain a “depth profiling” of the measured structures.
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Product
Atomic Absorption Spectrometer
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Atomic absorption spectroscopy (AAS) determines the presence of metals in liquid samples. Metals include Fe, Cu, Al, Pb, Ca, Zn, Cd and many more. It also measures the concentrations of metals in the samples. Typical concentrations range in the low mg/L range.
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Product
Stereoscopic Zoom Microscope Automation
SZ-2000
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Applied Scientific Instrumentation
Based on ASI's proven DC servo motor technology, the SZ-2000 automates stereo zoom microscopes. The unit can be configured for motorized focus only, motorized focus with automated zoom control, or motorized focus with automated zoom control and an automated XY translation stage. The Z axis focus resolution varies slightly depending upon the model of the microscope, with 0.8 microns being the smallest step size available on a Nikon SMZ800.
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Microscope Spectrophotometer
508 PV
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The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.
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Scanning Electron Microscopes
SEM
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Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
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Miniature Quartz Force Sensors
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Often the test engineer will try to take low level measurements with a sensors not rated for these low levels. Due to insufficient sensitivity the resulting data may be noisy, hard to analyze or unusable. Using the appropriately sized and ranged PCB Miniature Quartz Force Sensor solves the problem and gives reliable data at a Low Amplitude level. The miniature sensor configuration permits low-amplitude, dynamic compression, tension, and impact force measurements.
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Portable Microscope With XY Stage, X400 1mm Field Of View, 1µm High Resolution
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*Counting of cells, algae and other samples*Easy positioning of the sample*Methodically scanning of slides and some counting chambers*Works with standard microscope slides (25x75mm or 1”x2”) and 32mm wide counting chambers (top cover of counting chamber needs to be <1mm thick)*Allows manual movement of the slide and counting chamber independently in the left-right (X) axis and front-back (Y) axis
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Force Tensiometers
Sigma 702
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The Sigma 702 is a standalone force tensiometer that provides accurate surface and interfacial tension measurements (Platinum Du Noüy ring, Platinum Wilhelmy Plate), manual determination of Critical Micelle Concentration (CMC) and density measurements. The open design and convenient control keyboard operations make these instruments easy to use without the need for an external computer.
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Product
Sensor Products: Weld Force Gage
90061
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Model 90061 is a self-contained, portable measurement system which allows auditing of the pinch force generated between the electrodes of resistance spot welders. Resistance welding uses a pair of electrodes to clamp two base metals firmly together prior to and during application of electrical current. Poorly clamped parts result in a defective joint. A correctly clamped assembly aids in reducing the resistance in the joint and allows the current flow to properly heat the base metals to weld the part.
