Test Pattern Generators
-
Product
End of Line Test System for Automotive Seats
AS519
Test Platform
AS519 is specifically designed to perform ECU’s EOL tests in the automotive industry. It integrates a programmable power supply up to 20V 20A with high reading resolution. Interaction with the DUT is established through CAN bus by an interphase adapter in a USB port of the test managing computer.
-
Product
True Concurrent Test
TestStation Duo
Test System
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
-
Product
Infotainment Test for Automotive Applications
test
Multimedia operating interfaces are complex control and display devices for functions such as entertainment, telephony, on-board computers and vehicle settings. The functional test of such complex control units and their networking within the vehicle architecture presents a particular challenge in every phase of the product design process.
-
Product
Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2T-1
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
-
Product
Standard 3.00 (85.00) - 6.00 (170.00) Non Replaceable General Purpose Probe
G-S-R
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 780Overall Length (mm): 19.81Rec. Mounting Hole Size (mil): 86Rec. Mounting Hole Size (mm): 2.18Recommended Drill Size: #44
-
Product
PXIe Vector Signal Analyzer: 6 GHz
M9391A
Vector Signal Generator
RF requirements keep growing while timelines keep shrinking. To help ease the technical and business pressures, the right test solution provides continuity in measurements and longevity in capability. In the evolution of modular RF test solutions, the Keysight PXI VSA is the next logical step in signal analysis. With raw hardware speed and X-Series measurement applications, it delivers proven results faster. From fully modular hardware to software leverage to worldwide support, the PXI VSA is the low-risk way to manage change and be ready for tomorrow today
-
Product
Standard 2.20 (62.00) - 4.80 (136.00) General Purpose Probe
EPA-4J
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
-
Product
F-S General Purpose Probes
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 66Recommended Travel (mm): 1.68Overall Length (mil): 780Overall Length (mm): 19.81Rec. Mounting Hole Size (mil): 86Rec. Mounting Hole Size (mm): 2.18Recommended Drill Size: #44
-
Product
Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
Test Fixture
Stopper kit includedYAVCANCON2 for fixture identification not included
-
Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3T
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Iridium Physical Layer Test Systems
PLTS
Test System
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
-
Product
LTE RRM Test System
T4010S
Test System
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
-
Product
Four Channel Arbitrary Waveform Generator 1.25GS/s 16Bit 1GS Mem 4CH 4 Markers AWG
P1284M
Waveform Generator
The Proteus P1284M, is a PXIe based, 1.25GS/s, four channel arbitrary waveform generator offering technologically advanced options and configurations such as, a dual channel 2.7GS/s digitizer with 9GHz bandwidth, to transform the instrument to an arbitrary waveform transceiver. The P1284M offers industry leading performance Including an innovative task oriented programming, real time data streaming, fast feedback loop for environment dependent waveform generation and user customizable FPGA for application specific solutions.
-
Product
Standard 1.00 (28.00) - 2.75 (78.00) Non Replaceable General Purpose Probe
E-S-R
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 65Full Travel (mm): 1.65Recommended Travel (mil): 43Recommended Travel (mm): 1.09Overall Length (mil): 495Overall Length (mm): 12.57Rec. Mounting Hole Size (mil): 67Rec. Mounting Hole Size (mm): 1.70Recommended Drill Size: #51Overall Length Remark: Overall length for E-S-V and E-S-W is .540 (13.72)
-
Product
9GS/s 16Bit 8GS Mem 4CH 8 Markers RF AWG Desktop
P9484D
Waveform Generator
The desktop version of the Proteus arbitrary waveform generator series offers up to 12 channels in a 4U, half 19” dedicated chassis. The compact form size and small footprint save valuable bench space. So for synchronized, phase coherent, multi-channel applications such as quantum physics and radar applications the Proteus arbitrary waveform transceiver is an ideal, space efficient and cost effective solution.
-
Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
In-Circuit Test System
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
-
Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
-
Product
Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2L-1
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
-
Product
Standard 0.79 (23.40) - 1.75 (49.60) General Purpose Probe
HPA-40J
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 35Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 660Overall Length (mm): 16.76
-
Product
BMS Manufacturing Test System
Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
-
Product
Test Systems
Test System
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
-
Product
Standard 1.00 (28.00) - 2.30 (65.00) Non Replaceable General Purpose Probe
P2532-2
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 156Test Center (mm): 3.96Full Travel (mil): 139Full Travel (mm): 3.53Recommended Travel (mil): 93Recommended Travel (mm): 2.36Overall Length (mil): 812Overall Length (mm): 20.62Rec. Mounting Hole Size (mil): 94.5Rec. Mounting Hole Size (mm): 2.40Recommended Drill Size: #41 or 2.40 mm
-
Product
Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3J-1
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3H
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
LitePoint RF Test System
J750
Test System
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
-
Product
16 Bit Waveform Generator
PA72G16400
Waveform Generator
The PA72G16400 is a 16-bit arbitrary waveform generator, capable of generating waveforms at speeds up to 400Msps. The high resolution and the high sample rate allows generating signals with very low quantization noise levels. An onboard offset voltage source allows generating offset signals while maintaining optimal utilization of the DAC’s digital range. With the 8MWord of memory, there is lots of room for uploading several different patterns, allowing switching patterns with minimal bus communication.
-
Product
Radio Frequency, Communications, & Navigation Test Systems
Test System
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
-
Product
PXI-5404, 100 MHz Bandwidth, 1-Channel, 12-Bit PXI Waveform Generator
778577-02
Waveform Generator
The PXI‑5404 is a 100 MHz clock generator capable of generating clock and sine wave signals and some other standard functions. This clock generator can generate signals from -1 V to +1 V and uses direct … digital synthesis (DDS) to precisely generate waveforms.
-
Product
Combination Board Functional Test System
QT 4256 ATE
Functional Test
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
-
Product
Waveform Generator, 80 MHz, 1-Channel
33611A
Waveform Generator
Keysight 33600A Series waveform generators with exclusive Trueform signal generation technology offer more capability, fidelity, and flexibility than previous generation DDS generators. Easily generate the full range of signals you need with confidence that the signal generator is outputting the signals you expect.
