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Geometry
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WATOM
Wafer edge and notch profile measurementThe use of smaller and smaller patterns in the semiconductor industry calls for increasingly advanced materials of extremely high quality. In response to the steady improvements in the quality of wafers, KoCoS Automation has developed WATOM, a wafer edge and notch profile measurement tool which heralds a new era of extremely precise wafer geometry measurement.WATOM supports quality assurance throughout the wafer manufacturing process, starting at the very beginning and continuing on through to wafer reclaim.The WATOM Edge and Notch Wafer Geometry Analyser sets the worldwide benchmark for the quality assurance of geometrical measurements in semiconductor wafer manufacturing, combining the highest quality standards with top-class service. These high-precision, laser-based edge profile measurement tools are specially designed for optimum integration in manufacturing lines within the semiconductor industry.
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Companion Tool to VS for Test Time & Pin reduction
UltraScan
UltraScan is SynTest's solution to combat increase in test time. In 130 nm or smaller ? nanometer geometries, many defects become delay defects and it becomes necessary to use delay tests to detect the transition faults and path delay faults. Often bridging tests are also required.
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Refractive Index Profiler
S14
The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
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Day Camera Testing
CI Systems' CCD test stations are used to carry out all the necessary tests to verify and compare the quality of a CCD based camera. These stations are based on CI Systems' reflective collimators, Visible Radiation Sources, special targets and integrated software, to project standard patterns with known geometry and intensity to the Unit Under Test. As a result, these stations are turnkey solutions for the CCD camera testing needs.
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Linear Strain Gauges
Linear Pattern Strain Gages are the most straightforward geometry of strain gauge, designed to indicate strain in only a single direction.
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Benchtop Sphere (d/8°) Geometry Spectrophotometers
Hunter Associates Laboratory, Inc.
Diffuse d/8° benchtop sphere spectrophotometers are recommended for transmittance color and haze measurements of transparent liquid and solid samples, and color measurements of opaque samples where it is desired to negate the effects of sample gloss and texture, as is necessary in the color formulation process when determining the effect of pigment variations irrespective of surface characteristics.
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Non-Destructive Subsurface Layer Profiling
NMR-Mouse one-sided NMR
The unique, powerful Profile NMR-MOUSE® probe works hand-in-hand with the Kea2 spectrometer. The Profile NMR-MOUSE is a portable, open NMR sensor equipped with a novel permanent magnet geometry that generates a flat sensitive volume parallel to the scanner surface. The system can measure *Proton density as a function of depth *T2 NMR relaxation times *T1 NMR relaxation times *Self-Diffusion coefficient of liquids
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Front-end
With geometries getting smaller, macro inspection becomes both more challenging and crucial for defect-free and high-yield wafer manufacturing. The variety of defects calls for detection optimization, fast screening and categorization of the high volume manufacturing environment, while maintaining high throughput.
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PCB Track Resistance Calculator
TRC100
The TRC100 is a handy free utility which lets you enter track shape and length, along with material type, the TRC100 will give you an answer in Ohms for the trace you describe. TRC100 is useful if you are working on fine geometries, and need to take care about series loss. You may also find TRC100 useful in power supply applications.
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Hardware and Software Complex for Measuring Geometric Parameters
Vishera
Non-contact measurement of the geometry of objects using telecentric lenses Opto Engineering, illuminators of various modifications, 3D scanner Sick Ranger. The telecentric pair, in conjunction with modern digital cameras from Basler, ensures high accuracy in measuring the geometric parameters of objects, the principle of laser triangulation ensures high accuracy and scanning speed.
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Thin Film Analyser
TFA
The TFA instrument has be designed to monitor dissolution rates with a minimal volume of developer, typically ≤ 1 ml. The design uses surface tension to hold the developer in a small gap between the sample and the detector head. The instrument allows multiple measurements on the same sample. Thickness measurement can be made in the same geometry as dissolution measurements.
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PV-IV Solutions
We offer a broad range of PV IV Measurement systems for measuring solar cells from 3 mm to 300 x 300 mm. The wide range of solar simulators, vacuum chuck test stations, and electronic loads make it impossible to list “standard solutions” Most systems are put together for individual customer needs based on cell type and contact geometry of the devices being tested. Over the last several years we have designed and manufactured a wide range test solutions for many different types of cells and contact geometries. In most cases a customized solution is no more than a slight customization of a standard platform that has been previously designed.
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GONIOPHOTOMETRY
Goniophotometers are required to measure angular resolved distributions of photometric or colorimetric quantities, either by rotating the lighting device under test or by moving the sensor around the device. Depending on the application, different geometries are used to obtain distributions in the appropriate CIE coordinate system.
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UltraScan PRO Spectrophotometer.
Hunter Associates Laboratory, Inc.
The D65 illumination source is calibrated in the ultraviolet region for the accurate measurement of whitening agents. UltraScan PRO has an extended wavelength range into the near infrared and near ultraviolet that permits the measurement of camouflage materials and UV blockers. The system uses diffuse/8° geometry with automated specular component inclusion/exclusion. It also features three sizes of sample measurement areas with automated lens change. The UltraScan PRO includes EasyMatch QC software and an electronic record keeping version that is 21 CFR 11 compliant is available.
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Wheel Running Tester up to 15000 kg axle load
MINC II EURO | VP 420005
Maschinenbau Haldenwang GmbH & Co. KG.
The test lane-compatible MINC II EURO guarantees a verification of the axle geometry in seconds when the test vehicle drives over (up to 15.0 t axle load) as well as a fully automatic evaluation of the deviation in m / km. The measured values are displayed either in analog form on a dial or by transmission to a PC screen (including graphic representation).
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Mobile Assay System
ISO-CART-85
Complete In-situ NDA Gamma-Ray Analysis Solutions for a Wide Variety of Samples including "Free-Release" Decommissioning WasteMeasures all common geometries: pipes, cylinders, floors, ceilings, walls, drums, boxes, and soilsEasy-roll cart for maneuvering over any surfaceWide selection of collimators and shields available for different measurement situationsContinuous height adjustment and variable tilt adjustmentISOTOPIC software, proven results on thousands of real-world samplesFactory pre-calibrated or calibrate with a single inexpensive mixed isotope point sourceFlexible reporting: measurement results can be reported in grams or activity (Bq or Ci)
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Industrial Computed Tomography
TomoScope® XS
Coordinate measuring machine for three-dimensional measurement utilizing computed tomographyFast measurement with high resolution via the next generation transmission tubeReduce measurement time by 90% with OnTheFly TechnologyLow operating costs as a result of the new monoblock designExtremely precise air bearing rotary axis for low measurement uncertaintyLow space requirement thanks to compact designLow weight allows for installation almost anywhereFast amortization through low acquisition costsStandard-compliant calibration for reliable and traceable measurement results, optionally with DAkkS certificateVersatile fields of application such as plastic, metal and multi-material componentsSoftware for 3D real-time reconstruction of workpiece geometries during tomography
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High Impedance Active Probes
7
Designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes. The Model 7 consists of a flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms in order to avoid undesirable reflections. A special miniature connector receives replacement coaxial probe tips that provide a shielded environment to within 3 mm of the fine tungsten probe point, thus minimizing capacitive coupling to other parts of the circuit. The replaceable coaxial probe tips are offered in various point sizes and can also be bent to any shape in order to accommodate a variety of probing geometries.
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Non-Destructive Testing
The essential feature of active thermography is the targeted supply of energy to the test object. A temporal and spatial characteristic heat flow results depending on the geometry and thermal properties of the test subjects. Its progression on the surface of the test object is captured by a thermographic camera.
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Crack Opening Displacement (COD) gauges
COD
Instron® Crack Opening Displacement transducers are designed specifically to perform standard ASTM and ISO fracture mechanics tests (both cyclic and static), covering all common specimen geometries (CT, SEB, Centre Crack, Arc Shaped). Each model offers class leading linearity, whilst being rugged enough to withstand the high energy release common in many of these applications and can be used at both elevated and sub-ambient temperatures. These gauges comply with requirements laid down in ASTM E399-09.
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Multibeam Echosounder - Deep Water
SeaBat 7160
The SeaBat 7160 transducer array is comprised of linear receive and transmit arrays mounted together on a support base. The T-shaped array geometry provides the basis for a compact, high-resolution sonar which is easily installed for portable or hull mounts – a first for a high-resolution system in this frequency range. The system features a pitch-stabilized transmitter and an active roll compensated receiver.
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High Precision Angular Position, Calibration and Geometry Inspection
GeoOrdinate
Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.The GeoOrdinate has been designed specifically for the inspection of large and heavy components and is fully compatible with any shop floor environment whilst maintaining world class accuracies more commonly seen in the standards laboratory.
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Inspect a Large Range of Part Geometries
ECHOMAC® PA Composite Tester
ensures complete inspection of the part. The system is scalable, allowing the flexibility of adding channels as needed to handle a large range of part geometries. Meets or exceeds USA, European and other international specifications in aerospace and automotive industries. MAC can supply mechanics designed to meet customer requirements ranging from inline bubbler systems to stand alone immersion tanks with part placement.
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Substrate Manufacturing
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Probe Pins
Cobra-Series
Cobra-series probe pins offer long lifetime and low particle contamination for high-density probing applications. We can produce them using different materials and fine pitch geometries.
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Step Probes
*Precisely controlled probe travel*Step tip geometry*Replaceable and non-replaceable versions*Plating options available
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Fiber Geometry System
2400
The 2400 Fiber Geometry System is designed to provide high-speed automated measurements of optical fiber end-face geometry. Repeatable and accurate measurement of parameters such as core and cladding diameter, core and cladding non-circularity, as well as core-cladding concentricity provide invaluable process control information, and ensure that customer demands for low loss fiber splices are satisfied. Measurement options are available for both side view coating geometry measurement and fiber curl characterization.
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Correlation Analysis
EDM Modal Correlation Analysis allows the user to correlate two modal models; EMA and/or FEA models. Comparing the experimental data with that acquired through finite element analysis helps in validating the test results. Users can import the geometry model and mode shape data from FEA or EMA software.
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ICP-MS spectrometers (ICP MASS)
SPECTRO Analytical Instruments GmbH
SPECTRO MS is a double-focusing sector field ICP MS (ICP mass spectrometer) based on a Mattauch-Herzog geometry with a newly developed ion optic and pioneering detector technology. It is the only ICP MS instrument available on the market today that is capable of simultaneously measuring the complete mass range used for inorganic mass spectrometry from 6Li to 238U with a permanent ion beam going to the detector.
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Fiber End Face Interferometer
Thorlabs' GL16 End Face Interferometer measures and images the end face geometry of single- and multi-fiber connectors. A non-contact technique called scanning white-light interferometry (SWLI) provides high accuracy, repeatability, and reliability for fiber connector testing, particularly for pass/fail testing using IEC or Telcordia requirements. The system can be controlled locally through the touchscreen display or remotely through a browser-based application (see Software tab for details), allowing it to be easily integrated on the production floor.
