Lifetime
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Product
TCSPC Lifetime Kit
DeltaTime
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The DeltaTime time correlated single photon counting (TCSPC) lifetime plug-in offers acquisition speed, flexibility, and affordability unavailable in any other multifunctioanl fluorescence solution on the market. DeltaTime seamlessly integrates monochromators, polarizers, and other accessories with the widest array of sources (LEDs, laser diodes, supercontinuum lasers) and detectors (including NIR), providing lifetime coverage from 25ps to 1sec over wavelengths spanning the UV to NIR.
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Product
Fluorescence Lifetime Spectrometer
S-FL
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The technique of Time Correlated Single Photon Counting (TCSPC) has been developed and introduced more then 25 years ago. The technique is now widely accepted to be the most sensitive fluorescence detection technique with the inherent temporal resolution required for fluorescence decays.
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Product
Wafer Lifetime Measurement with Photoluminescence Detector
WCT-120PL
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Measure the calibrated carrier-recombination lifetime of a silicon wafer using both the standard method and the photoluminescence meth
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
Minority Carrier Lifetime Tester
HS-CLT
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HS-CLT Minority Carrier Lifetime Tester has strong functions. It can not only measure carrier lifetime of wafer but also silicon ingot, silicon filament,silicon phosphorus ingot,silicon boron ingot, seed crystal and other irregular shape silicon material.The minority carrier testing ranges from 1μs to 6000μs, the minimum resistivity is 0.1Ω.cm, (can be extensive to 0.01Ω.cm). Dynamic curve monitoring in the whole process.
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Product
Contactless Lifetime Measurement and Inhomogenities Device
MWR-2S-3I
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Lifetime determination is based on measuring photoconductivity decay after pulse light photo-exciting with usage of reflected microwave as probe.Simultaneous IR light transmission gives possibility to detect any inhomogenity insidesilicon brick and made 3D image of defects.
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Product
Scanners
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All BK Mikro scanners utilize servo motors for accurate measurements and increased lifetime.
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Product
Fixed Surveillance System for Perimeter Security
Argus
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Argus is a fixed, rugged, preconfigured wide area surveillance system. Combining a best-in-class radar and thermal camera with Command and Control software, Argus is designed to detect and track multiple threats both near and far in the most demanding weather conditions 24 /7. When compared to other perimeter security solutions, Argus has the lowest initial cost per kilometer of secured space as well as the lowest lifetime cost.
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Product
Data Logger for Temperature and Humidity
DSR-THCO₂
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Simultaneously measures and logs temperature, humidity and carbon dioxide High precision IR CO sensor, with a lifetime of 15 years Optional measuring range between 2000ppm and 10000ppm Especially designed and developed for air quality, agriculture research, biological reaction, environment protection and other applications
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Product
Environmental Chambers
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Sanwood Environmental Chambers Co ., Ltd.
Sanwood climatic chambers for battery can be tested under controlled temperature and humidity conditions, similar to the conditions under which batteries operate during their lifetime.
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Product
Dual-Band RF Tuner and 4-Ch 400 MHz A/D with Kintex UltraScale FPGA - 6U VPX
Model 58891
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- Jade Xilinx Kintex UltraScale FPGA Products and Navigator Design Suite Software Video- Jade Xilinx Kintex UltraScale FPGA Family Brochure- Accepts RF signals from 925 MHz to 2175 MHz- Programmable LNA handles L-Band input signal levels from -50 dBm to + 10 dBm- Programmable analog downconverter provides IF or I+Q baseband signals at frequencies up to 123 MHz- Four 400 MHz 12-bit A/Ds digitize IF or I+Q signals synchronously- Four FPGA-based multiband DDCs (digital downconverters)- Two Xilinx® Kintex® UltraScale™ FPGA- 10 GB of DDR4 SDRAM- Sample clock synchronization to an external system reference- PCI Express interface (Gen. 1, 2 & 3) up to x8- Clock/sync bus for multimodule synchronization- Optional LVDS and gigabit serial connections for FPGA for custom I/O- Navigator BSP® for software development- Navigator FDK® for custom IP development- Spark® fully-integrated development system- Free lifetime applications support- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Product
Optical Oxygen Sensors
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PST offer a range of factory calibrated optical oxygen sensors which measure trace and ambient oxygen levels using luminescence-based optical technology.The patented technology allows the range of sensors to produce low power operation, while offering a long lifetime.
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Product
Non-Contact Mapping Life Time System
MWR-2S-3
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The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Product
Calibration Services
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WTG's calibration package is more than just verification of performance specs. It is a complete package of services including inspection and maintenance. Our services uphold the value of the instrument and extend its lifetime.
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Product
The Standard R&D Wafer-Lifetime Tool
WCT-120
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Best available lifetime measurement accuracy. Measure lifetime and surface recombination for a wafer of any quality or crystallinity.
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Product
Measurement System For Testing & Binning Of Back-End LEDs
TP121-TH
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The photometric specifications of LEDs must meet very high tolerance requirements regardless of whether they are to be used in general, automotive or other specialist lighting applications. This is often a problem since the manufacturing tolerances of LEDs can be higher than those permitted in the end-use applications. Also, LED binning by LED manufacturers in order to classify LEDs based on their tolerances is performed with flash mode testing using pulsed current flow. However, end-use applications of the LEDs often operate in constant current mode and with significant thermal effects. The sophisticated LED processing industry therefore requires measurement devices that can be used for both manufacturer-compliant pulsed mode, as well as constant current operation mode. When the LEDs are run in constant current mode, the junction temperature has significant influence on the performance and lifetime of the LED. Therefore, test systems should be able to test the LEDs at specific junction temperatures.
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Product
CMM AutoQAL & CMM Continuous Mercury Monitoring Systems
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Continuous Mercury Monitoring systems, the CMM and CMM AutoQAL, are TÜV and MCERTS certified solutions for continuous mercury monitoring from hot, wet and corrosive gas streams of industrial processes, such as waste incineration, cement production and powerplants. Gasmet offers a full CMM solution package which consists of a system, lifetime service and support, documentation and training, and our expertise.
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Product
Anti-Vibration Kit For TBOX And UST Series
Anti-Vibration Kit
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*Multi-directional dampers*Withstands extreme temperatures*Extending product lifetimes*Maintains HDD stability*Available for tBOX and UST series*Easy installation with a wall mount bracket*Customizable for different application needs
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Product
PXI RF Relay Module
Relay
PXI RF Relay Modules offer single-pole double-throw (SPDT) and terminated switches. SPDT models include excellent insertion loss, voltage standing-wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay-count-tracking feature on these models to predict relay lifetime and reduce unexpected system downtime. SPDT models are also well-suited for passing high-order harmonics from PXI RF Signal Upconverter Modules or routing multiple sources to PXI RF Signal Downconverter Modules. Terminated switch models feature front-mounted SMA connectors and high-performance solid-state relays for fast switching time and unlimited mechanical lifetime. These models also include termination on every COM line and channel, which helps minimize reflections of the RF signal and protect your instruments.
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Product
30W to 1800W - Single Output
HWS/HD Series
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*Limited Lifetime Warranty*-10 to +71°C Operation (-40°C start up)*Universal input (85 - 265VAC)*Conformal coated PCBs*Class 1 Div 2 option (/RYHD suffix)
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Product
Inline Wafer Testing
IL-800
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Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps.
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Product
General Purpose Radiation Survey Meter/Geiger Counter
Rad 100™
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The RAD 100™ is a general purpose radiation survey meter/geiger counter that detects and measures alpha, beta, gamma, and X-radiation. It is intended for personal safety and educational purposes. Like the popular Radalert® 100X, the RAD 100™ features a 3-second update on its digital liquid crystal display (LCD). The LCD shows the current radiation level in your choice of microSieverts per hour (SI units) or mR/hr for gamma radiation measurements. For mixed sources (alpha, beta, gamma) the CPM mode is recommended. This instrument also offers an accumulated total and timer function, up to 9,999,000 counts and 40 hours. A red LED blinks and a beeper chirps with each count (the chirp can be muted). This is a professional instrument that is also easy to learn to use and to operate, and carries the industry leading Medcom warranty (2 years overall limited to 1 year on the GM sensor). Many instruments designed by the Medcom team are still working perfectly after 30 years of use, so this instrument should provide a lifetime of useful information.
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Product
Memory
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Renesas is renowned for its product lifetimes, and our memory products are no different. Our wide range of low power SRAM products provide high reliability, stable supply and long lifetime support often not found in these devices, making them ideal for industrial designs. Renesas’ ultra-fast QDR™ (Quad Data Rate) SRAMs are ideal for next-generation high bandwidth communication systems that require memories capable of very high operating frequencies combined with low latencies and full cycle utilization. Our EEPROM realizes high speed, low power consumption and a high level of reliability by employing advanced MONOS memory technology, a CMOS process and low voltage circuitry technology.
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Product
Solid State PIN Diode Transfer Switch, 100 MHz to 18 GHz
P9400C
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The Keysight P9400C solid state PIN diode transfer switch offers outstanding performance in terms of port-to-port isolation, switching speed and low insertion loss over a broad operating frequency range of 100 MHz to 18 GHz. The P9400C is particularly well suited for ultra-fast RF and microwave switching applications in instrumentation, communications, radar, switch matrices and various other test systems where high isolation, speed and lifetime of a switch is critical.
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Product
Analysis Software for FLIM, PLIM
SPCImage
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*Analysis of Single-Decay, FLIM and PLIM Data*Analysis by Iterative Convolution and Fit Procedure or by First Moment of Photon Distribution*Calculations of Decay Parameters and Lifetimes by Various Decay Models*Calculation of FRET Efficiencies*Display of Lifetime and FRET Images*Display of Lifetimes, Amplitudes, Intensities or Ratios*Export of Lifetime Data and Images
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Product
Measurement System
BLS-I/BCT-400
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The BLS-I/BCT-400 measurement systems perform lifetime measurement on monocrystalline or multicrystalline silicon (ingots or bricks) without requiring surface passivation.
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Product
C/I Clamp Meters
CLAMPMETER, 400A AC (CM-410)
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*Measures to 600 volts AC and DC, and 400 amps AC*Data hold to capture important readings*Audible continuity test*Auto power off for longer battery life*Accessories included: (2) 1.5V AAA batteries, test leads, carrying case*Lifetime Limited Warranty
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Product
Cable TV analysers
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Specific field meters for CATV, QAM, DOCSIS and EuroDOCSIS 3.0. Its rugged construction ensures a long lifetime.
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Product
Femtosecond Fluorescence Up-Conversion Spectrometer
FOG100
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Femtosecond optical gating (FOG) methods give best temporal resolution in light induced fluorescence lifetime measurements. Since 1997 we manufacture model FOG100-DX for operation with femtosecond oscillators and we offer now FOG100-DA for operation with femtosecond amplified pulses.
