X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
-
Product
X Ray Flaw Detector
-
A non-destructive testing (NDT) device used to inspect materials for internal flaws or defects such as cracks, voids, inclusions, and weld discontinuities.
-
Product
Total Reflection X-ray Fluorescence (TXRF) Services
-
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
-
Product
Computed Tomography and CT Scanner
-
When conventional x-ray images aren’t enough, a diagnosis for soft tissue conditions requires appropriate technology. Whether cross-sectional images are required or entire pictures of internal organs, CT exams and scanning are a vital part of a healthcare or imaging facility.
-
Product
Fat Analysis
-
Unlike standard x-ray systems which use a single x-ray energy spectrum to scan products, DEXA technology uses two energy spectrums to discriminate between high and low energy x-rays. A patented software algorithm uses the differential x-ray energy absorbance of these two energies by the meat to determine the fat content.
-
Product
X-Ray Fluorescence Analyzer
MESA-50
-
HORIBA has been selling the XGT-WR series of EDXRF analyzers for many years, providing screening measurements of samples containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.XGT systems are used daily throughout the world. HORIBA has now developed the new MESA-50 EDXRF analyzer, based on its long experience with customer requirements and knowledge. MESA-50 provides user friendly operation and good performance. MESA-50 includes three analysis diameters, suitable for every sample, from thin cables and electronic parts to bulk samples. The combination of SDD detector and Digital pulse processor(DPP) changes the image of EDXRF.HORIBA's new MESA-50 supports ecological procurement; it contributes not only to EU RoHS and ELV compliance testing, but also regulatory work for many other countries.
-
Product
Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
-
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
-
Product
Real Time X-Ray Imaging
GO-SCAN C-VIEW
-
Go-Scan C-view is a light weight ruggedized real time X-ray imaging system specifically designed for hand-held inspection such, among other, Corrosion Under Insulation (CUI) inspection. It includes a high speed and high resolution CMOS imager and a battery-operated 70kV x-ray tube designed for portable field operation. The video imaging system captures images and displays them on a hand held display in real-time.
-
Product
Energy Dispersive X-ray Fluorescence Analyzer
X-5000
-
HORIBA continues it's innovation in the petroleum market by proudly teaming with Olympus Innov-X to promote the X-5000 Mobile XRF Analyzer. The X-5000 is a rugged, fully integrated closed beam portable EDXRF system that offers the power and performance of a traditional benchtop XRF, but is designed for transportable operation.
-
Product
Photodiodes
-
Opto Diode manufactures high quality standard and custom photodiodes. Our wide range of standard device feature low dark current and low capacitance. The silicon detectors are ideal for general purpose applications, laser monitoring, position sensing, measuring photons, electrons, or X-rays, or for detecting sun and rain applications. The devices operate from the deep UV to the near-infrared wavelengths.
-
Product
Proton Induced X-ray Emission (PIXE)
-
Elemental Analysis Incorporated, utilizing Proton Induced X-ray Emission (PIXE), provides a non-destructive, simultaneous analysis for the 72 inorganic elements from Sodium through Uranium on the Periodic Table for solid, liquid, and thin film (i.e. aerosol filter) samples. The PIXE technique offers the advantage of analysis, without the necessity for time consuming digestion, thereby minimizing the potential for error resulting from sample preparation.
-
Product
MultiBeam System
FIB
-
An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
-
Product
Conveyor X-ray Scanners
-
Innovative baggage X-ray screening units for quick and easy identification of the material composition of scanned objects.
-
Product
Diffractometers & Scattering Systems
-
Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.
-
Product
X-Ray Inspection
-
X-ray inspection systems are used wherever defects need to be detected by non-destructive means. The spectrum of use is broad and ranges from quality controls for complex assemblies, to the testing of materials for cracks and air inclusions, to foreign matter inclusions and shape deviations. The trend toward miniaturization, higher packing densities, and the relocation of components to the interior of the assembly require precise X-ray inspections that detect hidden defects quickly and reliably. X-ray systems from Viscom are used for the inspection of series assemblies as well as sampling and prototype controls. They take care of typical inspection tasks in concealed areas such as void controls, THT filling level measurements, and HIP inspections. At the same time, the systems reliably determine defect features such as coplanarity and polarity – at high inspection speeds and in a cost-effective way.
-
Product
XRF analysis
X-Supreme8000
-
XRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 for quality assurance and process control requirements across a diverse range of industries.
-
Product
Charge Integrator Amplifiers
AD8488
-
Analog Devices’ charge integrator amplifiers convert the charge acquired by X-ray or photodiode detectors to a voltage. The channels are composed of CMOS transistors, using typical high input impedance CMOS gates. The integrators generate charge dependent voltages using a range of selectable capacitance values that accommodate a broad range of input charge values. The integrators are followed by single-ended input to differential output voltage amplifiers where offset and low frequency noise voltages are subtracted from the input voltages.
-
Product
Sindie Online
-
Sindie Online is an industrial-grade process analyzer delivering continuous sulfur detection to monitor fuel streams and help to prevent tank contamination. It has many advantages over competing technologies: Powered by MWDXRF, Sindie Online has an exceptional signal-to-noise ratio using monochromatic excitation of the X-ray source characteristic line – a technique that is faster, safer and cleaner than UVF.
-
Product
Temperature Controlled Microscope Stages
-
Your product descripThere are various version options for this stage, including pressure, vacuum, electrical sample measurement and sample holders to mount the stage vertically in IR or xray spectrometers.tion goes here.
-
Product
Tracealyzer
-
Get X-ray vision into your embedded software at runtime.Find improvements quickly, speed up development and verify the real-time behavior. Deliver great products with confidence.
-
Product
(Visible and IR) Streak Cameras
AXIS-PV
-
Our ultrafast cameras are well-suited for time-resolved spectroscopy of ultrafast events in the X-rays as well as in visible light.
-
Product
Radiation Detection
-
Radiation detectors for safety quality assurance is top of mind for hospitals, nuclear power facilities, nuclear medicine laboratories, x-ray manufacturers, government agencies, state inspectors, emergency response and HAZMAT teams, and police and fire departments around the world. Fluke Biomedical offers a complete line of radiation detection, personal dosimeters, staff radiation dosimeter monitoring, and safety products and solutions that allow these professionals the versatility they need to get the job done and the quality they trust in a radiation-safety device.
-
Product
High-power Benchtop Sequential WDXRF Spectrometer
Supermini200
-
Elemental analysis of solids, liquids, powders, alloys and thin films. The new Supermini200 has improved software capabilities as well as a better footprint. As the world''s only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD)..
-
Product
Medical Imaging
-
Teledyne e2v has over 35 years of experience in the medical field and offers medical devices companies a range of CCD and CMOS image sensor solutions and services. We understand the challenges facing the healthcare landscape (including ageing populations and the management of healthcare spending), and through close partnerships with our suppliers, are able to offer customers agility and flexibility over our entire supply chain. This enables us to provide our customers with a fully comprehensive digital imaging solution. We also produce and sell an X-ray intra-oral dental product named Demoniac, which is compliant with ISO 13485.
-
Product
Inspection System for high-power precise 3D X-ray CT
X-eye PCT225
-
Inspection System for 3D X-ray CT able to analyze defected area precisely by precise movement of axis with high polished Anti-vibration table. High-power X-ray Tube of max. 450kV and large area Flat Panel Detector of max.16 inches can be installed depending on the sample. Customized 3D CT equipment is available with selecting main parts by customers depends on their needs for size and material.
-
Product
Control Unit for SITEx & SITExs
SITEX SCU286
-
The SCU286 has a system for direct measurement of the high voltage delivered by the X-Ray generator to guarantee the accuracy of the radiological parameters. Based on this data the control system maintains the stability of mA and kilovolts to within ± 0.5% in any selection range.SITEX & XS units offer a totally constant quality of exposures, as they are virtually exempt from fluctuations in the power supply.
-
Product
Marine Fuel Sulfur Analyzer
NEX QC MFA
-
Applied Rigaku Technologies, Inc
Specifically designed for marine fuel applications, the new Rigaku NEX QC MFA features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience. The shuttered 50 kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides an analysis of sulfur (S), nickel (N), vanadium (V), iron (Fe) and zinc (Zn) ... all with low limits-of-detection (LOD).
-
Product
Microprocessors
-
CAES specializes in digital hardware design for commercial and aerospace applications. Our processing solutions are ideal for spacecraft on-board computers, payload processing, nuclear power plant controllers, critical transportation systems, high-altitude avionics, medical electronics and X-ray cargo scanning.
-
Product
Metrology Solutions for Semiconductors
-
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
-
Product
X-ray Fluorescence (XRF) Measuring Instrument
FISCHERSCOPE XDV-µ
-
Smallest measuring surface, greatest precision. Universal instrument for measuring on smallest and flat components and structures as well as complex multilayer systems.
-
Product
Total Reflection X-Ray Fluorescence (TXRF) Products
-
Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
