MIxed Signal Test Systems
See Also: Mixed Signal, Mixed Signal ATE, Mixed Signal Oscilloscopes, Mixed-Signal Test, Mixed Signal Testers
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Product
Battery PACK (500v-1000v)Test System
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Shenzhen Sinexcel RE Equipment CO., Ltd
PACK test equipment adopts sinexcel, firstly adopts three-level AC scheme, and the detection process supports multi-gear switching. The device integrates voltage, temperature, pressure and other auxiliary channels, and CAN also integrate various communication protocols such as temperature box, water cooler, mainstream CAN CANFD 485, etc. It supports a variety of practical and innovative functions such as data one-click automatic export, which meets all aspects of PACK battery electrical performance testing.
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Product
Various Types of Automatic Hardness Testing System
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Various Types of Automatic Hardness Testing System
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Product
Test Automation Platform Deployment System
KS8000A
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TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher level test executive software environments. The Keysight KS8000A Test Automation Platform (TAP) Deployment System provides a lower cost, scaled down alternative to the full KS8400A TAP Developers System without the graphical user interface, results viewer and timing analyzer. Deploy your existing test software and TAP plugins into manufacturing environments using the KS8000A command line interface or your own interfaces.
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Signal Integrity Test Products
RoBAT SCARA-TDR-M
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*Fully automatic TDR tester for bare and assembled PCBs*2 – 24 Port Ultra-compact TDR units*Full range of TDR tests and measurements available*100% test in a production environment*Custom modules with automatic tool changer
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Product
Test System
4003 TLP+™
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The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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Product
Guzik Signal Analyzer
GSA 6000 Series
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Works with Read-Write Analyzer RWA 4000. Guzik Signal Analyzer (GSA) 6000 series combines high-speed waveform digitizer with built-in digital signal processing hardware and high-speed data transfer link to a computer. The Signal Analyzer comes in a space-saving display-less 2U 19” rack-mounted form factor.
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Product
COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
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CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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Product
Video Signal Processors
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Products that apply signal processing to convert, reformat, or optimize incoming video signals.
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Product
Instrumented Pendulum Impact Testing System
JB(INSTRUMENTED)
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Jinan Testing Equipment IE Corporation
JB-450I/750I Instrumented Pendulum Impact Testing Machine is equipped with high precision instrumented strain-gauged striking edge & high-speed data acquisition system. This instrumented test system can measure the force of a test specimen during an impact event. Then, the instrumented test data can be used to calculate the energy absorbed by the test specimen. In addition, the crack initiation and arrest loads can be used in fracture mechanical models.
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Product
Projectile Speed Measurement Test System
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This test equipment will help manufacturers, trading standards, consumer bodies, CPSC, CPSIA laboratories and regulatory authorities to check that they meet the requirements of ASTM F963 - 08 Standard Consumer Safety Specification for Toy Safety and ISO 8124-1:2009 projectile Safety of Toys –Part 1:Safety aspects related to mechanical and physical properties. It may also be valuable for certain sports equipment and related tests.
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Signal Conditioning
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To get most out of high-quality sensors, accurate, low-noise processing of the sensor signals that are emitted is essential. Kistler offers an attractive portfolio of solutions for signal processing and subsequent data digitization. Piezoelectric (PE) sensors with a charge output require a so-called charge amplifier. On the other hand, piezoelectric sensors with integrated electronics (IEPE) are supplied by Piezotron couplers which decouple and amplify the signal.
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Product
Signal Conditioning System
28000
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The Precision 28000 Signal Conditioning System makes it easy to manage a test with up to 256 channels of fully programmable transducer conditioning. Choose a mix of bridge, charge, IEPE w/TEDS, voltage (filter amplifier), strain, thermocouple, RTD/potentiometer, frequency, or other transducers. Self-tests traceable to NIST. 4, 8 and 16-slot rugged and transportable mainframes feature integrated cooling. Customize the 28000 for high-speed transient applications, static applications, or a combination of both.
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Hardware-in-the-Loop Test Systems
HIL
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Our early development efforts and NI VeriStand expertise uniquely qualify us to maximize the benefits of and provide top-notch integration services for this software platform. Wineman Technology offers powerful and flexible MIL and HIL testing solutions, such as: Full range of MIL and HIL test systems. Software for testing. Software for simulating electronic control modules. Fault insertion unit (FIU)..
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Product
Thermal Imaging System for Electronics Testing
ETS320
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Whether the goal is product testing or scientific research, heat can be an important indicator of how a system is functioning. The FLIR ETS320 is a non-contact thermal measurement system that pairs a high-sensitivity infrared camera with an integrated stand, for hands-free measurement of printed circuit boards and other small electronics.
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Product
Signal Patchcords
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VPC standard signal patchcords are available in 36" and 72" lengths. Please contact a Field Application Engineer about the availability of other lengths.
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Product
6TL36 Inline Handler
AM304
Test Handler
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
Adjustable Signal Samplers
7998
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Now, you can extract a low signal level from a 50-Ohm coaxial system with the Model 7998 and 7999 series of Adjustable Signal Samplers from Coaxial Dynamics. These Signal Samplers are essential tools for spectrum analysis, RF signal scope observation, or frequency counting control.
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Automated Shock Test Systems
AutoShock-II Test System
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The AutoShock-II is a fully automated series of shock test systems used to measure and identify product fragility levels and evaluate protective packaging. With the simulation of real world shock pulses and impact energy levels, manufacturers can systematically test and optimize product design and packaging. L.A.B. Equipment, Inc.''s fully automated computer controlled shock and data analysis test systems are the critical path in accomplishing this optimization.
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Product
SIGNAL GENERATOR
TG-1300
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LOW BATTERY CONSUMPTION COMPACT SIZE DESIGN OUTPUT LEVEL ADJUSTABLE OUTPUT LEVEL DISPLAY MAX. 5BANDS(individual or Simultaneously) PORTABLE TYPE
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Product
Mixed Signal Oscilloscope - 1.5 GHz, 4 Analog Plus 16 Digital Channels
MSOX4154A
Oscilloscope
1.5 GHz4 analog plus 16 digital channels Easily view signals on the large 12.1-inch capacitive touch screen Isolate signals in seconds with exclusive Zone touch triggering Capture more data with 4 Mpts memory and standard segmented memory See more signal detail with 1,000,000 wfms/s update rate Expand your measurement capabilities with full upgradability: Add dual-ch 20 MHz arbitrary Wave Gen, 3-digit DVM, serial trigger and analysis & mask testing at any time
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Product
SIGnal Workbench
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Flexible, programmable signal conditioning and fault insertion solutions for data acquisition applications.
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Product
Test System
Series 201
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The 201.net is fully programmable to electrically test and ensure the integrity of discrete semiconductor devices. The system is modular in design with each stimulus module individually addressable for specific test requirements.
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Vibration Test System
3-axis
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This small 3-axis vibration test system has been developed in response to many customers' request for ?gcompact and easy to handle & use h multi-axis VTSs without sacrificing performances, featured by its small installation area of W900mm by D850mm, relatively quiet due to employment of small fans insterad of bolower(s), a displacement of 25mmp-p for each axis and max. transient acceleration of over 98m/s2<10G>*,
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Product
Airbag Test System
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Dongguan City Simplewell Technology Co. Ltd.
Airbag Test System by Simplewell
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Product
Hign Speed Bare Board Test System By Non-Contact Test Technologies
SX-750SUPERⅣ
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Suitable for a wide range of applications. Can be connected to a wide range of machines: from hand press to reel mechanism and in-line mechanism. We offer docking with our customers own machines. Compact main tester simplifies integration via installation inside a mechanism. If requested, we will perform a study to decide which functions should be added.
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Product
Vacuum Leak Test Systems
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Vacuum leak testing is the principal leak test method for testing parts that could have leakage from an external source into their housings and casings. Parts like underwater sensors or housings, outdoor electrical housings, sealed components, and components associated with vacuum sources are all prime candidates for vacuum leak testing. Operation of instruments that supply vacuum to test parts instead of pressure works in a similar, yet essentially opposite, manner as pressure decay testing.
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Product
Partial Discharge Testing Of Transformer & Localization System
AE-150™
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The is designed to detect and localize Partial Discharge activity by correlating acoustic and electric sensors' data. The AE-150™ has many acquisition modes, each used for detecting and locating Partial Discharge activity in a transformer. The AE-150™ unit is mounted on the transformer tank using its powerful magnets that also hold four acoustic sensors.
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Product
Long-Stroke Tensile Testing System For Vulcanized Rubber
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Capable of Measuring Even Specimens with a Large Break Strain A tensile test method for vulcanized rubber is stipulated in JIS K6251 (Rubber,vulcanized or thermoplastic-Determination of tensile stress-strain properties). One of the properties of vulcanized rubber is significant elongation. This long-stroke tensile testing system for vulcanized rubber has a long stroke that is required for calculating these tensile characteristics of rubber, and accommodates dumbbell specimens Nos.1 through 6 stipulated in JIS K6251.
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Product
Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
