Product

Standard Probe Station Chucks & Accessories

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ABET Technologies, Inc.

ABET Technologies, Inc.

In this test solutions section of our website we describe the expanding line of Abet PV IV probe stations for the growing variety of solar cell types and sizes being developed around the world. This page describes a line of vacuum chucks and accessories for top/bottom, top/top, and bottom/bottom solar cells from 3 x 3 mm to 300 x 300 mm. Probe stations for multiple device on a single substrate and multifunction probe stations are described further in the sections highlighted to the left of this page.

Product

Analytical Probe Station with Laser Cutting System

LCS- 4000 Series

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MicroXact, Inc.

LCS- 4000 Series - MicroXact, Inc.

The LCS-4000 Probe Station with Integrated Laser Cutting System gives the user maximum flexibility in semiconductor diagnostic cutting, failure analysis, trimming, marking and topside layer removal. All of these functions can be performed on a microscopic level, all on this one system which provides a high level of performance that is remarkably easy to use.

Product

Probe Station

ETCP1000

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ECOPIA

ETCP1000 - ECOPIA

Installation of “Hot and cool chuck” - Sellectable chuck size : 4inch, 6inch. - Temperature variation : -193°C ~ 300°C (80K ~ 573K) - Additional requirements : Vacuum chamber, LN2 tank(Bombei), microscope, CCD camera, manipulators. - EPS500 is standard model in ETCP1000 probe station.

Product

Automated DC Parametric Curve Tracer

MegaTrace

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Robson Technologies, Inc.

MegaTrace - Robson Technologies, Inc.

MegaTrace supports pin counts greater than 625 up to 2160 pins, with 1080 pins being popular. Comprised of a cart that contains the test chassis, PC monitor, drive bus box, and a test interface, MegaTrace is easy to move around and use with other instruments like emission microscopes, probe stations, and other remote testing requirements.

Product

Hot Chucks

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Materials Development Corporation

Materials Development Corporation

Probe stations to suit all measurement requirementswhether production, engineering or research. See individual data sheets for more details.

Product

Probe Station

S-1160

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Signatone Corp.

S-1160 - Signatone Corp.

S-1160 Probe Station 100mm, 150mm and 200mm wafer stage's completely manual and user friendly.

Product

CC-TLP Probe

CC-TLP-50-A1

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High Power Pulse Instruments GmbH

CC-TLP-50-A1 - High Power Pulse Instruments GmbH

*Capacitively coupled TLP probearm (CC-TLP) compatible with standard probing stations*18 GHz SMA connector*Tilt angle adjustment*Calibration gauge for needle height

Product

Electrical Probe Systems

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Instec, Inc.

Instec, Inc.

INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.​Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.

Product

Portable Manual Probing Station

Model W4.0 x L6.5

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D-COAX, Inc.

Model W4.0 x L6.5 - D-COAX, Inc.

This portable manual probing station is designed for a versatile, comfortable, and accurate operation on up to 4.0” wafers or 4.0” X 6.5” printed circuit board assemblies. This turn-key, manually operated probing station, model W4.0 x L6.5, is part of the D-COAX commitment to the test and measurement and PCB fabrication industries.

Product

Probe Station

EPS1000

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ECOPIA

EPS1000 - ECOPIA

Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided. - Maximum pcs of manipulators can be installed on the base unit of probe

Product

C-V Plotters

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Materials Development Corporation

Materials Development Corporation

MDC will tailor your CSM/Win Semiconductor Measurement System for your exact requirements. Choose the best capacitance meter, output device, and probe station for your needs. All CSM/Win C-V plotters feature the latest Dell Computers. The computer and capacitance meters are rackmounted in one compact enclosure. When ordered with a hot chuck or probe station, MDC can deliver a turnkey system of unparalleled performance.

Product

Flying Probe Programming & Test Development

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Testing House, Inc.

Testing House, Inc.

Testing House offers full Flying Probe Programming and Test Development using its very own Seica Pilot LX Flying Probe Test Stations.

Product

Recirculating Chillers

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Lake Shore Cryotronics, Inc.

Lake Shore Cryotronics, Inc.

Recirculating chillers from Lake Shore offer high performance for improved cooling capacity for your Hall measurement system, VSM, probe station, or electromagnet application.

Product

Mini Probe Station

C-2

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EverBeing Int'l Corp

C-2 - EverBeing Int'l Corp

The smallest probe station which still preserves the key functions and precision that are fundamental to all probing. This size is still capable of DC and RF measurements, making it the most versatile in its size.

Product

High Power Devices

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SemiProbe

SemiProbe

SemiProbe configures our PS4L Adaptive Architecture into the Voltarus (TM) family of probe stations to fulfill the unique requirements of testing high power devices at wafer level prior to packaging. Voltarus probe stations are available in manual, semiautomatic, and fully automatic configurations that can test and characterize power devices up to 10 KV or 200 Amps (pulsed).

Product

Portable Wafer Probe Station

PS-5026B

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High Power Pulse Instruments GmbH

PS-5026B - High Power Pulse Instruments GmbH

The PS-5026B is a rugged portable wafer probing solution which has been designed for high reliability, compact size and minimum cost.

Product

Semi-Automatic Probe Station

P300A

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Micromanipulator Company

P300A - Micromanipulator Company

The P300A probe station is the most stable, intuitive, and space efficient 300mm semi-automatic analytical probe station available today. Designed for low current, sub-micron positioning applications, the P300A comes standard with features such as single-point ground, dry/dark environment, and integrated thermal chuck plumbing.

Product

Probe Station

EPS300

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ECOPIA

EPS300 - ECOPIA

Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided.

Product

Cryogenic Probe Station

TTPX

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Lake Shore Cryotronics, Inc.

TTPX - Lake Shore Cryotronics, Inc.

The TTPX probe station is an affordable, entry-level probe station capable of making a wide variety of non-destructive, standard electrical device measurements. The compact tabletop design is perfect for academic and laboratory research settings. The TTPX provides efficient cryogenic temperature operation and control with a continuous refrigeration system using either liquid helium or liquid nitrogen.

Product

Fully Manual Systems

SPS-1000, SPS-2000, and SPS-2200

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MicroXact, Inc.

SPS-1000, SPS-2000, and SPS-2200 - MicroXact, Inc.

The SPS-1000, SPS-2000, and SPS-2200 systems are MicroXact’s premier manual probe stations designed to be flexible and easy to use. The high level of performance and affordability of these manual probe systems put them in a class of their own.

Product

Probing Solutions

ES62X-CMPS

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ESDEMC Technology LLC

ES62X-CMPS - ESDEMC Technology LLC

The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.

Product

Semi-automatic 150mm Probe Station

CM460

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Signatone Corp.

CM460 - Signatone Corp.

CM460 Semi-automatic 150mm probe station step & repeat, point & shoot, color mapping, and complete software control.