DDR
Double Data Rate memory achieved by reading both the rising and falling edge of clock.
See Also: Memory, Memory Test, NAND, DRAM, Memory Device, DDR4
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Product
PXI Digital Waveform Instrument
Digital Waveform
PXI Digital Waveform Instruments feature up to 32 channels, can sample and generate digital waveforms at up to 200 MHz, and interface with various standard TTL and low-voltage differential signals (LVDS), as well as settable voltage levels. These devices offer per clock cycle, per channel bidirectional control, and phase shifting. They include deep onboard memory with triggering and pattern sequencing. Some models also support doubledatarate (DDR) technology and real-time hardware data comparison. You can use Digital Waveform Devices to create device simulation and complex stimulusresponse tests.
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Product
Multifunction Data Collection and Analysis System
2002
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The Model 2002 DME System is a state of the art, multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
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Product
Multifunction Data Collection and Analysis System
9000
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The Model 9000 DME System is a high performance multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
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Product
Logic Analyzer
GoLogicXL-36
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Logic analyzers and oscilloscopes offering fast sample rates and large memory depths are required to debug and test modern electronics. The GoLogicXL captures a very large window of bus activity using sample depths up to 1 billion samples. 4 GHz sampling rates expose the finest details in your signals. 1 GHz Transitional sampling provides the optimum method to capture fast data bursts separated by seconds, minutes, or even hours of bus inactivity. The GoLogicXL State analysis can also synchronize with single-data-rate 300 MHz SDR clocks, and double-date-rate 250 MHz DDR clocks (500 MHz effective).
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Product
Memory Analysis Software for Logic Analyzers
B4661A
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DDR3, DDR4, DDR5, LPDDR2, LPDDR3, LPDDR4, and LPDDR5 Analysis . The Keysight B4661A memory analysis software offers a suite of options that include the industry’s first protocol compliance violation testing capability across speed changes, a condensed traffic overview for rapid navigation to areas of interest in the logic analyzer trace, powerful performance analysis graphics, and DDR and LPDDR decoders. With the B4661A memory analysis software and a Keysight logic analyzer*, users can monitor DDR/2/3/4/5 or LPDDR2/3/4/5 systems to debug, improve performance, and validate protocol compliance. Powerful traffic overviews, multiple viewing choices, and real-time compliance violation triggering help identify elusive DDR/LPDDR system violations.
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Product
Detective Logic Analyzer
DDR3
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Provides logic analyzer like deep transaction Listing and Waveform captureCan store up to 1G of captured StatesContinuous, real time analysis, not post-processingEye Detector guarantees valid data acquisitionExtensive Triggering and Storage Qualification allows precise insightProtocol Violation Detector provides hundreds of simultaneous, real time tests to JEDEC specificationsRow Hammer Analysis for potential data corruptionInteractions among up to 8 ranks, over two slots are analyzed.Mode Register Listing providedSupports Auto-Clock rate detect and clock stoppage Connects to the target under test with DIMM, SO-DIMM, and BGA interposers or a midbus probeIntegrated Microsoft Charts gives quick insight into large trace capturesTrigger In & Out allows the Detective to integrate with other test tools
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Product
AXIe Logic Analysis & Protocol Test
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Keysight's AXIe Modular Logic Analysis and Protocol test modules and powerful analysis software provide essential capabilities for engineers working on fast digital designs and chipsets using high speed parallel and serial buses, such as DDR and PCI Express Gen 3.
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Product
Infrared Microscope
DDR200 & DDR300
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The McBain DDR200 and DDR300 for 200mm and 300mm wafer defect detection and review are unmatched in value and features in this special application and price category. The systems offer significant and unique advantages for both production and engineering use, and provide an ideal solution when both defect detection and dimensional metrology are required.
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Product
Recording System
Surveyor DFR DDR
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The Surveyor Recording System is a DFR/DDR with local Input Modules connected to a Controller. The Input Modules are connected to the Controller by multiconductor cables. The Controller contains a single board computer running 64-bit Microsoft Windows 10® and the E-MAX Director program, for recording, storing and transferring data.
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Product
Logic Analyzer
GoLogicXL-72
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Logic analyzers and oscilloscopes offering fast sample rates and large memory depths are required to debug and test modern electronics. The GoLogicXL captures a very large window of bus activity using sample depths up to 1 billion samples. 4 GHz sampling rates expose the finest details in your signals. 1 GHz Transitional sampling provides the optimum method to capture fast data bursts separated by seconds, minutes, or even hours of bus inactivity. The GoLogicXL State analysis can also synchronize with single-data-rate 300 MHz SDR clocks, and double-date-rate 250 MHz DDR clocks (500 MHz effective).
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Product
Infrared Microscope
DDR200/300 NIR
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The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
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Product
Functional/Protocol Debug and Analysis Reference Solution
DDR4
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Highest confidence in measurement accuracy! Industry’s fastest triggering and data capture for DDR4 analysis, test, and debug.
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Product
Data Recording System
Director DII - DFR DDR
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Using the Microsoft Windows 10® operating system, DII features complete Transient and Long-Term Phasor Data Recording, Analysis, and Transmission. E-MAX DII has a maximum capacity of 128 Analog and 256 Digital directly connected channels.
