Functional Test
black box type testing via interface level inputs and resulting output analysis.
See Also: Functional ATE, Functional Test Systems, Interoperability Test, End of Line
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EOL/Functional Testing
Functional Test
Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Function Test Systems & Equipment
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Cincinnati Test Systems (CTS) provides our customers with turnkey systems that include the design, manufacture and support of custom built lean cell and automated functional equipment testing solutions. We are a recognized global leader for providing test solutions integrated with advanced technology, precision instrumentation, information software written by CTS engineers with proven experience, and supported by a team of technical application specialist.
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Test Engineering Projects
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Precision Development Consulting Inc
Fiber Optics Test System, Data Collection, Trident Missle Components, PC Board Functional Test and Bearing Tester
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PCI Precision Resistor Card 9-Channel, 1.5Ω To 3.55kΩ
50-297-023
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PCB Test Fixtures
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ATE, ICT, semiautomatic & manual electronic test fixtures, PCB test fixtures, cable test fixture, wiring harness test fixtures, dedicated test fixtures, functional test fixtures, electronic test fixture programming. PADS Schematic capture, circuit board layout, PCB design prototype, solder paste stencils, X-Y coordinate data, B.O.M. maintenance, and manufacturing documentation, Gerber data.
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Continuous Testing Platform
TOSCA
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Tricentis Tosca is a Continuous Testing platform that accelerates testing to keep pace with Agile and DevOps. With the industry’s most innovative functional testing technologies, Tricentis Tosca breaks through the barriers experienced with conventional testing tools. Using Tricentis Tosca, enterprise teams achieve unprecedented 90%+ test automation rates—enabling them to deliver the fast and continuous feedback required for Agile and DevOps.
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Digital Control DC Electronic Load
IT8200 Series
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IT8200 series economical programmable electronic load,with the highest cost/performance ratio and small size, they are widely used in production testing lines and maintainance lines etc. Resolution 1mV/1mA ensures the accurate measurement result. IT8200 series has programmable performance, and can quickly recall 4 * 40 group memory data, panel function keys and display interface is clear, provide customers with simple operation program, easy and fast to complete a variety of complex tests. The series has CV, CC and CR mode, and short circuit test function, it is the most cost-effective electronic load products.
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AMIDA 5000 Tester
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AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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PXI High Density Precision Resistor Module, 9-Channel, 2Ω to 62.1Ω
40-298-111
Programmable Resistor Module
The 40-298-111 is a high density programmable resistor module with 9 channels which can be set between 2Ω and 62.1Ω with 0.25Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Test Studio Dev Edition
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Test Studio Dev Edition is a Visual Studio extension allowing software engineers to create functional automated UI tests in Visual Studio using C# or VB.NET. It is designed to provide ready-to-use Visual Studio automated testing functionality across web and desktop. Applications that are built with the Telerik and Kendo UI controls can be automated in a snap, by way of built-in native component translators.
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PCI High Density Pecision Resistor Card, 3-Channel, 3.5Ω To 395kΩ
50-298-142
Programmable Resistor Module
The 50-298-142 is a high density programmable resistor card with 3 channels which can be set between 3.5Ω and 395kΩ with 0.5Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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CT Analyzer
PCT200i
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PCT200 series CT test set (CT Analyzer) is a current transformer test equipment specially designed for current transformer characteristic test and with additional PT test functions for reference test. PCT200i owns more test items and higher technical parameters.
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PXI Precision Resistor Module 6-Channel, 3 to 2.97M
40-297-051
Programmable Resistor Module
A simple solution for applications requiring accurate simulation of resistive sensors. The series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Clamshell Type Mechanical Fixtures
Series 11
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The MT Series 11 dual well mechanical kits are an affordable solution to printed circuit board testing with the advantage of testing two devices. These can be similar devices, or devices that are used together in a functional test. The Series 11 Kits have the same available features and options as the Series 10 Kits.
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PXI 2.5W Programmable Resistor Module, 4-Channel, 1.5Ω to 472Ω
40-251-020
Programmable Resistor Module
The 40-251-020 is a programmable resistor module with 4 channels which can be set between 1.5Ω and 472Ω with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Rapid PSE And Chained Data Test Of 4-Pair And 2-Pair PSE's
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The optional PSL-3424-QT feature license opens up two important productivity tools in the PSL-3424 platform. PSL-3424 Quick Test is a fully automated PSE functional test covering between 2 and 8 PSE ports in a test cycle with average test times on the order of 10 seconds per port tested. The Chained Data Test user interface allows rapid construction and verification of test setups used in “snaked data path” testing of PSE’s with user specified loads and optional LLDP power negotiation on each test port.
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PXI 5W Programmable Resistor Module, 2-Channel, 2Ω to 102kΩ
40-252-034
Programmable Resistor Module
The 40-252-034 is a programmable resistor module with 2 channels which can be set between 2Ω and 102kΩ with 2Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI 2.5W Programmable Resistor Module, 4-Channel, 1Ω to 470Ω
40-251-114
Programmable Resistor Module
The 40-251-114 is a programmable resistor module with 4 channels which can be set between 1Ω and 470Ω with 2Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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3 Wire (Digital) Earth Resistance Tester
ST-1520
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Standard Electric Works Co., Ltd
● Capable of measuring earth resistance and earth voltage.● 2mA measuring current permits the testing of earth resistance without tripping earth leakage current breakers in the circuit under test.● Auto power off function.● The timer operates automatically for about three to five minutes when the "PUSH BUTTON SWITCH" and "TIMER ON BUTTON" are pressed together. This will keep test "ON" for the duration of the timer.● Timer for test function (count 3-5 minutes).● Battery operated.● Data hold function.● Small and light weight.● Calibration performed with supplied test leads.
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Microprocessor System Tester
IST-6700
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IST Information Scan Technology, Inc.
The IST 6700 is a low cost, stand-alone test instrument that provides a wide range of automatic and manual features for troubleshooting microprocessor-based circuit boards. It employs CPU emulation with low cost CPU personality pods to attach to or replace the resident CPU. With stored "Known Good" test data, the 6700 can provide fully automatic functional tests to check the system RAM, ROM, control signals, address, and data bus plus the measurement of the CPU clock frequency and supply voItage.
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Multi-Purpose Probes
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*For All your Functional Test Needs *Machine Building *end of line test
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LTE eNodeB Testing
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The DuoSIM and DuoSIM-Advanced are the most scalable eNodeB test systems in the industry. From basic functional testing to complex C-RAN environment simulation, the DuoSIM line of testers makes validation and development of network equipment faster, easier, and more cost effective.
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Automate Functional Tests
GXtest
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With GXtest you can automate functional tests and find bugs in early stages. GXtest is easy to configure, use and maintain. It allows running the necessary tests to ensure the high quality of the generated software, finding errors when solving them is less costly.
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Satellite ATE
MS 1123
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Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.
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Non-functional Testing Services
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Good software has both- efficient functionality and excellent performance. While functional testing pays attention to improve the functioning of the software, our non-functional testing solutions aids in enhancing software performance under various conditions. QACraft has helped several enterprises all over the globe to boost performance by evaluating the software when it comes to software and eradicating the lacking factors from it. Carrying out non-functional testing for the software helps in checking the software’s accessibility, scalability, and responsiveness.
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PXI High Density Precision Resistor Module, 4-Channel, 3Ω to 6.97kΩ
40-298-130
Programmable Resistor Module
The 40-298-130 is a high density programmable resistor module with 4 channels which can be set between 3Ω and 6.97kΩ with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI High Density Precision Resistor Module, 4-Channel, 3Ω to 26.7kΩ
40-298-132
Programmable Resistor Module
The 40-298-132 is a high density programmable resistor module with 4 channels which can be set between 3Ω and 26.7kΩ with 0.5Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Opticle Encoder Tester
Endeavour
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Evolusys Technologies Sdn. Bhd.
The Endeavour test system is a complete solution for testing optical digital and analog encoders for electrical and functional test with high accuracy and high speed. It provides high precision, research-grade electrical and functional testing and signal characterization suitable for encoder development. For quality assurance in encoder production, the Endeavour can be easily combined with a handling system for automated, high-end testing and qualification in the production of encoders.
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ICT/FCT-Fixtures (Small IF)
GenRad CK-1-228X-S
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
