Functional Test
black box type testing via interface level inputs and resulting output analysis.
See Also: Functional ATE, Functional Test Systems, Interoperability Test, End of Line
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Product
Single Function MIL-STD-1553 Test & Simulation PCIe Card
ASE1553M-x
Simulator
Single Function MIL-STD-1553 Test and Simulation module for PCIe with 1, 2 or 4 dual redundant streams.
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Product
Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
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According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
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Product
PCI Precision Resistor Card 9-Channel, 1Ω To 122Ω
50-297-112
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Solar ATE
MS 1534
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The Inverterless ATE is an automatic test equipment which is used to test the all functional and various test conditions of Inverterless Solar Unit. This ATE shall be a GO/NOGO Tester for Inverterless Solar Unit. All production units can be tested with this ATE for functional testing and clearance. This ATE reduces the man effort for quality checks and detects the failure units. The Inverterless ATE can check the UUT with minimum user interactions. It shall test and generate test report in PDF format for the conducted tests with necessary data. The ATE operates on 230V AC power. The ATE has In-Built AC-DC converter which provides 12V DC for operate the unit. Also it has additional AC-DC converter to simulate solar power to the Inverterless units. The main objective of the ATE is to test the Inverterless S in all possible test scenarios without external test equipments and less user interactions.
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Product
PXI 10W Programmable Resistor Module, 2-Channel, 1Ω to 470Ω
40-253-014
Programmable Resistor Module
The 40-253-014 is a programmable resistor module with 2 channels which can be set between 1Ω and 470Ω with 2Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Product
CTEK MUS 4.3 TEST&CHARGE Battery Charger and Tester
56-959
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The MUS 4.3 TEST&CHARGE combines an advanced micro-processor controlled battery charger with a battery and alternator test function to provide the ultimate in battery testing, charging and maintenance.
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Product
Medical Withstand Voltage Tester
2670YM
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Shenzhen Chuangxin Instruments Co., Ltd.
Medical Withstand Voltage Tester，2670Y Medical Withstand Voltage Tester Has All The Function Of The Conventional Withstand Pressure Tester,And Increasing The Arc(Flashover)Detection Function,It Can Test The "Flashover" Phenomenon Of Electrical Equipment Intuitively,Accurately,Rapidly And Reliably Through The External Oscilloscope,The Measured Electrical Equipment Without "Flashover" Phenomenon,
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Product
Functional Testing
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Whatever your functional testing requirement, whether analogue, digital, or a combination of technologies, we have a solution. With over 2500 applications delivered in this field we have a level of experience that cannot be matched. Ensure the reliability of your product with our functional testing tools. Our functional test solutions range from completely standalone applications to those matched for our FLEX range of ATE test systems. Whatever your testing needs, we will help you choose the best option for you.
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Product
Fibre Channel Simulator & Analyzer Applications Software
fcXplorer Simulyzer
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Avionics Interface Technologies
FC-1, FC-2, and FC4 Analyzer modes and displays - Frame parser for custom display of FC frames and payload data - Captured data can be saved as binary or “csv” files - User-defined trigger and filter features - “Live Capture” real-time display - Error detection and reproduction - Complete control of the transmit link - Replay of recorded data with precision timing or corrected protocol timing - Special testing functions such as defining command/response for exchange management
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Product
High-Speed Digital Testing
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Silicon Turnkey Solution, Inc.
High-speed devices create significant challenges for functional testing, for example, the need for high-bandwidth interfacing to maintain signal integrity at multi-gigabits per second data rates and the ability to measure high-speed bit error rate and jitter. STS brings extensive experience in high-speed functional testing for commercial, military and aerospace devices to meet the most stringent customer requirements. Our highly integrated testing laboratory and efficient workflow are designed with one goal in mind: to shorten time-to-market and enhance our customers’ ability to compete.
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Product
Ultimate Probe
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The Ultimate Probe is an ultimate device that offers multiple test functions that reduces diagnostic time. Applicable to 12V to 24V vehicles with the ability to power components such as radiator fans, starter motors, relays, window regulators, windshield wipers, etc.
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Product
Power Conversion Automated Test Platform
C8000
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Chroma Systems Solutions, Inc.
Power conversion testing is our core competency. Chroma’s engineering delivers cost-effective automated test system and software platforms to fit your Design Validation Testing (DVT) requirements in the lab or High Speed Functional Testing in the production line. Built into each system are Chroma’s years of expertise, precision instrumentation, pre-written test libraries, and local program management with global support. From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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Product
Analogue IC Tester
SYSTEM 8 (AICT)
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The SYSTEM 8 Analogue IC Tester is the answer to testing analogue devices. The key feature of the AICT is its ability to functionally test all common analogue ICs and discrete devices in circuit. It is also capable of testing all types of analogue and digital components by means of the well-known, power off V-I test technique. For users requiring only the latter function, please select the Analogue Test Station section.
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Product
Winding Resistance Tester
JYR-50C/40C/20C
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1. With demagnetization function.2. Testing range reach to 20k3. Also apply to testing tranformer with high winding resistance.
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Product
Test Handler
ETH
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The ENGMATEC test handler as the "heart" of our inline test solutions impresses with its wide range of applications for in-circuit, functional or final tests. All components of the modular system are coordinated with one another and can be combined with one another and with various production systems. Vision systems, scanners, marking devices and many other functions can be integrated.
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Product
Contunuity Tester With Audio Warning
CT-01
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Laxtronics Instruments & Controls Pvt. Ltd
5 Kilo Volt AC, 30 Milli Ampere, Timer 0 To 100 Seconds, HV Prods, Start-Stop-Trip-Reset Using Single Switch On The Test Prods. Start Function Apply Test Voltage From 0 To Set Voltage Graduall
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Product
2-in-1 High-Voltage Test Hood
LX-HVE600EC
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2-in-1 high-voltage test hood with integrated interchangeable setHV hood for electrical safety test & function test.The test cells are made of stable, highly insulating plastic and are closed by a swiveling, transparent cover. The built-in safety switch is used to lock the hood and release the high-voltage sources. This ensures that no high voltage is active when the door is open. There is a generously dimensioned wiring space in the floor of the test cage. An interchangeable adapter plate in the test cell - optionally with an interchangeable interface or an interchangeable adapter cassette - allows quick adaptation to different types of test items. Prepared openings enable connectors and other common interfaces or cable bushings to be easily attached. The hood is opened and closed almost effortlessly thanks to precisely coordinated gas springs.
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Product
Multifunctional Safety Tests
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Manufacturers of electrical or electronic products are required by law to carry out an electrical safety test before placing them on the market. This final test takes place at the end of the manufacturing process and is therefore also referred to as an EOL test (end-of-line). Depending on the prescribed standard and directive, the following parameters are tested:- Leakage current and discharge current- Insulation resistance or the insulation strenth- Dielectric strength or electric strength- Correct installation of the protective conductor (ground continuity and ground bond test)- Faultless functioning of the product under the conditions defined for intended use (function or run test
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Product
Deluxe DMM w/Amp Shutters
582
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*Huge 2 inch LCD Display, easy to see from across the room *Display is backlit for use in Dark Spaces *Amp Shutters prevent mistaken operation, improve safety and saves fuses by blocking unused amp jacks! *Great Meter for Electrical Trouble Shooting *11 Test Functions, 33 Test Ranges *Measures Temp in Both F and C, Probe Included *Desireable 20 Amp Test Range *Modern Design, the Protective Holster is Built-In *Data Hold *Carrying case, Test leads, Temp probe, Instructions and Battery included
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Product
High Power Programmable AC Source with Transients
61510
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Chroma Systems Solutions, Inc.
Power Rating:61511: 12KVA61512: 18KVAVoltage Range: 0-150V/0-300V / AutoConfigurations with input voltage of 220V or 480VFrequency: DC, 15Hz-1500HzSingle-phase or three-phase output selectableProgrammable slew rate setting for changing voltage and frequencyProgrammable voltage and current limitHigh output current crest factor, ideal for inrush current testingTurn on, turn off phase angle controlTTL signal which indicates output transientLIST, PULSE, STEP mode functions for testing Power Line Disturbance (PLD) simulationVoltage dips, short interruption and voltage variation simulationHarmonics, inter-harmonics waveform synthesizerComprehensive measurement capability, including current harmonicsAnalog programmable interfacesRemote interface: GPIB, RS-232, USB and EthernetCapable of delivering power output up to 90KVA by implementing Master-slave parallel operation
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Product
FPGA PXI Card with 40 Channel ECL Buffer Module
GX3640
FPGA PXI Card
The GX3640 is comprised of the GX3500 FPGA card and the GX3540, 40 channel ECL expansion card. It is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), and functional test applications. The GX3640 consists of 20 differential ECL drivers and 20 differential ECL receivers. Each channel can be accessed via software commands for use in static I/O applications.
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
PCI Precision Resistor Card 9-Channel, 2Ω To 13.6kΩ
50-297-031
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
PXIe Multi-Channel Function Generator Module, 8-Channel
43-625-004
Function Generator
The 41-625-004 (PXI) and 43-625-004 (PXIe) are function generator modules that provide 8 channels in a single PXI/PXIe slot. They can generate sine waves to 300 kHz with 5.76 mHz frequency resolution referenced to the 10 MHz PXI clock. The output voltage range is up to +/-25 V in a 16-bit resolution. It also support PXI trigger functions allowing events from other instruments to initiate waveform generation or sweeps.
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Product
Imperial Test Executive
ITE
test
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
NI Automated Test Software Suite
test
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Arbitrary/Function Generator,2 Ch,150 MHz,16 bit,128Mpts/Ch,6 Vpp output, Wave Sequencing
T3AWG2152
Function Generator
Arbitrary/Function Generator,2 Ch,150 MHz,16 bit,128Mpts/Ch,6 Vpp output, Wave Sequencing.
