Near-field Scanning Optical Microscope
Near-field Scanning Optical Microscope
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Product
Optical Gas Imaging Camera
EyeCGas CO
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Opgal Optronic Industries Ltd.
EyeCGas CO is a handheld OGI camera for CO gas leak detection. With this camera you can safely and remotely detect and locate carbon monoxide as well as other harmful gases emissions. It is also the only OGI camera that is certified for ATEX zone 2 and UL class I Div II, hazardous environments. The EyeCGas CO allows for routine and on-demand inspections in the steel manufacturing operations and other industries where CO emissions need to be closely monitored. With EyeCGas CO, Opgal helps you detect and repair toxic gas leaks inside the facility, whether in vent stacks or pipes, allowing video and audio recording while maintaining safety. Whether these toxic gases are part of the manufacturing process, or a byproduct of the production line, EyeCGas CO helps increasing safety and protect the environment.
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Product
Ultrasonic Optical Flaw Detector
MIV-X
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Thanks to Shimadzu’s proprietary light imagining technique, which combines an ultrasonic oscillator with a stroboscope, defects near the surface of a material, including peeling of the bonding and adhesive surfaces of heterogeneous materials, as well as paint, thermal sprays, and coatings can be inspected easily and non-destructively.
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Optical Active Module
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UPM (Universal SFP-Typed Power checker Module) provide very high productivity for power checking work on high density fiber optic systems and devices for FTTH, CWDM-PON and local network systems. UPM can measure optical power intensity.
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Product
Custom Microscopes and Optical Systems
OpenStand
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Whether developing new automation techniques and software or developing new imaging methods, you can quickly find that you need a microscope system tailored to your application and business needs. Prior Scientific has developed OpenStand® to offer a working platform to build OEM solutions and one-off customizations with excellent value for money and reduced development time.
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Product
Two-Way Optical Loss Tester
KI23403OLV-INGAAS-APC-50U
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A Two-Way Optical Loss Tester (OLTS) that's perfect for medium to ultra high fiber count loss, length and optical return loss testing applications on multimode fiber at 850 / 1330nm. A pair of these compact instruments set new standards of productivity, accuracy and ease of use. A multimode APC connector on this model is required for reliable ORL test performance.
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Product
Laser Scanning Microscope
OLS4100
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The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
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Product
Spectroscopy Upgrade for Any Microscope
SMS
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Get a simple upgrade to your existing microscope, or a turnkey microspectrophotometer system that works out-of-the-box.
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Product
Variable Optical Attenuator
KI 7010 Series
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The KI 7010 Series hand held Fiber Optic Variable Attenuator is a precision handheld instrument commonly used for testing optical system margin. Superior specifications, high productivity and remote control capability also make this a genuine laboratory instrument.
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Product
Optical Transceiver FMC Modules
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Sundance Multiprocessor Technology Ltd.
FMC Modules with Optical Transceivers
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Product
Optic Node
OX 752
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Converts even weak Optic Signals to a high quality RF Signal. LED BAR Optic Level Display has been provided for ease of system maintenance. They are best suitable for Analog as well as Digital transmission to maintain BER, MER Characteristics.- High Quality Nodes- Frequency 40 ~ 1000 MHz- Good Sensitivity of -11 dBm- RF O/P 110 dBµV at 0 dBm Optic I/P- High Voltage Surge Protection- LED Optic Level Display- Powder Coated Housing
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Product
Temperature Controlled Microscope Stage
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Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
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Product
Hi-Res Radar Scan Converter PMC
Eagle-2
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Curtiss-Wright Defense Solutions
Eagle-2 is a high-performance radar scan converter from Curtiss-Wright Defense Solutions. Eagle-2 provides improved performance and support for high-resolution screen displays up to 2560 x 1600, including 2048 x 2048, making it the perfect choice for high-end radar display applications such as air traffic control (ATC) displays, VTS display command and control consoles, and radar head monitors.
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Product
Optical Talk Sets
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Talk sets in fiber optics are used as a communication device in the installation, activation, and repair of optic fiber networks. The talk sets offered through GAOTek are high quality, easy to use, and ruggedly built so you know they’ll be reliable no matter the conditions your field work is in.
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Scanning Slit Beam Profilers
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DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
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Product
Optical Power Multimeter
TM503N
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TM503N Optical Power MultiMeter, a new generation of high-performance optical network test meter, with the characteristics of excellent performance and fast filed–test, has adopted the latest laser exploration and processing technology. It is a compositive optical power meter aimed at optical network maintenance, equipment research and development.
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Product
Near-field Chambers
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Most antenna measurements need to be carried out in the far field; that is, the test antenna should be illuminated by a plane wave. Typically this is carried out by providing sufficient separation between the source and the AUT so the spherical wave approaches a plane-wave character.
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Product
1149.6 Boundary Scan Feature, GTE 10.00p
K8213B
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Keysight’s Interconnect Plus Boundary Scan 1149.6 feature enables all the tools required to develop and execute this test method on the board under test. Compared to the 1149.1 standards, the 1149.6 standards define test methods for the boundary scan devices that are designed with AC coupled signals or differential nets needed for high-speed operations of the device.
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Product
Area Scan Cameras
uEye
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Imaging Development Systems GmbH
From the industrial-grade webcam alternative to the ultra-fast 10 GigE industrial cameras to the individual board level camera. uEye stands for versatile, easy-to-use USB and GigE industrial cameras with a wide selection of CMOS sensors and variants. The combination of first-class quality “Made in Germany”, long-term availability and high user-friendliness makes the industrial cameras unique.
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Product
Microscopic Four-Point Probes
M4PP
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CAPRES M4PP Microscopic Four-Point Probes have an electrode pitch three orders of magnitude smaller than conventional four-point probes, and are fabricated using silicon micro-fabrication technology.
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Product
Optical Link
OPT-2
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The OPT-2 Optical Link allows the THERMES-USB to be operated with total optical isolation between THERMES and the host computer. USB Isolation device offers up to 4500 volts DC isolation.
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Product
Handheld Variable Optical Attenuator
VOA100
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Shanghai Tarluz Telecom Tech Co., LTD
VOA100 handhold optical variable attenuator is used for continuously variable optical signal attenuation. As the VOA100 is used in the laser system for the on-line testing, therefore, it can be used in the digital system of communication devices (such as: PHD, SDH) and also in the system of adopting analog modulation (CATV)
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Product
Fibre Optic Laser Encoders
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The RLE system is a unique, advanced homodyne laser interferometer system specifically designed for position feedback applications.
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Imaging Scanning Monochromator
H1034
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HORIBA Scientific OEM has developed a high-throughput imaging scanning monochromator based on an aberration-corrected concave holographic grating with low stray light and high efficiency. This proprietary layout with single optics design is ideal for imaging for low-light applications. It features a 3-position external filter wheel, TTL drive electronics, 4-phase stepper motor and associated worm/gear 90:1 ratio mechanism, encoded, aligned and focused at factory.
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Line Scan Camera
Linea ML
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The Linea ML brings leading edge CMOS technology that is faster than ever, with affordable multiline architecture that enables the newest, most powerful inspection techniques including HDR, color and multispectral analysis, and multi-field imaging (single-pass bright/darkfield). With a native fiber optic interface for easy, low-cost long cabling, the Linea ML opens new horizons in inspection.
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Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
