Test Call Generators
check telecom networks by call event validation.
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Alternate 1.30 (37.00) - 4.50 (128.00) General Purpose Probe
HPA-1D-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2H-2
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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120 GSa/s Arbitrary Waveform Generator
M8194A
120 GSa/s sample rate supporting signals up to 64 GBaud on 4 channels in a 1-slot AXIe module - simultaneously.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Standard 1.10 (31.00) - 3.85 (109.00)General Purpose Probe
SPA-64-3
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3: 0,365″; Tip 8: 0,385″; Tip ,9,10: 0,363″
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3G
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Vector Signal Generator
SGT100A
The R&S®SGT100A has a clear focus on automated environments with high speed and a compact design. The radio frequency chain has been optimized for the fastest frequency and level switchover times. In the baseband, the multisegment waveform mode helps users quickly switch from one test signal to the next. Though compact in size, the R&S®SGT100A has excellent RF characteristics (signal quality and level accuracy). Maximum output level, level repeatability and excellent EVM performance are key characteristics in production environments. Equipped with a LAN and USB interface, the R&S®SGT100A enables remote control of test equipment in automated applications.
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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92 GSa/s Arbitrary Waveform Generator
M8196A
New Arbitrary Waveform Generator with the highest combination of speed, bandwidth and channel density.92 GSa/s sample rate supporting signals up to 64 GBaud on 4 channels in a 1-slot AXIe module - simultaneously.
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Bluetooth RF Test System
FRVS
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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P2262A General Purpose Probes
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 710Overall Length (mm): 18.03
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High Definition Arbitrary Waveform Generator
T3AWG Series
T3AWG3K Series consists of six high definition high performance Arbitrary Waveform Generators (HD AWG) consisting of 2, 4 and 8 channels, 16 bit vertical resolution, 12 Vpp max output voltage (50Ω into 50Ω), 128 Mpts/ch memory (optional 1 Gpts/ch), a maximum sampling rate of 1.2 GS/s and a max sinewave frequency of 250 MHz and 350 MHz respectively. The baseline HW voltage offset capability provide the unmatched ability to generate ±24 V or 48V output voltage window (50Ω into High Impedance).
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Seno-Con Test System
PANTHER 2K QST
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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High 4.00 (113.00) - 6.70 (190.00) General Purpose Probe
P2250-9-8
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,453Overall Length (mm): 36.91Rec. Mounting Hole Size (mil): 126Rec. Mounting Hole Size (mm): 3.20Recommended Drill Size: #30 or 3.20 mm
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PXIe Arbitrary Waveform Generator, 500 MSa/s, 16 bit, 200 MHz
M3201A
The M3201A PXIe arbitrary waveform generator is ideal for general purpose AWG automated test requirements. It offers high channel density with high-quality output with low phase noise. The optional real-time sequencing, intermodulation synchronization, and graphical FPGA programming software tools expand its capability to enable a number of solutions including envelope tracking (ET) and DPD (part of PA/FEM reference solution), MIMO, baseband electronics design, wireless device manufacturing, ATE, beamforming and other multi-channel coherent signal generation and multi-channel signal generation.
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PXI-5670, 2.7 GHz PXI Vector Signal Generator
778768-02
2.7 GHz PXI Vector Signal Generator—The PXI‑5670 has the power and flexibility you need for product development applications from design through manufacturing. It can generate custom and standard modulation formats such as AM, FM, PM, ASK, FSK, PSK, MSK, and QAM. The PXI‑5670 delivers a highly flexible and powerful solution for scientific research, consumer electronics, communications, aerospace/defense, and semiconductor test applications as well as for emerging areas including software defined radio, radio frequency identification (RFID), and wireless sensor networks.
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6GHz Four Channel Signal Generator 19" 1U Rack Module
LS6084R
The LS6084R, 6GHz four channel RF Analog Signal Generator, offers industry leading performance, in a 1U, 19” space efficient, rack-mounted box. The LS6084R features four phase coherent channels, exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The LS6084R was designed to offer excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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50MS/s PCIBus Arbitrary Waveform Generator
5325
Model 5325 is a Single-Channel Arbitrary Waveform Generator that combines many powerful functions in one small package. Supplied free with the instrument is ArbConnection software, which is used for controlling the 5325 and for generating, editing and downloading waveforms from a remote computer.
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Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Ethernet/LXI generatorNETBOX 16 Bit Arbitrary Waveform Generator - up to 40 MS/s on 8 Channels
DN2.654-08
The generatorNETBOX DN2.65x arbitrary waveform generators (AWG) is a general purpose multi-channel AWG with outstanding dynamic performance. The series includes LXI units with either four, eight or 16 synchronous channels. The large onboard memory can be segmented to replay different waveform sequences.
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Alternate 1.00 (28.00) - 2.00 (57.00) General Purpose Probe
P2663G-1C2S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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TestStand
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Standard 1.50 (42.00) - 3.30 (94.00) General Purpose Probe
P2663G-1R1S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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6GHz Single Channel Portable Signal Generator
LS6081P
The LS6081P, 6GHz Single Channel RF Analog Signal Generator, offers industry leading performance, in a modern tablet like design that can be used as a benchtop or portable unit. The LS6081P features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The LS6081P was designed to offer excellent performance and meet today’s most demanding applications, whether in the lab or out in the field.
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Standard 1.10 (31.00) - 3.85 (109.00)General Purpose Probe
SPA-64-7
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3: 0,365″; Tip 8: 0,385″; Tip ,9,10: 0,363″
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Fully-Automated CTIA-Compliant OTA Test System
TS8991
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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OTP-Based Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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RF & Microwave Signal Generator
SMA100B
The R&S®SMA100B RF and microwave signal generator delivers uncompromising maximum performance. It provides the purest output signals while maintaining the highest output power levels with the lowest harmonics, far outpacing the competition. As the world's leading signal generator, it can handle the most demanding module and system T&M tasks in the RF semiconductor, wireless communications, aerospace and defense industries.
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PXI FlexRIO Signal Generator
The PXI FlexRIO Signal Generator combines analog I/O and a user-programmable FPGA into a single, customizable instrument. The instrument enables RF signal generation up to 2.9 GHz with 12 bits of resolution. The PXI FlexRIO Signal Generator uses FPGAs from Xilinx alongside LabVIEW and Vivado programming options for custom algorithm implementation and real-time signal processing. Using this instrument with NI-TClk, you can synchronize modules in one or more PXI chassis at up to picosecond‐level accuracy for high‐channel‐count applications.
