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PCB Test Fixtures
jigs which hold, align and engage pcb with test interconnect.
See Also: Test Fixtures, Board Test Fixtures, ATE Fixtures, Bed of Nails
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PCB Test Fixtures
ATE, ICT, semiautomatic & manual electronic test fixtures, PCB test fixtures, cable test fixture, wiring harness test fixtures, dedicated test fixtures, functional test fixtures, electronic test fixture programming. PADS Schematic capture, circuit board layout, PCB design prototype, solder paste stencils, X-Y coordinate data, B.O.M. maintenance, and manufacturing documentation, Gerber data.
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PCB Test Fixture Kits And Customized Fixtures
Mirotech manufactures portable benchtop PCB test fixture kits and provides customized test fixture solutions for the electronics industry. Our innovative, streamlined designs are compact in size and feature a linear collapsing system, interchangeable and reusable plate design, top and bottom probing, and are affordably priced. All fixtures are built using high quality hardware and materials and manufactured using the DATRON M8Cube, known for its precision and accuracy. Each of our custom designs are unique to our customer’s particular project requirements. Fixture kits come pre-assembled, and include blank plates ready for you to drill your test pattern.
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Custom PCB Test Fixtures
Emergent Electro-Mechanical designs and manufactures customized test fixtures and burn-in racks. Each of our custom designs is unique to our customer's particular project requirements. Emergent fixtures feature innovative design components including a linear collapsing system, interchangeable and reusable plate design, and top and bottom probing.
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PCB Test Fixture Kits
Emergent's fixture kits are available in bottom and double sided probing versions. They are fully scalable, from compact benchtop testers to full size multi-UUT production floor models. The removable, interchangeable plate design allows you to easily add and move test points, or swap out plates to test a completely different product. Each kit comes with a standard linear collapse over-clamp. A cam-follower closing system can be specified for higher force applications. Our fixture kits are manufactured using industrial grade phenolic laminate, which is similar to G10 in hardness and strength but easier to machine. The standard kit comes pre-assembled with blank plates for machining.
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Fixture Kit In-Line 6TL35 455x600mm
AH500
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 3000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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ATE Self Test Fixtures
AL663
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
Stopper kit includedYAVCANCON2 for fixture identification not included
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Wireless Test Standards Software
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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PCB Adapter, Receiver, QuadraPaddle, 192 Position, to NI PXI-2529 with six 36" cables
510150154
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to NI PXI-2529 with six 36" cables
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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ITA 192-Pin PCB Adapter to 3x IDC 64
YAV90Q06
3x 2 IDC 64 x 1000mmCables set J6200560 (Order Separately)
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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TestStand
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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PCB Adapter, ITA, QuadraPaddle, 192 Position, to PCB-Mounted 2x68 Male SCSI Connectors
510150165
PCB Adapter, ITA, QuadraPaddle, 192 Position, to PCB-Mounted 2x68 Male SCSI Connectors.
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PCB Adapter, Receiver, QuadraPaddle, 192 Position, to 2x68 Male SCSI Connectors
510150125
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to PCB-Mounted 2x68 Male SCSI Connectors
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PCB Adapter, ITA, SIM, VTAC, 16 Pos, 5 Slot, to (1) USB 5 Gbps (USB 3.0, USB 3.1 Gen 1, USB 3.2 Gen 1)
510171104
A small, modular PCB board that connects high speed data inserts (VTAC) to a single USB 5 Gbps (USB 3.0, USB 3.1 Gen 1, USB 3.2 Gen 1) connector. Great for COTS cable configurations. Compatible with all VTAC/SIM ITA modules.
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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PCB Adapter, Receiver, QuadraPaddle, 192 Position, to NI PXI-2532 with 36" Cables
510150143
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to NI PXI-2532 with 36" Cables
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Regenerative Battery Pack Test System
17020
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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PCB Adapter, ITA, SIM, VTAC, 32 Pos, 6 Slot, to (1) HDMI
510171113
PCB Adapter, ITA, SIM, VTAC, 32 Pos, 6 Slot, to (1) HDMI.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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PCB Adapter, Receiver, TriPaddle, 96 Position, To PCB-Mounted 1x96 Male DIN 41612 Connector
510104139
The 96 Pin Signal receiver module is made from Ryton R-7, withstanding temperatures up to 220°C. Nomenclature is molded on the module.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
