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Probe Interfaces
Connect ATE instrumentation to interface test adapter.
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Ultrasonic Flaw Detector
MFD800C
MFD800C intelligent digital ultrasonic flaw detector, Mitech concentrated years meticulously developed main product. Unique design, sophisticated manufacturing, convenient operation, powerful function, It takes many advantages in one unit. It had received customers' favored since its inception. It can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. With full digital 640X480 TFT LCD display, it can select the operating interface style and the LCD brightness according to environment. With humanizing interface design, the waveform show delicately. It can find the defects clearly in full screen. Single hand capable for holding operation, the curve making, probe calibration and other conventional operation can be completed automatically. Core processor CPU with 400M main frequency, it can complete the complex run quickly and realize intelligent defect analysis. Low power design with large capacity and high performance lithium ion battery module，it can work more than 8 hours continuously. Full English master-slave menu, emphasizing on user experience, collecting shortcut keys, digital shuttle rotary wheel, cross menu three operating way in one body, customer with different habits can operate it freely. It supports many languages. Its waterproof, oil proof, dustproof function can achieve IP65 protection level. It is the necessary professional precision instrument for defect detection, quality control, on-line safety monitoring and life evaluation in fields of oil, chemical, metallurgy, shipbuilding, aviation, railways and so on.
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INTERFACE TEST FIXTURE KITS
GENRAD 2270
Test-X GR Series CAM/TRAC® kits offer the same "Z" axis motion as the standard CT Series with the advantage of interface compatibility.Standard features include locking handle assembly, 3/8" FR4 probe plate, and 12 position I/O block interface..
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Load Pull
All Focus tuners use extremely efficient calibration and tuning algorithms and control electronics based on LAN control (iTuner). This is a merger our proven tuner technology with state of the art control electronics to create the latest tuner generation. The on-board micro-processor and tuning firmware form a self-contained and fully calibrated test instrument. The micro-processor inside the tuner accepts ASCII format communication, via an industry standard TCP/IP interface, controls up to nine stepper motors (tuner axes) and executes interpolation and tuning functions for single probe (CCMT) tuners (one probe per frequency range). For tuners with more than one independent probe (MPT) covering the same frequency range to allow for harmonic tuning, external computing power is required, because of the exponentially growing number of combinations of tuner states (slug positions).
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Powerful In-Circuit Production Flash Programmer
CYCLONE FX
P&E Microcomputer Systems' Cyclone FX programmer is is a powerful in-circuit, stand-alone programmer that supports a wide range of ARM Cortex and NXP® processor families. It's a versatile tool that offers on-board storage of programming images, provides power to the target, supports manual or automated programming, and has an easy-to-use touchscreen interface. Programming may be launched by a single button press without a PC or automatically from a PC via the automated control SDK. The Cyclone may also be used as a debug probe during development.
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Adjustable Press Plate Bed of Nails Testers
Protector Adjustable Family
Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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Oscilloscope
RTM3000
Designed as daily problem-solving tool, the R&S®RTM3000 combines the power of ten (10-bit ADC, 10 times the memory and 10.1" touchscreen) with a Rohde & Schwarz probe interface for all Rohde & Schwarz probes.
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Pilot Control Software Suite
The SemiProbe PILOT Control Software Suite semiautomatic and fully automatic probe systems employs the SemiProbe patented Adaptive Architecture. Software modules can be added to the base system as needed. PILOT Control Software consists of a Microsoft Windows-based user interface built on the SemiServer application for communicating to and from the probe system. Individual customer applications can be integrated with PILOT Control Software for a customized system to meet individual needs.
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JTAG Probe
MAJIC
MAJIC (Multi-Architecture JTAG Interface Controllers) JTAG Probes are small, stand-alone, processor-based systems that provide an intelligent connection between host-based development tools (the debugger) and an embedded processor via its standardized JTAG debug logic IP macrocell.
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SIP-90-6 Test System Interface Probe
SIP-90-6
Overall Length (mil): 656Overall Length (mm): 16.66Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
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Hardness Testers
Dalian Taijia Technology Co.,Ltd
Digital durometer for shore hardness testing pocket size model with integrated probe● Test scale: shore hardness● Standards: DIN53505, ASTMD2240, ISO7619, JISK7215● Parameters displayed: hardness result, average value, max. value● Measurement range:0-100HA(HD)(HC)● Measurement deviation:＜1%H● Resolution: 0.1● Auto switch off● With RS232C interface● Operating conditions: 0℃ to 40℃● Power supply: 4x1.5V AAA (UM-4) battery● Battery indicator: low battery indicator● Dimensions: 162x65x38mm● Weight (not including probe):173g● Application:Shore A is designed to measure the penetration hardness of rubber, elastomers and other rubber like substances such as neoprene, silicone, and vinyl. It can also be used for soft plastics, felt, leather and similar materials.Shore D is designed for plastics, Formica, Epoxies and Plexiglass.shore C is designed for various foam and sponge.
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Interface Pin
Smiths Interconnect offers interface probes for all major test equipment manufacturers. We also provide a variety of interface pins for use in test fixtures.
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Ultra-High Vacuum Scanning Kelvin Probe
Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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48 Ω HMM Pulse Force Probe
PHD-HMM-48-1
High Power Pulse Instruments GmbH
*High current wafer-level and package-level 98 Ω HMM probing with grounded DUT*Built-in high surge 48 Ω pulse reflection suppression resistor up to 80 A peak*Fast rise time < 0.5 ns due to low inductance GND loop*Variable pitch from 50 µm to 5 mm*Tungsten replacement probe tips*SMA pulse force pigtail*Compatible to PHD-3001A interface*High reliability
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2.5 GHz, 20 GS/s, 4ch, 100 Mpts/Ch High Definition Oscilloscope
WavePro 254HD
HD4096 technology provides 12-bit resolution up to 8 GHz and 20 GS/s. Up to 5 Gpts of acquisition memory enables detailed viewing of long events.15.6" 1900 x 1080 Full HD capacitive touchscreen.New ProBus2 input supports up to 8 GHz bandwidth and direct compatibility with a wide variety of existing ProBus probes - 50Ω and 1MΩ coupling modes support all input types on a single connector. MAUI with OneTouch user interface for intuitive and efficient operation.Deep toolbox enables and simplifies complex analysis.Intuitive navigation to quickly find important features in long waveforms. Zone Trigger – Simple Triggering for Complex Signals.
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6 GHz, 20 GS/s, 4ch, 100 Mpts/Ch High Definition Oscilloscope
WavePro 604HD
HD4096 technology provides 12-bit resolution up to 8 GHz and 20 GS/s.Up to 5 Gpts of acquisition memory enables detailed viewing of long events. 15.6" 1900 x 1080 Full HD capacitive touchscreen.New ProBus2 input supports up to 8 GHz bandwidth and direct compatibility with a wide variety of existing ProBus probes - 50Ω and 1MΩ coupling modes support all input types on a single connector. MAUI with OneTouch user interface for intuitive and efficient operation. Deep toolbox enables and simplifies complex analysis. Intuitive navigation to quickly find important features in long waveforms. Zone Trigger – Simple Triggering for Complex Signals.
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FRP-25T Test System Interface Probe
FRP-25T
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 120Recommended Travel (mm): 3.05Overall Length (mil): 1,210Overall Length (mm): 30.73
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Rack Based Test Solutions
Most equipment manufacturers and large enterprises prefer rack-based test tools as they are compact and higher density form factor solution for testing, monitoring, and troubleshooting network conditions. GL’s Multiple TDM Optical and Packet (mTOP™) rack enclosure can house any combination of USB based test equipment which are easily deployed and securely fixed to an equipment rack to provide extraordinary scalability to test switches, routers and end-to-end networks. These rack based platforms incorporates the basic test unit along with the necessary PC hardware, Windows® 10 64-bit operating system and remote accessibility via scripting and remote desktop. There are no moving parts with the unit, so reliability and longevity are integral. GL’s latest mTOP™ Probe stand-alone hardware variant is an all-in-one self-contained test instrument. The mTOP™ Probe can include any of the multiple TDM Optical and Packet interfaces USB device combined with the PC into one single box. The comprehensive mTOP™ Probe hardware unit is designed for easier portability and convenient for field testing which incorporates the testing features for multiple interfaces along with necessary PC hardware in a single box. GL’s USB based test equipment - PacketExpert™ (Ethernet), tProbe™ (T1/E1), USB T3/E3 (TDM), Dual UTAs (Analog/Wireless), and LightSpeed1000™ (SONET SDH) to support multiple interfaces in a compact rack space or included in a portable Probe unit.
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PhyView Analyzer
The PhyView Analyzer dramatically simplifies the task of Ethernet 10/100/1000 interface testing in finished products without the need for test fixtures, test signals, scopes, and probes.
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Press Down Rods Bed of Nails Testers
Protector Press Rods Family
Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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DisplayPort v1.3 Protocol Analysis Probe
FS4500
The FuturePlus FS4500 DisplayPort Analysis Probe provides a mechanical, electrical and software interface to the DisplayPort bus, a digital display interface standard supported by the Video Electronics Standards Association (VESA). The FS4500 is used to design and debug computer motherboards, monitors, home theater systems, and silicon chips incorporating DisplayPort technology.
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High-Resolution ER Data Logger
MS4500E
The MS4500E is a hand-held, battery-powered, corrosion meter capable of measuring and storing data from all types of electrical resistance (ER) corrosion probes. The instrument is light weight, microprocessor-based, and features a simple, menu-driven interface using a keypad and a backlit graphical LCD display.
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Tester Electrical Interfaces
The primary element of the tester electrical interface is the Probe Pin Ring (PPR). Sometimes referred to as a ‘tower,’ this array of spring-loaded probes can be arranged to provide a controlled impedance path, a low leakage connection, a low inductance arrangement for high currents, or just about any connection characteristic you require. inTEST EMS provides electrical interfaces in various OEM-supported designs, inTEST standards, and custom configurations.
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RSP-2T Test System Interface Probe
RSP-2T
Current Rating (Amps): 5Average Probe Resistance (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 167Full Travel (mm): 4.24Recommended Travel (mil): 79Recommended Travel (mm): 2.00
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PCI Express® 5.0 Interposer
OCP NIC 3.0
The Summit product family includes a wide variety of Interposer systems, designed to reliably capture serial data traffic while minimizing perturbations in the serial data stream. Probes include interposers, which are designed to capture data traffic crossing the PCI Express card connector interface, and MidBus probes, which are designed to capture traffic flowing within a PCB.
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TLP Probe Arm Kit
TPA-95
High Power Pulse Instruments GmbH
*Flexible pulse force, pulse sense combined TLP probe arm kit based on TPA-95L and TPA-95R*Compatible with typical standard micropositioner mechanical interfaces*4.7 kΩ pulse sense voltage divider, which results in a voltage transfer ratio of (4700 + 50)/50 = 95 : 1 into 50 Ω*Variable probe pitch configuration*1 m flexible 50 Ω cables with SMA connector for pulse sense*0.1 m flexible 50 Ω cables with SMA connector for pulse force*Tungsten probe tips*Can be used for chuck backside grounded TLP measurements
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CAM/TRAC Test Kits
Series 43
The GR Series 43 CAM/TRAC®1 kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 43 provides interface compatibility by using a 12 position, GR2270 style I/O block interface. This interface accepts the industry standard I/O, power, and coax blocks.
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DH Series Tip - CrossSync PHY PCIe5 CEM x16
DH-CSPHY-PCIE5-CEMX16
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Quad Input Logging Thermometer
DT304
UEi Test & Measurement Instruments
This series of Digital Thermometers offers a unique combination of features including logging capabilities with 9,999 memory positions and a USB interface and software, one, two and four inputs offering relative and differential readings. The Apollo also offers a solution to storing probes and is manufactured to conform to the IP67 standard, meeting performance expectations of water submersion and high-pressure dust resistance
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Data Logger for Extremely Low Temperature
DSR-ELT
Special probe using military industrial technology supports measuring temperature ultra low to -196 Original fittings for sensor connection, ensures 100,000 plugs Support single DSR connecting to PC via USB interface, and multiple DSR grouped in RS485 or LAN networking for central management Suitable for medical refrigerator, biological specimens preservation, scientific research and other applications
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Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 580 x 250 mm (wxd)
CMCSK-03-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
