LSI
IC around 10,000 circuits.
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Performance Board For LSI Tester
Place inner layer GND plane all over. Impedance control of signal line and crosstalk prevention, etc. contribute to improvement of characteristics in various ways.
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LSI Functional Verification Services
SpecInsight
The keys to functional verification are “verification strategy” and “highly complete verification item extraction.” Our functional verification services emphasize highly complete verification item extraction while also generating test benches and functional scenarios, random verification, and even functional coverage to meet customer demands by providing these services from a wide variety of angles. By implementing functional verification on the RTL and C models designed by customers from a third-party perspective, we improve quality of customers’ circuits.
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Hardness & LSI Titration Kit
Ultrameter™ III 9PTKB
The Ultrameter III 9P™ AHL Titration Kit, is based on the tried and tested design of the Ultrameter II™. The 9P adds the ability to perform in-cell alkalinity and hardness titrations either as stand-alone measurements or as part of an LSI calculation. Alkalinity, hardness, pH and temperature values can be manipulated in the LSI calculator to predict the effect of changes on water balance. Measurements are extremely accurate. And the 9P is simple to operate and maintain.
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Mixed signal LSI test system
Multi-pin type model is now launched in WL27 Logic/Power mixed LSI test system.This system is suitable for multi-site test in A/D mixed device such as automotive・motor driver IC. It’s a high throughput and cost performance mixed signal LSI test system.
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Dynamic Ultra Micro Hardness Tester
DUH-210/DUH-210S
A new evaluation system for measuring the material strength of micro regions, such as semiconductors, LSI, ceramics, hard disks, vapor deposited films, and thin coating layers, not addressed by previous hardness testers. It can also be used to evaluate the hardness of plastics and rubbers. This instrument uniquely measures dynamic indentation depth, not the indentation after the test. This in turn permits measurement of very thin films and surface (treatment) layers that are impossible to measure with conventional methods. Additionally, this same method supplies the data needed to calculate elastic modulus on the test specimens.
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Functional Test Trainer System
QT65
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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DIGITAL TACHOMETER
IBL-DT2235A
International Biological Laboratories
This is a Digital Hand Held Contact type Tachometer and has Micro Computer LSI Chip
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Digital Lux Meters
Model KM LUX 99
Kusam Electrical Industries Limited
• Precise & easy readout.• High accuracy in measuring.• LSI - circuit use provides high reliability & durability.• Permits a wide range of light measurements.• Low Battery Indication.• Auto zero adjust.• Compact, light-weight, & excellent operation.• LCD display can clearly read out even in High Ambient Light• LCD display provides low power consumption.• Separate LIGHT SENSOR allows user take measurements at an optimum position.
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Crystal Vibration Tester 1HZ~100MHZ
Shenzhen Chuangxin Instruments Co., Ltd.
1 It's using reciprocal counting technique, high accuracy, wide measuring range, truly equal precision measurement, fast speed measurement, high sensitivity.2 single-chip microprocessor technology cycle frequency measurement and intelligent management, making the instrument has high reliability and excellent performance / price ratio.3 It's using LSI design, the use of CPLD devices, instrument components greatly reduced, reliability has been greatly improved, the average time between failures ≥10000h. The machine looks nice, small size, light weight, easy to use.
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Wafer ESD Tester lineup
Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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USB ASSP
µPD720202
µPD720202 is a USB host controller LSI compatible with the USB 3.0 and xHCI (eXtensible Host Controller Interface) 1.0 specifications. The system bus is compatible with the PCIe Gen2 specification. The controller provides two USB ports with LS (Low-Speed) / FS (Full-Speed) / HS (High-Speed) / SS (SuperSpeed) support.
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LSI Structure Simulator
PARADISEWORLD-2
A high-speed and high-accurate simulator of LSI structure with graphical user interface. Capable to handle ULSI with ultra high-speed pattern layout viewer. Stable simulation evn for the complex profile.
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Electronic Components
We supply a wide range of components and materials to the electronics industry, such as: integrated circuits for personal computers, semiconductor materials for system LSI, optical communication materials for telecommunications, components for display devices seen in smartphones and projectors, and materials used in solar cells and lithium batteries.
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Semiconductor Electrical Test
We conduct electric property test (final test) of the completed (packaged) LSI products. We will support testing of analog devices, logic devices, other electronic parts, modules, application products and so on. We will test according to customer's specification regardless of evaluation, trial production, mass production, by know-how cultivated with long-time mass production results. Test initial examination ~ From consistent correspondence up to selection and evaluation, individual correspondence such as design only is accepted.
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Digital Tachometer - Non Contact / Contact / Non Contact & Contact
MODEL - KM- 2234BL / KM 2235 B / KM 2241
Kusam Electrical Industries Limited
Digital Tachometer uses latest technology for accurate measurements. It has Exclusive one chip of Microcomputer LSI Circuit, It is housed in tough ABS case & has ergonomic design for easy holding in the hand.
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Bare Board Tester
1232
High-Precision Batch Fixture-Type Testing System that Support Boards with Embedded Passive and Active Devices. The 1232 is a bare board tester that utilizes the full range of Hioki’s in-circuit testing technologies to deliver LSI reliability testing, complex component separation testing, high continuity and insulation testing, and more. (Double-sided alignment) Testable board dimensions: 50 × 50 to 330 × 330 mm (including clamp area) • Support for build-up boards that require resistance guarantees.
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Protocol Control Control
PC2
The PC2 software from SCSI Toolbox, LLC brings a new level of parallel SCSI protocol control to your test environment. Designed in cooperation with LSI Logic to work with their Fusion-MPT Message Passing Interface technology, PC2 allows all negotiated parameters to be displayed or set for all devices connected to any SCSI Host Bus Adapter based on the LSI53C1030 chip set. PC2 also provides the means to generate hardware SCSI bus resets.
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USB ASSP
µPD720201
The µPD720201 is a USB host controller LSI compatible with the USB 3.0 and xHCI (eXtensible Host Controller Interface) 1.0 specifications. The system bus is compatible with the PCIe Gen2 specification. The controller provides four USB ports with LS (Low-Speed) / FS (Full-Speed) / HS (High-Speed) / SS (SuperSpeed) support.
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Digital Tachometer
KM- 2234BL / KM 2235 B / KM 2241
Kusam Electrical Industries Limited
Digital Tachometer uses latest technology for accurate measurements. It has Exclusive one chip of Microcomputer LSI Circuit, It is housed in tough ABS case & has ergonomic design for easy holding in the hand.
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1HZ~100MHZ Crystal Oscillator Tester
CX-118A
Shenzhen Chuangxin Instruments Co., Ltd.
1 It's using reciprocal counting technique, high accuracy, wide measuring range, truly equal precision measurement, fast speed measurement, high sensitivity.2 single-chip microprocessor technology cycle frequency measurement and intelligent management, making the instrument has high reliability and excellent performance / price ratio.3 It's using LSI design, the use of CPLD devices, instrument components greatly reduced, reliability has been greatly improved, the average time between failures ≥10000h.The machine looks nice, small size, light weight, easy to use.
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TTL/I2C/SPI Expansion Kit
OP-SB85L
OP-SB85L is the interface expansion kit that has a port to measure TTL / CMOS signal level communications, and the one to measure the voltage of high-speed analog input. The port for TTL / CMOS supports the measurement of TTL / CMOS level communications that power supply system is from 1.8V to 5V. It is suitable for monitoring the communication between the LSI and the interface IC on the printed circuit board by directly probing into the lines. It supports the protocol of not only UART and HDLC but also I2C and SPI on monitoring and simulating.
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TTL/I2C/SPI* Expansion Kit
OP-SB5GL
OP-SB5GL is the interface expansion kit that has a port to measure RS-232C(V.24) and a port to measure the TTL / CMOS signal level communications. The port for TTL / CMOS supports the measurement of TTL / CMOS level communications that power supply system is from 1.8V to 5V. It is suitable for monitoring the communications between the LSI and the interface IC on the printed circuit board by directly probing into the lines. It supports the protocol of not only UART and HDLC but also I2C and SPI* on monitoring and simulating.
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Power Analyzers
Multi-functions : WATT, VA, Whr, Power factor, ACV, * Built-in data hold function.ACA, Hz. * RS-232 output interface.* True AC power ( Watt ) & apparent power ( VA ) * Exclusive custom exclusive design LSI circuit, provides highmeasurement. accuracy, reliability and durability.* True rms display for ACV, ACA. * Built-in over input indication.* Supper large LCD, easy to read-out, display the Watt, * Power supply by batteries.Power factor, Voltage & Current value at the same time. * Built-in low battery indicator .* Auto range. * Durable plastic housing case with handle.
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Probe Card
Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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Package Probe
Test Socket
Jigs for testing the electrical characteristics of devices in the final testing stage after LSI package assembly.To match the increasingly high functionality of LSIs for communications and networks, such as mobile phones and mobile devices, we provide two types of test sockets: The "J-Contacts" series suited for high-frequency, high-performance devices, and the "BeeContacts" series, spring probes with a unique structure that delivers excellent contact stability.
