Burn-In
The application of current, typically at high temperatures, over periods of time to detect infant mortality.
See Also: Burn-In Boards, High Power Burn-in, Burn-In Sockets, PCB Inspection
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Laser Diode Light Current Voltage (LIV) Test Instruments
The Yelo LIV test instrument allows LIV measurements to be taken from laser devices loaded into a Yelo module. This module can also be used with the Yelo Y1000L Low Power Burn-in system. The LIV test instrument has been designed for easy operation. Once powered on, and with laser supply enabled, the touch screen can be used to initiate, monitor and review measurements of laser devices.
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Horizontal Flammability Tester
UI-TX40
Horizontal Flammability Tester – Horizontal Flammability Chamber is used to test textile and material used in vehicles horizontal burning rate when exposure to a small flame. Horizontal Flammability Test Method includes ISO 3795, ASTM D5132, JIS D1201, SAE J369, FZ/T01028, GB/T8410, GB/T20953 and etc.
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Open Top BGA Sockets
Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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Production Wafer Level Burn-in
TV19 VersaTile™ probe cards are designed with Celadon’s patented ceramic technology for superior electrical performance, yet is highly modular due to it’s 28mm x 28mm chassis. Micro-adjustments can be made in seconds with an allen wrench and a microscope. Easily align VersaTile cards for different wafer layouts using a 4.5” compatible 1×3 , 200mm, or 300mm VersAdjust plate.
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Photonics Test Solutions
Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Glow Wire Tester
Shanghai Dean Electrical Co., Ltd
Glow wire tester would stipulate material (Ni80 / Cr20) and the shape of the heating wire (4 mm Φ nichrome wire) in large current heated to test temperature (550 ℃ ~ 960 ℃, after 1 mi to specified pressure (0.95 + / - 0.1 N) vertical burning hot try 30 s, inspect goods and bedding content whether light-off or the burning time to determine the fire risk of electrical and electronic equipment finished product;Determination of ignitability, ignitability temperature (GWIT), ignitability and ignitability index (GWFI) of solid insulation materials and other solid combustible materials is also applicable to the industries of insulation materials, engineering plastics or other solid combustible materials.
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DC Electronic Loads
An adjustable electronic load gives the test engineer the ability to qualify designs, check production batches or service and repair electrical products. Many applications demand an adjustable electronic load. These include the burn-in of new devices along with general power supply, battery, fuel cell and generator testing.Both static and fully dynamic DC loads are offered. With dynamic functionality 2 levels of load current can be set. The rise and fall time can then be adjusted together with the time period spent at each level. The load can also be made to follow complex waveforms by tracking an external arbitrary oscillator input.
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Flash Point
At which temperatures will your sample burn, ignite, or cause fire? How are your flammable liquids composed, and what are their properties? Volatility is directly related to a substance‘s flash point temperature (flammability). Anton Paar’s flash point testing equipment safely and easily determines the values you require for the processing, storage, transportation, and classification of dangerous liquids.
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IC Test Services
With knowledge gathered from decades of supporting Tier 1 and emerging industry leaders, Amkor understands test solutions must address advanced technology, quality, performance and cost of test. We offer full turnkey solutions including wafer processing, advanced bump, wafer probe, assembly, final test, system-level test, burn-in and end-of-line services.
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HMV Horizontal Flame Chamber - Motor Vehicles
Atlas Material Testing Solutions
Atlas’ HMV chamber determines the comparative burn rates and burn resistance of textiles, plastics and other automotive interior materials.
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TEST SOCKET
IC Package It is a device to install INTERFACE between TESTER and DEVICE during TEST to check electrical defects such as O / S (Open, Short) test, mounting test, BURN-IN TEST and RLC TEST, The device
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6 ½ Digits Dual-Display Digital Multimeters
SDM3065X
The SIGLENT SDM3065X-SC includes a multiplexer that provides multi-point measurement capabilities. The scanner features 12 multi-purpose + 4 current channels and supports the following measurement functions: DCV, ACV, DCI, ACI, 2WR, 4WR, CAP, FREQ, DIODE, CONT and TEMP ( RTD and Thermocouple ). It provides a convenient and versatile solution for test applications that require multiple measurement points or signals and is an ideal tool for R&D burn-in and production testing.
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Ultra High Speed Programmers
With superpro/7500 as the representative of the high-speed programmer, support chip comprehensive, burning faster, is adhering to the Superpro family's outstanding pedigree of the latest professional intelligent general programmer/burner/burner. Relying on Xeltek powerful device.
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Sensirion SHT31-DIS-B Humidity and Temperature Sensor Breakout Board
SEN-37002-F
Breakout board for the Sensirion SHT31-DIS-F with a built-in permeable membrane filter. This sensor is an extremely accurate digital (I2C interface) temperature and humidity sensing device, with +/-0.2C temperature and +/-2% humidity accuracy typical. These specs far exceed the accuracy of ICs that came before it, including the HTU2x and SHT1x series, and improves upon the success of the SHT2x that came before it. In addition, the SHT31-DIS-B has a wide input voltage range of 2.4V-5.5V and includes temperature isolation and airflow cutouts as recommended for the optimal operation. Finally, in the case of environmental changes that could cause light condensation, the SHT31-DIS-B has a built-in heater to burn off any condensate.
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Custom Fixtures
Joule mechanical design and manufacture capabilities allows us to create other custom projects to meet your test needs. Joule can design burn-in racks, jigs and stand-alone test station.
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Test House Services
Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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Car Accessories Material Burning Tester
ZRS-4H
• Test Gas Source: Gas or Liquefied Petroleum Gas (Suggestion: Use good quality gas if possible) • Burner inner diameter: ￠9.5±0.5mm, about 100mm long with air adjusting hole • Height of flame: Can be adjusted from 20 mm to 100 mm according to the standard requirement • Applying time of flame: Burning time can be adjusted from 0 to 99 minutes 99 seconds • Test process: Automatic control • Inner volume: 0.05m³ • Material: Stainless steel or iron plate spray • Power: AC 220V; 50Hz/5A
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High Power Burn-In Test
Easily test the reliability of your high power laser devices with the Y2000H burn-in and life-test system. It will quickly identify defective laser devices so you can prevent them reaching your customers. Y2000H's full automation and expandable capacity helps you work through your tests more productively. And its user-friendly software makes testing your devices easier than ever.
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Head Mounted Temperature Transmitters
Datexel manufactures a large range of head mounted temperature transmitters. Field proven and high accuracy are the ingredients in the Datexel range of head mount temperature transmitters. Low cost, fully isolated, PC programmable, direct or inverse output, up scale or down scale burn out are just some of the features available on the Datexel range of head mounted temperature transmitters.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Visual Fault Locator
HW-205
Shanghai Fibretool Technology Co.,Ltd.
The HW-205 is specially designed for field personnel who need an efficient and economical tool for fiber tracing, fiber routing and continuity checking in an optical network during and after installation.- 2.5mm universal connector- Operates either in CW or Pulsed- Constant output power- Long battery life (up to 60 hours)- Laser case ground design prevents ESD damage- Portable and rugged, easy to use- Burning testing to ensure the reliability.- Optional 1.25mm connector adapter
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Burn-In Test Fixtures
Burn-in generally involves the extended operation of a product in a temperature-controlled environment. With possible humidity and supply voltage margining - the burn-in process can then be extended to include power stress (levels and on/off cycles) tests, high humidity environmental simulation as well as the classic "four corner test" of high voltage + high temperature, high voltage + low temperature, low voltage + high temperature and low voltage + low temperature.
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100Hz/120Hz/1kHz Handheld LCR Meter
U1731C
Now you can measure at frequencies as high as 100 kHz, a capability that is typically found only in benchtop meters. With the auto identification, Ai which conveniently displays component type and detailed component analysis such as Z, ESR, DCR, you can get measurements done faster. Better yet, the battery lasts up to 16 hours, ideal for testing on the go. With the U1730 Series, you can perform quick, basic LCR measurements at your convenience, without burning a hole in your pocket.
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Cloud And Networking
From laser chips (EMLs, DMLs, and VCSELs) and pluggable coherent transceivers to pump lasers and TrueFlex® colorless/directionless/contentionless ROADMs, Lumentum’s comprehensive, vertically integrated portfolio lowers costs and speeds time-to-market. We optimize our components for best-in-class performance, creating flexible and scalable platforms that address ever-changing market conditions and product migrations. To ensure field reliability, Lumentum uses only the best materials and processes including stringent, proprietary burn-in processes during laser manufacturing.
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Thermal Protective Performance Tester (TPP)
Sataton Instruments Technology CO., Ltd
Thermal protective performance tester (TPP) is to determine the heat transmission of protective clothing or textiles exposed to flame and radiant heat resources. The tester which can provide thermal protection index (TPI) calculated by software is the recommended tool for evaluation the potential of second degree burn of the materials to block convective and radiant heat penetration. Analysis software can display real-time temperature curve and automatically detect heat time curve to show Stoll curve for rating the thermal protective performance of tested textiles.
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Radiant-Heat Protective Performance Tester (RPP)
Sataton Instruments Technology CO., Ltd
Radiant-heat protective performance tester which is normally called as RPP tester is to determine the radiant-heat protective performance of single or multi-layer textiles or other materials intended for heat protective clothes or assembly against radiant heat. The tester is a limited suitable tool for evaluating the potential of textiles for second degree skin burns.
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Vertical Flammability Chamber
TESTEX Testing Equipment Systems Ltd.
Vertical Flammability Chamber for measuring the vertical flame spread of children’s sleepwear, fabrics (fabric burn test), other textile materials or resilient filling materials used in upholstered furniture. Vertical Flammability Chamber complies with ASTM D6413, CALIF TB117, 16CFR Parts1615/1616, etc. Please contact us for more information about flammability test method.
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Horizontal Flammability Tester
TF311
TESTEX Testing Equipment Systems Ltd.
Horizontal Flammability Tester, to determine the comparative burn rates and burn resistance of textiles, particularly those for automotive interior use. Horizontal flammability tester is safe and easy to operate, Comprises draft free stainless steel cabinet with observation window, sample holder and door mounted burner.
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Diode Scanner
SC924
Frothingham Electronics Corporation
The SC924 is an electromechanical device for testing diodes loaded on burn-in boards.A set of Kelvin contacts is indexed from diode to diode. The contacts move over a range of 24 inches in the X direction and the table holding the boards moves over a range of 9 inches. This allows scanning of multiple burn-in boards or boards with multiple rows of diodes.
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Analyze RTL
ASICs and FPGA routinely have millions of gates with memories, transceivers, third party IP and processor cores. Problems can be time consuming and complex to debug in the lab and through simulations. Designers need verification tools that can identify problems quickly to reduce their verification and debug time before simulation, before synthesis, and definitely before burning chips in the lab.
