Test Programming
Consulting companies that provide/develop complete testing solutions or specific software capabilities or tools, and even end-product operation and maintenance training. Using a combination of original and generic capabilities, they save time, resources, and costs of the production company. (teradyne.com)
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Test Programming LabVIEW
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With LabVIEW, National Instruments provides an industry standard for developing a test environment.Our employees have many years of experience in many areas of this development environment.
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Product
Test Programming
TestAssistant II
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From a front-end graphical user interface to a back-end relational database, TestAssistant II organizes and maintains everything necessary for testing. Tester interfaces, wires, connectors, adapter cables, and other complex sub-assemblies are graphically represented.
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In-Circuit Test Programming Services
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Acculogic offers in-circuit / ATE test programming services for the most widely used Automated Test Equipment / platforms, in our state of the art test development laboratories. Staffed by a highly skilled team of engineers with an impressive track record in providing test solutions to customers in a variety of industries.
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Test Fixture Kits
Test Fixture
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Semiconductor Test Software
Test System
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
Data Logging and Analysis With Tecap
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Tecap provides such a tool for simple online overview. This tool is useful to analyse the stability of the developed test program. It is easily to recognize if the program shows the expected repetitive accuracy.
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Test Adapter
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Development of a 12-way test and programming adapter from Toptest for ?? The Dash ?? from Bragi, a wireless, intelligent earphone with communication and sensor technology. With the first version of the test adapter, only a purely sequential testing was possible due to the interdependencies of the tests. In version 3.0, the now autonomous tests were brought into a parallel TestStand sequence. In addition, individual sockets were prioritized in order to optimally use the hardware resources. This resulted in a time advantage of 80% compared to the initial situation.
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Product
Test Executive Software
TestBase
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TestBase is a test executive that supports the visual development, database storage and run-time execution of test program sets.
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Test Adapters / Aeroflex Test System
52xx / 5300
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We develop and manufacture test adapters for your existing interface including documentation and test program
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Product
JTAG Boundary-Scan Controller
NetUSB-1149.1/SE
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8-TAP USB 2.0 and LAN Based JTAG Controller. The NetUSB-1149.1/SE is an advanced 8-TAP USB 2.0 and LAN-based JTAG/boundary-scan controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
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Microelectronic Services
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Services for ASIC houses and Integrated Device Manufacturers are IC Wafer / Final Test, IC assembly, Test Program development, product engineering, Flash / EEPROM programming, characterisation / capability studies, yield enhancement, design verification and failure / yield analysis. Das Test Haus are specialists for wafer test, low power, mixed signal and eeprom test.
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Product
Aging and Life Test Rack
SY2036
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SY2036 Aging and life test rack is fully designed according to the IEC standard, and can also be designed based on the customer request. SY2036 can test LED, CFL, HID Indoor lamp and Outdoor lamp. Input Power supply: AC220V, 50/60HZ, 12KVA Min (110V is option) • Built-in transformer: 0-250V 5KVA and 0-300V 5KVA (Other power is option) • Maximum power for EUT: 5KVA and 12A (Other power is option) • EUT and Number: 112pcs B22, 112pcs E27. 36pcs T5/T8/T12 Tube. 32pcs LED panel (Other EUT can be designed according to customer request) • ON/OFF test: Can be set on the touch screen with program • Test number: 0~99999（Adjustable）
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Hydraulic Universal Testing Machines
HW Series
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Control Software is used to control the Universal testing machine. The Tester and the software are designed to accommodate a wide variety of testing needs. The software has a variety of pre-set programmed test cycles for compression, tensile and cyclical testing to meet a variety of testing standards.
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Product
6TL10 Table Top Test Base
H71001000
Test Platform
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
Pulse Adapter
CV30P650
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Frothingham Electronics Corporation
The CV30 P650 test station is currently the highest voltage pulser in a series of exponential pulse generators that can be connected to our FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of high power exponential pulses. The CV30 P650 pulse adapter can produce a maximum current of 100A at up to 600V using exponential pulses up the 10/1000 waveform. The pulser is rated at 30KW from 300V to 650V. Voltage compliance at 100A is 600V. The station can also include all of the usual FEC200 tests in the same test program.
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Testing & Programming Solution - Electronic Assemblies
BARCUDA VP230
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The BARCUDA VP230 is the right system if you are looking for a complete turnkey solution for flexible testing and programming of your electronic assemblies. The stand-alone unit uses the technologies of embedded JTAG solutions such as VarioTAP or ChipVORX. However, you can also expand these to meet the functional test requirements of your electronics production.
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Product
Software
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Our range of pcb test software covers your requirements in the entire production process: from preparation of CAD files to test program generation and quality assurance.
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Product
DiodeTester
FECPLS500
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Frothingham Electronics Corporation
The PLS500 automatic tester is designed primarily to do SURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses and THERMAL RESPONSE either in DVF (mV) or degrees per watt. All three test types may be performed in a single test program.
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Product
High Performance 50 MHz Dynamic Digital I/O PXI Subsystem
GX5960 Series
Digital I/O Module
The GX5960 digital subsystem represents the highest level of performance available for PXI-based digital instrumentation and features high performance pin electronics and a timing generator / sequencer in a compact, 6U PXI form factor. The GX5960 series consists of the GX5961 clock generator board with 16 driver / sensor channels and the GX5964 driver / sensor board which supports 32 bi-directional I/O channels. Up to 528 digital I/O channels can be supported by the GX5960 digital subsystem. Each digital channel features a wide drive / sense voltage range of -14 V to +26 V (maximum swing of 24 volts) which can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and a load value (with commutation voltage level) – offering the user complete flexibility when creating test programs and fixtures for multiple UUTs. In addition, each channel offers a parametric measurement unit (PMU) for DC measurements.
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Product
4-TAP PXI Express JTAG Controller
PXIe-1149.1/4E
Controller
The PXIe-1149.1/4E is a highperformance, multi-feature boundaryscan controller for multi-TAP and concurrent JTAG test and in-system programming. Featuring a high-speed PXI Express (PXIe) interface with four independent and configurable Test Access Ports (TAPs) along with direct serial programming capability, the PXIe- 1149.1/4E enables of boundary-scan integration with PXIe systems.
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Prodution Testers
Effitest E50
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Effitest e50 is a flexible and cost efficient solution with easy programming, debugging of test programs and life-cycle support.
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Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Automatic Test Software
EasyTest 2.0
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EasyTest © 2.0 is a set of common test automation software platform, with the definition of test engineering, test process editor, test program generation, test execution process, test data on a network share as one of the functions. Using EasyTest © 2.0 can easily set up a large network systems and ground test integrated test system, you can build standalone automatic test system, or automatic control equipment R & D engineers, and other data stored for use in research and development.
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Test Program Sets & Custom System Level Software
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WesTest Engineering Corporation
WesTest Engineering Corporation offers turnkey test solutions for the military and aerospace sectors. Our engineering capabilities present an unmatched ability to take customer test requirements and design, developand integrate Test Program Sets (TPS) with diagnostics to the component level. This is further supported by a full complement of documentation, from Test Requirements Documents, to TPS Flowcharts, to Test Reports.With 36 years’ experience and 1000+ TPSs in our history, the WesTest Engineering Staff remains as one of the top notch senior staff’s in the TPS sector today. Our leadership and program management have the historicalexperience to lead WesTest capability to meet the customer’s requirement.
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Certification Programs
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With the intention of creating confidence among customers and facilitating interoperability across multi-vendor networks, the UNH-IOL has partnered with several industry forums to create certification programs. Testing plays a large part in these certification programs, and the use of independent third-party test houses, like us, is key to their success. We do not certify devices, rather we supply unbiased information these certification programs need to accurately certify devices
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Rotary Table Test system
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The requirement was to develop a test system that can take very different test and programming times into account so that the hardware used can be used in the best possible way.
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Manufacturing Test Only System
MTO
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The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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Flying Probe Test Programming & Testing Services
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Zero Defects International LLC
ZDI utilizes a Seica flying probe tester in order to provide test program development and testing services to customers in Silicon Valley and throughout North America. This is a very cost-effective solution for printed circuit assembly manufacturers who do not have in-house equipment of their own but have customers who require test services.
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Product
Spectrum Analyzer Modular AFM AXIe
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The software and hardware complex "Modular Spectrum Analyzer AFM AXIe" for the analysis of RF signals with a frequency of up to 10 GHz is intended for use in automated testing programs, research in the frequency domain of periodic signals in the RF and microwave ranges, as well as for analyzing the parameters of signals with analog modulation (AM, World Cup, FM).
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Product
PCI Based JTAG Controller
PCI-1149.1/Turbo
Controller
The PCI-1149.1/Turbo is a powerful PCI-based JTAG/boundary-scan controller that is used for testing and in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
