Integrated Development Environment
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Product
Multi-Protocol Wireless Application Networking System with Open, Integrated, Secure & Scalable System for Data Aggregation & Viewing
Ion
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Jacobs’ vendor agnostic architecture was designed and implemented with the goal of an open Industrial Internet of Things (IoT) solution. ion© adapts and applies technology that enables our customers to gain efficiencies and savings, through connecting our client’s sites then collecting and displaying data in a unified interface. This provides custom insights to our clients, empowering them to ensure safety and respond quickly. The Jacobs ion© solution has been operationally deployed for over a decade and enables innovative approaches for data accuracy, data timeliness, and safety — greatly improving information flow and productivity.
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Product
Immunity Development System
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Used for EMI suppression in printed circuit boards during the development phase. The developer can use the E1 set to quickly identify the causes of burst and ESD interference. This allows the developer to design suitable measures to solve the causes of the interference. It can also be used to test the effectiveness of the measures taken.
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Product
Type 39 CompacFrame Development Platform, 6 And 8 Slot 3U OpenVPX Aligned To SOSA
39S0xBWX94Y3VCC0
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Elma’s SOSA aligned CompacFrame is the next generation portable test platform designed to accelerate development and test of plug-in cards (PICs) aligned to the Open Group® SOSA™ Technical Standard. Accommodates up to 8-slot OpenVPX backplane.
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Product
Leak & Seal Integrity Tester
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Saicheng Leak Tester is professionally designed for the leakage tests of packages, bottles & pouches for food, drugs, medical instruments, household chemical products, cars, electronic components, stationeries and other industrial products. The instrument also can be used to test seal performance of specimens after falling and compression tests.
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Product
Integrated Couplers/ Harmonic Mixers
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These waveguide bandwidth integrated coupler/mixers are designed to allow phase locking or signal monitoring of compact millimeter wave systems. RF inputs and outputs are on opposite sides of a thin wafer to obtain minimum insertion length. These devices use silicon Schottky barrier beam-lead diodes on a rugged stripline circuit. Nominal coupling value is 10 dB. For coupling values greater than 10 dB, non-directional coupler models are available (consult factory).
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Product
Development System
FE-SND2
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* Emulates Atmel AT89C51SND2 Microcontrollers * 62K Code Memory * Real-Time Emulation * Frequency up to fmax * ISP and X2 Mode Support * Windows Debugger For C, C++ and Assembler * USB or RS-232 Linked to PC * C Compiler and Assembler
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Product
Integrated NDT Inspection Device
FlawHunter
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The FlawHunter is an integrated NDT inspection device, equipped with an advanced, high-resolution Laser Shearography sensor with a vacuum (partial) excitation system. It is ergonomic & easy-to-use and is equipped with a workflow-oriented, GUI-display and left/right-hand button control. Regardless of the application, the FlawHunter provides reliable and resolute measurement results for in-field (service) NDT and quality control (post-production) operations.It can be used on any material & surface provided a stable vacuum can be generated within the vacuum seal (viewable inspection area).
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Product
Signal Integrity Evaluation up to 26.5 GHz
N5222BT
Network Analyzer
The N5222BT provides the N5222B 26.5 GHz PNA, application software including PLTS and enhanced TDR, and accessories for signal integrity evaluation of cables, backplanes and BGA packages.
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Product
Integrated Leeb Hardness Tester
TIME®510D
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Beijing TIME High Technology Ltd.
TIME®510D is an updated version of TIME5120 Leeb Hardness Tester, the cheapest and most popular leeb hardness tester manufacturer by TIME. It is portable and integrated with universal impact device D. Compared to TIME5120, the new product offers significant improvements in both outlook and performance.
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Product
Development System
FE-5131
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Emulates AT89C5131/AT89C5131A Derivatives with 6/12 Clocks/Cycle31K Code MemorySoftware TraceReal-Time EmulationFrequency up to 40MHzMS-Windows Debugger for C and AssemblerKeil Vision2 Debugger CompatiblePLCC, SOIC, QFP and 32-QFN Emulation HeadersSerially Linked to PC at 115Kbaud
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Product
New Design 3m Electric Integrating Sphere
IS-3.0MA
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It has all functions of IS-*MA Integrating Sphere with Holder Base.• Lisun engineers add the infrared anti-pinch device (the video please come to the “video” tab) and the cross laser positioning device in the integrating sphere.• Please refer to article The New Design 3m Electric Integrating Sphere for more information.
