Integrated Development Environment
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MTM Development Board Kit
REDUCE MTM WIRING COMPLEXITIES: The MTM Development Board Kit development and testing of embedded and high-level programs with comment MTM modules.
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Spectrophotometer & Integrating Sphere Test System
LPCE-1
This Test System is suitable for photometric and colorimetric measurement of luminaries such as Energy-saving lamps, Fluorescent lamps, HID lamps (high voltage sodium lamps and high voltage mercury lamps), CCFL and LED. The measured data meets the requirements of CIE and IES LM-79 for the measurement of photometry and colorimetry.
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Windows On Arm Development Kit
ROM-2860
ROM-2860 (Qualcomm QCS6490 OSM) built-in MS Windows 11 IoT Enterprise O.S. with the cable kit,power Adapter and audio board.
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Current Integrated Sources
CIS
The CIS current integrated source was designed to provide a stable alternating current source for the electricity meter test equipment, and in laboratories. The output current is isolated and independent from the mains voltage. Different CIS versions are available depending upon the values of output power and output current required.
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In-Circuit Tester Integration
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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Series Gated Integrators and Boxcar Averagers
SR200
Stanford Research Systems, Inc.
The SR200 Series Boxcar Averager System is a modular instrumentation platform designed to acquire and analyze fast analog signals. The system consists of a NIM compatible mainframe and modules which can be selected to tailor a system to individual requirements. The
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Temperature, Humidity And Others Relevant Environment Tester
King Design Industrial Co., Ltd.
Allows your product quality and reliability tests more realistic toward actual environment; simulate the actual environment in the temperature, humidity and vibration by separated of combined tests. The tester is equipped with control panel, Chinese-English display and micro-computer temperature control system; applicable to aerospace, military, vehicles, electronics and other high-tech products.
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Temperature Logger with Integral Stab Probe
TV-4076
Temperature recorder with integral stab probe LCD display of current readings 30,000 readings capacity High accuracy and reading resolution Fast data offload Splashproof case Low battery monitor and battery low indicator Programmable alarms Optional audible alarm box USB and serial download cables
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Microwave Wideband Synthesizer w/ Integrated VCO
ADF5356
The ADF5356 allows implementation of fractional-N or integer-N phase-locked loop (PLL) frequency synthesizers when used with an external loop filter and an external reference frequency. The wideband microwave VCO design permits frequency operation from 6.8 GHz to 13.6 GHz at one radio frequency (RF) output. A series of frequency dividers at another frequency output permits operation from 53.125 MHz to 6800 MHz. The ADF5356 has an integrated VCO with a fundamental output frequency ranging from 3400 MHz to 6800 MHz. In addition, the VCO frequency is connected to divide by 1, 2, 4, 8, 16, 32, or 64 circuits that allow the user to generate RF output frequencies as low as 53.125 MHz. For applications that require isolation, the RF output stage can be muted. The mute function is both pin- and software-controllable.
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High Precision Spectroradiometer Integrating Sphere System
LPCE-2(LMS-9000)
LPCE-2 is an Integrating Sphere Spectroradiometer LED Testing System for identifying the performance of single LEDs and LED lamps. LED’s quality should be tested by checking its photometric, colorimetric and electrical parameters. According to CIE127-1997, IES LM-79-08 and IES LM-80-08, it recommends to using an array spectroradiometer with integrating sphere to test SSL products. The LPCE-2 system is applied with a CCD Spectroradiometer (LMS-9000B or LMS-9000A) and worked with A molding integrating sphere with testing holder base function which will be more circle and the test results will be more accurate than the traditional integrating sphere.
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Silicon Nails Feature Development And Runtime, GTE 10.00p
K8228B
The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
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Integrated Assemblies
Teledyne RF & Microwave offers full first-level integration capabilities, providing not just performance components but also full subsystem solutions to help reduce program schedule and cost. Drawing on our expanding breadth of components, Teledyne delivers customer-specified subsystems of analog and mixed analog-digital design, including hybrid, MMIC, and mixed hybrid-MMIC configurations. Designed to meet military or space applications, some typical subsystems Teledyne delivers include I/Q demodulators, coupled detector assemblies, switched amplifier detector assemblies, and dual-band VCOs.
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Development Platforms and Accessories
Development chassis for VPX and SOSA aligned module payloads. The DK3 / DK6 for 3U and 6U VPX system design, support air and conduction cooled modules with quick conversion that tracks and streamlines your development cycle.
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Programmable Demultiplexers with Integrated CDR
Advanced Science and Novel Technology, Co., Inc.
Broadband digital deserializer 1-to-16.Low-power LVDS output data buffers with a proprietary architecture.Clock-divided-by-16 LVDS output buffer with 90-step phase selection.Single +3.3V power supply.Industrial temperature range.Low power consumption of 730mW at 17Gbps.Custom 100-pin CQFP package (13mm x 13mm).
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Integration Spheres
Offers a wide range of integration spheres (0.25m to 3 m diameter) and spectrometer options, application-specific modules as well.
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Test development service
Test development may be a complex task, because each emulated session must be unique and consistent. Unless the website consists of exclusively static pages, there is no testing tool that can fully automate the test design process. In many cases the implementation may require considerable research of the client-server communication scheme.
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VME & VPX Evaluation & Development
EZ Platforms
Kontron provides a solution for a quick entry into the evaluation and development of VME and VPX applications. EZ turnkey platforms are compact air-cooled rack systems with pre-integrated VME or VPX board along with the associated rear transition module (RTM) and pre-loaded software. Engineers with no prior VME or VPX expertise can start application development in seconds.
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Class 2 Integrating Sound Level Meter
HD2010UC.kit2
The HD2010UC.Kit2 is a Class 2 integrating portable sound level meter performing statistical analyses. The instrument has been designed combining price competitiveness and simplicity of use. Attention has been paid to the possibility of updating the instrument, and the HD2010UC can be integrated, at any time, with other options like “Advanced Data Logger” to extend its application scope.
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Environment Monitoring System
ENVIROMUX-MINI-LXO
The ENVIROMUX-MINI-LXO features 2 temperature/humidity ports, 5 digital inputs, and 1 output relay for control of external devices. Linux inside.
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Bluetooth Integrated Digital Multimeter Detector
Bluetooth with Memory Integrated Wireless Connectivity 4 in 1 Digital Multi Detector With Moisture Detector
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Class 1 Integrating Sound Level Meter and Analyzer
HD2010UC/A.Kit1
HD2010UC/A is a Class 1 integrating portable sound level meter performing either spectral or statistical analysis.
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Integrated Transformer Test Van
XD90
Hangzhou Xihu Electronic Institute
The XD90 integrated modular power system testing vehicle provides an integrated yet flexible solution of preforming a wide selection of normal and specialty tests on power equipment. Designed with the effectiveness and efficiency of power testing in mind, this platform achieves the goal of “integration of functions” instead of just a “combination of instruments”. Not only it provides an abundant means of power testing, but with optimized device placement, operational convenience, and safety factor.
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Boundary Scan / JTAG Test Development System
onTAP Development
The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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ETX Development Baseboard
ETB9F000
The ETB9F000 has four PCI slots and three ISA bus expansions as well as CompactFlash™ Type II socket. Most I/O functions have been integrated into this baseboard.
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PacStar Integrated Solutions
Curtiss-Wright Defense Solutions
PacStar Integrated Solutions are turnkey tactical and expeditionary, based on the PacStar 400-Series, combined with IQ-Core Software, and a vast array of partner technologies — pre-integrated and ready to meet mission requirements.
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Development System
FE-SND2
* Emulates Atmel AT89C51SND2 Microcontrollers * 62K Code Memory * Real-Time Emulation * Frequency up to fmax * ISP and X2 Mode Support * Windows Debugger For C, C++ and Assembler * USB or RS-232 Linked to PC * C Compiler and Assembler
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Development System
PCIe490
The PCIe490 Expansion Chassis enables users to scale application workstations with up to eight additional PCIe boards per chassis and up to 63 total slots with chassis daisy chaining. It was designed to accommodate the Abaco Systems PC820 and PC821 with Xilinx Ultrascale technology and multiple FMC+ interfaces.
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Run-time production test environment
XJRunner
XJRunner is the specialised run-time environment for executing pre-compiled XJDeveloper projects. With a range of special features it is particularly aimed at board manufacturers and in-field support.
