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Backplane Test
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Backplane Test System
402HV
Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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PCIe 6.0 Protocol Test Backplane
P5563B
The Keysight P5563B PCIe 6.0 Protocol Test Backplane provides a convenient means for testing PCIe 6.0 add-in cards with a self-contained portable and powered passive backplane. The P5563B provides power required for all combination of exerciser and analyzer with device under test.
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Backplane Test System
402LV
Very High Pin Count Level IV Backplane Test System. To ensure that Testronics maintains its leadership position as the premier supplier of backplane testers, we will be introducing our solution to testing high pin count / very large backplanes, the Model 402.
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PCI Express 3.0 Test Platform with SMBus Support
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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PCI Express, PCI, Multi-Interface Test Backplanes
Amfeltec PCI Express, PCI, Multi-Interface Test Backplanes
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16 Slot VME64x 19" Rackmount Development Platform
12V16OPX98Y5VPE0
Elma's Type 12V System Platform family of enclosures for VITA architectures (VME, VME64X, VPX and VXS) provides a rugged, versatile platform. This configuration is based on a 16-slot VME64X backplane. Assembled and tested.
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PCI Express 4.0 Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Multi-Interface Test Backplane
SKU-047-01
The Multi-Interface Test Backplane was designed to support hardware and software designers who need to be able to plug in boards with different interfaces (into the host computer).
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Backplane & Cable Test
Backplane and cable test systems from Terotest include LINX, a fixtureless test system. Each LINX test card plugs directly into the unit under test, which removes the necessity for long test cables and fixtures. This is called distributed testing and results in dramatically lowered costs. LINX is extremely easy to use, with a self-learn function or input from CAD.
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1 PICMG® CPU, 1 PCI-E® x16,1 PCI-X™, 2 PCI™ Slots Backplane
EBP-5E1
- Segment: 1- Slots:1 PICMG® CPU, 1 PCI-E® x16, 1 PCI-X™, 2 PCI™- Support ATX power supplies- Dimension: 153 mm x 330 mm
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3U Enclosure with 32-bit Backplane, CompactPCI Redundant Power Supply
cPCIS-1202
- Dual 3U CompactPCI® systems, each with five peripheral slots and one system slot- 1/1 250 W CompactPCI® Power supplies- Suitable for both rack-mount and desktop applications- Comprehensive EMC shielding- Optional rear I/O configuration (cPCI 50mm depth RTMs)
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2-Slot 64-Bit 6U CompactPCI Backplane
cBP-6402R
ADLINK offers a wide selection of standard backplanes from single up to 20 slots. Furthermore, a professional OEM team is capable of custom backplanes with a quick turnaround tailored to your specifications. We make designing, developing, prototyping, and maintaining your projects simple & efficient. For all your backplane needs, give us a call, we have a solution for you.
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1 PICMG® CPU, 1 PCI-E® x16, 3 PCI-E® x4, 7 PCI™ Slots Backplane
EBP-13E4
- Segment: 1- Slots:1 PICMG® CPU, 1 PCI-E® x16, 3 PCI-E® x4, 7 PCI™- Support ATX power supplies- Dimension: 330 mm x 318 mm
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1 PICMG® CPU, 1 PCI-E® x4 Slots Backplane
EBP-D3E1
- Segment: 1- Slots: 1 PICMG® CPU, 1 PCI-E® x4- Support ATX power supplies- Dimension: 331 mm x 39 mm
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5-Slot 32bit 6U CompactPCI H.110 Bus Backplanes
cBP-6105R
- PICMG:2.0 R3.0, 2.1 R2.0, 2.5 R1.0- Dimension (mm, WxH):120.9 x 262.05 (mm, WxH, vertical insertion view)- Segment:One- cPCI Bus:32-bit/33MHz- System Slot:Right-hand side (upper side for board's horizontal insertion)
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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1 PICMG® CPU, 1 PCI-E® x16, 4 PCI-E® x1, 4 PCI® Slots Backplane
EBP-10E5
- Segment: 1- Slots:1 PICMG® CPU, 1 PCI-E® x16, 4 PCI-E® x1, 4 PCI®- Support ATX power supplies- Dimension: 330 mm x 318 mm
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Passive Backplanes
A wide range of ADLINK backplanes are available for PICMG CPU cards. They are the most flexible and expansible solutions for industrial slot-hungry applications.
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5-Slot 64-Bit 6U CompactPCI H.110 Bus Backplane
cBP-6405R
- PICMG:2.0 R3.0, 2.1 R2.0, 2.5 R1.0- Dimension (mm, WxH):120.9 x 262.05 (mm, WxH, vertical insertion view)- Segment:One- cPCI Bus:Up to 64-bit/66MHz- System Slot:Right-hand side (upper side for board's horizontal insertion)
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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4U CompactPCI Hybrid PlusIO System with 5 CompactPCI and 4 CPCI-S.0 Peripheral Slots
cPCIS-P2630R
- 3U CompactPCI PlusIO backplane with five CompactPCI and four CPCI-S.0 peripheral slots and one system slot- Temperature, voltage, and fan monitoring LEDs- Supports rear I/O backplane with P2 connectors for CompactPCI 50mm depth RTMs- Hot-swappable cooling fans & filter- 400 W ATX Power supply
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8-Slot 32-bit 6U CompactPCI Backplane
cBP-6108F
- PICMG:2.0 R3.0, 2.1 R2.0, 2.5 R1.0, 2.9 R1.0Note- Dimension:202.5 x 262.05 (mm, WxH, vertical insertion view)- Segment:One- cPCI Bus:32-bit/33MHz- System Slot:Right-hand side; System Slot Rear I/O:P3, P4 and P5 rear I/O with AB-type shroud
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Prototyping & Test Consulting Services Solutions
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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1 PICMG® CPU, 1 PCI-E® x16 (with x8 Bandwidth), 3 PCI-E® x4 (with x4 Bandwidth), 8 PCI® Slots Backplane
WBP-13E4
- Slots: 1 PICMG® CPU, 1 PCI-E® x16(with x8 bandwidth), 3 PCI-E® x4(with x4 bandwidth), 8 PCI®- Support ATX power supplies- Dimension: 328mm x 312mm- For NuPRO-E72& NuPRO-E43 only- Segment: 1
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3U CompactPCI® Subsystem with 8-slot Backplane and 1 + 1 CompactPCI® Redundant Power Modules
cPCIS-2632 Series
- 3U CompactPCI® backplane with seven peripheral slots and one system slot- Temperature, voltage, and fan monitoring LEDs- Supports current sharing on +5 V, +3.3 V, and +12 V- 1 + 1 hot swappable 250 W + 250 W CompactPCI® power supplies- PICMG® 2.11 47-pin power interface- Hot-swappable cooling fans & filter
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13-Slot 64-bit 6U Compact PCI Backplanes
cBP-6413DR
- 2 Systems- cPCI Bus: up to 64-bit/66MHz- System A: 1 system + 7 Peripherals- System B: 1 system + 4 Peripherals- 1 CMM slot
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.