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Data Test Sets
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Air Data Test Sets
For calibrating altimeters, airspeed indicators, rate-of-climbindicators and other avionic instruments.
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915MHz Data Link Test Set
Kratos Defense & Security Solutions, Inc.
The 915MHz Data Link Test Set (DTS) is a portable, industry leading test instrument used for verification of Data Link Subsystem Replacement (DLS-r), Army Ground Station Unit (GSU), and other 915MHz Gulf Range Drone Control Systems (GRDCS) communications equipment in compliance with the GRDCS Data Link Format Specification.
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Air Data Test Set
ADTS-2000
TestVonics ADTS-2000 Test Set is a portable, high precision, dual channel air data pitot static test system. This tester is designed to calibrate, test and troubleshoot air data instrumentation and aircraft pitot-static systems. The ADTS-2000 meets all requirements of the KTS-2000 , P/N: 18910920000, P/N: 18910920001, P/N: 18910920002, or having NSN: 4920-01-588-4428 and NSN: 4920-01-554-4549 . The test set has been designed with functional and reliability features highly suited to withstand the harsh environmental and demanding conditions of the flight line environment. The test set is designed for testing a wide range of commercial and military aircraft, both rotary and fixed wing. The ADTS-2000 accuracy complies with standards for RVSM and is designed to replace the TTU-205 test set.
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Air Data Controller-Monitor
ADTS-1555ER
The ADTS-1555ER is an extended range derivative of the ADTS-1555 Air Data Test Set. The test set can be used to precisely generate and measure Pitot and Static pressures. The ADTS can be used as a benchtop system or rackmounted for ATE. The ranges and accuracy specifications of the test set make it ideal to replace many legacy, aging, and/or unsupported air data test sets.
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Air Data Test Set System
B511
The BRAT Option B511 is an option to the BRAT Test System utilizing Commercial-Off-The-Shelf (COTS) equipment. The system is used to augment the existing BRAT capabilities to test rate of change of altitude or pressure.
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Air Data Controller-Monitor
ADTS-1575
The ADTS-1575 Air Data Test Set can be used to precisely generate and measure Pitot and Static pressures. The ADTS can be used as a benchtop system or rackmounted for ATE. The ranges and accuracy specifications of the test set make it ideal to replace many legacy, aging, and/or unsupported air data test sets.
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Air Data Test Calibrator
ADTS-1555
The ADTS-1555 is a high precision Air Data Test Set that can be used as to generate and measure Pitot and Static pressures. The ADTS-1555 can be used as a benchtop or installed into a standard 19-inch rackmount. The control and measurement ranges of the system make it ideal for testing commercial and military aircraft instrumentation.
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Flightline Air Data Test Set
ADTS-3150 Series
TestVonics ADTS-3150 Series is a portable, high precision, dual channel air data pitot static test system. This tester is designed to calibrate, test and troubleshoot air data instrumentation and aircraft pitot-static systems. The test set has been designed with functional and reliability features highly suited to withstand the harsh environmental and demanding conditions of the commercial flightline environment. The test set is designed for testing a wide range of commercial and some military aircraft. The ADTS-3150 accuracy complies with standards for RVSM.
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Air Data Calibration
Fluke calibration offers digital pressure monitors, air data calibrators and laboratory standards for air data pressure range calibrations. Each of these systems feature pressure ranges, measurement units and features specific to calibrate air data test sets and RVSM compliant air data instruments. Models include 2468 Ruska and ADCS-601 DHI primary level standards; 7750i Ruska air data controller/calibrator and RPM4-AD DHI reference pressure monitor.
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Air Data
Testing altitude and airspeed components in commercial and military air data applications are critical for the safety and performance of an aircraft. Mensor air data test set and indicators provide the high accuracy necessary for these applications. Air Data Test Sets control altitude /altitude rate and airspeed /airspeed rate, for testing altimeters and airspeed indicators or air data computers in a dynamic way that simulates actual flying conditions. Air data Indicators measure Altitude /Altitude Rate and Airspeed /Airspeed Rate for applications where conditions are externally controlled.
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Complete Air Data Solutions
TVCS--5500 Series
TestVonics offers complete Air Data Solutions for both commercial and military organizations. These packages include everything the end user needs to test, calibrate and re-certify a variety of air data equipment. Packages vary and may include the following:*High Precision Air Data Calibrator*Test Set Support Equipment (ie MCTS, PVT)*Vacuum and Pressure Sources*Universal Power Supply*Pitot & Static Hose and Test Cable Assemblies*Pre-Configured Rackmount Enclosures Available
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Universal Power Supply
TestVonics power supplies deliver clean, regulated AC power in a 3.5” high bench top or optional rackmount unit. The TVCS-PS-P1350 model has a fixed output of 115V 400Hz Single phase, ideal for testing the TTU-205 Test Sets. The TVCS-PS-1351 model has a variable output with selectable frequency (50/60/400 Hz) and voltage output for testing of a variety of test equipment including the TTU-205 and other air data test sets.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Prototyping & Test Consulting Services Solutions
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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PXIe SSD Storage Unit
DM-4M.2-3U
The Big River™ DM-4M.2-3U PXI Express storage unit provides up to 3.8TB* of M.2 SSD storage capacity. With a PCIe x8 Gen3 host interface, the DM-4M.2 delivers high-speed data rates for sequential writes of 3.25GB/s** and sequential reads of 3.41GB/s** to PXI Express based systems. The single slot design of the DM-4M.2 increases the availability of valuable chassis space, allows for maximum storage flexibility. The DM-4M.2 complies with PCIe Gen3 protocol standards. The product is commonly used in the industrial control, test and measurement fields. The DM-4M.2 operates under Windows, Linux, Unix, Solaris and VxWorks.
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Optimize Throughput And Cost For MmWave 5G Device Functional Test
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Communications Test System for Frontline Diagnostics
ATS3000P
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Lens Module Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Benchtop Automated Functional Test
midUTS
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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6TL60 Rotary Test Handler
H79006010
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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PXIe-8267, 4 TB, M.2, PXI Data Storage Module
785308-01
PXIe, 4 TB, M.2, PXI Data Storage Module - The PXIe-8267 PXI Express high-speed data storage module features large-capacity, high-throughput storage in a single PXI Express slot. With M.2 solid-state drives, the PXIe-8267 is ideal for stream-to-disk or stream-from-disk applications requiring sustained, reliable data throughput such as high-speed signal intelligence, RF record and playback, and multi-sensor data acquisitions systems.
