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PCB Test And Design-For-Test Services Group
ntellitech has a very experienced consulting and test development organization that is dedicated to provide our customers with high-quality design and test services. Choosing Intellitech Test Services can help you lower the risk of adopting a new Design-for-Test methodology or speed your product to market when you need to deploy a test solution quickly.
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Design for Test
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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Design for Test Service
Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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Communications Test System for Frontline Diagnostics
ATS3000P
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Custom Electronics Design
Partech Systems offers a contract design and development service, with specific expertise in design of electronic test products.
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Testing Multi-Radio Mobile Devices
IQxstream
With LitePoint's IQxstreamTM mobile test system you will have all the capability you need to fully test many 3G and even 4G cellular radios and standards. Moreover, the system is designed to reduce per-device test time and cost because of its unique parallelism architecture. A 100 MHz capture capability means that it can test adjacent channel leakage ratios (ACLR) in one, five-channel capture.
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System Level Test and Burn-in Solutions
System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Digital Dailysate Meter
Digital Dialysate Meter™ D4 & D6
The DIGITAL DIALYSATE METER is specifically designed to test both acetate and bicarbonate dialysate quality. Measure Conductivity, pH and Temperature to ensure proper mixing during dialysate preparation and as a final check of dialysate quality before hemodialysis treatment. There are no strips or reagents that expire or subjective interpretation of results. Internal sensors require the user to place the sample in the instrument, preventing contamination of dialysate by the measurement device.
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Custom Testing
You create a custom test plan (a file that lists a series of tests to be run), to meet requirements specific to your environment and apply that test plan to any number of clusters. You specify the order in which tests run and the specific components to be tested. After you set up your custom test environment, you run the test procedure from SMIT and view test results in SMIT and in the Cluster Test Tool log file. For information about customized testing, see Setting up custom cluster testing.*Fixture Design*Fixture Fabrication*Custom Test Stands*Prototype Testing Services*Product Safety Testing Services
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Bleeder, Pressure Indicator - Brake, F/A-18 Hornet
F-18 Brake Bleeder. This unit is designed to test, monitor and bleed the brake systems of F/A-18 Hornet fighter aircraft.
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PXI Multiplexer, Very High Power DC, 4-Channel, 20A, 28V
40-664A-002
The multiplexer is suitable for switching heavy loads or for slave switching large external relays, contactors and solenoids. In particular these relay modules are designed for automotive test applications requiring the switching of DC voltage at high current.
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PCI-6284 , 32 AI (18-Bit, 625 kS/s), 48 DIO PCI Multifunction I/O Device
779110-01
32 AI (18-Bit, 625 kS/s), 48 DIO PCI Multifunction I/O Device - The PCI‑6284 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Shielding Solutions
Antenna Test Chambers are especially designed for testing RF devices and antennas from frequency ranges of 700 MHz to 6000 MHz. These Antenna Test Chambers provide a shielding of more than 90 dB as well as lowest residual passive intermodulation.
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Laser Diode Testing
The low power series of burn-in and life test systems are designed to test the reliability of low power laser diodes up to 1 Amp in current. The modular design means they can test up to 2,048 lasers, however due to the flexibility of the system, it can be adapted to suit both low volume R&D environments and high volume production environments.
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Defect Isolation
*Traverse through the physical design to trace nets and vias down to the defect location*Utilizes industry standard LEF/DEF design files, scan-based test information, tester fail logs and diagnostic reports to determine and isolate the physical defect location*Enables the user to leverage their diagnostic experience to determine the root cause of the defect*Interactive layout viewer displays scan chains, mapped mismatches of scan cells, layers, nets and subnets with search capabilities(component, net, cell)*Physical XY coordinates are always displayed for components and nets to guide the user through the design to quickly identify suspect sites for FA using techniques like Emission, OBIRCH, LIVA, TIVA, or FIB
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Socket Phone
Design for phone device test and system verify.Phone device: CPU,flash,baseband,LPDDR,power IC.etcPitch range from 0.30 to 1.27mmKey material: PEI,Peek,Torlon,PPS.etcContact with top pogo pin
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50Hz-100kHz LCR Meter
Chroma 11022/11025
Chroma Systems Solutions, Inc.
The Chroma 11022 and 11025 LCR Meters are passive component testers that can give you the most cost effective alternative equivalent to the high priced meters. They are designed for the demanding applications in production test, incoming inspection, component design and evaluation. Programmable test signal level settings are from10mV to 1V in a step of 10mV, and the VM/IM signal level monitor functions allow you to evaluate your devices at the level you specify. Ten test frequencies of 50Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz, and 100kHz, can be used to evaluate passive components and transformers/ LF coils.
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PCI High Density Resistor Card 6-Channel, 24-Bit, 0 To 16M Ohm
50-295A-121-6/24
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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High Voltage Oil Test Set
Supreme Instrument Laboratories
Supreme High voltage Oil Testing Apparatus is designed for testing of dielectric strength of transformer Oil or any other insulating liquids. It constitutes a complete equipment and apart of an A.C. supply of 230 / 240 Volts, no other supplementary facilities are required for its operation.
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Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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Programmable DC Electronic Load - (Economical)
63200E Series
The 63200E series are high power DC loads that include a choice of three operating voltages, 150V, 600V and 1,200V, with power levels from 2kW to 24kW and up to 2,000A in a single unit. Power levels can increase up to 240kW when multiple units are paralleled.These high power loads are designed for testing a wide range of EV products including DC charging stations, car battery discharge, on board charger power components, and other power electronics components. With its high power capabilities, parallel control and dynamic synchronization functions make this load ideal for automotive batteries, fuel cells and more. The 63200E load's master/slave control application enables units with the samevoltage specification to be used in parallel and synchronized dynamically to meet the power testing requirements. In addition, a 255-set data storage function has been built-in for recall of the stored settings at any time. When used in automated testing, the save and recall functions can save a great deal of time.
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Pressure and Force Measurement Systems for R&D, Testing, and Quality Assurance
Tekscan is the leading manufacturer of tactile pressure sensors and measurement systems. Our pressure mapping systems are used by product designers and test engineers throughout the research, design, testing, and manufacturing cycle to verify and enhance product performance. The informative data allows companies to save money in design, design verification, reengineering, and machine set-up costs.
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Digital Battery Testers
Electronic devices designed to test the remaining capacity of a battery's overall charge.
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300 HP Complete Bench Hydraulic Test Center
HTC-300
The Hydraulic Test Center (HTC) is a versatile machine designed to test heavy-duty, off-highway hydraulic components. The 300 hp (224 kW) HTC Complete Bench is for the dealer that services components from a predominately medium size machine mix such as large construction equipment (loaders, dozers, excavators). The Complete Bench offers full functionality to test all types of pumps and motors including: transmissions, hydraulic motors, hydraulic cylinders, valve blocks, torque converters, open and closed loop pumps.
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Halo Automatic Testing System
Our revolutionary Halo system is an automatic metal detector testing device. It is designed to automatically test ferrous, non-ferrous and stainless steel samples on all Fortress metal detectors. Automatic testing saves time, money, labor, along with removing the risk of human error and work place injury at critical control points on a manufacturing line while complying with industry standards. The Halo system is ideal for applications where manual testing of a metal detector is made difficult due to access, position, access to the product flow, environmental conditions, etc.
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PXI Dual Programmable PSU, DC Input
41-740-001
This PXI dual programmable power supply module is designed specifically for test applications that demand precision output voltage/current and tightly coupled measurement capabilities. Its versatile design makes it ideal for a broad range of testing applications in markets as diverse as communications, aerospace, and automotive manufacturing.
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Automated Discrete Semiconductor Tester (ATE)
5300HX
The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
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Infrared LED Analyser
The IR LED Analyser has a unique fiber which has been specially selected and prepared and must be used in conjunction with the Feasa Optical Head that was specifically designed for Infrared LED Testing.
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Aerospace & Defense ATE Systems and Services
TE solution design, development, and integrationMeasurement / Test Process analysis and consultationEasy-to-use software interfaces for Engineers and UsersFactory automation for test processesAll major instrument brands available & supported
