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Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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HandyScope HS6-DIFF With SafeGround & SureConnect: 500 MS/s, 250MHz BW, 4 Channel (256MS/ch), USB Differential Digital Storage Oscilloscope, Spectrum Analyzer, Voltmeter, Transient Recorder
HS6-DIFF-500XMSG-W5
The only oscilloscope in the world that has:- SafeGround, differential input channels that can be switched to single ended.-SureConnect, auto-detects a true connection between the probe tip and the device under test.- CMI interface.- USB 3.0 interface, 5Gb/s data transfer- Lowest noise
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Optical signal transmission
Digital
The fibre optic cable are used to transmit digital signals from the device under test under EFT/burst interference.
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Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Artificial Power Supply Network
KH3762
Beijing KeHuan Century EMC Technology Co,.LTD
The artificial power supply network (also called the power supply impedance stabilization network) should be able to provide a stable impedance to the device under test in the radio frequency range, isolate the device under test from high-frequency interference on the power grid, and then couple the interference voltage to the receiver.
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Regenerative Power System, 950 V, 20 A, 10 kW, 200/208 VAC
RP7953A
The RP7953A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test. The regenerative capability enables the energy normally consumed to be returned to the grid cleanly, saving costs associated with energy consumption and cooling.
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Multi-Channel Attenuation Control Unit (4-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step
J7204B
The J7204B is a multi-channel (4-channels) attenuation solution for signal attenuation and conditioning of up to 4 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7204B reduces cost of ownership and provide the best measurement accuracy.
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RF Shielded Test Enclosure, Largest Rack Mountable Enclosure
JRE 1724
Originally designed for testing wide screen laptops, the rack-mountable JRE1724 is ideal for large wireless devices such as; Mesh Network AP's, Cellular/LTE/4G Base Stations, and other large RF devices. Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble free operation over its lifespan. Internal struts keep the lid open for easy internal access when connecting the device under test.
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NI-9224, ±10 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module
783862-01
±10 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9224 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9224 is simultaneous sampling with two options for filtering a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Regenerative Power System, 1500 V, ±60 A, 30 KW, 400/480 VAC
RP7984A
The RP7984A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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RSE Wireless EMC Spurious Emission
TS8996
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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1kV, 25 MHz High Voltage Differential Probe with Auto Zero Disconnect
HVD3102A
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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700 V, 25 MHz High-Voltage Differential Probe (÷10, ÷100)
AP031
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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PXI 18 Channel Data Comms MUX, 96-pin SCSI
40-735-902
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. The 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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ISI Channel Boards
M8049A
The M8049A ISI channel boards can be used to emulate channel loss in receiver test setups. The boards are used to emulate channel loss for data rates of 32 Gb/s and higher. A choice of 21 PC board traces with different lengths can be inserted into the signal path. The trace lengths range from 0.8 inch (20.3 mm) to 22.3 inch (566.4 mm). By cascading the traces within one board or with another board, a wide range of channels can be emulated with very fine resolution of insertion loss steps. With their small size the ISI channel boards can be located closely to the device under test.
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Modular Power
RFP AC Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Test Probe
Beijing KeHuan Century EMC Technology Co,.LTD
Is a physical device used to connect electronic test equipment to a device under test (DUT).
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PXI Dual 18 Channel MUX, 96-Pin SCSI Connector
40-735-912-S1
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. The 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Modular Power
RFP Controller
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Automated Optical Inspection (AOI)
Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew). It is commonly used in the manufacturing process because it is a non-contact test method.
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Matrix Modules for 34980A
The 34980A matrix modules are full cross-point matrices allowing you to connect any row to any column in the same instance. This is a convenient way to connect multiple test instrument points to multiple points on a device under test. All matrix modules also include a relay switch counter to help predict when relays need to be replaced.
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Performance Board
The role of the performance board is accurate transmission of tester signals all the way to the device leads. Custom performance boards from ADVANTEST deliver support for DUTs (devices under test), as they become faster and smaller, with greater pin counts, and increasingly take the form of SMDs. ADVANTEST performance boards also support a host of test requirements, such as analog test, high-speed performance, and high-density, for testing state-of-the-art ICs.
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HIGH FREQUENCY DC BIAS
6565 SERIES
The 6565 HF DC Bias Unit is intended to be used with a Wayne Kerr 6500 analyzer, either the 6500B Precision Impedance Analyzer or the 6500P HF LCR Meter. Its function is to provide a source of DC bias current through the Device Under Test (DUT) while the analyzer is making AC measurements. Each 6565 unit can provide up to 10 A of DC current, and up to six 6565 units can be connected in parallel to supply a maximum 60 A. A digital ammeter on the front panel allows the user to see the dc bias current value and an indicator LED shows when the bias current is enabled.
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Low Resistance Ohm Meter
6237 DLRO
Standard Electric Works Co., Ltd
The 6237 DLRO is a "full feature professional instrument". The RUGGED and "O-RING" SEALED Digital LowResistance Ohm and Contact Meter is specially designed to measure very low resistance accurately and give the result directly on the large and clear LCD. The 6237 DLRO makes measurements by passing a constant current through the device under test (generally a conductor, contact or low resistance) and measuring the voltage across it. The Low Resistance is then calculated by ohm's law. This superb instrument is powered by rechargeable battery. It is supplied complete with instruction manual. This ensure that every product is not just fully functional and calibrated after the assembly lines, but also within tight specifications tolerances before leaving the strict quality control of Standard Electric Works.
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Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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PXIe-4113, 2-Channel, 10 V, 6 A PXI Programmable Power Supply
782857-02
The PXIe‑4113 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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NI-9239 , ±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
780181-01
±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9239 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Designed for both speed and accuracy, the NI‑9239 is an effective general-purpose analog module because of its resolution, sample rate, and input range.
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Frequency Response Analyzer
A frequency response analyzer measures the gain and phase response characteristics with respect to frequency of the device or system under test, by applying a frequency swept sine wave to it and examining its response signal.Featured wide dynamic range realizes high precise measurement, and also ultra low frequency measurement.
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12-Ch 10A RCV Power Distribution Unit
AR438
AR438 module helps with interconnection, power supply and load switching, monophasic and triphasic, adding the current measurement capability up to 10A.Enable input helps for a safe relay disconnection. It is a quick electrical -hardware- disconnection of the relays and is designed to be an auxiliary safety element, so that loads cannot reach the device under test.
