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Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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Automated Test Interface
ATI-100
Matrix Test Equipment Incorporated
Now, with our ?New? Model ATI-100 you can turn your existing Matrix Signal Generator and Switchable Filter Bank into a full-blown DTS (Distortion Test System). Plug and play is the word, just plug in your Multiple Frequency Signal Generator, Switchable Filter Bank, Spectrum Analyzer, Oscilloscope, Power Meter, Frequency Counter, etc. to allow the following automatic testing with a single insertion of DUT (device under test
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AC Voltage Proving Units
HLV-2
Standard Electric Works Co., Ltd
The AC Voltage Detectors and AC Voltage Testers utilized to determine if the devices under test are functionally working. They are not a calibrator and cannot be utilized for calibration.
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PXI Battery Simulator Module
41-750-001
The 41-750 is a battery simulator module that can be used to simulate the power supplies of cellular phones and other portable battery devices. It features fully floating output terminals than can deliver voltages up to 6 Volts. The fast responding remote sense connections allow the module to regulate the supply voltage at the device under test.
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MEMS Device-Oriented Testers
Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.
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One Phase Electric Power/Energy Calibrator
MC133
The MC133 master unit model is a one phase electric power/energy calibrator. It can supply the device under test with single phase precise voltage and current with calibrated phase shift along with DC voltage and current capability. Output voltage can be set in five ranges up to 280V and output current in six ranges up to 30A. Simulated electric power can be set independently for each phase. Frequency can be set from 15Hz to 1 kHz with resolution 0.001Hz to 0.01Hz. The MC133 Calibrator is equipped with 5 1/2 digital DC meter with DC ranges 20mA or 10V for direct calibration of various types of power transducers and wattmeters.
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PXI Matrix Switch: 8x32, 1-Wire, 100Vrms/2A, Armature Relays
M9122A
The M9122A is an 8x32 full crosspoint switch matrix offering high-voltage switching in a high-density PXI module. This module allows for higher voltage switching of multiple channels in a single instance. Any row can be connected to any column, making it ideal for routing instrument signals to the device under test. This module is configured with a common ground. The durable armature switches are capable of switching up to 100Vrms, with up to 60W of power. The 8-wide bus can be used to route signals between your instruments and the device under test. Choose from the durable connector block or standard cable connections.
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RF Device Tester
RF ITS
Sterner's automated test management system, combined with integrated RF technology modules, provides full functionality, including: Apply power to the device under test (DUT). Read and write blocks of data to set up and validate product EEPROM using a hard-wired communications interface. Scan transmitting devices or traveller barcodes and write the information to the DUT (the "sign-up process"). Inject an RF signal of known frequency and power level to test receiver sensitivity.
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Qualification Tester
LQ402
Computer Gesteuerte Systeme GmbH
The qualification tester LQ402 is designed to support up to 6 DUTs (Device under Test), for which the loads are installed in separate load boxes. The system consists out of 2 cabinets. One is for the electronic components with the primary measurement devices and the other one holds the 6 load boxes.
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Acoustic Test Chambers
Small Device Test Chambers are used for >Basic sound level measurement of small products and equipment >Pre-compliance testing of small products and equipment >End of line manufacturing test on small products and equipment Small Device Test Chambers provide acoustic isolation from outside sounds and/or reduce the sounds from the device under test radiating into the host
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Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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Regenerative Power System, 20 V, ±400 A, 5 KW, 400/480 VAC
RP7941A
The Keysight RP7941A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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Regenerative Power System, 2000 V, ±30 A, 20 KW, 400/480 VAC
RP7973A
The RP7973A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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RFP DC Low Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Power/Voltage Rail Probe. 4 GHz Bandwidth, 1.2x Attenuation, +/-30V Offset, +/-800mV
RP4030
The Teledyne LeCroy RP4030 Power Rail Probe meets the specific requirements of those who need to acquire a low-voltage DC signal as part of a:-Comprehensive power integrity, digital power management IC (PMIC), voltage regulator module (VMR), point-of-load (POL) switching regulator, or low-dropout regulator testing- Complete embedded power management system that includes PMICs, VRMs, POLs, and LDOsThe RP4030 will faithfully acquire a low-impedance, low-voltage DC power/voltage rail signal without unduly loading the device under test (DUT), while providing high offset to allow DC power/voltage rail signal display on an oscilloscope with high gain.
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Three-Phase Electric Power/Energy Calibrator
MC133Ci
The MC133Ci model is a compact one-housing three phase electric power/energy calibrator. It can supply the device under test with one phase accurate AC voltage and current with calibrated phase shift or DC voltage and current. Output voltage can be set in five ranges up to 280V and output current in six ranges up to 30A.
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PXIe-4113, 2-Channel, 10 V, 6 A PXI Programmable Power Supply
782857-02
The PXIe‑4113 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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PXI Dual 18 Channel MUX, 96-Pin SCSI Connector
40-735-912-S1
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. The 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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Customized Test Fixtures
Test fixture is a device designed to mount a device under test (DUT), equipment under test (EUT) and unit under test (UUT) in place and allow it to be tested by being subjected to controlled electronic test signals and procedures.
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Test Port Adapter Set, 3.5 Mm To 3.5 Mm
85130D
The Keysight 85130D test port adapter protects the test set port from being directly connected to the device under test. These adapters have a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 3.5 mm to PSC-3.5 mm male adapter and a 3.5 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 28 dB or better.
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PXIe-4154, 2-Channel, 8 V, 3 A PXI Programmable Power Supply
781155-01
2-Channel, 8 V, ±3 A PXI Programmable Power Supply—The PXIe‑4154 is a specialized programmable power supply for battery simulation. It is designed to simulate a lithium‑ion battery cell’s transient speed, output resistance, and 2‑quadrant operation (source/sink). Critical to many RF and wireless applications, the simulator’s fast transient response time allows it to rapidly respond to changes in load current with minimal voltage dip, which makes the PXIe‑4154 ideal for powering devices under test (DUTs) such as RF power amplifiers, cellular handsets, and a variety of other mobile devices. To model the behavior of a battery more accurately, you can use the onboard programmable output resistance to simulate a battery’s internal resistance. For quiescent and standby current measurements, the PXIe‑4154 features integrated current measurement.
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Mobile Communications DC Sources (45 W, 100 W):
663xx Series
Use this family of specialized DC power sources to test your digital wireless appliances. All models offer DC sourcing, current sinking, fast transient response, GPIB, and measurement capabilities to help you with the unique challenges of simulating batteries and battery packs and measuring the current drawn by your device under test.
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Frequency Response Analyzer
A frequency response analyzer measures the gain and phase response characteristics with respect to frequency of the device or system under test, by applying a frequency swept sine wave to it and examining its response signal.Featured wide dynamic range realizes high precise measurement, and also ultra low frequency measurement.
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700 V, 25 MHz High-Voltage Differential Probe (÷10, ÷100)
AP031
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Test Connector Components
Any flat substrate, or bumped substrate, can be compressed against Z-Axis Elastomeric Connectors to make contact. The picture illustrates a Z-Thru Z-Alloy Connector Frame used to connect the DUT (Device Under Test) to a circuit board.
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BERT Measurement Solutions
Bit error rate testers (BERTs) are usually the initial step for communications testing. These instruments generate digital test patterns, typically pseudorandom binary sequences (PRBSs), that drive devices under test (DUTs). Following the transmission of the signal through the link, the receiver in the BERT captures the signal. This setup can be used for multiple testing purposes, such as to evaluate the performance of a transmitter, a receiver, or an optical link.
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Kelvin Test Contactor/Probe Head
Gemini
At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
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2-Module ICT System, I317x Series 6
E9902G
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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PXI 2 Pole 18 way Mux with 2 Pole 18 way sen
40-658-002
This PXI multiplexer combines a 2-pole 18-way power distribution MUX with a second lower power 2-pole 18-way MUX in one convenient single slot PXI module.The module is ideal for power distribution where power and sense signals are required to be connected to an array of devices under test. This multiplexer is also convenient for making 4 wire low resistance measurements by supplying the resistor under test with high current through the power MUX and sensing the voltage drop through the sense MUX.
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PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit
782435-01
PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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RF / MW switch
The RF / MW switch includes a variety of RF and microwave switch modules - RF multiplexers, which are available for use in the 34980A multifunction switch / measurement unit, providing broadband switching from DC to 20GHz . Use these modules to route test signals between your device under test and a signal source, oscilloscope, spectrum analyzer, or other instrument. The switch / attenuator driver module also controls the external switches and attenuators of the 34980A.
