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Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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TEM Lamella Preparation And Volume Imaging Under Cryogenic Conditions
ZEISS Correlative Cryo Workflow
ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
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Microscopy Software/Hardware
ZEISS Atlas 5
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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Trace VOC Analyzer
PTR-TOF 6000 X2
The new PTR-TOF 6000 X2 is our premium PTR-TOF trace VOC analyzer. We conceived a unique system comprising of a novel high-resolution TOF and IONICON’s PTR technology with the new “X2” features, for the ultimate PTR-TOFMS experience. X2 combines the latest generation of performance enhancing tools incl. the ION-BOOSTER funnel as well as the hexapole ION-GUIDE. The ion funnel focuses the ions into the hexapole ion guide which results in nearly lossless transmission of an extremely focused ion beam into the TOF mass spectrometer. This increases the sensitivity dramatically and also improves the instrument’s mass resolving power. Utmost resolution, sensitivity and lowest real-time detection limit are now available in a robust, transportable platform that is smaller and lighter than previous products.
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Ion Beam Deposition
Create ultra-precise, high-purity, thin film layer devices with maximum uniformity and repeatability with Ion Beam Deposition (IBD) Systems.
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Ion Sensor
984v2
The Meech Model 984v2 Ion Sensor is an easy-to-use device for checking the performance of both AC and DC powered static eliminator bars.
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Ion Blower Nozzles
VARIO discharge products consist of a separate AC power supply unit for connecting one or more Eltex discharging components. In SINGLE discharging, the voltage generation (power supply unit) is integrated in the bar.
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Beam Profiler
WinCamD series
CW & Pulsed laser profiling. Wavelength Range: 190 nm- 15 m*. Resolution: 5.0 m*. Smallest Beam: 42 m*.
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Beam Diagnostics
We offer camera-based devices with wavelength ranges from UV to IR. All are cameras are USB3.0, for the fastest data transfer rates.
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Ion & Electron Detection
Photonis is the global leader in the development and manufacturing of detectors and optical components to detect ions and electrons. These detectors and components have been designed for a wide range of scientific instruments used in space and research projects but also in cells and material analysis in lifescience or non destructive testing.
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Beam Load Cell
EST-70
Technopark Automation & Control
The EST-70 Shear Beam Load Cell is commonly used on platform, hopper weighing and pallet weighing applications. It is low cost and available in capacities from 500 kg to 2000 kg.
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Beam Bender
10726A
The Keysight 10726A bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This bare optic requires a user-supplied mount.
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Headlight Beam Testers
VLT offers a wide range of professional headlight beam testers. From simple manually operated models up to fullly automated robot type machines for use in integrated test lanes.
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Ion Chromatography
IC Software- MagIC Net
MagIC Net is the software to control your Metrohm ion chromatograph and any modules for liquid handling, sample preparation, and automation connected. Intuitive operation, comprehensive system monitoring, and straightforward data management make MagIC Net, what it is: the preferred software for state-of-the art ion chromatography.
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Broad-Beam Ion Milling
Materials Evaluation and Engineering
Ion beam milling is a unique method of sample preparation that complements and significantly extends the capabilities of the traditional microscopy and metallographic laboratories.
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Beam Profiling
The beam propagation factor M2 is a common single parameter that charac-terizes the whole beam as it propagates through space. According to ISO standard 11146, this parameter could be defined by several measurement techniques based on beam profiling along several points of the propagating beam. The standard defines several measurement techniques, all of which are based on beam profiling measurements using devices such as cam-eras, knife edge and slits. There are two main measurement requierments - 1) Measurements of focused beams. 2) Measurements of collimated beams. Our M2 devices are capable of measurements of both laser types and due to their modular design interchangeable heads can be mounted in same M2 gear.
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Laser Beam Positioning
Under the trade name of SpotOn we offer a wide variety of computerized position measurement systems.This is a family of cost-effective and versatile solutions to numerous industrial and laboratory applications.Among the measurement applications, are:Measure laser power and centration or displacementAlign beams and QC of optical systemsMeasure target rotation and displacementMonitor vibration, deflection and motion
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UV-NIR Beam Profiler
CinCam
CINOGY Technologies CinCam is optimized to provide excellent sensitivity from the UV to NIR spectral range involving CCD/CMOS/InGaAs technologies. Thanks to its high resolution and its small pixel size, the CinCam ensures the highest accuracy in laser beam analysis of cw and pulsed laser systems. The plug and play design facilitates easy and flexible adaption to standard optical components.
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Chloride Ion Test Kit for Abrasives
134A
Contamination can build up, particularly if the blast media is recycled several times. Using the Elcometer 134A Chloride Ion Test in the field will accurately identify contamination and prevent costly surface-related failures.
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Beam Profiler
BladeCam Series
0.65" Thin! Portable, Port-Powered, USB 2.0, Beam Profiling for Windows XP & Vista, Intel-Mac.
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Scanning Slit Beam Profilers
DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
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*High-Power Beam Profiling
Beam analysis of high-powered industrial lasers have always proved to be difficult because of the power levels (affecting the power densities) that these lasers operate at. Yet, the measurement of these lasers are critical for their success because of thermal effects which are more of a factor at these higher powers. These high-power performance measurement products have proven to be solutions for laser users who operate and maintain these high-powered lasers
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Ion Blower Guns
For manual cleaning tasks, we combine the advantages of Eltex nozzle technology with the variability of a hand-held air gun. Thus, a wide variety of shapes can be cleaned efficiently. For use in hazardous areas, we offer a special version of the ion blower guns.
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*Beam Profiling For 266nm To 3000µm
Unlike a power meter that measures average or instantaneous Watts or Joules of the overall laser beam, knowing how the power is distributed within the beam is equally as important. As an example, if you want to cut something the power should generally be focused in the center of the beam to concentrate the power density in a very small area but if you were trying to weld something with all the power in the center you would poke a hole in the weld; requiring the power to be equally distributed as in a top hat profile.
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Spectro UV-Vis Dual Beam
UVS-2700
Spectro UV-Vis Split Beam PC is a precise scanning Spectrophotometer with a new design of 8 microprocessor automatic 2 row cell holder that moves noiseless with a special membrane. This Split Beam Spectro has a dual detector and a very accurate system.
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Beam Directional Power Supply Mains
SiteX CP200D
Being just 20 mm longer than the CP160D, the CP200D represents the best compromise between high penetration (up to 42 mm for steel) and the capacity of the generator to fit with various NDT applications, such as inspections of more technical materials in the aeronautical or space industries. The CP200D is one of the most versatile generators on the market and thanks to its built-in multiple X-Ray output carrousel it will adapt to a very wide variety of NDT applications, without compromising in any manner its light weight (12 kg) and ease of use.
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Benchtop Ion Meters
Benchtop Ion Meters for Cl (chloride), F (fluoride), Na (sodium), Ca (calcium), Br, (bromide), NH4 (ammonium), NH3 (ammonia), Cn (cyanide), Ag (silver), K (potassium), S (sulphide), Pb (lead), I (iodide), Cu (copper), Cd (cadmium)
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Camera Based Beam Profiling
BeamGage
See your beam as never before with BeamGage®. The camera-based beam profiling system consists of a camera and analysis software. Often times, this system will need to be used with beam attenuation or beam sizing accessories, depending on your laser application. The advantage to camera-based beam profiling is the real-time viewing and measuring of a laser’s structure. BeamGage software includes an extensive set of ISO quantitative measurements, features a rich graphical interface, and features its patented UltraCal™ algorithm, providing the industry’s highest accuracy measurements.
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Ion Beam Milling Systems
When material specimen surfaces are prepared for SEM or incident light microscopy, the specimen usually undergoes multiple processes until the layer or surface to be analyzed is machined with precision. Leica Microsystems’ workflow solutions for solid state technology cover all steps required for demanding high-quality sample preparation.
