Filter Results By:
Products
Applications
Manufacturers
Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
-
product
Trace VOC Analyzer
PTR-TOF 6000 X2
The new PTR-TOF 6000 X2 is our premium PTR-TOF trace VOC analyzer. We conceived a unique system comprising of a novel high-resolution TOF and IONICON’s PTR technology with the new “X2” features, for the ultimate PTR-TOFMS experience. X2 combines the latest generation of performance enhancing tools incl. the ION-BOOSTER funnel as well as the hexapole ION-GUIDE. The ion funnel focuses the ions into the hexapole ion guide which results in nearly lossless transmission of an extremely focused ion beam into the TOF mass spectrometer. This increases the sensitivity dramatically and also improves the instrument’s mass resolving power. Utmost resolution, sensitivity and lowest real-time detection limit are now available in a robust, transportable platform that is smaller and lighter than previous products.
-
product
TEM Lamella Preparation And Volume Imaging Under Cryogenic Conditions
ZEISS Correlative Cryo Workflow
ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
-
product
Microscopy Software/Hardware
ZEISS Atlas 5
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
-
product
Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
-
product
Ion Beam Deposition
Create ultra-precise, high-purity, thin film layer devices with maximum uniformity and repeatability with Ion Beam Deposition (IBD) Systems.
-
product
Ion Beam Etch
Nexus IBE Series
Etch precise, complex features for high-yield production of discrete microelectronic devices and components with the NEXUS® Ion Beam Etch (IBE) Systems.
-
product
Ion Beam Sources
Veeco offers the most comprehensive array of ion beam sources for a broad range of applications, including the industry's only Linear gridded sources.
-
product
Ion Chromatography
IC Software- MagIC Net
MagIC Net is the software to control your Metrohm ion chromatograph and any modules for liquid handling, sample preparation, and automation connected. Intuitive operation, comprehensive system monitoring, and straightforward data management make MagIC Net, what it is: the preferred software for state-of-the art ion chromatography.
-
product
Ion Blower Nozzles
VARIO discharge products consist of a separate AC power supply unit for connecting one or more Eltex discharging components. In SINGLE discharging, the voltage generation (power supply unit) is integrated in the bar.
-
product
Ion Chromatography
Eco IC
Discover Eco IC, an ion chromatography system that focuses on the essentials while not compromising on quality, robustness, and reliability. Eco IC has been developed to enable more users to benefit from this technique. Whether you need to perform routine water analysis or you’re looking for an instrument for higher education, Eco IC comes with all the components you need. In addition, you can also save time and reduce work by getting an automated system.
-
product
Ion Chromatography
930 Compact IC Flex
The 930 Compact IC Flex is a versatile ion chromatograph developed with a focus on the requirements of routine users.
-
product
Ion Chromatography
940 Professional IC Vario
High-end ion chromatography system for research applications and method development
-
product
Ion Chromatography
Hyphenated Techniques
Extend the scope of ion chromatography by interfacing your Metrohm IC with various sampling system and detection techniques
-
product
Focus Risk View
Fasoo RiskView is a tool for security administrators that monitor activity related to unstructured data and user activities with confidential data. It gathers information from Fasoo Usage Tracer (the log analysis utility for Fasoo Enterprise DRM) and Fasoo eData Manager. It has APIs that can be configured to import log data from other security technology components, including firewalls, DLP, databases, and even physical security systems (e.g., entry/exit data from keycard or biometric systems) and employee attendance records. Fasoo RiskView includes a decision making framework that security administrators as well as business managers can use to review suspicious activities and after relevant investigations, in order to decide whether or not to take action to address these concerns with potential insider threats.
-
product
Ion Chromatography
Metrohm IC Driver 2.1 for Empower®
Software drivers for integrating Metrohm IC instruments in "Empower® 3" made by Waters. One license per computer authorizes the operation of IC systems under "Empower® 3".
-
product
Beam Profiler
WinCamD series
CW & Pulsed laser profiling. Wavelength Range: 190 nm- 15 m*. Resolution: 5.0 m*. Smallest Beam: 42 m*.
-
product
Expanded Beam Connectors
Amphenol Fiber Systems International
Expanded Beam uses a lens in front of the fiber to collimate the light coming out of the fiber. The lens expands the size of the beam from 9 um to 285 um for SM. Expanded Beam connectors have distinct advantages and disadvantages compared to Physical Contact connectors. Read our White Paper on Expanded Beam Connectors for more in-depth details.
-
product
Non-Contact Beam Profiler
BeamWatch
The patented BeamWatch non-contact profiling system accurately captures and analyzes industrial multi-kilowatt lasers wavelengths from 980nm - 1080nm by measuring Rayleigh Scattering. It features a complete passthrough beam measurement technique, no moving parts, and a lightweight compact design which makes it ideal for comprehensive analysis of industrial multi-kilowatt lasers
-
product
Beam Diagnostics Systems
Characterize the spatial intensity distribution and size of laser beams, and visualize beam shape, with speed and accuracy.
-
product
Ar Gas Cluster Ion Source
GCIS
The Kratos Ar Gas Cluster Ion Source (GCIS) is optimised for depth profiling organic materials in Arn+ cluster mode and inorganic materials in Ar+ monomer mode, dependent on the operating parameters defined by the user and the type of material to be profiled. In Arn+ ion cluster mode the ions can be accelerated up to a maximum of 20 keV. This enables the successful sputter depth profiling of the widest range of polymer materials to be undertaken. However, Arn+ cluster depth profiling has been shown to give very low sputter yields for inorganic materials. In order to retain the capability of generating depth profiles from this class of materials this ion source can also be operated in the more conventional Ar monomer (Ar+) mode.
-
product
IR Temperature Sensor with GigE (Manual Focus)
FLIR A35
The FLIR A35 is a thermal imaging temperature sensor for condition monitoring, process control/quality assurance, and fire prevention applications. The A35 integrates seamlessly into existing systems, offering comprehensive visual temperature monitoring. As part of the Ax5-Series, the A35 is among the only thermal imaging temperature sensors on the market to provide temperature linear output through GenICam™ compliant software.
-
product
Laser Beam Positioning
Under the trade name of SpotOn we offer a wide variety of computerized position measurement systems.This is a family of cost-effective and versatile solutions to numerous industrial and laboratory applications.Among the measurement applications, are:Measure laser power and centration or displacementAlign beams and QC of optical systemsMeasure target rotation and displacementMonitor vibration, deflection and motion
-
product
Benchtop pH/ORP/Ion Meter
LAQUA ION2000
Water quality analysis is repeatedly performed in laboratories on a daily basis. Our compact and powerful benchtop model was developed to provide simplicity with excellent on-site usability.
-
product
Technology that Focuses on Measurable Safety
Foretify™
A Measurable Scenario Description Language (M-SDL) used to describe both scenarios and coverage goals at a very high level (soon to be made open) to enable a ‘measurable safety’ ecosystem
-
product
Beam Position Detectors
We offer a wide range of laser beam position detectors for optical alignment including Quadrant Cell Photoreceivers, PSDs, and Thermopile Position Sensors. Please see our Beam Position Sensor Guide for more information.
-
product
Broad-Beam Ion Milling
Materials Evaluation and Engineering
Ion beam milling is a unique method of sample preparation that complements and significantly extends the capabilities of the traditional microscopy and metallographic laboratories.
-
product
Economical Bending Beam Load Cells
EBB SERIES
The EBB Series is a economical low capacity bending beam load cell suitable for use in a variety of industrial and OEM force measurement and weighing applications. It is made of an aluminum alloy and comes in 1, 2, 5 and 10 kilogram ranges.
-
product
Electron Beam Lithography System
Spot type Electron Beam Lithography System JBX-8100FS achieved high throughput, small footprint and electric power saving.
-
product
LED Collimated Beam Sensor
LA-300
Panasonic Industrial Devices Sales Company of America
LED Collimated Beam Type, which is as accurate as a Laser Sensor, but much safer.
-
product
Waterproof pH/ mV/ Ion/ Dissolved Oxygen handheld meter
CyberScan PD 650
Collecting multi-parameter data in the field is a breeze with Eutech’s CyberScan 650 multi-parameter series. The CyberScan PD650 delivers quick, lab-accurate measurements of pH and dissolved oxygen simultaneously. Auto-logging function records up to 500 data sets with date and time in GLP-compliant format.
