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Gigabit Ethernet Test
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Dual Channel Gigabit Ethernet Test & Simulation Instrument for PCI Express
PCIe-DCE
Avionics Interface Technologies
Dual channel, high precision Ethernet Test Instrument
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10 Gigabit Ethernet Test & Simulation Instrument for PXI Express
PXIe-10GE
Avionics Interface Technologies
Supports 10G and 1G Full Duplex Ethernet2 Network Interfaces (future expansion to 4 network interfaces)User controlled Ethernet frame transmissions with high precision timing and scheduling
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GAOTek Handheld Gigabit Ethernet Test Module
A0070008tek
GAOTek Handheld Gigabit Ethernet test module is a highly efficient test instrument which designed for Ethernet layout and integration tests which conforms to Ethernet test standards. This instrument is required for testing from physical layer to service layer of emerging (or next generation) networks. The Ethernet tester is the new Ethernet tester to qualify Ethernet service over LAN and RAN deployment. This is a highly efficient test instrument for service providers to ensure SLA KPIs with the subscribers.
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Dual Channel Gigabit Ethernet Test & Simulation Instrument for XMC
XMC-DCE
Avionics Interface Technologies
Dual channel, high precision Ethernet Test Instrument
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Dual Channel Gigabit Ethernet Test & Simulation Instrument for PXI Express
PXIe-DCE
Avionics Interface Technologies
Supports 10/100/1000 Mbit/s Full Duplex EthernetUtilizes SFPs to support both Copper and Optical interfacesUser controlled Ethernet frame transmissions with high precision timing and scheduling
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L2-7 10GbE Test Solutions
NGY 10GE SFP+ and 10G BASE-T Load Modules
Keysight Network Applications and Security
Ixia's 10 Gigabit Ethernet LSM10GXM test load modules delivers an industry-leading, high-density, affordable layer 2 through 7, 10 Gigabit Ethernet IP test solution. The NGY family supports both low port count layer 2/3 applications with limited project budgets and highest density test lab, QA, and system test applications. NGY is perfect for both converged data center infrastructure testing and 10GbE switch test beds. NGY load modules leverage Ixia's converged data center test applications to offer the high port scalability, virtual scalability, protocol coverage, with an affordable test solution for data communications testing.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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PXIe-8521, 4-Port, 100BASE-T1 PXI Automotive Ethernet Interface Module
786771-01
PXIe, 4-Port, 100BASE-T1 PXI Automotive Ethernet Interface Module - The PXIe-8521 is a 100BASE-T1 unshielded twisted pair (UTP) Automotive Ethernet interface for developing applications with the NI‑XNET driver. The PXIe-8521 is ideal for developing applications that require … Automotive Ethernet to test and validate automotive electronic control units (ECUs). The interface provides up to four independent endpoints or up to two network terminal access points (TAPs). It features onboard hardware timestamping and can act as up to four separate 802.1AS masters or slaves, which allows it to synchronize with an external network as well as the rest of a PXI system. The PXIe-8521 also provides LEDs on the front panel so that you can monitor the network link and activity.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Ethernet to CAN Bus Gateway
YAV90090
• High-performance Arm Cortex-M3 MCU with 512 Kbytes Flash, 120 MHz CPU, ART Accelerator, Ethernet P/N STM32F207IEH6• USB 2.0 connector for serial data transfer (reserved for factory use)• Connections for CAN, and power supply via 4-pole Weidmüller connector• Reboot and reset of the device to factory defaults with a reset button• Plastic casing for benchtop operation• LEDs for device status and power supply• Voltage supply from 8 to 30 V
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Prototyping & Test Consulting Services Solutions
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Optimize Throughput And Cost For MmWave 5G Device Functional Test
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Communications Test System for Frontline Diagnostics
ATS3000P
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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RJ45 (Ethernet 100 Base T) to 90 Series Interface (R)
J90RJ45R
RJ45 Ethernet connector for VPC Tripaddle 90 series RCV moduleUp to three connectors per moduleFor Cat 5 Fast Ethernet cable IEEE 802.3 standard100 Base-T
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PXIe-8280, 1-Port, 50 Gigabit, RDMA PXI Ethernet Interface Module
788261-01
The PXIe-8280 is a high-performance 50-Gigabit remote direct memory access (RDMA) interface for PXI Express. This module includes one 50-Gigabit Ethernet QSFP28 port in a single-slot PXI Express module and supports RDMA over Converged Ethernet (RoCE).
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Lens Module Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Benchtop Automated Functional Test
midUTS
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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6TL60 Rotary Test Handler
H79006010
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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4 or 8 Channels In-Line Real-Time ARINC-Ethernet Converter
NLINE-EA429
NLINE-EA429™ is an innovative product that provides “remoting” of ARINC operations on 10/100/1000 Ethernet IP/UDP local area networks (LAN). NLINE-EA429 is a small, low-power, rugged device that provides connectivity for 1-8 ARINC 429/575/573/717 Channels – Ideal for remoting ARINC connections for in-field applications or point-point lab usage.
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PXIe-8240, 40 Gigabit PXI Ethernet Interface Module
784977-01
40 Gigabit PXI Ethernet Interface Module—The PXIe-8240 is a high-performance 40-Gigabit Ethernet QSFP+ interface for PXI Express based on the Intel XL710 40Gb Ethernet controller. It includes two 40-Gigabit Ethernet QSFP+ ports in a single-slot PXI Express module and is compatible with both copper and fiber optic cabling.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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PXI Ethernet Interface Module
PXI Ethernet Interface Modules equip PXI systems with high-bandwidth Ethernet-based connectivity with up to 40 Gb/s data rates per port. Featuring compatibility with industry-standard network and automatic cable polarity detection, these modules are ideal for high-performance data transfer and vision applications on the PXI platform. These modules have independent bandwidth to support two GigE Vision cameras with Power over Ethernet (PoE).
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.