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Automated Wafer Handler up to 450mm
GPR-GB7S
The GB7S Robot System employs Genmark’s breakthrough and patented GPR™ Technology to achieve the highest level of performance currently available in an automated wafer handler which is capable of handling up to 450mm diameter wafers. The patented GPR technology enables the servo-controlled robot to interface compliantly and intelligently with misaligned cassettes, FOUPS and process modules, as well as provide software-controlled end-effector deflection compensation during transport of heavier payloads. The unique and patented YAW technology feature of the GPR-GB7S Robot System enables it to access in-line process modules, FOUPS and cassettes from a fixed centralized location, and eliminates the need for radial placement of process and other stations around the robot. The GB7 Robot System can have various arm configurations to accommodate a wide range of SMIF/cassettes front-end layouts.
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C Meter
DU-6210
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 10 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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LCRZ Tester
DU-6218
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 55 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Test Socket Lids
For handler setup or hand test, a manual lid is often required as part of the test hardware set. We have refined our standard offerings so that with each socket you can receive a lid designed specifically for your application from one of five standard lid form factors
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Die Test Handler
3112
Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
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Universal Off-Line Handler
OLS Series
Developed as an economical and versatile solution, it adapts to any offline test application - ICT (In Circuit Test), ISP (Flashing) or FCT (functional). The design of this solution allows the quick and ergonomic change of fixtures , with a change time of less than 3 minutes.
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100Hz-50kHz LCR Meter
Chroma 11021/11021-L
Chroma Systems Solutions, Inc.
The Chroma 11021/11021-L are the most cost-effective digital LCR Meters, providing 100Hz, 120Hz, 1kHz, and 10kHz test frequencies for the 11021 and 1kHz, 10kHz, 40kHz, 50kHz test frequencies for the 11021-L. Standard RS232 interface, optional GPIB & Handler interface, high speed and stable measurement capabilities enable the Chroma 11021/11021-L can be used for both component evaluation on the production line and fundamental impedance testing for bench-top applications.
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Inline Handler W/By-Pass Line Master Push Down
6TL33
A perfect basis for a heavy-duty, reliable, high precision, and automatic integrated Test system for medium to high demanding environments. Important technical and economic advantages due to their modular structure and expansion capability are evident. The production testing environment will be flexible and efficient, helping towards the always valued Return of Investment.
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Observational Systems: Data Handlers And Battery Packs
Data loggers allow users to connect a variety of sensors to a single controller that manages, stores, and sends the collected data as a single data stream.
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Inline Handler W/Bypass Line Master
6TL35
A perfect basis for a heavy-duty, reliable, high precision, and automatic integrated Test system for medium to high demanding environments. Important technical and economic advantages due to their modular structure and expansion capability are evident. The production testing environment will be flexible and efficient, helping towards the always valued Return of Investment.
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Tube-To-Tube Gravity Handler
Rasco SO1000
The SO1000 test handler’s mature design and high reliability it provides excellent cost of test. Highly flexible as a result of a broad range of device kits can be combined with various Sensor and MEMS applications.Featuring a fast plunger with up to four plunger heads for high speed and high throughput with index time down to 500 ms. Available in single, dual, and quad configurations.
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Digital Low Resistance Tester
TH2512
Shenzhen Chuangxin Instruments Co., Ltd.
The TH2512 series digital dc low resistance tester i s an intelligent, wide range, high-precision tester which suitable for transformer, inductor copper resistance, relay contact resistance, switches, connectors, wire resistance, contact resistance component solder contact resistance, PCB line, welding hole resistance and metal detection, etc. It’s applied to the production line and can use HANDLER interface and GPIB interface (option) output good/bad signal, in order to improve production line automation testing capability.
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100Hz-50kHz LCR Meter –
11021/11021-L
Chroma Systems Solutions, Inc.
The Chroma 11021/11021-L are the most cost-effective digital LCR Meters available, providing 100Hz, 120Hz, 1kHz, and 10kHz test frequencies for the 11021 and 1kHz, 10kHz, 40kHz, 50kHz test frequencies for the 11021-L. The standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities enable the Chroma 11021/11021-L for use in both component evaluation on the production line and fundamental impedance testing for bench-top applications.
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High Performance Chipscale Test Sockets
SC
Ardent Concepts Test Sockets for ATE test deploy patented SC Contact Sets. This technology is capable of over 2 Million mechanical insertions in production environments and uses easy to replace pins with no complicated assembly procedure. It is designed to be drop-in compatible with 1mm offset and straight through footprints to ease implementation, and RC SC’s simple and robust design is extremely cost effective when compared with existing “roll” type test contactors and sockets. Designed specifically for JEDEC QFN and MLF applications, SC High Performance Test Sockets are available for most handler set-ups and offer exceptional AC performance.
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Turret Contactors
Design available for all Turret handler models. Leaded and Leadless packages, device pitch down to 0.20mm for Kelvin and Non Kelvin testing on both thermal and ambient environment.
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2D Color Temperature Tester
LCC-900
Screens the pass/fail results or module type LED image information that is automatically reset via data transfer with handler unit. Data results are stored in server for unified management.
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Test House Services
Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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Wafer Level Test Handler
Kronos
Wafer level test handler for 6/9DOF sensors with real stimulus. Very high UPH capacity and the lowest cost of test (COT). KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.
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Fully Automated In-line Test System For LED Light Engines
We are pleased to announce that we have received an order for the supply of a fully automated in-line test system for testing LED light engines from ASD Lighting, based in Rotherham. The solution provided, consists of an in-line handler fitted with a vision system. The camera software is capable of learning the position of all LED’s on a new pcb, thereby reducing the time to introduce a new product. In addition to identifying the location of any missing or faulty LED’s the tester measures the colour temperature of every pcb. An image is taken of faulty units with the location of any missing LED’s identified
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Die Sorter Handler
4605-HTR
4605-HTR is a MAP Sorter which picks up devices from wafer ring and sorts to tape or bin according to the MAP file created by film frame test handler or prober. 4605-HTR is a high speed handling system, available for 12 inches wafer rings. When used in combination with 4170-IH, 4605-HTR much improves efficiency in testing process of leadless devices as a high speed sorting machine.
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Single Site Test Handler
3210
Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
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Cantilever Spring Pin ULTRA
CONTACT Series
ULTRA® CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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Automatic Docking Connectors
D25
iDock Series connectors are a Mass Interconnect for use with automatic machine handlers. The D25 is capable of mating a wide variety of I/O module configurations, and can engage up to 5,952 signal contacts. All iDock Series connectors are compatible with VPC's existing line of modules, contacts, and tools.
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Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
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Miniature IC Handler
3270
Chroma 3620 is an innovative system handler for high-volume multi-site IC testing, especially for CIS Testing, at the system level.
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Test Handler
M4872
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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6TL36 Plus In-line Test Handler w/Bypass
EA923
- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
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300KHz Precision LCR Meter
Model 4300R
Aplab Precision LCR Meter Model 4300R is a new generation of impedance test equipment with high accuracy, wide measurement range and six digits resolution. Being featured with test frequency up to 300kHz, test voltage of 5mV ~ 2V, built-in -5V ~ 5V DC bias and -10V~10V DC voltage source output, it can meet all requirements for measuring components and materials and provide guarantees for production line quality assurance, incoming inspection and laboratory precision measurements. The Handler, RS232C and GPIB interfaces as well as improved command system provided by the instrument make it easier to build the test system.
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Gravity Handler
State of the art model, which features a high throughput capability, eight sites, and high and low temperature measurements, and meets all high-frequence contact requirements. Complete measures to prevent jamming and lead deformation enable high availability. This model is highly regarded by top users around the world because of its high throughput and high reliability.
