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Real-time X-ray Inspection Systems
JewelBox Series
JewelBox x-ray inspection systems feature ultra-high resolution, powerful microfocus x-ray tubes, five-axis, and positioners. The JewelBox Series is divided into three broad categories: JewelBox 70-T, JewelBox 90-T and Ultra Compact each of which can be customized for specific applications.
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Complete Non-Contact Inspection System For OLED/TFT/LTPS
GX3/GX7
*Fastest*Workable to large panel as well as fine pattern of medium-small panel*Workable to large mother glass of every generation*Possible to dock width Repair Machine
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Printed Circuit Board Inspection System
NIDEC-READ offers an array of testing equipment used to conduct open/leak tests on motherboards, as well as many other printed circuit boards. They can be flexibly configured according to applications in terms of size, type, and the number of test pins required.
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Entry Level AOI
iSpector
The Mek iSpector series AOI machines are fully compatible with Mek’s Catch System for classification, repair and SPC, utilizing the same powerful 22X software that is used in the premier Mek PowerSpector series. There is no compromise on the wide range of inspection algorithms and component libraries.
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Vision System With LGA1151 Socket 7th/6th Gen Intel® Core™ I7/i5/i3 & Celeron®, Intel® Q170, 4 PoE, 4 USB 3.0, And Real-time Vision I/O
IPS962-512-PoE
The IPC962-512-PoE meets the increasing requirements for maximum quality and flexibility in modern production plants. It features flexible expansion capacity, camera communication interfaces, real-time vision-specific I/O with microsecond-scale and LED lighting control. This machine vision controller is powered by the LGA1151 socket 7th/6th generation Intel® Core™ (codename: Kaby Lake/Skylake) and Celeron® processors (up to 65W) with the Intel® Q170 chipset. The IPS962-512-PoE comes with a full range of isolated I/O interfaces and real-time controls essential to machine vision applications, including trigger input, LED lighting controller, camera trigger, as well as an encoder input for conveyor tracking. The real-time vision system PS962-512-PoE enables a fast and high accurate inspection to ensure that the desired quality is achieved with no manufacturing defects. It supports four IEEE802.3at PoE LAN ports and four USB 3.0 ports for connection with industrial cameras. Operating over a wide temperature range from -10°C to +55°C, the IPS962-512-PoE provides reliable and stable performance within severe environments. Its easy setup and compact design are ideal for space constrained environments. Moreover, one PCIe x16 and one PCIe x4 expansion slots allow quick installation of I/O cards and graphics cards. Two easy-swappable 2.5" HDDs are available for extensive storage needs.
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GeoSwath Module
The GeoSwath Plus Sonar Module contains a wide-swath bathymetric sonar suitable for a range of survey and inspection tasks. The GeoSwath Plus is a 500kHz interferometric sonar, or phase detecting bathymetric sonar (PDBS) from Kongsberg GeoAcoustics. Boat-mounted GeoSwath sonars are used worldwide for high accuracy surveys including port and harbour navigation and environmental mapping: the Gavia’s GeoSwath module makes this capability available in a commercial AUV. The GeoSwath Plus offers: wide swath coverage of up to 12 times the AUV altitude when near the seabed; integrated bathymetry with simultaneous true digital side scan; high depth resolution suitable for IHO survey standards; as well as the accuracy and repeatability of a boat-mount hydrographic survey system. Like most of the survey-grade sensors on the Gavia AUV, the GeoSwath data is time-synchronised with the AUV master clock using the vehicle PPS/ZDA system. Benefits of the GeoSwath AUV module include ease of deployment, ease of use, reducing survey time, and the ability to take a 500kHz high-resolution sonar down to targets in 1000m of water. The GeoSwath Plus post-processing software (provided as standard with the system) allows a user to inspect and process the data, create and inspect digital terrain models, and create basic sonar mosaics. Several other commercial post-processing software packages are also available, please ask for details. Note that for best results the GeoSwath Module should be deployed with a direct-reading sound velocity sensor (option) in the Control Module, and one of the high-accuracy INS/DVL Navigation Modules for motion sensing.
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Ultra High Performance 3D CT System
UltraTom
3D micro-tomography (CT Scan) and nano-tomography. Modular system with multiple imagers and x-ray generators. Experimentations possible in-situ. Large volume Inspection and manipulation volume.
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Universal Offline AXI Systems
AXI XT-6 Series
The XT-series provides the advanced inspection capability of Nordson TEST & INSPECTION's inline system in a smaller footprint manual load/island of automation system. The platforms are designed for flexibility and ease of use for a wide variety of products requiring 2D and 2.5D automated X-ray inspection. The XT-6/XT-6A platform is a highly flexible automated X-ray inspection system with minimum footprint and a parallel-kinematic Hexaglide manipulation unit for extreme-angle off-axis image acquisition with high resolution. It is suitable for high-quality X-ray analysis of electronic assemblies and material analysis of parts that require flexible part manipulation with multiple inspection angles. For batch modes and volume inspection the XT-6 can be equipped with a single-sided conveyor setup and magazine load/unload station (XT-6A).
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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High Precision Angular Positioning, Calibration and Geometry INspection
LabStandard AIR
Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.The LabStandardAIR has been designed as a “Contact Free” system and eliminates features, which may detract from achieving the optimum rotational performance. The rotating elements are supported on super high precision, air lubricated, hydrostaticbearings and are not subject to disturbances associated with gear drives.
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Dual Projection 3D In-Line Solder Inspection System
KY8030-2
The new KY8030-2 delivers 2x fasterinspection without compromising performanceand accuracy.Using patented dual projection, the systemeliminates the critical Shadow problem thatall 3D SPI systems can be vulnerable to.Easy UI and SPC Plus are included in the systempackage in order to help users achieve faster& easier printer process optimization
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Gear Metrology System
The Gear Metrology System is a non-contact gear inspection system that generates a 3D point cloud, providing manufacturers with real-time metrology and inspection data to optimize production processes, and improve ROI.
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Saluki S5700 Series Field Comm Analyzer (SA/CA/OPTICAL)
S5700 Series Field Comm Analyzer combines the highest performance operating specifications and multi-functional measurements such as cable and antenna system analysis, fiber inspection, spectrum analysis, cellular signal demodulation, interference analysis, signal coverage mapping and RF/optical power measurements in a single instrument.
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Modular Performance
MIZ-85iD
The MIZ-85iD leverages the architecture of our industry-leading MIZ-80iD eddy current instrument into a modular, instrument-only system. It’s a small, rugged and lightweight unit that can be utilized in a variety of inspection environments.
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2-port/4-port PCI Express GigE Frame Grabber Card
AX92320
The AX92320 supports PCI Express x4 lane, two or four independent Gigabit 802.3at (PoE, Power-over-Ethernet) compliant Ethernet ports and GigE Vision camera compliance. The PCI Express x4 frame grabber can provide up to 30 watts at 54 VDC power to port which allows power to be supplied to connected PoE-based devices, such as GigE Vision cameras in machine vision systems. The intelligent GigE Vision card also supports IEEE 1588 (precise time protocol), enabling synchronization with multi-camera acquisition. Combining IEEE 1588 and PoE function, the card utilizes a single Ethernet cable for power, data, and synchronization. Furthermore, it supports jumbo frames up to 9.5KB. The AX92320 is ideal for PoE applications such as automated optical inspection (AOI), factory automation, and PC-based surveillance systems.
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PV Module Inspection
INSPECTION SYSTEMS FOR PROCESS OPTIMIZATION AND QUALITY CONTROL IN THIN-FILM MODULE PRODUCTION
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3D Automated Optical Inspection System
EAGLE 3D 8800 SERIES
EAGELE 3D 8800 AOI applies 8-way projection for 3Dmeasurements to all models, minimizing shadow effectserrors and performing 100% 2D&3D examinations simultaneouslyin all FOV areas.
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Navigation Analyzers
Rohde & Schwarz provides class-leading signal level and modulation analyzers specifically designed for commissioning and servicing terrestrial air navigation systems. The devices are easy to operate and ensure full functionality even in harsh environments. Match your needs with the right device for ground inspection and flight inspection.
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Anritsu X-ray Inspection Systems
Choosing the best inspection system is critical to meeting the ever-stricter food quality standards of the world’s leading poultry and meat processors. That’s why Cantrell•Gainco is an authorized distributor for Anritsu X-ray detection equipment, a leading technological powerhouse in the industry.
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Optical Inspection System
OIS Products
A manual optical inspection system that is able to inspect the wire-bonded leadframe or substrate.
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Test Solutions for Networked Vehicle Components/Connected Cars
Infotainment & Telematics
Developing automatic test systems for the automotive industry is one of our core areas. This industry in particular is characterized by rapid technological progress and ever faster time-to-market requirements.In the vehicle, multimedia devices are used for pure entertainment, but also as vehicle information, which are intended to cover security and navigation services.Infotainment and telematics devices such as eCall modules, connected gateways, instrument clusters or the HMI (Human Machine Interface) are networked with each other and with the most important vehicle functions. All of this is made possible - in addition to GNSS (Global Navigation Satellite System) - by wireless and new communication standards such as A 2 B, BLE, C-V2X, Wi-Fi 6 and 5G.The complex networking is a very attractive factor for drivers and passengers, but this complex communication can become a major challenge for developers.High-speed interfaces and high-frequency modules used in combination must send and receive signals between the different devices absolutely error-free.With our individual and sensitive test and inspection systems, we also simulate vehicle components or emulate the vehicle environment and thus ensure the functionality of your devices. We take your pioneering developments to the next level.
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Software to Order
Our company develops turnkey technical vision systems, including writing software for specific tasks of the Customer, such as:- image capture- algorithms for localization and detection of objects- recognitionalgorithms - inspection algorithms, defect detection- logging and archiving- interface operator- programming FPGAs and controllersand much more
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Metal InspectionSystems
Metal surfaces must undergo a reliable inspection, because defects impair the functions of steel tubes or medical engineering products. Relying to the often appearing strong structures of such surfaces, special robust vision techniques are needed to make, for example, geometric measurements. Our systems are prepared to provide a fully automated, 100 % inspection rate in a rough industrial environment.
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Boat Mount with Pan & Tilt 2D Forward Looking Sonar
Deployed from a patrol boat, Teledyne BlueView's BV3100 is ideal for search and recovery operations, dive team situational awareness, and diver vectoring. It is also an effective means of harbor bottom inspection as well as diver and underwater IED detection.The BV3100 uses Teledyne BlueView's 2D forward looking sonar mounted to a digital pan and tilt system to deliver clear, streaming imagery during both confined and wide area searches. This real-time imagery is produced whether moving or stationary, even in zero visibility water conditions. The BV3100 can be used alone or as a complement to side scan sonar by allowing the user to reacquire and guide divers to targets found in side scan imagery.
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HD Inspection System
vCam-6
The vCam-6 HD inspection system from Vivax-Metrotech gives you the flexibility to cover a range of inspections including municipal collection systems, residential plumbing, indoor commercial lines, and lateral lines from three inches up to eight inches in diameter. Our camera systems use the latest technology packaged in a rugged, lightweight, compact profile made specifically for the harsh conditions related to sewer lateral inspections. All Vivax-Metrotech camera systems are backed up by a full one-year warranty, on-site training, and local support through our dealer network.
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Reticle Handling
A reticle/mask exchange and inspection system. Individual I/O stations allow transfer of the reticle/mask between all scanner/stepper and shipping boxes, such as Canon, Nikon, ASML, Toppan, Hoya, DMS box etc.).
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Relay Tester
Beijing GFUVE Electronics Co.,Ltd.
Assists in the inspection, installation, and repair of assigned electro-mechanical controls and equipment systems.
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EV &Recharging Testing
PONOVO has long-term follow-up technology in China and abroad. Based on its own mature intelligent power detection equipment, and according to its own advantages in the field of new energy, PONOVO could be able to provide users with professional new energy test system solutions. In the field of electric vehicle technology, the electric vehicle charging facility detection platform based on the Internet cloud platform was introduced. This platform is one of the few domestic testing platforms that can automatically test the charging piles for network inspection, project acceptance, and factory testing. The platform has the advantages of automatic testing, low usage threshold, and high integration. It is widely used in the detection of relevant charging facilities in more than 20 provinces and cities in China, effectively meets the inspection of electric vehicle charging stations, and provides powerful technical support for the site acceptance test of charging stations.
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Wafer Inspection Products
Sonix provides manual and automated wafer inspection and metrology systems for wafers ranging from 100mm to 300mm, with extensive analysis capabilities at both the wafer and device level. These industry-leading automated wafer inspection systems are used by the world’s top manufacturers to ensure quality from development through production.
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AOI Handlings System
The AOI handling system is a compact facility with various test units. Via an ionization cleaning station the ceramics are transferred to the contacting station. There, the resistance values of the substrates are tested with a rigid needle adapter. Afterward, the ceramics are further conveyed to the three (optionally four) AOI test stations (for automatic optical inspection) and are tested for cracks, unevenness, faulty imprints, contamination, etc. The poorly evaluated ceramics arrive at a review station where the operator can assess and evaluate the errors on the monitor. If the operator is uncertain about a fault, the ceramic in question can be positioned under the microscope position and inspected by eye. Poorly defined ceramics are marked accordingly with an ink pen.
