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C Meter
DU-6210
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 10 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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LCRZ Tester
DU-6218
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 55 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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ARINC818 Cards
> ARINC818 is a specification which has become an Industry standard for the transmission of uncompressed digital video. This commercial standard uses Fibre Channel as a point-to-point communication link for low latency with the ARINC818 defining the packetized protocol for transmission of the digital video information. It is highly flexible and can be used for a variety of onboard display systems in both commercial and military applications. AIM’s ARINC818 cards use our field proven Common Core hardware design giving the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with one dual core RISC processor per port, massive DDR3 memory and IRIG-B time encoder/decoder functions are standard. The ARINC818 modules are available in PCIe formats.The new ultra high performance intelligent 4-lane PCIe 2.0 interface modules offer 2 ports with full function test, simulation, monitoring and analyzer functions for ARINC818 interfaces. The dual core processor provides onboard processing and data transfer capabilities for the most demanding applications including ARINC818 support done on board level. Large and high data throughput DDR3 RAM is accessible for the onboard processor as is a high performance FPGA implementing the customized ARINC818 Interfaces enabling the board to analyze incoming data in real time. Each module provides 2 ARINC818 compliant ports. SFP cages make it suitable for different media types as optical or electrical network technologies. Each module is delivered with a Board Support Package (BSP) containing the onboard driver software, a full Application Programming Interface (API) and detailed getting started and programming guides. Powerful PBA.pro databus test and analysis software is optionally available for all our ARINC818 cards.
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Logic Analyzer Probes
FS2354 & FS2355
The FS2354 and FS2355 are logic analyzer probes used to test DDR3 SO-DIMM memory modules. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR3 SO-DIMM systems.
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Memory Test System
T5830/T5830ES
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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AFDX®/ARINC664P7 Modules
AIM’s AFDX®/ARINC664P7 test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with multiple processors for real time bus protocol and application support, massive memory and IRIG-B time code encoder/decoder functions are standard. Versions are available to support the Boeing specific ARINC664P7 extensions.
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3U PXI-E System Controller
PX32101
LinkedHope Intelligent Technologies Co.,Ltd.
PX32101 is a 3U PXI-E system controller based on the newest Intel® Haswell platform. It is designed to provide comprehensive and reliable system controller to support hybrid PXIe-based systems for multiple environments test and measurement applications.Hybrid PXIe-based systems are often required to complete independent diversified complex testing tasks on the PXI test platform. PX32101 provides rich interfaces: 4 USB2.0 / 3.0 for peripheral connectivities; UART for communication or control equipment; dual 1000Base-T Ethernet, one port for LAN connection and the other one for the control of the next generation of LXI instruments. PX32101 can support 4 x4 or two PCIe x8-link, and up to 16GB / s system bandwidth. The ExpressCard 34 expansion slots on the front panel allow users to expand the system modules flexibly. If you install a hybrid multi-slot backplane in the system, then various standard PXI-E and PXI / CPCI peripheral cards could be fitted. In a multitasking environment, PX32101 processor is able to complete multiple tasks independently. The CPU and memory chips soldered with PCB increase reliability performance in shock and vibration environments. Combined with a variety of instrument control interfaces and reliable mechanical & electronic design, PX32101 can meet your hybrid PXIe-based testing for system application requirements perfectly.
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Digital Test Hammers
James Instruments? digital test hammers are an advanced, completely automated system for estimating concrete compressive strength. Its calculation, memory and recording functions allow for quick, easy and accurate test results.
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Memory Test System
T5221
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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T3DSO4000L-HD Series Oscilloscopes
T3DSO4000L-HD Series
The Teledyne Test Tools T3DSO4000L-HD Oscilloscopes feature four and eight channel low profile models all with 12 bits of vertical resolution. With analog bandwidth options of 500 MHz, 1 GHz and 2 GHz. Each model offers a maximum sample rate of 10 GSa/s with ESR per channel, and a maximum memory depth of 500 Mpts in single channel mode. The T3DSO4000L-HD series is ideal for ATE systems as well as other automated applications.
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Circuit Breaker Analyzers & Timers
CAT Standard Series
Circuit breakers are being tested during manufacturing, commissioning or maintenance stages. The most basic test requires timing measurement using circuit breaker timer. Their primary role is timing and motion measurement of medium and high voltage circuit breakers. Devices from CAT Standard series have suitable application in:electric power generation,distribution system,part of the electric power transmission system,contractors testing,and industrial environments.CAT Standard series meets the requirements of an easy to use circuit breaker timer and analyzer with an attractive price. Furthermore, they are portable and lightweight (weighs only up to 7 kg). Finally, the plastic case is unbreakable and has IP67 protective rating when the lid is closed.CAT Standard series includes five models:Three circuit breaker timers – CAT03, CAT31, and CAT61Two circuit breaker analyzers – CAT34 and CAT64CAT03 is a basic model intended only for timing measurement of main contact operations on the circuit breaker with one break per phase. Unlike CAT03, CAT31 has the possibility of circuit breaker operation initiation, coil current measurement, and auxiliary contact timing measurement. CAT61 differs in comparison to CAT31 by its ability to measure up to two breaks per phase.CAT34 and CAT64 are more advanced compared to CAT31 and CAT61, respectively, since they have additional analog channels. Also, they have the possibility of a travel curve recording.A user can download the test results to a USB memory stick or save it to internal memory. The CAT Standard series internal memory can store up to 500 test results (numerical and graphical data). Optional thermal printer prints test results in tabular and graphical form on 80 mm (3.15 inch) paper rolls. CAT Standard series instruments are compatible with DV-Win software. It provides full control of all CAT functions from a PC, as well as acquisition and analysis of test results.
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Memory Test System
T5511
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Auto Wire Integrated Tester Series
LX-1024A+
Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface,．·Up to 1500Vdc/1000Vac Test Voltage ,．·1024 Max. Test Points ,(Max of all series)．·500 Max Files Memory,support USB or PC unlimited expansion,．·Using Embedded Linux operating system，．·Adopted high resolution colour 640*480 TFT LCD ,．·Large 320×240 LCD display ,．·Instant test time :0-60s , optional adjustment.．·Providing Single-End ,Multi-segment ,Standard ,and Spot test of wire.．·Auto Scan and Auto Pin Search ,．·The system provides advanced instant open-circuit, short-circuit, continuity test,．·Intermittent Conductance Test,．·Intermittent Open/Short Test ,
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Memory Test System
T5851/T5851ES
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope
780319-03
1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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Compute Express Link (CXL)
Compute Express Link (CXL) is a new high-speed CPU-to-Device and CPU-to-Memory interconnect designed to accelerate next-generation data center performance. CXL technology maintains memory coherency between the CPU memory space and memory on attached devices, which allows resource sharing for higher performance, reduced software stack complexity, and lower overall system cost. This permits users to simply focus on target workloads as opposed to the redundant memory management hardware in their accelerators. CXL is based on a PCI Express 5.0 Physical layer with speeds up to 32GT/s. Teledyne LeCroy provides protocol analysis test equipment to support development and debug of CXL based devices.
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JTAG Functional Test
JFT
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Data Acquisition Equipment
Get the data you want, where, how and when you want it. Fluke gives you a broad choice in data acquisition for process monitoring and laboratory test systems. You can choose a stationary or portable data logger. Transfer data to internal memory, to a removable memory card, or to your PC. Choose a standalone or distributed networked units. And you can expand your system from 20 to 1,000+ channels, depending on the series.
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Training Board
The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
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Fully Automatic Colorimeter
DRK103C
Shandong Drick Instruments Co., Ltd.
(1)5 inch TFT color LCD touch screen, the operation is more humanized, new users can be mastered in a short period of time using the method.(2)Simulation of D65 lighting lighting, using CIE1964 complementary color system and CIE1976 (L*a*b*) color space color difference formula.(3)The motherboard brand new design, using the latest technology, CPU uses 32 bits ARM processor,improve the processing speed, the calculated data is more accurate and rapid electromechanical integration design, abandon cumbersome testing process of the artificial hand wheel is rotated, the real implementation of the test program, a determination of the accurate and efficient.(4)Using d/o lighting and observation geometry, diffuse ball diameter 150mm, diameter of the testing hole is 25mm.(5) A light absorber, eliminate the effect of specular reflection.(6)Add printer and imported thermal printer, without the use of ink and color, no noise when working, fast printing speed.(7) Reference sample can be physical, but also for data,? Can store up to ten only memory reference information.(8) Has the memory function, even if the long-term shutdown loss of power, memory zeroing, calibration, standard sample and a reference sample values of the useful information is not lost.(9) Equipped with a standard RS232 interface, can communicate with computer software.
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Programmable Low-Ohm Meter
DU5210/5211
Delta United Instrument Co., Ltd.
20m ~ 2Mtest range, 0.1% accuracy Provided Level and Pulse measurement modes, can be lower temperature influence in Pulse Mode Provided HI/LOW limit and BIN Sorting comparator function, to meet your needed 100 sets of memory, can be saved test parameter and comparator setting, easy to use. Auto Calibration Program Function, to easier your calibration procedure. (Specificity calibrator needed) Cover up free, system firmware upgrade can be update via RS-232, easy to maintenance High speed FADC, max. test speed up to 80 meas./sec, faster your automation equipment 240*64 Graphic LCD display, can be read the reading clearly and easier. User friendly programmable interface, easy to use Provided RS-232C and Handler combinatorial interface option, to meet your needed
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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ARINC 429 Bus Interfaces
AIM’s > ARINC 429 test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with multiple processors for real time bus protocol and application support, massive memory and IRIG-B time code encoder/decoder functions are standard. The latest versions also support avionics discrete I/O.
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High-Speed Memory Test Solution
UltraFLEX-M
The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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Leeb Hardness Tester
THL500
It is the highest brightness display in China showing all functions and parameters, easy read Largest screen Oled screen and operate,also can save lots of energy .the largest screen of Leeb hardness tester in China. Two hardness scale dual-display in the screen. Measuring direction in 360 and add the auto measure direction to make test easy and precision. Add four new hardness scales, HRA, HB for D impact device of alloy tool steel; HV for cast aluminum alloy. Add New user material function, to meet the need of user can test the special material. Test at any angle, even upside down. Wide measuring range. It can measure the hardness of all metallic materials. Direct display of hardness scales HRB, HRC, HV, HB, HS, HL and three types of strength values immediately. Seven impact devices are available for special application. Automatically identify the type of impact devices. Large capacity memory could store 600 groups (Relative to average times321 ) information including single measured value, mean value, testing data, impact direction, impact times, material and hardness scale etc. Upper and lower limit can be preset. It will alarm automatically when the result value exceeding the limit. Battery information indicates the rest capacity of the battery and the charge status. User calibration function. USB port with the PC humanity multi-functions data proceeding software. Original imported high speed thermal printer support the immediate printing function. It can save data permanently. Li rechargeable battery as the power source. Charge circuit integrated inside the instrument. Continuous working period of no less than 200 hours (EL off and no printing). Auto power off to save energy. Excellent after-sale service system for high quality products---3 years guarantee and all life maintenance. Easy to buy and comfortable to use.
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Probes And Cables
The iProbe is an intelligent temperature sensor that can be calibrated independently of SBIR’s blackbody systems or 104i precision thermometers. These ultra-stable, highly responsive iProbes are used to provide long term accuracy and repeatability of under 0.010°C. Each iProbe incorporates onboard flash memory that allows all calibration constants and calibration date information to be stored independently of the blackbody or thermometer system. This allows iProbes to be exchanged for use on a blackbody or thermometer without any loss in stability or accuracy. To re-calibrate a system you need only exchange the current iProbe with a recently calibrated one. No special equipment is required and there is no down time in the test area.
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Fibre Channel Modules
AIM’s Fibre Channel test, simulation and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with one dual core RISC processor per port, massive and scalable DDR3 memory and IRIG-B time encoder/decoder functions are standard. The new ultra high performance intelligent 4-lane PCIe 2.0 interface modules offer 2 ports with full function test, simulation, monitoring and analyzer functions for Fibre Channel networks. The dual core processor provides onboard processing and data transfer capabilities for the most demanding Fibre Channel applications including upper layer protocol support done on board level. Large and high data throughput DDR3 RAM is accessible for the onboard processor as is a high performance FPGA implementing the customized Fibre Channel interfaces enabling the board to analyze incoming and modify outgoing data in real time. Each module provides 2 Fibre Channel compliant full duplex ports, implementing the full link level services. SFP cages make it suitable for different media types as optical or electrical network technologies. Ports operate either in Traffic Simulator or Analyzer/Monitor mode with support for port related Frame Statistics. Sophisticated packet capturing mechanism and monitoring features are complimented with powerful triggering and filtering capabilities.
