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Scanning Probe Microscopy
SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Robotic Sample Loading Systems
Below you can see examples of two systems using our robotic sample loading system. Many other automated microscopy systems are possible using our components.
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Light Obscuration
FlowCam LO
Yokogawa Fluid Imaging Technologies, Inc.
Our new FlowCam LO instrument combines our patented flow imaging microscopy technology with an embedded light obscuration particle counter to provide you with the necessary data for USP regulations and validation with images.
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Analytical Software for Microscopy
SPIP
SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.
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Optical microscopy (OM)
Materials Analysis Technology Inc.
Optical microscopy is used to display the surface morphology of samples by 2D intensity contrast due to deflection and reflection of visible light shined on areas of interest. Its resolution is about half of the incident wavelength, which is ~0.2 μm for visible light (wavelength of 400-700 nm). Such resolution limits the maximum magnification to X1000, and thus optical microscopy provides preliminary inspection of sample surface structure.
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Electron Multiplication (EM) Standard Image Sensors
EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
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Fluorescence Illuminators
In fluorescence microscopy, fluorescent substances are viewed or imaged with a microscope. These fluorescent substances may be naturally occurring in the sample or may be introduced to assist in the identification of specific features in the sample. Multiple fluorescent substances (fluorophores) with different fluorescent properties can be visualized within the same sample using the capabilities of fluorescence illumination and fluorescence filter combinations.
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Temperature Controlled Microscope Stage
Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
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PXIe-5764, 16-Bit, 1 GS/s, 4-Channel PXI FlexRIO Digitizer
785171-01
The PXIe-5764 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PXIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Fluorescence Microscopes
PicoQuant offers different solutions for time-resolved confocal microscopy. The available systems include single molecule sensitive microscopes with picosecond temporal resolution and super-resolution imaging capabilities as well as upgrade kits for laser scanning microscopes of all major manufacturers that enable time-resolved applications.
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Scanning Electron Microscopy
SEM
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Transimpedance Amplifiers
Artifex Engineering GmbH & Co. KG
Applications include photodetection with PMTs and photodiodes, spectroscopy, Scanning Tunneling Microscopy, ionization detectors, pyro and piezoelectric detectors.
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Correlative Microscopy
Our modular software platforms enable you to acquire, process and analyze images in multiple dimensions and over various timepoints
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Image Analysis Micrometers
For calibrating and analyzing microscopy measurement systems, the IAM line of Image Analysis Micrometers are perfectly suited. Calibrated to NIST Standards, and imaged with the best line edge quality in the industry, the IAM series is a diversified line of slides that function in areas of color calibration (IAM-9C), Optical Magnification, Frame Distortion, and other applications. Custom features, substrates, sizes and designs are available as custom solutions.
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PCIe-5764, 16-Bit, 1 GS/s, 4-Channel PCI FlexRIO Digitizer Device
785961-01
The PCIe-5764 is a PCI FlexRIO Digitizer Device that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PCIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PCIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Fourier Transform Infrared Spectroscopy (FTIR)
Rocky Mountain Laboratories, Inc.
FTIR Analysis is used to analyze organic materials. Bulk and small particle materials can be analyzed. FTIR microscopy allows for the identification of particle as small as 10 µm. Determination of unknown materials is facilitated by spectral matching to a library of over 250,000 reference spectra.
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Semiconductor
Aerotech has a long history of engineering and manufacturing motion systems and components for high precision wafer processing, scanning electron microscopy (SEM), wafer bumping, 450 mm wafer manufacturing, lithography equipment and advanced laser micromachining. We also specialize in systems and components for vacuum applications, such as EUV lithography. So whether you need off-the-shelf wafer bumping components or a custom-engineered SEM system manufactured and tested to exacting specifications, Aerotech can provide the optimal solution for your application.
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EV Profiler Kit V2
Harness the power of single-molecule localization microscopy to characterize EVs across scales. Quantify nanometer small, rare, and precious EV samples with super-resolution precision. ONI’s EV Profiler helps you focus on answering the right questions about your EV populations.
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PXIe-5764, 16-Bit, 1 GS/s, 4-Channel PXI FlexRIO Digitizer
785167-01
The PXIe-5764 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PXIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Fluorescence Microscopes
Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology. Our confocal systems enable cell biologists to study function and structure using live-cell imaging in cell cultures and invertebrate model organisms at speeds and durations previously not possible. Bruker’s super-resolution microscopes are setting new standards with quantitative single molecule localization which allows for the direct investigation of the molecular positions and distribution of proteins within the cellular environment. Our latest addition, Luxendo light-sheet microscopes, are revolutionizing long-term studies in developmental biology and investigation of dynamic processes in cell culture and small animal models.
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Analytical Services
Surface Analysis; X-Ray Photoelectron Spectroscopy (XPS, ESCA), Auger Electron Spectroscopy (AES), Time-of-Flight Secondary Ion Mass Spectrometry (Static) (TOF-SIMS), Dynamic Secondary Ion Mass Spectrometry (D-SIMS). Microscopy & Diffraction; Organic Material Analysis; Bulk Chemistry.
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Digital Color Camera for Microscopy
LC30
The LC30 is a 3.1 megapixel digital color camera for microscopy that combines versatility with performance. The LC30 is the ideal entry-level microscope camera for quality bright-field imaging － suitable for material science applications. The Olympus LC30 color camera for microscopy combines versatility with performance. With up to 37 frames per second (fps), faithful color reproduction, full integration into Olympus imaging platforms, and an excellent cost-performance ratio, the LC30 is the ideal entry-level microscope camera for quality bright-field imaging － suitable for material science applications.. The sensitivity and frame rate of the 3.1-megapixel CMOS chip can be increased using various binning modes, resulting in easy observation and focusing. The LC30 camera can be quickly and easily mounted on all microscopes equipped with a standard C-mount adaptor, and requires only a single USB 2.0 cable for high-speed data transfer and power supply. Its complete integration into the OLYMPUS Stream imaging platforms helps ensure the seamless interaction of microscope, camera, and additional devices, delivering intuitive and efficient operation.
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Atomic Force Microscopy
Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Light Sheet Microscopes
Discover advanced light sheet microscopy solutions from Leica Microsystems. Our portfolio combines cutting-edge technology with exceptional imaging capabilities to enhance your research.
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High-Speed AFM
Is a type of atomic force microscopy (AFM) that, unlike conventional AFM, can take an image very quickly and with relatively low imaging force, therefore allowing for visualizing the dynamic behavior of biomolecules.
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Collaborative Correlative Microscopy
nanoGPS navYX
Correlative microscopy is the combination of multiple modalities performed on the same sample. The results produced emphasize the strengths of each modality while offsetting their individual limitations.nanoGPS navYX™ is an open solution which makes SEM-Raman correlative microscopy seamless regardless of the electron and optical microscopes used. Simply stick the Coordinates Transfer System to the sample!
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Laser Raman Microscopy System
RAMANforce/RAMANtouch
Nanophoton is the pioneer of confocal laser scanning microscopy and spectroscopic analysis. To celebrate, we relaunch our fastest and highest resolution confocal Raman microscope RAMANtouch/RAMANforce. With a newly designed spectrograph and the latest optical technologies, RAMANtouch/RAMANforce’s spatial resolution and sensitivity have been highly improved, making it the optimal solution for all applications.
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Imaging & Analysis
Microscopes offered by Buehler generally fall into the categories of stereo microscopes, upright microscopes, or inverted microscopes. Inverted microscopes are commonly referred to as metallurgical microscopes. Microscopes may offer episcopic (reflected light) observation, diascopic (transmitted light) observation, or both possibilities. Illumination may be delivered in bright field mode (BF) or dark field mode (DF), and several techniques such as differential interference contrast (DIC) and polarized light microscopy make use of the nature of light to reveal specific pieces of information when studying materials.
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Fatigue Testing And Certification
Fatigue engineering is subject to uncertainty, and data from well executed tests are used to validate conclusions made by analysis and to provide a basis for structural certification. Our staff have extensive experience in testing materials and components under slowly varying, static loads, and under rapidly varying cyclic loads. Tests under static loads are used to assess material properties or to assess the load-deformation behavior of structural components. Tests under cyclic loads provide time to crack initiation, time to failure, or measurements of crack growth over time. We have extensive experience in measuring fatigue crack growth behavior in metallic materials. Past programs have measured crack growth with microscopy and photogrammetry at the surface, cracked area with direct current potential drop, and through-thickness crack profiles with quantitative fractography. By assessing crack growth with a variety of experimental methods, we enable robust analysis validation for cases of complex cracking. Our capabilities in fatigue engineering allow for careful design of a fatigue test program. Whether the tests use constant amplitude loading or an irregular loading spectrum, we specialize in engineering the test that meet your needs. Much of our experience is in non-standard test programs, which require engineering to optimize the test setup. Few others match our capability and experience in fatigue test engineering.
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PXIe-5764, 16-Bit, 1 GS/s, 4-Channel PXI FlexRIO Digitizer
785169-01
The PXIe-5764 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PXIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
