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NF
1) EMF closest to the antenna. 2) Near-field optics.
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Near Field Probes 1GHz - 10 GHz
SX set
The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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AMIDA VCSEL Tester
AMIDA VCSEL tester can be divided into three parts: LIV measurement system, Near Field measurement system and Far Field measurement system. To achieve the above three measurements, in addition to the necessary optical components and optical instruments, the core technology is to provide fast and stable current pulses to drive the VCSEL laser diode to emit light, and then to test various optical and electrical properties
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Near Field Probes
Used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices.
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Near-Field Scanning Optical Microscope Platform
MoScan-F
MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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Near Field Microprobe E-field 7 MHz to 3 GHz
ICR E150
The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.
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NF-Series Standard Plus Models
The E-DRIV® NF-Series standard plus models feature a selectable Double Hit Mode for soft joint applications and a selectable Soft Start mode. Engineered for high volume manufacturing applications the brushless motor design ensures durability and reduces the standard maintenance costs associated with brush type electric screwdrivers. The NF power tool is ESD certified, ensuring less than 1 Ohm at the bit tip. ESD management assures product quality, cost savings and a reduction in overall ESD failures.
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Refractive Index Profiler
S14
The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
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Variable Gain Amplifiers
50 dB Gain, 14 dBm P1dB, 100 MHz to 18 GHz, Rack Mount, Variable Gain Amplifier, 6.5 dB NF, SMA
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L-Band Separate Raman Fiber Amplifier
RFA6000
Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to the multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Fiber Amplifier (RFA) is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. It is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600 nm.
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Combination Board Tester
ATE QT2256-640 PXI
Qmax Test Technologies Pvt. Ltd.
Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.
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Near Field Micro Probe ICR HV H Field
The measurement coil is located vertically in the probe head. The near field probes are run with a positioning system (Langer Scanner).
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Near Field Probes 30 MHz up to 6 GHz
XF1 set
The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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VLF Diagnostics System
PHG 70 TD
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PHG 70 TD. The combination of the PHG 70 programmable test generator with the BAUR dissipation factor measurement system produces the cable testing and diagnostics system PHG TD. It is operated via PC control. Dissipation factor measurement and diagnostic testing sequences can be programmed in the menu, after which the dissipation factor measured values are automatically determined in various voltage steps and a final evaluation is conducted.* Biggest dynamic range of tan delta measured values from 1 to 10-4 with a cable capacitance >10 nF to 20 uF* High resolution +/- 1x10-5 applicable even in new PE/XLPE cables* Insensitive against interferences due to complete mains separation* Lowest time required for assessing a medium-voltage cable (3-phase approx. 1 hour)
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Near Field Probes 30 MHz up to 3 GHz
RF6 set
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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C & L-Band Separate Raman Fiber Amplifier
RFA7000
Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to the multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Fiber Amplifier (RFA) is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. It is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600 nm.
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RGO-2000P Robotic Goniophotometer For Plant Lighting
Hangzhou Everfine Photo-E-Info Co., LTD
RGO-2000P proposed a solution based on the plant lighting requirement to measure and evaluate the spatial light distribution performance of plant lighting based on the limitations of far-field measurement and ILMD near field distribution goniophotometer.
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Fiber optic active antennas / field probes
EFS-105
The EFS-105 is the first in a family of fiber-optic active antennas & E-field probes. The field distortion caused by the probe head is nearly zero due to the exceptionally small probe head and the all-optical signal transmission and power supply. This gives an invaluable advantage for near field measurements and measurements close to metallic parts.
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Near Field Strength Monitor / Bug Detector
NFSM-2000
Locate and Identify Hidden Radio Transmitters with an all Digital Display, earphone and accompanied tool for finding hidden RF Wireless Cameras.
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Shielding Effectiveness/ Conductivity Test
EM-2107A | 30 MHz – 1.5 GHz
The EM-2107A is a standard test fixture for evaluation of the electromagnetic shielding effectiveness of planar material. The fixture is an enlarged section of coaxial transmission line and complies fully with the requirements of ASTM test method D4935-1. The measured data relates to the shielding effectiveness due to a plane wave (far field EM wave) from which near field values for magnetic and electric fields may be inferred. The EM-2107A is provided with a reference standard test specimen, a dynamic range specimen. Dynamic range of greater than 80dB is achievable, although the cables and other test system components usually establishes the limiting factors.
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EMC Scanner
EMxpert
EMXpert is a unique magnetic near field scanning system that helps designers be highly productive in understanding and diagnosing these problems, quickly and early in the development cycle.
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V-Band Low Noise Amplifier 50 to 75 GHz, 35 dB Gain, 5 dB NF
SBL- 5037533550-1515-E1
50 to 75 GHz, 35 dB Gain, 5 dB Noise Figure V Band Low Noise Amplifier for IEEE 802.11.ad WiGig. Model SBL-5037533550-1515-E1 is a low noise amplifier with a typical small signal gain of 35 dB and a nominal noise figure of 5 dB across the frequency range of 50 to 75 GHz. The DC power requirement for the amplifier is +8 VDC/150 mA. The mechanical configuration offers an in-line structure with WR-15 waveguides and UG-385/U flanges.
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Near Field Probes 30 MHz up to 3 GHz
RF2 set
The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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RF Near Field Probe Set DC to 9GHz
EMF & RF close field sniffer-set for use with any Spectrum Analyzer or Measurement Receiver. The EMC Near Field probe set allows for straightforward pinpointing and measurement of interference sources in electronic component groups as well as execution and monitoring of generic EMC measurement. Our RF near field probe set is especially suitable for: - Pinpointing interference sources - Estimation of interference field strength - Verification of shielding and filtering measures - Identifying faulty components - Detecting circuitry overly sensitive to interference.
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Large-size Hybrid Reverberation / Anechoic Chamber
F-Series
The F large-size hybrid Reverberation/Anechoic Chamber represents the most versatile OTA test system in the market today. With the same unique test features of their E Series RC counterparts, the F-Series can also test large form-factor devices under test (DUTs) like laptops, large TV sets, solar and trash compactors, drones, fridges or washing and vending machines, among others. With up to 16x16, 8DLCC and DUTs up to 2m and 500 kg including full-body phantoms in a turntable, the F Series also expands the frequency range down to cover 200 MHz up to 40 GHz frequency ranges and the test modes to include EMC, BS, small cell, eNodeB and Virtual Drive Testing over the air (VDT-OTA). In an again unheard-of feature, the F-Series is also reverse-convertible into an Anechoic chamber, allowing Far Field (FF) and Spherical Near Field (SNF) radiation patterns, efficiency and gain measurements and pre-5G testing of antennas and devices. Conversion from RC to AC or vice versa can be performed within half a day.
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Near Field Micro Probes ICR HH H Field
The measuring coil is horizontally located in the probe head. The near field micro probes are operated with a positioning system (Langer Scanner).
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E-DRIV® Brushless Electric Screwdrivers
NF-Series
Designed for high production environments, the E-DRIV® NF-Series feature a high performance brushless motor design that provides durability and reduces the common maintenance costs associated brush type electric screwdrivers. The NF tool is ESD certified, ensuring less than 1 Ohm at the bit tip. ESD management in power tools ensures product quality, cost savings and a reduction in overall ESD failures. The versatile assembly power tool is available in four different model configurations to meet the demand of various unique fastening applications.
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USB Magnetometer
MultiDimension Technology Co.,Ltd.
A three-axis digital magnetometer that is intended for the measurement of magnetic fields near the probe tip at frequencies less than 250 Hz.
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EMC Accessories
Complete your EMC test setup with the essential accessories to compliment the test equipment. Whether it is a LISN (or V-Network) to counteract interference from external power sources on conducted emissions from the device under test, probes to locate the near field sources of radiated emissions, receive and transmit antennas, or tripods for holding antennas in place, the Rohde & Schwarz catalog of EMC accessories provides the additional items you need for EMI and EMS measurements, guaranteed 100% suitable for use with Rohde & Schwarz EMC test equipment.
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Scanning Magnetic Microscope
Circuit ScanTM 1000
Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Cylinder type, Near field Antenna Measurement System
anm02
As it combines the vertical direction of the probe antenna with the turn of the object antenna, and performs the near field measurement in the shape of a cylinder. The result will be converted to far field. Feature The pattern behind the antenna can be measured by a cylinder scanning. Fast measurement.For example ) Vertical direction 256 point and Rotatory direction 180 point : 30 minutes.
