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Pulse Current
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Split type Pulse Current Sensor
CTF-03
MULTI MEASURING INSTRUMENTS Co., Ltd.
*Suitable for the operation and cable continuity check of the equipment by pulse current detection method.*Wide AC current range from 0.1mA to 8A.*Ultra compact and light weight.*High sensitivity and least affection from external magnetic field.
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Split type Pulse Current Sensor
CTF-05M
MULTI MEASURING INSTRUMENTS Co., Ltd.
*Pulse current detection for power demand meter.*Through hole type CT.*Open collector output.
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Split type Pulse Current Sensor
CTF-05K
MULTI MEASURING INSTRUMENTS Co., Ltd.
*Pulse current detection for power demand meter.*Clamp type CT.*Open collector output.
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Split type Pulse Current Sensor
CTF-05T
MULTI MEASURING INSTRUMENTS Co., Ltd.
For detecting current pulse with open collector output (for power pulse)
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AMIDA VCSEL Tester
AMIDA VCSEL tester can be divided into three parts: LIV measurement system, Near Field measurement system and Far Field measurement system. To achieve the above three measurements, in addition to the necessary optical components and optical instruments, the core technology is to provide fast and stable current pulses to drive the VCSEL laser diode to emit light, and then to test various optical and electrical properties
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Milliohm Meter
16502
Chroma Systems Solutions, Inc.
Basic accuracy : 0.05%Pulsed test current output mode is used to reduce thermal EMFs affection on milliohm measurementDC test current output mode is used to fasten measurement speed for inductive DUTDry-circuit test current output mode (limited Max. 20mV) is used to measure such contact resistances where the maximum open-circuit voltage must be limited to 50mVTemperature correction (TC function) regardless of material or temperatureUseful temperature conversion function for motor/ coil evaluation4 channels R scan with balance check function for fan motor (combined with A165017 option)0.001mΩ~1.9999MΩ wide measurement range with 4½ digits resolutionStandard RS-232 interfaceOptional GPIB & Handler interfaceBin-sorting functionComparator and pass/fail alarming beeper functionLarge LCD display (240 x 64 dot-matrix)Friendly user interface
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High Current SMU Family 100 A
AXC760x
Generate extremely short, fully regulated current pulses from 100 µs up to 100 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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50 µs Pulse Medium Current Source/Measure Unit (MCSMU)
B1514A
The 50 s Pulse Medium Current SMU is an SMU designed for faster pulsed IV measurement. It enables a pulsed measurement down to 50 s pulse width, a 10 times or more narrow pulsed measurement than provided by a comparable conventional SMU. In addition, the instrument offers a wider range and versatility, up to 30 V / 1A, with voltage/current programmability. It is useful to characterize high to medium power devices on the new materials such as SiC and GaN, and organic devices, and the MCSMU expands your choices of pulsed IV measurement.
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Through Hole type DC Current Sensor／for Load Current Measurements
MOHT-1500B Open loop method
MULTI MEASURING INSTRUMENTS Co., Ltd.
*Hall effect measurement for DC/AC/Pulsed current.*For the use of UPS, batteries, switching power supply, DC motor drivers, etc.
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High Voltage 50 Ω Pulse Generator
TLP-4010C
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±10 kV*High pulse output current up to ±40 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
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Reflectometer
T-510
Techno Instrumentation (India) Private Limited
Pulse Echo, Impulse current and Decay methodprovided to get the distance to almost all typesof faults.Laptop based 15 inch display with user friendlyinterface for easy operation.Online support of experts to review fault graphs.Comparison feature of any 5 graphs for reviewand analysis to get more accurate results.Velocity of propogation(VOP) control makes iteasy to precisely pre-locate faults in cables withdifferent velocity.Automatic storage of more than 10,000 faultgraphs.
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High Current SMU Family 250 A
AXC757x
Generate extremely short, fully regulated current pulses from 300 µs up to 250 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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Pulse Initialization Demo Board
TMR9112
MultiDimension Technology Co.,Ltd.
The TMR9112 demo board was developed to support evalution of the TMR9112 single-axis sensor. The demo board comes with the fast bipolar current pulsing circuit needed for initialising the TMR9112 sensor, and it can be powered from a USB port or any external 5V power supply. For user convenience, the demo board has an optional on-board timer clock with four selectable frequency settings. The On-board timer clock and frequency output can be enabled using the jumper pins. This demo board is divisable along the dotted line so that the sensor board can be seperated from the pulsing circuit board.
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Through Hole type DC Current Sensor／for Load Current Measurements
MOHT-800B Open loop method
MULTI MEASURING INSTRUMENTS Co., Ltd.
*Hall effect measurement for DC/AC/Pulsed current.*For the use of UPS, batteries, switching power supply, DC motor drivers, etc.
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Transforming Analog Circuit Breaker Testers
MAC-21
The MAC-21 uses proven microprocessor and A/D converter technology to provide real-time waveform analysis. This ensures accurate true-RMS readings of current pulses, even with DC offset and distortion, which are typical in primary injection testing. Intelligent threshold algorithms provide accurate trip time measurement. Integration of measurement and control functions allow advanced features such as preset on times, auto ranging, and optional printer or computer interface.
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120 A High Voltage 50 Ω Pulse Generator
TLP-12010C
High Power Pulse Instruments GmbH
- High pulse output current up to 120 A (short circuit)- Ultra-fast 50 Ω high voltage pulse output with typical rise time 100 ps (0 A to 40 A) and 300 ps in high-current mode (0 A to 120 A)- Wafer, package and system level TLP, VF-TLP and HMM testing- Up to 180 kW peak output power into 50 Ω load- Built-in HMM pulse up to ±32 kV in 50 Ω-configuration- High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)- 6 USB programmable pulse rise times: 100 ps to 50 ns (custom selectable)- 8 (optional 9) programmable pulse widths: 0.5 ns (optional), 1 ns to 100 ns (0 A to 40 A), 1 built-in pulse width: 100 ns (>40 A)- The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 GPIB programmable steps (0 A to 40 A)- Optional external pulse width extensions from 5 ns to 500 ns (>40 A to 120 A)using the external pulse width extender TLP-12012A6- Built-in pulse reflection suppression- Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses- Efficient sofware for system control and waveform data management- The sofware can control automatic probers for fast measurements of complete wafers- Combines TLP-12010A and TLP-4010C into one system- Can be operated together with TLP-12012A6 and TLP-3011C pulse width extenders- Integrated interlock safety shut-down- Industrial isolated and EMI/ESD protected USB control interface
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Closed Loop Hall Effect Current Sensors/Transducerswith Rectangle Windows
ChenYang Technologies GmbH & Co. KG
This Hall Effect current sensor is based on closed loop compensating principle and can be used formeasurement of DC and AC current, pulse currents etc. The output of the transducer reflects thereal wave of the current carrying conductor.
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Transmission Line Pulse Testing
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
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High Current SMU 1600 A
AXC7585
Generate extremely short, fully regulated current pulses from 300 µs up to 1600 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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Open Loop Current Sensor
C03 30A
The C03 offers efficient and precise sensor solutions for direct, alternating and pulsed currents in industrial, commercial and communication systems. It consists of three main components: an accurate, linear Hall sensor with low temperature drift, a flux collector and a transformer. It is characterized by a very low resistance and thus lowers power loss and temperature drift - for optimal performance.
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Partial Discharge Detecting Detectors
Hangzhou Xihu Electronic Institute
Including pulse current PD detecto, high frequency PD detector, transient earth PD detector, ultra high frequency PD detector, and ultrasonic PD detector.
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Current Pulsers and Laser Diode Drivers (Pulsed Current)
These instruments generate current pulses whose amplitude is largely independent of the load voltage. This makes them ideal for pulsing device whose voltage may vary with time (for instance, the voltage drop of laser diodes may vary with temperature, or explosive squibs which change impedance during ignition). This voltage independence is a trade-off with speed. If faster rise times are required, consider using pulsed voltage instruments instead.
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Other Power Electronic Capacitors
AC/DC Power Film Capacitors, DC Pulse Current Capacitors, DC Filter Capacitors, Pulse Grade Capacitors, Motor Run Capacitors, Feed-Thru Capacitors and other Customized Capacitors
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Power Sources
MS-Series
The MS-Series Power Sources are high performance, high efficiency, AC to AC converters. Rugged powerful output provides up to 350 amps of pulse current for driving non-linear loads.
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High-Voltage Time-of-Flight Pulsers
Are high-voltage pulse generatorscapable of driving 50 (or higher) loads and operating over a wide pulse width range. The instruments include IEEE- 488.2 GPIB and RS-232 interfaces. For diode loads, thesemodels can be used to provide up to 1, 2, 4, 5 or 8 Amps of pulsed current if the diode is connected in series with 50. All models operate over a wide pulse width range of 100 nsto 100 us.
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Power Cable Fault Locator
TM500
TM500 Power Cable Fault Locator adopts international advanced electronic testing technologies and SCM technology, and combines low-voltage pulse reflection and pulse current testing methods, is suitable for the precise range finding of power cable high resistance, flashover, disconnection, and low resistance. Low-voltage pulse reflection method applies to test the range of the low resistance and broken line, and the length and wave velocity of various cables. Pulse current testing method can be divided into breakthrough high-voltage flashover and DC high-voltage flashover for the high resistance and flashover cable fault finding.
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Measurement System For Testing & Binning Of Back-End LEDs
TP121-TH
The photometric specifications of LEDs must meet very high tolerance requirements regardless of whether they are to be used in general, automotive or other specialist lighting applications. This is often a problem since the manufacturing tolerances of LEDs can be higher than those permitted in the end-use applications. Also, LED binning by LED manufacturers in order to classify LEDs based on their tolerances is performed with flash mode testing using pulsed current flow. However, end-use applications of the LEDs often operate in constant current mode and with significant thermal effects. The sophisticated LED processing industry therefore requires measurement devices that can be used for both manufacturer-compliant pulsed mode, as well as constant current operation mode. When the LEDs are run in constant current mode, the junction temperature has significant influence on the performance and lifetime of the LED. Therefore, test systems should be able to test the LEDs at specific junction temperatures.
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Through Hole type DC Current Sensor／for Load Current Measurements
MOHT-400B Open loop method
MULTI MEASURING INSTRUMENTS Co., Ltd.
*Hall effect measurement for DC/AC/Pulsed current.*For the use of UPS, batteries, switching power supply, DC motor drivers, etc.
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Through Hole type DC Current Sensor／for Load Current Measurements
MOHT-200B Open loop method
MULTI MEASURING INSTRUMENTS Co., Ltd.
*Hall effect measurement for DC/AC/Pulsed current.*For the use of UPS, batteries, switching power supply, DC motor drivers, etc.
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High Voltage 50 Ω Pulse Generator
TLP-3010C
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±8 kV*High pulse output current up to ±30 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
