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RF Probes
Coaxial Probes are said to offer repeatable performance up to 3 GHz in custom or standard configurations.
See Also: Test Probes
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Standard 3.06 (86.70) - 4.00 (113.40) RF Probe For SMA Connectors
CSP-30ES-013
Nominal Impedance (Ohms): 50Current Capacity (Amps) @ 20° C: 1.00Bandwidth @ -1dB (GHz): 35.00Return Loss @ -20dB (GHz): 22.00Test Center (mil): 328Test Center (mm): 8.33Recommended Travel (mil): 100Recommended Travel (mm): 2.54Full Travel (mil): 200Full Travel (mm): 5.08Overall Length (mil): 1,033Overall Length (mm): 26.24Rec. Mounting Hole Size (mil): 297Rec. Mounting Hole Size (mm): 7.54
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Fixed Aperture RF Current Monitoring Probe
TBCP1-200
The TBCP1-200 is a fixed aperture RF current monitoring probe.The probe has a 3dB bandwidth of approximately 200 MHz. The aperture of the RF current monitoring probe is 25 mm. Its transfer impedance is > 14 dB Ohm in the range from 40 kHz to 200 MHz.
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Eddy Current Probes and Drivers
Proximity sensors work on the eddy current principle. A proximity system consists of an eddy current probe, extension cable and driver. A high-frequency RF signal is generated by the driver, sent through the extension and probe cables and radiated from the probe tip. The tip consists of a precision wound copper coil inside a chemical and temperature resistant PEEK case.
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RF Volt Meters
The latest addition to Boonton’s popular 9200 series of RF voltmeters. It combines accuracy, smart probes, and operator features that have never before been available in its price range.
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Precision Picoprobe™ Micropositioner Probe Holder Kit
PHD-3001A
High Power Pulse Instruments GmbH
*Pulse force and pulse sense fixed pitch and flexible pitch RF probing solution for TLP/VF-TLP/HMM on-wafer measurements using Picoprobe™ Model 10*High peak current capability 80 A (100 ns)*DC – typ. 7 GHz bandwidth*Isolated probe-head ground shield for high pulse sense common mode signal rejection*Including fixed pitch replacement probe tip 50 Ω, right, 100 µm pad pitch*Including fixed pitch replacement probe tip 5 kΩ, left, 100 µm pad pitch*Including flexible pitch clamps plus 10-5k(0502)-125-W-1 and 10-50/30-125-W-1 replacement probe tips*True coaxial high-resolution 80:1 rotary probe-head for accurate probe tip adjustment
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Enhanced Probe Station
EB Series
Comprehensive prober for DC and RF. The EB series contains features to step-up your usability to acquire the accurate data you need from your devices. It has a built in probe card slot.
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MPI Fully Automatic Probe Systems
MPI Advanced Semiconductor Test
Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.
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Test Contactor/Probe Head
Hydra
Engineered for excellence and efficiency, Hydra™ spring probe series offers precision, reliability, and standardized semiconductor test interface.Designed to be best-in-class at a competitive price point, Hydra is optimized to maximize your operational efficiency. Hydra is built to withstand demanding high-volume manufacturing test environments with its robust and durable design.With a common test-height, Hydra offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, Hydra streamlines inventory management with fewer probe part numbers to manage and shorter lead times.
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RealProbe RF Probes
Unmatched performance In-Circuit RF Probes covering up to 18GHz. These are must tools for any in-circuit RF and Microwave testing and troubleshooting.
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Radio Frequency Probes
In coaxially constructed radio frequency probes, the inner conductor is used for signal transmission, while the outer conductor serves as shielding. These probes are used for contacting many standardized RF connectors and RF sockets. Starting with larger Fakra or HSD connectors, over SMA, SMB, SMC connectors, up to small SMD-equipped switch connectors or for contacting directly on PCBs.
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Active Differential Probe, 100 kHz to 12 GHz
U1818B
The Keysight U1818B 100 kHz to 12 GHz active differential probe makes it easy to perform high frequency in-circuit measurements using network, spectrum and signal source analyzers. With flat frequency response, low noise floor, and direct power from instrument connection, the U1818B allows measurements to be made while taking full advantage of Keysight's RF analyzers dynamic range.
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Probe Cards
Ceramic Blades
SV TCL offers a variety of ceramic blades and blade probe cards. We have patented ceramic microstrip blade probes available in low leakage and low capacitance for optimal signal transference, while SV TCL's blade cards are ideal for parametric and RF testing.
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RF Voltage Probe
P-20 Series
The P-20A is a PASSIVE 10:1 RF VOLTAGE PROBE with a 50 Volt DC BLOCK built in. It has been designed to allow users of RF test equipment to use standard signal tracing techniques. The P-20A makes it possible to conveniently and accurately monitor or inject signals up to 3 GHz into RF circuits without significantly loading or detuning them.
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Probing Solutions
ES62X-CMPS
The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.
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Snap-on RF Current Monitoring Probe
TBCP2-250
The TBCP2-250 is a snap-on RF current monitoring probe. The probe has a very flat response with a 3dB bandwidth of 250 MHz and is characterized over the frequency range from 30kHz to 300 MHz. Upon request, it can also be supplied with a test protocol covering the frequency range 1 kHz to 350 MHz. The aperture of the RF current monitoring probe is 32 mm. Its transfer impedance is > 12 dB Ohm in the range from 700 kHz to 300 MHz.
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Current Probes
Com-Power's Current Injection Probes are used for RF conducted immunity testing per IEC 61000-4-6, CISPR 16-1-2, RTCA DO-160 and MIL-STD 461. Current injection Probes are to be used only when there is no commercially available CDN for the type of port(s) to be tested.
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6TL36 Plus In-line Test Handler w/Bypass
EA923
- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
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Test Contactor/Probe Head
xWave
Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
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PCB Connectors
Smiths Interconnect offers a broad range PCB connectors for harsh environments. A wide choice of configurations and terminations of signal, power, high speed, RF contacts and spring probes solutions.
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Frequency Shaped Isotropic Electric Probes
PI-SH-FCC, PI-SH-ICNIRP
An isotropic electric field probe with shaped frequency response meeting the ICNIRP or FCC RF safety standards for occupational and general public exposure limits (see the specified frequency ranges below). Meter readings are shown in % of the STD – standard reference level, eliminating the need to know the source frequency. Probe output is proportional to RF power density in the whole specified power range, producing the correct RF power measurements in single and multi-signal environments, typically present at multiple antenna sites.
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LISN & Voltage Probes
All commercial LISNs include an artificial hand connection and a transient limiter. This adds a 30dB insertion loss. A 30dB pre-amplifier is included which can be connected in the RF output feed to return the insertion loss to 0dB. The Voltage Probe requirement is covered by our PLIP (Power LIne Interference Probe). This fully meets the requirements of CISPR16, but has additional features:*Fully galvanic isolation between input and output (>1kV), for the safety of operator and analyser!*Shrouded safety clips for attachment to the line to be measured.*Filtered frequency response matched to Band A and B.*Current limiting on the output.*Visual indication of high voltage input.
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Bulk Current Monitoring Probe
MP-50
The Current Monitoring probes may be used whenever RF current measurements are required. Current measurements are made by placing a current carrying conductor within the “sensing” window of the probe and measuring the probe’s output voltage with an RF detector. Calibration of the probe permits the conversion of the voltages measured to current. Current measurements can be made over the frequency range shown in the transfer impedance curve furnished with each probe. There is virtually no loading of the circuit and the technique permits normal operation of the device under test during measurements. The MP-50 can be used for the procedure for clamp injection when the common- mode impedance requirements cannot be met given in chapter 7.4 of IEC/EN 61000-4-6 „Immunity to conducted disturbances, induced by radio frequency fields”. The MP-50 can also be used as current monitor for BCI testing as per ISO11452-4, RTCA/DO-160 section 20, MIL-STD-461 and various automotive standards.
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RF Helmholtz Coil
The Beehive Electronics 135A RF Helmholtz coil generates a well-controlled, uniform magnetic field. It can be used to calibrate magnetic field probes, such as the Beehive 100 series, or for testing the susceptibility of other devices to magnetic fields. The Helmholtz coil comes supplied with a fixture that makes it easy to calibrate Beehive 100 series probes.
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Diode Power probe
The COMM-connect 3026 Diode based temperature compensated probe is designed for use with the COMM-connect range of Power Monitors. The probe will handle from 50µW to 100mW . Used with external couplers and the our measurement system application from 1W to 1MW, a high dynamic range can be configured. The 3026 Diode based probe gives excellent stable results along with the COMM-connect Power Monitor variants. This gives our customers a number of applications to monitor and control the last part of your RF network installation from transmitters to the antenna.
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Near Field Probes 30 MHz up to 6 GHz
XF1 set
The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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High-Frequency Probe, 300 kHz to 3 GHz
85024A
85024A high-frequency probe makes it easy to perform in-circuit measurements. An input capacitance of only 0.7 pF shunted by 1 megohm of resistance permits high frequency probing without adversely loading the circuit under test. Excellent frequency response and unity gain guarantee high accuracy in swept measurements with this probe. High probe sensitivity and low distortion levels allow measurements to be made while taking advantage of the full dynamic range of RF analyzers.
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Fiber optic thermometer systems
TS Series
Micronor now offers a complete range of fiber optic temperature sensors, probes and interfaces for temperature measurement in challenging environments. TS series fiber optic temperature probes offer immunity to RF and microwave radiation along with wide temperature range, intrinsic safety and non-invasive use. The fiber optic temperature probes can operate over -200°C to +300°C (-328°F to +572°C), and withstand harsh and corrosive environments. Typical fiber optic temperature monitoring applications include:
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MPI Automated Probe Systems
MPI Advanced Semiconductor Test
MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
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SMART III RF Probe
Finna Sensors’ Smart III RF Moisture Probe is appropriate in those situations where NIR use on conveying systems/web applications or RF flat plate sensor use on board type products are not sufficient. Examples include tanks, bins, barrels, drums, Super Sacks™, silos, etc. These applications require a probe type moisture meter where the probe is inserted into, and is surrounded by product. Since the probe generates a 3 inch diameter radio frequency field around the length of the probe, a significant volume of product is measured. As the product is slowly removed from the silo, and refilled from the top, it passes by the RF Probe, thereby providing a constant real time moisture measurement. Typical applications would include starches, distillers and brewers grains, granulated chemicals or food ingredients, whole grains such as corn kernels, rice, soybeans, tree nut stockpiles, etc.
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Test Contactor/WLCSP Probe Head
ACE
ACE™ test sockets offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm, ACE features an innovative design that provides superior performance, improved yields and power efficiency.ACE probe heads deliver exceptional electrical performance, both DC and RF. Manufactured from HyperCore™ base material, a proprietary material of Cohu’s Everett Charles Technologies, ACE probes have the electrical properties of BeCu with the non-oxidizing properties of a precious metal. The short signal path, sharp tips, and large contact area between plungers provide high current conductance and reliable contact with less force.
