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Industrial CT Scanning Services
Computed tomography (CT) is also referred to as industrial x ray and industrial imaging. It is an x-ray methodology yielding 3-dimensional (3D) results by placing an object on a rotational stage between an x-ray tube and x ray detector, rotating the object 360 degrees and capturing images at specific intervals—such as every degree or every half degree.
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Scanning Probe Microscopy
SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Spatial Laser Measurement
Our laser systems for mine and quarry scanning, vessel-mounted waterway scanning, land-based mapping applications and marine dynamic positioning have been developed over many years of close work with those in the field, and have been adopted widely due to their reliability and ease of use.
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Segmented STEM Detector
Opal
In a drive to meet our customers’ needs, El-Mul developed a detection solution for Scanning Transmission Electron Microscopes (STEM) which can support multiple applications such as DPC, cryo tomography, imaging of strain, charge, light elements or Z-contrast.
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Vector Network Analyzer Automation Suite
ZNrun
For a facility manager the yardstick for optimization could be maximizing the daily production yield, while for a test-engineer it might mean being able to easily define a test setup and have it loaded on each device in the factory in seconds. A tester might be interested in seeing only the result of the measurements, after having started it by scanning a barcode, while quality managers might find it convenient to be able to download real-time yield statistics on their way to the factory. The R&S®ZNrun software suite was designed with optimization in mind and acknowledges these re-quirements by offering each party the possibility to expedite their workflows as much as possible.
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Stealth Lumber Metal Detector
Stealth lumber metal detectors are custom manufactured to suit any large scale application. Ruggedly built, Stealth lumber detectors are suited for scanning an entire log and for machinery/chipper protection. The Stealth uses digital signal processing technology and has high sensitivity levels to ensure the detection of the smallest ferrous, non-ferrous and stainless steel contaminants.
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Monitor and Test Video Quality
Torque Electronic Couch Potato (ECP)
The ECP is designed to monitor and test video quality of experience. This affordable, compact, palm-sized monitoring probe monitors true customer viewing experience by providing measurements from the end users’ point of view, after the STB. Scanning through available channels or navigating through interactive content menus via an external IR blaster, the ECP provides a single dashboard highlighting service quality across all channels.
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Wireless Data Logger
IM2100 Series Scanners are useful for scanning parameters like temperature, flow, humidity, pressure etc and indicate them in a multiplexed manner. These scanners show the values one after the other in preprogrammed time interval called scan time. Options like PC communication, alarm relays are available. Scanners can communicate with SCADA software and are suitable for Data Acquisition system where local recording is not required.
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AFM-Raman for Physical and Chemical Imaging
XploRA Nano
Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer.Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.
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Analytical Software for Microscopy
SPIP
SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.
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Scanning Electron Microscope
Verios G4 XHR SEM
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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PDS Motionscan Software
Allows a 3D Scanning sonar user to collect motion compensated 3D point clouds from a moving platformTeledyne PDS MotionScan system allows a 3D Scanning sonar user to collect motion compensated 3D point clouds from a moving platform. The MotionScan system is comprised of: an RTK capable dual antenna GPS with precision heading output, a heave, pitch and roll sensor, a topside control console. In combination with a BlueView 3D Multibeam Scanning Sonar this creates a full survey package.
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Autofocus System
CRISP
Applied Scientific Instrumentation
The CRISP system is designed to maintain focus over time i.e. compensate for thermal & other factors that may cause the sample to drift out of focus over time. It also can be used to maintain a given focal point while scanning the sample in XY. If you are looking to find the optimal focal point while scanning through the sample in Z phase.
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3D Multibeam Scanning Sonar
ProScan™
Teledyne BlueView's 3D Multibeam Scanning Sonar user interface software. ProScan connects to the sonar and pan/tilt unit, configures each scan, generates full 3D point clouds, and optionally streams output to third party hydrographic software for fusion with other sensors. Data is recorded in multiple file formats: .son (raw acoustic data file for ProScan reprocessing), .txt (plain text record of all point locations and positional data) and .xyzi (industry standard xyzi data for 3D point cloud viewers, registration software, etc.). In playback mode, users can review and reprocess scans to modify sound speed, intensity threshold, multidetect and range settings as needed. ProScan coupled with Teledyne PDS MotionScan, pitch, roll heading and position sensors provides the capability to scan areas to collect 3D point clouds while correcting for motion.
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E-Beam Power Supplies
Maximize image quality and repeatability. Designed for scanning electron microscope tools, Advanced Energy’s precision e-beam technologies deliver impressive performance, accuracy, and reliability.
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Ultra-High Vacuum Scanning Kelvin Probe
Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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Sewer Pipe Scanner
ES-620
The ES-620 series of Electro Scan products are designed for scanning sewer pipe from 6 to 60 inches in diameter. Two products, designed for direct integration to your existing CCTV Truck include the ES-620 for 6 to 20 inches in diameter and the ES-2060 for 20 to 60 inches in diameter.
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Fluorescence Microscopes
PicoQuant offers different solutions for time-resolved confocal microscopy. The available systems include single molecule sensitive microscopes with picosecond temporal resolution and super-resolution imaging capabilities as well as upgrade kits for laser scanning microscopes of all major manufacturers that enable time-resolved applications.
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Real-time and Direct Correlative Nanoscopy
LabRAM Soleil Nano
Fully integrated system based on our OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano offers unprecedented capabilities for direct co-localized AFM-Raman and photoluminescence measurements. AFM imaging modes (topographic, electrical, mechanical, etc.) and Raman acquisition can be performed either sequentially or simultaneously at the same location of the sample surface. Optical nano-resolution is also achievable with Tip-Enhanced Raman Spectroscopy and Photoluminescence (TERS/ TEPL). LabRAM Soleil Nano is compatible with the environmental chamber for AFM and Raman measurements in controlled atmosphere and at low temperatures.
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Radar Systems
A radar system utilizing electronic-computer techniques whereby raw data is used to track an assigned target, compute target velocity, and predict its future position without interfering with the scanning rate.
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Scanning Electron Microscopy
SEM
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Autonomous Pulsed Doppler Wind LiDAR System
Galion
The Galion LiDAR, distributed by SgurrEnergy, has been optimised for collecting data for wind power applications. The all-sky scanning capability enables many more data collection opportunities than VAD scanning alone.
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Fourier Transform Optical Spectrum Analyzer, 600 - 1700 nm
OSA202C
Thorlabs' Optical Spectrum Analyzers (OSAs) perform highly accurate spectral measurements. Compatible with fiber-coupled and free-space light sources, these compact benchtop instruments suit a wide variety of applications, such as analyzing the spectrum of a telecom signal, resolving the Fabry-Perot modes of a gain chip, and identifying gas absorption lines. Many commonly available OSAs use grating-based monochromators, which have slow acquisition times due to the need to mechanically scan the grating and average out noise at each wavelength. Thorlabs' OSAs acquire the spectrum via a Fourier transform using a scanning Michelson interferometer in a push/pull configuration. This approach dramatically improves the acquisition time, enables a high-precision wavelength meter mode with 7 significant figures and ±1 part-per-million accuracy, and allows the included software to provide robust statistical analysis of the acquired spectra, as explained in the Design tab.
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Transimpedance Amplifiers
Artifex Engineering GmbH & Co. KG
Applications include photodetection with PMTs and photodiodes, spectroscopy, Scanning Tunneling Microscopy, ionization detectors, pyro and piezoelectric detectors.
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16-CH 12/16-Bit 100 kS/s Low-Cost Multi-Function DAQ Cards
PCI-9111 Series
ADLINK PCI-9111 series are 16-CH, 100 kS/s low cost multi-function DAQ card. The PCI-9111 series feature flexible configurations on analog inputs. A RC filter is implemented on each A/D input channel for user to attenuate or filter input signal. The PCI-9111 series provide analog inputs with 5 programmable input ranges for bipolar inputs. The PCI-9111 series also support automatic analog input scanning. PCI-9111DG provides 12-bit A/D resolution while PCI-9111HR provides 16-bit A/D resolution. The PCI-9111 series also feature 1-CH 12-bit analog output, 16-CH TTL digital inputs and 16-CH TTL digital outputs. ADLINK PCI-9111 series deliver cost-effective and reliable data acquisition capabilities, and is ideal for a broad variety of applications.
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Ultrasonic Thickness Gauge
72DL PLUS
The Olympus 72DL PLUS™ ultrasonic thickness gauge delivers precision thickness measurements at high speed in a portable, easy-to-use device. With fast scanning, advanced algorithms, and our lowest-ever minimum thickness capability, you can confidently measure the thickness of very thin layers in the most challenging applications.
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Universal Total Stations
SPS730 And SPS930
Nothing else comes close. Trimble Universal Total Stations lead the industry in accuracy, range and reliability for fine grading, paving, stockpile scanning and site measurements.
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Multiplexer
SC6540
Our patented SC6540 modular scanning matrix pioneered the largest productivity improvement in the electrical safety compliance industry in years. With up to 16 independent high voltage or high current channels in a convenient 2U design, the SC6540 can be customized in 10 different configurations for multi-point Hipot, Ground Bond, Insulation Resistance and Leakage Current testing.
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Software
Thor3D Suite
Since both the Thor3D scanner and the Drake 3D scanner are wireless, an embedded software program is pre-installed on the internal computer of the scanners. This software launches when you start your scanner and facilitates the acquisition of 3D data. Using the build-in touch screen, control the scanner with the help of this straightforward program. The interface is simple to use and understand. It has several buttons (such as “Start”, “Stop”, “Power Off”) and a few settings for the adventurous users (such as “Sensitivity” parameters to help when scanning in bright lighting conditions).
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PXIe-2569, 100-Channel, 1 A, SPST PXI Relay Module
780587-69
PXIe, 100-Channel, 1 A, SPST PXI Relay Module—The PXIe‑2569 is a general-purpose switch module that features independent single‑pole single‑throw (SPST) Form A armature relays. It is fully software programmable and contains a 32,000‑step scan list for deterministic scanning capability. This module offers maximum relay density, so it is ideal for medium-power automated test loads.