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Silicon
atomic number 14 tetravalent metalloid chemical element.
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Silicon Detectors
Through the photovoltaic effect, detectors provide a means of transforming light energy to an electrical current. The root of the theory behind this phenomenon is a small energy gap between the valence and conduction bands of the detector. When light, with enough energy to excite an electron from the valence to the conduction band, is incident upon the detector, the resulting accumulation of charge leads to a flow of current in an external circuit. Since light is not the only source of energy that can excite an electron, detectors will have some amount of current that is not representative of incident light. For example, fluctuations in thermal energy can easily be mistaken for light intensity changes. A variety of these "non-light" contributions are present and, when summed up, make up the total noise within the detector.
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Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Epi Thickness & Composition
FTIR (Fourier Transform Infrared) is the most important technology for measuring epitaxial film (Epi) thickness, measuring impurities in Silicon and monitoring dielectrcis, like Borophosphosilicate glass (BPSG), FSG, PSG, etc in semiconductor industry. FTIR is evolving from a primarily quality control (wafer supply chain) technology to a tool/process/chamber (test wafers) monitoring technology and more importantly, a device (product wafers) monitoring tool.
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Resistivity Standard
Resistivity Standards are bare silicon wafers available in 3 in, 8 in and 12 in sizes. The silicon is p-type (Boron) doped to nominal resistivity values, from 0.002 ohm.cm to 75 ohm.cm as available on the 3" model.
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Temperature Measurement IR Sensors & Detectors
ST60 High Temperature
A single-channel silicon-based thermopile that will withstand operating temperatures of 225C, with a small active area of 0.61mm x 0.61mm in a TO-5 package. The reduced height package functions as an internal aperture. Two thermistor options provide ambient package temperature measurement. Currently only available with 8-14um silicon window. Time constant of 18ms with Nitrogen encapsulation gas delivers a very low Temperature Coefficient of Responsivity of -0.4%C. This detector has a very short thermal shock response to ambient temperature change.
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40 Gigabit Ethernet AdvancedTCA® Fabric Interface Switch Blade
aTCA-3710
The aTCA-3710 is a high performance, high bandwidth, 40G Fabric switch blade for AdvancedTCA® platforms. This product is ideal for bandwidth intensive telecom applications such as wireless access controller, DPI/security network, IPTV, IP multimedia subsystem, RNC/BSC, broadband access/bearer network, data center, and LTE/4G network applications. The aTCA-3710 provides 40GbE hub-to-node connectivity and integrated switch silicon that supports load balancing, priority queues, packet classification, and flow control to enable strict bandwidth management for implemented applications.
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4-20mA Input A/D Converters
Analog Devices range of 4-20mA Input A/D Converters deliver accuracy, robustness and flexibility for Industrial Control applications. As the world’s leading supplier of data converters, Analog Devices is constantly introducing new A/D converters (ADCs) that drive system level architectures. Our portfolio of leading industrial 4-20mA Input A/D Converters offer considerable integration including, sense resistor, signal conditioning circuitry and advanced on-chip diagnostics to maximize performance and provide an integrated system level solution, all based upon robust silicon processes.
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Ultrafast Joulemeter
Measure every pulse at up to 200 kHz with MACH 6. Measure with 12-bit digital accuracy and capture up to 4 million pulses in real time. Our MACH 6 Joulemeter is the only instrument in the world that performs at this speed, and with this precision. It is designed to support our full complement of fast energy probes that include Silicon, InGaAs and Pyroelectric Detectors. Measure from pJ to mJ and from 0.35 to 2.5 m. Using the M6-Si detector and the M5-UC-QED accessory, you can make relative measurements at 266 nm.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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PCI Bus Analyzer / Exerciser
PCI650
Silicon Control introduces an economical analyzer and exerciser for PCI systems. This 3rd generation PCI analyzer combines high performance hardware with a sophisticated and intuitive software interface. The result is a powerful diagnostic tool for bus analysis all on a single plug-in card.
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Voltage Controlled Oscillators
Teledyne RF & Microwave offers Voltage Controlled Oscillators (VCOs) utilizing bipolar transistors & silicon varactors over the frequency range of 40 MHz to 18GHz. Many of the VCO designs incorporate internal filtering, regulation & amplifiers to meet total system requirements in a small integrated package. Additionally, our hermetic hybrid designs can be screened to the most demanding military and space applications.
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Photometers & Colorimeters
Instrument Systems Optische Messtechnik GmbH
A photometer is used to measure the photometric quantities of illuminance (lx), luminous intensity (cd), luminous flux (lm), and luminance (cd/m²). The integral method and the fast response time of silicon photodiodes means that photometers can achieve an outstanding measuring speed. They are therefore ideal for performing fast goniophotometric measurements. We take great care in the development and production of photometer heads and use innovative amplifier technologies.
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Wideband True RMS AC Voltmeter
323
The Ballantine 323 True RMS analog ac voltmeter uses advanced true rms circuitry to achieve square law response from rugged, fast responding silicon diode detectors with no thermal lag and overload vulnerability inherent in thermocouple devices.
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Si1145 UV / Ambient Light / Proximity Sensor
SEN-36002
SEN-36002 is a highly integrated carrier board designed for the Si1145 UV, Ambient Light and Proximity sensor IC from Silicon Labs. This sensor has 100mLUX resolution, and has a dynamic range of 1 LUX to 128 kLUX with IR correction. This means that whether your application is indoors in poor lighting conditions or outside in full sunlight, this sensor has you covered. In addition, we added a high power LED (150mA max, 20 degree) to take full advantage of the proximity sensing capability of this IC - something you won't see on most competitive carrier boards. Integration is easy with 4 x 4-40 sized mounting holes at the corners of the PCB and signal translation to handle interface voltages from 3V to 5V. The board is interfaced via an I2C interface and function pins have been broken out to a 0.1" pin header. The INT pin is also broken out for interrupt capability.
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Security/Detection
If your design challenge is to create the best motion sensor or motion detector - fire sensor or fire detector, smoke sensor or smoke detector - you've come to the right company. Dexter's sensor technologies are at multiple fronts today, reducing the threat of combat on land, sea and air. Yet the industry leading advantages of Dexter sensors - low cost, high sensitivity, low energy consumption and long life - make them the perfect motion sensor for home, office and facility applications. Dexter thin-film and silicon detectors can target precise threats, whether defined by movement, temperature or body mass. Intensive MIL-STD-883H testing performed by Trialon Corporation, an independent testing facility, confirm that Dexter Research's silicon-based temperature sensor detectors meet the same rugged requirements of 1,000G's for mechanical shock and 30G's in random vibration for which our thin-film detectors are famous. Download Dexter's report here (PDF).
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Light Meter
PLMT68
Light Meter Measures In Lux and Foot Candles (User Selectable)Over-Range IndicatorAuto RangingPeak Hold, Max and Data HoldRelative ModeLong-Life Silicon Photo Diode InsideMeasurement Rate: 1.5 Times per SecondMax Range: 400,000 LuxAccuracy: +/- 5% Under 10000 Lux, +/- 10% Over 10000 LuxMax Resolution: 0.1 Lux/FCAccessories Included: 9V Battery, Carrying Case, Photo DetectorDimensions: 6.50' H x 2.99' W x 1.69' DWeight: 14.22 oz.Sold as : Unit
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X-Design and Verification System
Ascent XV
The Ascent X-design and verification system (XV) prevents, detects and isolates issues caused by the propagation of unknowns (‘Xs’) in RTL designs, including Xs that occur during power-on initialization and switching between power modes. Early sign-off of X issues eliminates costly, painful gate-level debug, and prevents hidden functional bugs from slipping through to silicon.
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Rectifier Diodes
Chip Diodes from Bourns has emerged that offers the capability to provide a silicon diode with minimal packaging overhead. The small signal 0603, 1005 and 1206 Chip Diodes are lead free with Cu/Ni/Au plated terminations while the other packages (SMA, SMB, SMC, 1408, 1607, 2010, 2419, 8L NSOIC, 16L NSOIC, SOT23, SOT23-6, 16L WSOIC) use 100% Tin terminations. All Bourns® diodes are compatible with lead free manufacturing processes, conforming to many industry and government regulations on lead free components.
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Barometric Pressure Transmitter
Comptus Barometric pressure sensors utilize an integrated silicon, absolute pressure sensor with internal temperature compensation. The sensor is mounted to the signal conditioner board. A 3/16 inch diameter tube may be attached to the sensor to provide remote pressure sensing. The output of the sensor is scaled to provide the desired output signal.
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Wide Bandgap Transistors
The key for the next essential step towards a more energy-efficient world lies in the use of new materials, such as wide bandgap semiconductors (WBG) which allow for increased power efficiency, smaller size, lighter weight, lower system cost or all of these together. STMicroelectronics offers the broadest product and technology portfolio of silicon carbide (MOSFETs) and gallium-nitride-based (e-mode HEMT) devices, covering bare dies, discretes and modules belonging to the STPOWER family.
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BSE Detection
SLIM
SLIM™ is an innovative design for under-the-column BSE detection.SLIM™ puts El-Mul’s ScintiFast™ together with a segmented, shaped light guide and Silicon Photomultipliers (SiPM) to create a fast, sensitive, segmented and compact BSE detector for e-beam tools.
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Silicon Test & Yield Analysis Solutions
Tessent®
The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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Film Thickness Probe
FTPadv
The SE 500adv combines ellipsometry and reflectometry to eliminate the ambiguity of measuring layer thickness of transparent films. It extends the measureable thickness to 25 µm. Therefore the SE 500adv extends the capability of the standard laser ellipsometer SE 400adv especially for analyzing thicker films of dielectrics, organic materials, photoresists, silicon, and polysilicon.
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USB Connectivity Bridges
USBXpress
Silicon Labs USBXpress devices are highly optimized solutions that enable designers to easily add USB to existing and new applications. These fixed function devices provide the easiest method to add USB without the need for any firmware or driver development. USBxpress portfolio supports several USB to serial bridge devices including human interface (HID) devices and USB Audio devices.
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Light Meter
PLMT56
Light Meter Measures In LuxOver-Range IndicatorLong-Life Silicon Photo Diode InsideMeasurement Rate: 1.5 Times per SecondMax Range: 50,000 LuxAccuracy: +/- 5% Under 10000 Lux, +/- 10% Over 10000 LuxMax Resolution: 0.1 LuxDimensions: 7.40' H x 2.52' W x 0.96' DAccessories Included: 12V A23 Battery, Photo DetectorSold as : Unit
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HF/HNO3 Monitor
CS-153N
The CS-153N is a high-precision chemical solution concentration monitor designed to meet the strict demands of semiconductor wet-etching processes. Etching processes use HF/HNO3 solution to etch silicon oxide and remove particles from the wafer surface. The CS-153N continually monitors each component of the HF/HNO3 solution (HF/HNO3/H2O), alerting the user each time the solution is replaced or replenished. This allows you to maintain the concentration of the HF/HNO3 solution within the tolerance range, while eliminating unnecessary solution replacement.
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Silicon Heavy-doped Pen Tester
HS-MPRT
Heavy doped testing, especially good for purchase the material.■ Not only sound alarm, but also Led light alarm , to guarantee sorting work accurately.■ adaptable for sorting little granular material, little broken IC Wafer and other little silicon material.■ Can set alarm ranges from 0.0 to 1.0Ω﹡㎝.
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Solar Radiation Sensors
Ingenieurbüro Mencke & Tegtmeyer Gm
The silicon solar radiation sensor (Si) sensor provides an inexpensive but yet robust and reliable solution for measuring the solar irradiance specifically for the monitoring of photovoltaic (PV) systems. Due to the structure of the sensor element, which corresponds to a PV module, these sensors are ideally suited as a reference for the monitoring of PV systems to determine the solar radiation.
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DisplayPort v1.3 Protocol Analysis Probe
FS4500
The FuturePlus FS4500 DisplayPort Analysis Probe provides a mechanical, electrical and software interface to the DisplayPort bus, a digital display interface standard supported by the Video Electronics Standards Association (VESA). The FS4500 is used to design and debug computer motherboards, monitors, home theater systems, and silicon chips incorporating DisplayPort technology.
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ATE Test & Engineering Services
We can provide a limited scope project or a full turn key solution where we analyze a data sheet and provide a full test plan. Our wide range of ATE test equipment and experienced team can support first silicon debug to release to high volume production for a wide range of products, from Digital to RF, including wafer sort and packaged part testing. Test platforms include Verigy, Teradyne, Advantest.
