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Surge Test
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High Voltage Surge Comparison Test Set-Up
Relying on our years of experience in this industry, we are highly acclaimed for manufacturing and exporting High Voltage Surge Comparison Test Set-Up. With wide use in electrical and power generation sector, this equipment is available in different technical specifications and models. We manufacture this High Voltage Surge Comparison Test Set-Up in accordance with industry standards using high grade raw materials. We offer this testing equipment to clients at competitive price.
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Coupling/Decoupling Network
Suzhou 3ctest Electronic Co.,Ltd.
coupling/decoupling network is to test the capacity of high speed communication line for surge test. Data transmission rate is up to 1,000MBit/s. It is designed to meet the requirements of figure 14 in IEC/EN 61000-4-5: 2005. The material of decoupling device is high conductive magnetic material. Stable decoupling capacity and transmission rate, easy to use and compact size.
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Cross Voltage Testers
designed to perform the 60 Hz power line cross test/AC power fault tests required in GR 1089 issue 6 table 4.5 surge test 3,4, 4.3,and 6, and for UL 1950 section 6.4 paragraph 3 and 4.. Preset and Adjustable Time Settings Measuring Terminals including Voltage Sense and Current Shunt portals provide a safe location for users to accurately measure test voltages and output current while setting up tests. Calibration of the Mini_PT-600 is designed to be performed with a simple handheld multi-meter and the removable Currents Shunts can be easily sent to a calibration laboratory if required.
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Power Frequency Transducer
PP1S
1. Measuring and conversion IEC 6882. Dielectrical strength IEC 688 4 KVac / 1 min.3. Impulse test ANSI C37.90 / 1989 IEC 255-3 5KV ( 1.2 x 50 us ) 3KA ( 8 x 20 us ) - current coil4. Surge test (ring wave) ANSI C37.90 / 1989 ( 3KV - 0.5us / 100KHz ) IEC 255-3 ( 2.5KV - 0.25ms / 1MHz )5. Adaptability for power system VDE 0110 6. Measuring reliability VDE 3540
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Transient Over-voltages Tester
SUG335
The SUG335 is a 1.2/50μs Transient Over-voltages Tester. The polarity interval time can be at least 1s. The standard voltage waveform complies with the IEC 60335, IEC61180, IEC 62052-11: 2003, IEC 61008-1: 1996, IEC 61009-1:1996 and IEC 60947-1: 1995, IEC60060, IEC1036 surge voltage test and has been used for safety testing to determine if the clearance was fulfilled the safety requirement while the transient voltage in the circuit.
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Multi-Operational Surge Tester
MB Model
Bench all-in-one versatile Multi-Operational Surge Tester that you need for all of your electrical insulation testing. The Hi-Pot tester has separate L.E.D. panel meters for direct readout (voltage and leakage current) so that no interpolation on the scopes display is ever needed. This MOST can surge test extremely low inductance windings, DC armatures, etc.
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Inductor Tester
An impulse can be applied to the coil of a chip power inductor to perform insulation tests (surge tests) within the windings.
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PAT TESTER
Precision Mastech Enterprises Co.
The Safety Pat Plus is a handheld battery powered unit suitable for carrying out electrical safety tests.Stores 300 test results and can be battery & mains powered. The instrument is capable of testing surge protected equipment & can test 110V, 230V appliances. It will return true leakage results at both 110V and 230V
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Lightning Surge Simulator
LSS-720B
Voltage surge test (1.2/50µs) and current surge test (8.2µs) specified under JEC-210 and 212 standard. (JEC: Japanese Electrotechnical Committe)High voltage surge test up to 20kV and high current surge test up to 4000A (30kV/6000A model available)
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Solenoid Valve Tester
DZ800
Shanghai Aoboor Electric Co., Ltd.
Insulation resistance, HIPOT, coil DC resistance, turn to turn surge tests can be automatically completed in one time. Applicable to electrical performance test of solenoid valves, changeover valves
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Impulse Voltage Generator
Hilo-Test manufactures Surge generators for surge voltage and safety tests as well as for testing the insulation withstand voltage, the waveform in accordance with IEC 60060. Especially for EMC tests on photovoltaic systems and surge voltage tests, for example, to relay, capacitors, coils.
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High Voltage Surge Current Monitors
HVSCM
Designed to be used with the Model HVST High Voltage Surge tester. The Surge Current Monitor allows simultaneously surge testing 20 units. The Surge Current Monitor monitors the current going through each unit under test at the time of the surge. If a unit under test breaks down or leaks, the Surge Current Monitor will identify the bad unit by lighting the corresponding LED. The most important features of the surge tester are its ability to test the entire winding insulation system. A high voltage surge generates turn to turn, coil to coil, and phase to phase voltage stress, as well as ground insulation stress. When used as a dielectric test, accurate voltage readings are essential. The HV Surge Tester monitors the voltage directly across the winding under test. In production testing we expect that most of the time the devices will pass. In the event that one should fail, the failed device would be removed and then all the parts would have ot undergo another surge test. Since most devices pass most of the time, simultaneous surge testing can be a real time saver.
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Static Electric Motor Analyzers
Baker Instruments’ static motor test equipment is the industry-leading suite of products for detecting weaknesses and faults in the insulation systems of electric motors, generators and coils. Employing both low-voltage and high-voltage tests – such as Baker’s signature surge test - these essential troubleshooting and predictive maintenance tools allow maintenance professionals to assess any need to maintain or replace specific motors and generators that support their business. Equally at home in the motor repair shop or on a plant floor, these testers ensure that the electrical condition of your rotating machinery is understood.
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Surge and Test Generator
STG 600
BAUR Prüf- und Messtechnik GmbH
Cable fault location with the BAUR STG 600. The STG 600 surge and test generator is a multifunctional cable fault locator for low voltage networks. The surge and test generator is used for cable testing as well as for precise location of high-resistive and intermittent faults in low voltage cables.* Specifically for use in low-voltage networks* High surge energy: 600 or 1000 J** Light, compact and transportable* Single systems for cable testing and faults location
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Digital Surge Tester
KT-905D
Surge Tester of KAST is divided for the use of 3¡40 §Ç by output voltage, and subdivided into type C of manual decision type, type A of auto decision type, type L of exclusive use for low inductance product test and type P loading printer which can printout its wave form and digital scope. Surge test requires only 0.5 second. Because Surge tester already performs 30 times of Impulse voltage test only for 0.5 second. Turn-to-turn short : phenomenon shorted between the side coils.
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Mobile Cable Fault Location System
Syscompact 2000
BAUR Prüf- und Messtechnik GmbH
Fault location with Syscompact 2000. The Syscompact 2000 is a multifunctional cable fault location system designed for modular 19" rack technology. The integrated surge and test generator is used for cable and sheath testing as well as for precise location of high-resistive and intermittent faults. The SYSCOMPACT 2000 is preferably used in low- and medium-voltage networks for fault location up to a cable lengths of 65 km. * Fast and reliable * Precise, dependable cable fault location High performance * high voltage unit* Integrated proven cable fault pre-location methods
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Surge Voltage and Surge Current Testing Systems
HIGHVOLT Prüftechnik Dresden GmbH
Pulse Voltage Test Systems are used for surge testing on transformers, cables, gas insulated switchgear (GIS), arresters, and other high voltage equipment.
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Wireless Test Standards Software
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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TestStand
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Current Tester
MIG0624
The MIG0624 current tester is designed to test surge protection devices for low voltage applications (<1000 V). MIG0624 is a current generator delivering a 8/20 µs impulse up to 24kA. The exact waveform delivered is a function of the surge generator and the impedance to which the surge is applied.
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Regenerative Battery Pack Test System
17020
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
