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System Level Test
SLT
As technology nodes continue to evolve and with a more aggressive time to market to bring devices to their end applications, full test coverage of such chips is possible only with System Level Testing.
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HTOL RF Testing Systems
Becker Nachrichtentechnik GmbH
Fully Automatic Test Systems for Lifetime Simulations of Electronic Components. Each output offers a separate, analogue level control. This ensures highest precision in level during a long term usage. A graphical user interface enables an intuitive and easy control.
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Cylinder Type Transformer Systems
YDTW\YDTCW Series
Shanghai Jiuzhi Electric Co., Ltd.
Conventional AC test transformers are especially designed for testing objects of medium capacitance. These systems are particularly suited for tests requiring stable voltage even if the load changes under voltage (corona, wet & pollution tests) or when the load is inductive (inductive voltage transformers).The possibility of stacking several of these transformer modules allows reaching very high voltage levels by keeping reasonable floor space.
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PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-03
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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5 Gas Industrial Combustion Analyzer
K9206
UEi Test & Measurement Instruments
K9206 is an Industrial Flue Gas Analyzer with wireless handset and built to test combustion systems over 10,000 MBTU/h with high concentration gas levels for extended durations. The K9206 is easily customized to measure 5 toxic gases simultaneously, 6 with direct CO2 measurement or order a preset sensor combination.
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PXI Integration Platform
ATS-3100
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Variable Power Supply
VS-10a
The VS-10a power supply is a light weight, portable, non-isolated “variable source” from 0 volts to 150 Vac or 0 volts to 150 Vdc and rated for up to 10 amps, thus the name VS-10a. It is comprised of an illuminated voltmeter that reads to the first significant digit, AC variable system output voltage, DC variable system output voltage, logic output voltage and one sense (continuity) contact monitoring points. Banana jacks for connection of test leads are spaced at intervals that allow the use of dual banana test plugs if desired. The VS-10a is protected by two levels of overcurrent protection; AC input, and ground fault protection by a GFCI. All circuitry is housed inside a custom designed case made from 16 gauge steel. An Internal fan dissipates heat buildup and exhaust through louvered side vents built into the case. The carrying handle is designed with a “spring return to rest” position and is padded for comfort. The case has been sized for optimum portability and is balanced from the handle during transportation. The case has a powder coated finish that is scratch, chemical and weather resistant. Rubber padded feet support the case when in the upright position and a convenience receptacle is located on the side of the case.
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ARINC818 Cards
> ARINC818 is a specification which has become an Industry standard for the transmission of uncompressed digital video. This commercial standard uses Fibre Channel as a point-to-point communication link for low latency with the ARINC818 defining the packetized protocol for transmission of the digital video information. It is highly flexible and can be used for a variety of onboard display systems in both commercial and military applications. AIM’s ARINC818 cards use our field proven Common Core hardware design giving the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with one dual core RISC processor per port, massive DDR3 memory and IRIG-B time encoder/decoder functions are standard. The ARINC818 modules are available in PCIe formats.The new ultra high performance intelligent 4-lane PCIe 2.0 interface modules offer 2 ports with full function test, simulation, monitoring and analyzer functions for ARINC818 interfaces. The dual core processor provides onboard processing and data transfer capabilities for the most demanding applications including ARINC818 support done on board level. Large and high data throughput DDR3 RAM is accessible for the onboard processor as is a high performance FPGA implementing the customized ARINC818 Interfaces enabling the board to analyze incoming data in real time. Each module provides 2 ARINC818 compliant ports. SFP cages make it suitable for different media types as optical or electrical network technologies. Each module is delivered with a Board Support Package (BSP) containing the onboard driver software, a full Application Programming Interface (API) and detailed getting started and programming guides. Powerful PBA.pro databus test and analysis software is optionally available for all our ARINC818 cards.
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Test Solutions for Networked Vehicle Components/Connected Cars
Infotainment & Telematics
Developing automatic test systems for the automotive industry is one of our core areas. This industry in particular is characterized by rapid technological progress and ever faster time-to-market requirements.In the vehicle, multimedia devices are used for pure entertainment, but also as vehicle information, which are intended to cover security and navigation services.Infotainment and telematics devices such as eCall modules, connected gateways, instrument clusters or the HMI (Human Machine Interface) are networked with each other and with the most important vehicle functions. All of this is made possible - in addition to GNSS (Global Navigation Satellite System) - by wireless and new communication standards such as A 2 B, BLE, C-V2X, Wi-Fi 6 and 5G.The complex networking is a very attractive factor for drivers and passengers, but this complex communication can become a major challenge for developers.High-speed interfaces and high-frequency modules used in combination must send and receive signals between the different devices absolutely error-free.With our individual and sensitive test and inspection systems, we also simulate vehicle components or emulate the vehicle environment and thus ensure the functionality of your devices. We take your pioneering developments to the next level.
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Anite Development Toolset
Benefit from a comprehensive suite of tools that support all phases of wireless terminal development, from pre-silicon protocol module development through to systems integration and verificationGain easy access to parameters at lower layers to re-create tests in the very early stages of chipset and device developmentAccess an extensive LTE/LTE-Advanced technology roadmap including early 5G specificationsRemain in control of test designs through accessing Layer 1 and Layer 2 using Application Programming Interfaces (APIs)Benefit from a high level of flexibility and control in terms of test creation
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Test Program Sets & Custom System Level Software
WesTest Engineering Corporation
WesTest Engineering Corporation offers turnkey test solutions for the military and aerospace sectors. Our engineering capabilities present an unmatched ability to take customer test requirements and design, developand integrate Test Program Sets (TPS) with diagnostics to the component level. This is further supported by a full complement of documentation, from Test Requirements Documents, to TPS Flowcharts, to Test Reports.With 36 years’ experience and 1000+ TPSs in our history, the WesTest Engineering Staff remains as one of the top notch senior staff’s in the TPS sector today. Our leadership and program management have the historicalexperience to lead WesTest capability to meet the customer’s requirement.
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Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Signal Level Meters
Wuhan Sunma Technology Co., Ltd.
Signal Level Meter is specially designed and manufactured for CATV system installation and testing. It‘s a portable instrument, easy to carry with many functions.It can test CATV signal level both at channel and frequency mode. Also it can measure CATV TILT,C/N, trunk cable Voltage, ect. The big character TN LCD clear1y displays all testing results. It especia1ly fit for CATV station as a professional measurement instrument. it can display 2 channels at the same time.
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Asynchronous System Level Test Platform
Titan
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Load Testing vs. Stress Testing
A load test is a planned test to perform a specified number of requests to a system in order to test the functionality of the system under specific levels of simultaneous requests. A load test ensures that a web system is capable of handling an expected volume of traffic, and therefore is sometimes referred to as volume testing. The goal of a load test is to prove that a system can handle the expected volume with minimal to acceptable performance degradation. The threshold of acceptable performance degradation must be defined by the testers as some value considered acceptable to the end user so that users will not bounce from the site.
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Wafer/Chip/Package Semi-automated ESD Tester
400SW
Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection. Stress level and measurement points are programmed by personal computor via GP-IB. Once test terminals are selected, ESD endurance is automatically measured.
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RF Bias Burn-In System
These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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Scienlab Battery Test System – Module Level
SL1001A Series
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Test Cell Vibration Monitoring System
The Test Cell Vibration Monitoring System is a complete package for monitoring dyno vibration levels generated during engine testing. This system was design to prevent catastrophic dyno failures.
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Immunity Testing Systems
CIS Series
The CIS series test systems are configured to perform conducted immunity testing according to IEC 61000-4-6. The system includes an ACS series power amplifier, coupling/decoupling Network (CDN), directional coupler, 150Ω to 50Ω adapters, power attenuators, cables and [optional] CSAT software. These systems, when properly configured, are capable of testing your products to all levels given in IEC 61000-4-6 up to 230 MHz. You can choose from three systems. Follow the links below for detailed information, including a comprehensive datasheet listing system specs.
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PXIe-6570, 100 MVector/s, PXI Digital Pattern Instrument
785283-01
100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.
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Measurement, Communications & Testing
Process & Analytical Instruments division of AMETEK
Measurement Communications & Testing provides the design, integration and installation of critical communication systems, workflow, life-safety solutions and calibration instruments for temperature, pressure and process control. It also is a leader in level measurement devices, continuous position sensors, hardness testers, force measurement devices and retractable cord reels. In addition, it offers a line of weathering test instrumentation along with laboratory and outdoor testing services.
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Advanced Diagnostics for ScanExpress™ JET JTAG Embedded Test Solutions
ScanExpress JET Advanced Solutions
ScanExpress JET advanced diagnostics add additional diagnostic resolution with fully automated analysis translating functional test results to down to the net and pin level, even with BGA packages.The seamless integration with ScanExpress JET and ScanExpress Runner as well as the ability to output ScanExpress Viewer fault reports for PCB visualization make ScanExpress JET Advanced Diagnostics a must-have tool for any JTAG test system.
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Combination Board Functional Test System
QT 4256 ATE
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Automated Shock Test Systems
AutoShock-II Test System
The AutoShock-II is a fully automated series of shock test systems used to measure and identify product fragility levels and evaluate protective packaging. With the simulation of real world shock pulses and impact energy levels, manufacturers can systematically test and optimize product design and packaging. L.A.B. Equipment, Inc.''s fully automated computer controlled shock and data analysis test systems are the critical path in accomplishing this optimization.
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AMIDA 5000 Tester
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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Standard Gain Horns
Standard gain horns can be used to experimentally determine the gain of other antennas by using the substitution method. The standard gain horn and the antenna under test are alternately connected to a well matched detector system in order to compare their relative power levels. The power level difference is then added to the appropriate level of the calibration curve to determine the absolute gain of the antenna under test.View more Standard Gain Horn Antennas
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Constant Volume Sampler
CVS-ONE
The CVS-ONE series is designed for the measurement of diluted emissions from vehicles and engines. The new integrated operating platform, HORIBA ONE PLATFORM is adopted for the CVS-ONE. The hardware has been significantly downsized from previous designs, reducing test cell footprint requirements. It introduces new functions and is more user-friendly, while still maintaining high accuracy. In conjunction with the MEXA-ONE (Motor Exhaust Gas Analyzer), the system can be used to measure extremely low emission levels such as SULEV. The new CVS reliably supports emission testing requirements of today and into the future.
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SpaceWire Physical Layer Tester
141
The SpaceWire Physical Layer Tester (SPLT) is a tool designed to test, validate and verify a SpaceWire system across all levels of the SpaceWire standard. Two SpaceWire ports employ a special LVDS interface which allows the transmitted signals to be deliberately and measurably manipulated to test the capability of a unit under test to receive signals of varying quality.
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Portable Telemetry Systems
Lumistar’s portable receivers and test transmitters take the state of the art technology found in the PCI receivers and simulators and install it into a hand held units. Our luggable Telemetry Systems can be configured using our card level products into unique custom solutions.
