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Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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Test development service
Test development may be a complex task, because each emulated session must be unique and consistent. Unless the website consists of exclusively static pages, there is no testing tool that can fully automate the test design process. In many cases the implementation may require considerable research of the client-server communication scheme.
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Test & Development
Taking a new board level product or system from concept to deliverable requires feature-rich development and testing tools. Elma's wide range of Type 15 (desktop), Type 32 & D-Frame (portable/desktop) and Type 39E (development frame) chassis for VITA and PICMG bus architectures provide the platforms necessary to meet your needs.
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Flying Probe Programming & Test Development
Testing House offers full Flying Probe Programming and Test Development using its very own Seica Pilot LX Flying Probe Test Stations.
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Engineering Test & Development Tools
Besides DG’s aftermarket diagnostic tools, DG Technologies also offers several engineering tools for vehicle network development. DG’s hardware and software products are used by a variety of engineering customers such as test engineers, production engineers, and fiber optic testers. Our customers use DG interfaces for manipulating messages, datalogging, and ECU end-of-line testing over various multiplex networks.
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Compliance Test, Development and Test Service
DinoStor
With its focus on solving critical backup problems associated with Network-Attached Storage (NAS), DinoStor delivers a broad range of products and services to benefit users and vendors of NAS solutions.
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Test & Development
Taking a new board-level product or system from concept to deliverable requires feature-rich development and testing tools. Elma has a varied selection of system development platforms to help you, from our E-Frame and smaller D-Frame to the L-Frame. Select the right backplane for the architecture you are developing on - CompactPCI, CompactPCI Serial, OpenVPX or SOSA - and either air-cooled or conduction-cooled guides to support the development boards.
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Test Equipment Development
PSE AG has been developing test equipment for many years for a wide variety of clients and uses. If you don’t see exactly the specialized test stand that you need for your innovative research, we will design and develop it for you.
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Software Update For Test Development, GTE 10.00p
K8224A
Software Update for test development is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.
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Test Automation Service
Test Automation framework and test development. Mobile Test Automation. Test Automation execution and maintenance.
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Mini In-Circuit Test System
U9403A
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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EYE Super UV Tester
UV rays are the greatest cause of product deterioration. This unique system dramatically intensifies the deterioration acceleration caused by UV rays. It can achieve an acceleration factor greater than 100 times normal sunlight, producing material effects equivalent to extended outdoor exposure. Its compact size makes it ideal for research and development testing of paints, inks, pigments and fibers as well as plastics.
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Source And Measure WiFi And Bluetooth Signals
IQview
The LitePoint IQview® simplifies WiFi and Bluetooth® device development with powerful tools to both source and measure WiFi and Bluetooth signals and analysis capabilities providing insight into device behavior. The IQview offers seamless compatibility with the IQflex® manufacturing solution enabling test software developed on the IQview to run on the IQflex platform widely deployed in manufacturing environments.
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Mini PCI Card
EXC-1553mPCIe/P1
This card’s small size and suitability for Mini Card compatible computers make it a complete solution for developing, testing, integrating 1553 interfaces and for performing system simulation of the MIL-STD-1553 bus, both in the lab and in the field.
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Adapter
EXC-1553UNET/Px(S)
The EXC-1553UNET/Px is an intelligent, single - or - dual channel, MIL-STD-1553 adapter. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of the MIL-STD-1553 bus, both in the lab and in the field.The EXC-1553UNET/Px shares its API with the entire Px family so that applications currently running on PCI, PCIe, ExCARD or PCMCIA boards will run without change on this device.Multiple units can operate via USB ports on the same computer. In addition, multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.
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Test Development
Best Electronics and Components Co., Inc.
USEA is involved at all levels of test development, including the necessary test board design and layout, software development, socket design and build, etc. We work on programs at all stages of the product development timeline and through to manufacturing.
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Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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HDMI®, DisplayPort Video Test Solutions
We provide test instruments that help manufacturers bring next-generation video, audio, and control products to market – faster and without interoperability problems. The quantumdata series products support a variety of test solutions including functional testing for developers in R&D labs, compliance solutions for developers and test engineers, verification and diagnostic testing for professional A/V integrators and installers and fault testing on production lines in manufacturing facilities.
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Development Switches
TTESwitch A664 Lab v2.0
The TTESwitch A664 Lab v2.0 supports laboratory testing and development efforts for non-real-time to hard real-time operations in distributed systems. The flight-capable TTESwitch Module A664 Pro is the core of TTESwitch A664 Lab v2.0. This enables a reduction in the development cost and time of a flightworthy switch.
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Automated Discrete Semiconductor Tester (ATE)
5300HX
The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
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Product Support Equipment
The TTU/515E or O/I Level Test Set was developed to provide a full end-to-end test of the NACES and FAST electronic sequencers used on the NACES ejection seat. The O/ITS provides simulated inputs and measures the timing of initiator firing sequencer outputs. The O/ITS, via a serial channel in the test connector, performs discrete element diagnostics on all the sequencer's redundant electronics and verifies its full functionality.
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Development Test Stands for Electric Motors
Development test stands from imc are characterized by high flexibility in electric motor trials. A comprehensive variety of motor types can be tested and a complete range of tests carried out. The mechanical configuration consists of a test bed with a load machine and a torque measuring shaft. The load machine and torque sensor shaft are mounted on a linear guide and precisely aligned axially by means of laser. It can be moved towards the test object on ball bearings, as a complete unit. Especially time-saving: no need to realign the load machine assembly when changing the torque sensor.
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Boundary Scan / JTAG Test Development System
onTAP Development
The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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Tool for the Automated Analysis of Measured Data
TRACE-CHECK
Day-to-day testing of newly developed features produces large amounts of data that are never analyzed or used. Sporadic errors often remain undetected and problems relating to complex real-time behaviour are generally hard to identify. To resolve such issues, TraceTronic has designed the tool TRACE-CHECK. This software has been successfully applied in test automation environments,
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Software Capabilities
In test system development, the best hardware is only usable if its software control environment is robust and easy to use. If you are a test system developer, you need to look at both the hardware and software aspects of your vendors of choice.
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Software
Alta may have the most advanced COTS MIL-STD-1553 and ARINC hardware devices, and our test and development software is 2nd to none. Alta's software is modular, portable, and made for real-time controls & test -- and designed for rapid integration success. This page provides a brief overview of each product and links to main landings pages.
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Test Software
Yelo Test Environment V5.0
The Yelo Test Environment (YTE) is an automated test environment developed by Yelo. Test sequences can be developed for multiple products and are tailored to customer needs and specifications. Flexibility in testing is a key benefit of the YTE and is provided to the user by allowing management of test sequence order. There is also the ability for the user to change the test limits or parameters for more or less stringent testing depending on requirements.
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Consulting
Consulting Services by LXinstruments including test process consulting, development of product specifications, pretests and feasibility studies, development of applications and support, examination of test equipment and process capability, and more.
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Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
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Thermocouple Wires & Connectors
Is designed for sensor manufacturers for the production of commercial grade thermocouple junctions, and for users of large numbers of exposed junctionthermocouples such as test & development laboratories where multipoint temperature sensing of test pieces is required.
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BGAN Network Emulator
BNE
Square Peg Communications Inc.
The Gatehouse BGAN Network Emulator (BNE) is a test tool developed and optimized to work in concert with the Square Peg BPLT to provide end-to-end emulation of the BGAN Network. The combination of the BPLT and BNE provides an on-the-bench emulation of the I4 satellites, the BGAN Radio Access Network (RAN) and the Core Network (CN). It is a very powerful test solution that enables terminal manufacturers, system integrators and application developers to test their applications thoroughly and consistently and to verify that applications are optimized to work under any network condition thereby providing the best possible user experience.
