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Test Management Software
See Also: Test Management, Test Management Applications, Test Management Solution, Test Management Suite, Test Management Tools, Test Executive Software
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Test Management Software
XStudio
XStudio allows the scheduling/running offully automated, semi-automated or manual test campaigns. It comes with an integrated requirement management module and a bug-tracking database. Some connectors are also provided to connect real-time with JIRA, Mantis, Bugzilla or TRAC.
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Test Management Software
Test case management and QA is about Coordination and Visibility. PractiTest allows you to Manage all the Requirements, Tests, Issues and Reporting in one simple software testing solution. Get all the information you need in one integrated test case management software solution. Real value from all the information. A Test Case Management tool to help you manage your work and your team.
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Test Management Software
Easy to use to minimal training. Our Test Management Software is powerful enough to accommodate all of your electrical and function testing requirements, whether testing a cable harness or fully equipped vehicle or aircraft.
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TMS Test Management Software
LX TMS
To diagnose and analyze electronic components and devices, various tests are required in development, production and service. Equipped with all the necessary standard functions, the test sequencer developed by LXinstuments meets all criteria for a successful and smooth test process. The test item ( DUT ) is examined under various operating conditions for its properties, function and usability. Typical areas of application can be found where the usual complexity of test sequences has to be processed. The test sequencer is therefore suitable for small and medium-sized systems where special functions of other sequencers are not required. The free, cross-platform, open source developer platform .NET serves as a starting point. The integrated WPF (Windows Presentation Foundation) framework ensures a user-friendly program interface.
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TestStand
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Primary Test Manager
The Primary Test Manager™ (PTM) software supports you during diagnostic testing, condition assessment and data management of medium- and high-voltage assets, such as circuit breakers, rotating machines, grounding systems, instrument and power transformers as well as bushings and on-load tap changers (OLTC).
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Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Test Management Software
ActivATE™
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Test Data Management Software
WATS
WATS is an off-the-shelf Quality and Test Management solution, chosen by customers who want real-time test and repair data for monitoring and improving product quality and manufacturing processes. WATS collects and structures Data worldwide, enabling real-time data acquisition, analysis, reporting and management of manufacturing quality.
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Companion for on-Site Testing
PTMate
The PTMate app is our mobile companion for the Primary Test Manager™ (PTM) software. It supports you on site by providing additional features on your smartphone, for example, sending images, displaying wiring diagrams, or sharing jobs and reports.
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Software - IDEAL Data CENTER
IDC
IDEAL Data CENTER (IDC) is the test result management software for LanTEK III cable certifiers from IDEAL Networks. IDC allows data cable installation professionals to easily download, manage, edit and print pdf reports. IDC offers a simple user interface with time saving features including; Microsoft ribbon toolbars; 4 button clicks to import data from the tester and 3 simple steps to create a professional report. IDC is the fastest management software from IDEAL Networks.
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Test Management Software Tool
TestRail
Modern test case management software for QA and development teams. Comprehensive web-based test case management software to efficiently manage, track and organize your software testing efforts. Auto-generate tests and BDD scenarios from requirements and user stories, with full tester control.
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Test management software
Online test case management tool allowing you to manage your test plans, test cases & test runs with ease
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Digital Management Software
EdgeGO
EdgeGO® is a robust software platform for remote device management in edge computing environments. It prioritizes quick deployment and user-friendly operation while ensuring scalability and security.
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Phi6 Drivers
Phi6 is the software environment to manage, control and program 6TL modules and systems.
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Wireless Test Standards Software
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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LEAK TEST MANAGER SOFTWARE
Leak Test Manager is a software application for PC compatible with Windows XP, 7, 8 and 10 that allows interfacing ForTest equipment to a computer via an RS232 connection (or Ethernet if optional is available on the instrument)
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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I-Pi SMARC Development Kit Based On Intel® 6th Gen Atom® X6425E Quad-Core SoC
I-Pi SMARC Elkhart Lake
The I-Pi SMARC Elkhart Lake is a SMARC-based edge solution development kit powered by Intel Atom x6425E quad-core SoC with integrated Intel UHD graphics and comprehensive high speed interfaces. Development-focused, this kit also supports the latest version of the Intel® Distribution of OpenVINO™ toolkit, which features more deep-learning models, higher inferencing performance, and fewer code changes, making developing ever simpler.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Regenerative Battery Pack Test System
17020
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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I-Pi OSM Development Kit Based On NXP® I.MX 93 Dual-Core Arm® Cortex-A55 & M33
I-Pi OSM IMX93
The I-Pi OSM IMX93 is an OSM-based smart solution development kit powered by NXP i.MX93 (dual-core Arm Cortex-A55 & Arm Cortex-M33) processor with an in-SoC Arm Ethos-U65 microNPU (Neural Processing Unit).
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
