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Test Pattern
Test signals for the calibration and alignment of TV broadcast and reception equipment.
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Astronics PXIe-6943, 1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument
785855-01
1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument - The Astronics PXIe-6943 works as a core component of digital test systems that may include switching, analog instrumentation, and an RF subsystem. This instrument features an advanced thermal design, temperate monitoring, … and a high-speed data sequencer for control of stimulus and response patterns. Additionally, the Astronics PXIe-6943 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and a <3 ns channel-to-channel skew. It also supports synchronized digital test systems from 32 to 224 channels.
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DisplayMate Multimedia with Motion Bitmaps Edition
DisplayMate Technologies Corporation
DisplayMate Multimedia with Motion Bitmaps Edition includes a Motion Engine that moves a special set of test patterns and test photos to measure and evaluate response time, motion blur and motion artifacts in displays for different speeds, directions, intensities and colors for all monitors, projectors and HDTVs. It has everything in the standard Multimedia Edition including all of its 500+ test patterns up through 3072 x 3072 resolution.
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Digital/Pattern/PE Card
PE16S
The PE16S represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the PE16, the PE16S offers high performance pin electronics and an enhanced timing generator in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 256 bi-directional pins (16 boards). The PE16S offers 16 programmable level input or output channels with 2 PMU . The PE16S also supports deep pattern memory by offering 32 M of on-board vector memory with per channel dynamic direction control running test rates up to 66 MHz.
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Clock Drivers
Multiple timing signals ("clocks") are required by CCDs, IR FPAs, and some CMOS image sensors to transport electrical charge across the array to a sense amplifier for conversion into image data. Pulse Instruments offers a line of "clock drivers" for generating these timing signals. The parameters of these clocks (clock rate, pulse width, pulse amplitude, rise- and fall-times, etc.) greatly influence the behavior and performance of the imaging device. Our products take logic-level inputs from a pattern generator and allow the user to adjust the output parameters to suit their device and testing requirements. Clocks can be "tweaked" in real-time to determine optimal operating parameters for a particular device, or else programmed in accordance with a test plan for automated production test.
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Drop-In Functional Test Fixtures
Circuit Check’s drop-in base fixture and replaceable personalized plates are the ideal solution where production volumes are lower and the need to change from one fixture and test program to another occurs quickly. Interchangeable test fixture drop-ins enable the same test system to be quickly reconfigured with different tooling and probe patterns for different products. This maximizes equipment re-use, while minimizing the cost for each new test. With Circuit Check’s base fixture and drop-ins, the wiring and test electronics are not disturbed, thus ensuring configuration consistency each time the system is re-tooled.
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Digital/Pattern/PE Card
PA32S
The PA32S represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the PE32, the PA32S offers high performance pin electronics and an enhanced timing generator in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 512 bi-directional pins (16 boards). The PA32S also supports deep pattern memory by offering= 32 M of on-board vector memory with dynamic per pin direction control and with test rates up to 33 MHz. With new 32M capture/log memory, PA32S can capture 32 channels fail log.
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IJTAG IP Integration Environment
Tessent IJTAG
To manage the complex requirements of testing a heterogeneous set of embedded IP, the industry developed IEEE P1687 (IJTAG). It standardizes a language for describing the IP interface and how IPs are connected to each other. It also introduces a language that defines how patterns that operate or test the IP are to be described. IEEE P1687 draws a clear line between what must be covered by the standard and what is better left to the ingenuity of the tool developers.
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Sync Generator
LT 4610
The LT 4610 is 1RU full-rack size sync signal generator that can output triple-rate SDI (3G-SDI/HD-SDI/SD-SDI) signals. It employs two power supply units for redundant operation to protect against power supply failures. The genlock function for external sync signals enables SDI signals, six sets of analog black burst sync signals, and audio word-clock signals to be output synchronously. The genlock function is equipped with a STAY IN SYNC function that maintains the phase when errors occur in the input signal, making it possible to provide stable sync systems.In addition to test pattern output including color bars and SDI check fields, the LT 4610 can embed ID characters, QVGA logo marks, safety area markers, and embedded audio in a SDI signal output.
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PXIe-6570, 100 MVector/s, PXI Digital Pattern Instrument
785283-01
100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.
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12 Channels 1.0 ~ 17.0 Gb/s (200Gbps) Pulse Pattern Generator and Error Detector
CA9806-12
The UC INSTRUEMNTS CA9806-12 is a highp erformance, flexible 12 channels Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (200 G). It is combined with three sets CA9806 4 CH 1.0 to 17.0 Gbps Pulse Pattern Generator and Error Detector that incorporates an external one by 4 rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build-in 8.5 ~ 15 Gb/s eye diagram testing function.
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400, 200, 100 Gbit Error Rate Tester
PAM-4 BERT
The MI-PE5610-1 is a PAM-4 BERT with an integrated propriety, optical PAM-4 modulator. ROSA testing is tremebous simpliefied by the integration of the optical PAM-4 modulator in the BERT chassis. This ROSA testing solution saves time and avoids trouble shooting and accelerates your product development. The BERT provides an excellent optical PAM-4 reference output signal with adjustable OMA of the three PAM-4 eyes.The implemented 3-Eye BER technique measures the BER in real time of the 3 eyes simultanously.A wide range of selectable pattern for compliance test and signal analysis is supported.
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Test Patterns
DisplayMate Multimedia Edition
DisplayMate Technologies Corporation
DisplayMate Multimedia Edition is the most advanced and powerful version of DisplayMate ever, with lots of proprietary and highly innovative suites of test patterns for setting up, tuning-up, calibrating, testing, evaluating, diagnosing, and analyzing CRTs, analog and digital LCD, Plasma, DLP, LCoS, and SXRD monitors and projectors, microdisplays, video boards, color printers, TVs and HDTVs, NTSC/PAL Television encoders and decoders, and more.
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Silicon Test & Yield Analysis Solutions
Tessent®
The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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Remote Intelligent Pod
ScanTAP
The test patterns generated by the PCI-1149.1/Turbo controller are distributed to the target system either directly through ScanTAP 4 and ScanTAP-8 pods. The ScanTAP-4 and ScanTAP-8 pods can apply test vectors and/or ISP patterns to target boards with a variety of JTAG chain topologies. In the simplest case, the ScanTAP-4 and ScanTAP-8 will provide the interface between the PCI-1149.1/Turbo controller and a target system consisting of a single JTAG Test Access Port (TAP). This would be the case where the target system consists of one JTAG chain and its single associated TAP.
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Emulate Test in simulation
STIL-VT
Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
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Video Test Generator
701A
If you’re testing digital or analog computer monitors, video projectors, multimedia monitors, or TVs, the 701A Video Test Generators provides the signals, test patterns, and audio to do your job, easily and accurately. Field technicians and factory people on the move will appreciate the convenience of battery power and small size. The 701A Video Test Generator is designed to go where you go.
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TV generator PAL-SECAM-NTSC
TRF498
TV generator TRF-498 provide high quality test patterns and signals according to PAL, SECAM and NTSC. You can select from 64 standard patterns and 5 user configurable patterns in 4:3, 14:9 or 16:9 format (50 or 60 Hz, interlaced and non-interlaced mode).
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Signal Generators
2, 4 and 8 Channel Arbitrary Waveform Generator and Pulse Pattern Generator solutions are ideal choice in automated test benches, for physics experiments, semiconductor tests, analog and digital debugging.
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Test Pattern Generator Delay & AV Sync Analyzer
VQDM-100
Versatile compact and robust multi-purpose tool for R&D and glass-to-glass QA/QC Instant visual-aural quality estimation plus automatic latency, AV sync and 3D LR sync measurement Multi-channel time-line analysis, including video frames continuity testing 4 Light Sensors with vacuum caps, 4 Audio inputs (standard line levels) 2 channels of AV timing analysis, simultaneous measurements of Video and Audio Latencies Real time multi-channel data acquisition via USB port Unique sophisticated set of static and dynamic test patterns up to 1080p@60fps - see more details in separate VQL page Source of VQDM, VQMA2, and VQMA3 Test Patterns for VideoQ Analyzers Multi-format digital and analog AV outputs: HDMI, YPrPb, S-video, SPDIF, LR analog audio Networkable unit, easy expansion with any external USB storage device: live clips, user content, etc.
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Website Testing Service
With test IO, professionals test your web app and website across the entire range of browsers and form factors. They know the patterns that lead to web app problems, and unlike your automated tests they can always tell the difference between a showstopper bug and a change to the naming conventions of your divs. They’ll even reproduce bugs in different browsers to help you home in the problem, so whether you’re doing a major overhaul of your website or a weekly update of your app, you can ship with confidence.
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Display Color Analyzer
Model 7123
Luminance and chromaticity measurement of Color Display0.005 cd/m2low luminance measurement (A712301)Wide luminance range: 0.0001 to 25,000 cd/m2 (A712301) 0.01 to 200,000 cd/m2 (A712302)High accuracy measurementMaximum 9 display modes: xyY, TΔuvY, u’ v’ Y, RGB, XYZ, Contrast, ProgramAble to control Video Pattern Generator and UUT (Unit Under Test)Built-in contrast measurement function to calculate the contrast ratio directlyEquipped with programmable test items that can complete the planned tests with one single buttonSupport USB flash disk that can copy the test procedures to other station for useJudgment function embedded to judge the test result automatically with one single buttonCalibration period setting and reminding functionMemory for storing 100 channels of standard color data and calibration dataBuilt-in flat display calibration data LCD-D65 & LED-D65* to be applied for chromaticity measurement instantlyOptional display white balance alignment system can be used to integrate all optical test stations to one single station
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Bennewart Flex Tester
UI-FT26
Bennewart Flex Tester, also named as Whole Shoe Sole Flexing Tester, is used to test outsole flexing resistance. The whole shoe sole flexing tester is intended to know the effect of sole materials and surface patterns on cut growth by flex sample in 90°as per ISO 20344, ISO 17707, DIN 53543 and etc.
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Camera Testing
FLIR
CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
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ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1 Small (Hold-Down Gate) / 230154
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Virtual tester
Emulate tester patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test programs. Reads the actual ATE program and creates a Verilog /VHDL simulation test bench.
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FUEL INJECTOR CANISTER CLEANER
FIT470B
*Cleans carbon from intake valves, fuel passages and cylinders with a professional carbon cleaning solution*Will restore the original spray pattern more effectively, giving improved performance, fuel economy and emission tests*Uses shop air with any professional canister cleaning solution on the market
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Oscilloscopes
Anritsu sampling oscilloscope is an ideal solution for Eye pattern analyses and Eye Mask tests. In addition, The excellent performance and high sampling speed reduce measurement times and help hold-down equipment costs.
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Electrical Signal Test
High-density, multi-channel pulse pattern generators and bit error detectors for the design, characterization and production test of optical transceivers and opto-electrical components.
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Pattern Generator
S-113
The Pattern Generator slot module of FOTS system is an efficient module for the characterization and test of external optical components and systems to be performed in high bit rate. This module is a kind of pattern generator and bit error rate tester that can be used to modulate optical components or systems and to test the bit error rate characteristics of optical systems or optical lines. This pattern generator slot includes two differential Tx/Rx channels, which can be operated simultaneously.
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Pattern Converter for WGL/STIL to ATE
VectorPort
VectorPort is a versatile, low-cost test development tool for converting WGL or STIL vectors to targeted ATE tester formats, including pattern, timing, and pinmap data. VectorPort can read and write all major formats in both parallel (Flat) vectors and serial (SCAN) vectors.
