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Test Software Development
See Also: Test Software, Software Development, Software Testing
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Turnkey Data Acquisition Systems
Series 6800
Based completely on the Series 6000 hardware and software platform, Series 6800 is a turnkey system configured for specific measurement types and environments. Systems are available for Strain/Bridge, Voltage/IEPE, Thermocouple and packaged for laboratory or portable applications. Systems range in channel count from 8 to 128 channels and can be easily expanded, should test requirements change. Included turnkey software helps facilities focus on testing, not developing software. If you don’t see a configuration that fits your application, we can likely build a system specific to your needs.
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ScanWorks Boundary-Scan Test
ScanWorks Boundary-Scan Test
The Boundary-Scan Test (BST) Development Software is one of the several configurations of the ScanWorks boundary-scan (JTAG) test and on-board programming environment. Test engineers can quickly develop interconnect tests and device-programming actions for use on first prototype board to accelerate the board bring-up process. Then tests can be exported for use in manufacturing and repair facilities.
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Test Program Sets (TPS)
Data Review, Corrections, & Generation (Reverse Engineering). Technical Requirement Documentation (TRD). Test Strategy Reports (TSR). Test Program Development – Software. TPS Sell-Off & Acceptance. Life-Cycle Support. Technical Interface Test Adaptors (ITA) – Hardware. Training - TPS Development, ATE/TPS Operator, Fault Diagnostic, ATE Maintenance.
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Drive-Thru Feature, GTE 10.00p
K8218B
The DriveThru feature enables the test development software to test integrated circuits or connectors when there are no test points assigned between the resistor and the device.
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Test Automation Platform (TAP)
The Keysight Test Automation Platform (TAP) provides powerful, flexible and extensible test sequence and test plan creation with additional capabilities that optimize your test software development and overall performance. TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher level test executive software environments.
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Test Automation Platform Developer's System
KS8400A
The Keysight KS8400A Test Automation Platform (TAP) Developer's System provides powerful, flexible and extensible test sequence and test plan creation with additional capabilities that optimize your test software development and overall performance. Keysight TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher-level test executive software environments. Leveraging C# and the power of Microsoft Visual Studio, TAP is not just another programming language. It's a platform upon which you can build your test solutions, maximizing your team's productivity by using your existing software development tools and infrastructure.
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PC/104-Plus Board
PCI-P104-ADAP
Model PCI-P104-ADAP simply allows for the installation of a PC/104-Plus or PCI-104 board into any Universal PCI, 3.3V or 5V slot. It is a standard PCI bus card that supports 32-bit wide data transfers to and from a PC/104-Plus board. This allows any user the convenience of hardware testing, software development, and debugging of a PC/104-Plus board in a PC environment.
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Software Suite for Automated Test
UTP Automated Test
Increasing product complexity, centralized test data management and different hardware platforms from different manufacturers – these are typical challenges of test software developers for which we offer specific solutions.Our test software solution is based on certified development environments such as NI TestStand, NI LabVIEW and .NET. Thanks to our expertise based on more than 30 years of experience, we have managed to create a hardware abstraction layer that serves hardware and software developers alike and improves their collaboration. At the same time, it also covers all the needs of maintenance engineers and operators.The UTP Suite for Automated Testing includes a wide range of tools for configuring, developing, analyzing, debugging, and executing test sequences. It helps you speed up your developments while maintaining a consistently high quality standard.
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Source And Measure WiFi And Bluetooth Signals
IQview
The LitePoint IQview® simplifies WiFi and Bluetooth® device development with powerful tools to both source and measure WiFi and Bluetooth signals and analysis capabilities providing insight into device behavior. The IQview offers seamless compatibility with the IQflex® manufacturing solution enabling test software developed on the IQview to run on the IQflex platform widely deployed in manufacturing environments.
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Functional / Non-functional Software Testing Services
Expert team with holistic experience and knowledge of software testing, development, and core business processes. We boast a comprehensive suite of software testing services that cover Functional and Non-functional testing,
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Software
Alta may have the most advanced COTS MIL-STD-1553 and ARINC hardware devices, and our test and development software is 2nd to none. Alta's software is modular, portable, and made for real-time controls & test -- and designed for rapid integration success. This page provides a brief overview of each product and links to main landings pages.
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Testing Tool Development
We can create a custom software testing tool for your needs.As developers who love testing, we invest in R&D, combining our product testing and software development expertise to deliver customized testing solutions for you, utilizing open source stacks combined with Artificial Intelligence for added power.
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Drive-Thru Feature, GTE 10.00p
K8218A
The DriveThru feature enables the test development software to test integrated circuits or connectors when there are no test points assigned between the resistor and the device.
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I-Pi SMARC Development Kit Based On Intel® 6th Gen Atom® X6425E Quad-Core SoC
I-Pi SMARC Elkhart Lake
The I-Pi SMARC Elkhart Lake is a SMARC-based edge solution development kit powered by Intel Atom x6425E quad-core SoC with integrated Intel UHD graphics and comprehensive high speed interfaces. Development-focused, this kit also supports the latest version of the Intel® Distribution of OpenVINO™ toolkit, which features more deep-learning models, higher inferencing performance, and fewer code changes, making developing ever simpler.
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I-Pi OSM Development Kit Based On NXP® I.MX 93 Dual-Core Arm® Cortex-A55 & M33
I-Pi OSM IMX93
The I-Pi OSM IMX93 is an OSM-based smart solution development kit powered by NXP i.MX93 (dual-core Arm Cortex-A55 & Arm Cortex-M33) processor with an in-SoC Arm Ethos-U65 microNPU (Neural Processing Unit).
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3U VPX Development Kit
This development kit enables efficient 3U VPX backplane design and software verification.- 3U VPX architecture- One CPU blade, one GPU blade (optional), SOSA-aligned- 1TB NVMe pre-installed in CPU blade- Rear transition module(s) included- Test Frame with backplane pre-installed
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Wireless Test Standards Software
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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TestStand
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Regenerative Battery Pack Test System
17020
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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COM Express Type 10 Starter Kit Plus
COM Express Type 10 Starter Kit Plus
The COM Express Type 10 nanoX Starter Kit Plus consists of a COM Express Type 10 core module reference carrier board that provides two PCIe Mini Card slots, 2 RJ-45 LAN ports, 2x USB 3.0, 2x USB 2.0, 1x USB client, 2x DB-9 COM, 1x SD card socket, and Mic/Linein/ Line-out. ADLINK also provides additional development tools including a verified 10.1" LVDS panel (optional), power supply, thermal solution and cabling accessories.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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I-Pi SMARC Development Kit Based On NXP® I.MX 95 Six-Core Arm® Cortex-A55, M7 & M33
I-Pi SMARC IMX95
The ADLINK LEC-IMX95 is a powerful and versatile SMARC module that delivers high-performance computing, graphics, machine learning, and vision capabilities for IoT and industrial applications. It is based on the NXP i.MX95 processor, which integrates six Arm Cortex-A55 cores, one Arm Cortex-M7 core, one Arm Cortex-M33 core, an Arm Mali GPU, an ISP, and an eIQ Neutron NPU that can run at up to 2 TOPS.
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
