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Total Reflection X-ray Fluorescence (TXRF) Services
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Total Reflection X-Ray Fluorescence (TXRF) Products
Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
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TXRF Spectrometers
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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TXRF Spectrometers
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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X-ray Fluorescence
XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
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X-Ray Fluorescence Analyzer
MESA-50K
In order to meet RoHS/ELV and to analyze hazardous elements, HORIBA has offered the X-ray Fluorescence Analyzer XGT-1000WR series. Since 2002, 1000 units have been used all over the world for these applications to meet the critical needs from our customers to analyze the sample without cutting it. In 2012, an intuitive MESA-50 X-ray Fluorescence Analyser was released. It became every popular in a very short amount of time, and in 2013 a new type of MESA-50 with a big sample chamber has been added to the MESA-50 series. It is equipped with the sophisticated LN2-free detector. As/Sb analysis function and Multilayer Film FPM are available as options.
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X-ray Fluorescence Spectrometers
Is a non-destructive analytical technique used to determine the elemental composition of materials.
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X-ray Fluorescence Spectroscopy (XRF) Services
Work we''ve done: Coating identification, Measuring lead levels in paint and solder, Elemental comparison of two metal ingots, Restriction of Hazardous Substance (RoHS) testing.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDL®
Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
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Reflection Probes
Reflection probes are used to obtain spectral information of diffuse or specular materials. The light from a light source is sent through six illumination fibers to the sample, and the reflection is measured by a 7th fiber in the center of the reflection probe tip. Discover our reflection probes below.
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X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-20
The SLFA-20 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
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Fluorescence Spectroscopy
HORIBA’s Fluorescence division incorporates technology from SPEX, IBH, Jobin-Yvon, PTI and SLM - the dominant names in Fluorescence Spectroscopy. We offer the widest range of Steady State Fluorescence spectrometers, Fluorescence Lifetime spectrometers, Steady State and Lifetime Multi instruments and Microscope-based Microscopy solutions.
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X-ray Fluorescence Sulfur/Chlorine-in-oil Analyzer
MESA-7220V2
The MESA-7220V2 measures both sulfur and chlorine in petroleum based products using the Monochromatic Energy Dispersive X-ray Fluorescence (EDXRF) method. A monochromatic X-ray source is used in order to obtain an ultra-low noise background which affords the best detection limits for both sulfur and chlorine.The detector window size was increased to collect more fluorescent X-rays and thus achieve lower level ppm values. This provides excellent, repeatable performance at both low and high concentrations of both elements.By adjusting the angle of the graphite crystal, the excitation beam can be measured to excite sulfur in the sample, increasing sensitivity.
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Wavelength Dispersive X-ray Fluorescence Spectroscopy
Wavelength Dispersive X-ray Fluorescence Spectroscopy
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Total Energy System
5000
The electric vehicle (EV) charging market is rapidly expanding, with more and more people switching to electric cars. As the demand for EV charging stations increases, so does the amount of energy that is being exchanged. This energy exchange market is already massive, with charging peaks reaching into the megawatts of energy. With this amount of energy comes a significant amount of revenue, which requires the most accurate billing possible. That’s where TESCO’s Catalog No. 5000 – Total Energy System comes in. The Catalog No. 5000 is a double duo system that enables the testing and accuracy verification of Electric Vehicle Service Equipment (EVSE) and Field Test Equipment for testing EVSE’s in the field. This system is a dual-purpose DC and AC System and includes both a 100A AC (ACT-100) Test System and a 200A DC Test System (DCT-200).
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X-Ray Inspection
X-ray inspection systems are used wherever defects need to be detected by non-destructive means. The spectrum of use is broad and ranges from quality controls for complex assemblies, to the testing of materials for cracks and air inclusions, to foreign matter inclusions and shape deviations. The trend toward miniaturization, higher packing densities, and the relocation of components to the interior of the assembly require precise X-ray inspections that detect hidden defects quickly and reliably. X-ray systems from Viscom are used for the inspection of series assemblies as well as sampling and prototype controls. They take care of typical inspection tasks in concealed areas such as void controls, THT filling level measurements, and HIP inspections. At the same time, the systems reliably determine defect features such as coplanarity and polarity – at high inspection speeds and in a cost-effective way.
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Fluorescence Multiphoton Microscopy
Ultima Investigator™
As the most streamlined model of Bruker''s Ultima family of multiphoton microscopes, Ultima Investigator™ features a base system specifically optimized for in vivo studies and is designed for add-on flexibility with a host of specialized options. Ultima Investigator''s high-resolution, high-speed, high-sensitivity deep imaging provides the ultimate value for smaller labs and additional imaging bandwidth in larger labs.
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Total Solution
SD 4.1 Family
To meet the ever increasing data transfer rate in high end applications, such as professional broadcasting transmission or advanced high resolution display, the SD 4.1 specification calls out the maximum performance of 1.56 Gbps at UHS-II full duplex mode per lane or half duplex UHS-II at 3.16 Gbps. In real applications, due to the system overhead and different SD 4.1 device controller designs, the actual measured performance can vary dramatically from system to system. With the newly introduced ADMA 3, the OS driver is now able to issue multiple read or multiple write commands at once, without having to wait for the SD controller to complete one command at a time. Once the SD host controller has collected multiple commands, it will then manage and complete them without intervention from the host software drive. Thus, the UHS-II 1.56 Gbps interface can be more effectively utilized and maximize the system throughput. This feature can be very useful when running multithreaded applications where multiple applications are constantly updating their status or swapping their contents by writing or reading small chunk of data to or from the memory card.
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Dispersive X-ray Fluorescence (EDXRF) Analyzers
Petro-Marine
The powerful Energy Dispersive X-ray Fluorescence (EDXRF) analyzers of Xenemetrix are capable of more sensitive and precise analysis than can be expected from a laboratory class analyzer.
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Fluorescence and Absorbance Spectrometer
Duetta
Duetta™ is a spectrofluorometer that combines, simultaneously, the functions of fluorescence and absorbance spectrometers. Thanks to its high-speed built-in CCD detector, the Duetta can acquire a full spectrum from 250 nm to 1,100 nm in less than one second, making it the fastest fluorescence spectrometer on the market.
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Reflection Meter
RC-088
This instrument is a special equipment for measuring the reflectivity of rearview mirror (or similar product) of motor vehicle. The product composes intelligent measuring instruments, optical integrating sphere, parallel lamp, standard light source, constant current source etc. It is easy to operate，it can measure the reflectivity quickly and accurately. On instrument structure, it adopts standardized modulation design. It takes latest single chip as its digital central processing element. After the measuring signal is converted by modulus, CPU will do some computation and compensation. The instrument can display the reflectivity of device which is measured in rear time. It operates simply and quickly, the indication is direct and accurate. It’s good for quality examination &control in the production scene as well as laboratories. This product has the convenience &quick demarcation way, can meet requirement of different occasion. It is applicable for measuring light reflection on mirror and not mirror parts.
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Fluorescence Detector
RF-20A/RF-20Axs
The excellent basic performance of the Prominence series is further enhanced by the RF-20A/RF-20Axs fluorescence detectors, which offer world-class sensitivity, excellent ease of maintenance, and validation support functions. They support a wide range of applications from conventional analysis to high-performance analysis.
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Total Stations
Zoom40 Series
The Zoom40 manual total station, with its high resolution color and touch display, gives you the flexibility to run X-PAD, Field Genius, SurvCE, or any custom windows CE software.
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X-ray Camera
Up until the introduction of SID-A50, X-ray inspection systems has been using detectors such as Image Intensifier (I.I.) and C-MOS Flat Panel Detectors, which needs to convert X-ray into optical light first, in order to visualize X-ray.These Indirect Conversion Method X-ray Detectors comes with multitude of issues. These problems include but not limited to; Low Sensitivity, Fuzziness, Time Degradation, Inadequate Life
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X-ray CT System
The surface and the internal parts, in one measurement. We provide “Dimensional X-ray CT System” that does not only observe the interior of the workpiece, but that can also perform high precision, contactless measurements.
