Picoprobe
Line of microwave and oscilloscope probes, has served the on-wafer probing needs of the worldwide semiconductor industry, beginning with a line of high impedance troubleshooting probes for diagnostic studies of the internal workings of complex logic and memory chips.
- (239) 643-4400
- 239 643-4403
- email@ggb.com
- PO Box 10958
Naples, Fl 34101
United States of America
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High Impedance Active Probes
35
The Picoprobe Model 35 has been engineered to meet the stringent demands of advanced high frequency circuit designers.
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Microwave Testing
220
The PICOPROBE® MODEL 220, a high performance microwave probe which incorporates a WR-5 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
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Calibration Substrates
The GGB Industries, Inc., line of CALIBRATION SUBSTRATES allows the user to calibrate any GGB Industries, Inc., microwave Picoprobe® at the probe tip. The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected
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Microwave Testing
10
PICOPROBE® MODEL 10 is a multipurpose, high speed, passive probe which can be used for driving as well as receiving signals. The Model 10 consists of a one meter length of flexible 50 ohm coaxial cable terminated by a carefully trimmed SMA on one end and by a miniature, high speed 50 ohm connector, specially developed to receive Model 10 replaceable coaxial probe tips, on the other. The 50 ohm coaxial cable was custom designed for Model 10 to be high speed, yet very flexible, so that moving the cable would not disturb the probe points.
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Differential Calibration Substrates
The GGB Industries, Inc., line of DIFFERENTIAL CALIBRATION SUBSTRATES allows the user to calibrate any GGB Industries, Inc., microwave Picoprobe at the probe tip. The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected.
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Microwave Testing
110H
The PICOPROBE® MODEL 110H is a high performance microwave probe which incorporates our patented coaxial design techniques and has inherent low loss and low dispersion characteristics.
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Microwave Testing
170
The PICOPROBE® MODEL 170, a high performance microwave probe which incorporates a WR-6 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
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Dual Microwave Probe
The PICOPROBE® DUAL MICROWAVE PROBE consists of two separate probes mounted on a single holder. One probe is fixed to the holder; the other is adjustable. Each probe may be individually configured with GSG, GS, or SG footprints having any fixed pitch from 50 to 2540 microns. The probe to probe (signal to signal) spacing is user adjustable over a 4000 micron (160 mil) range. When ordering, an initial signal to signal spacing should be specified (up to .75 inches).
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High Impedance Active Probes
12C
A high speed, high input impedance active probe for measuring the internal node voltage of integrated circuits. The input is 1 megohm shunted by 0.1 pf and the rise/fall times are 0.8 ns. This instrument has full dc capability and can be used with any oscilloscope. The Model 12C was specially designed so that when used in conjunction with a high input impedance oscilloscope, signal attenuation is 10:1 and with a 50 Ohm input, signal attenuation is 20:1.
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High Impedance Active Probes
18C & 19C
High impedance probes, PICOPROBE® MODEL 18C and MODEL 19C, combine the most advanced MOS and bipolar technologies with special, low capacitance packaging techniques to achieve truly remarkable electronic measurement capabilities. While being manufactured each instrument is individually optimized for the best possible performance. The extremely low input capacitance, high input impedance, and almost negligible input leakage current permits the direct probing of even the most sensitive MOS dynamic nodes. At the same time, the full dc capability of this Picoprobe coupled with the high speed capability permits the full characterization of circuits.
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Microwave Testing
120
The MODEL 120 PICOPROBE® sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 120 Picoprobe®, achieves an insertion loss of less than 1.75 db (typical) and a return loss of greater than 15 db (max.) over its frequency range.
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Microwave Testing
67A
A coplanar probe with patented flexible tips, the MODEL 67A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 67A achieves an insertion loss of less than 1.1 db and a return loss of greater than 14 db through 67 GHz.
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High Impedance Active Probes
7
Designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes. The Model 7 consists of a flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms in order to avoid undesirable reflections. A special miniature connector receives replacement coaxial probe tips that provide a shielded environment to within 3 mm of the fine tungsten probe point, thus minimizing capacitive coupling to other parts of the circuit. The replaceable coaxial probe tips are offered in various point sizes and can also be bent to any shape in order to accommodate a variety of probing geometries.
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Microwave Testing
50A
The GGB Industries, Inc., MODEL 50A probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 50A achieves an insertion loss of less than 1.0 db and a return loss of greater than 18 db through 50 GHz.
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Tungsten Probe Tips
T-4 Series
T-4 tips are for use in most standard commercial micropositioners for probing integrated circuits, pads, or lines. Each T-4 tip uses the same 10, 22, 35, 60, or 125 micron diameter tungsten wire as our Model 12C Picoprobe, but is mounted to a 0.020 inch diameter, 2 inch long tinned copper shaft.
