Electron Spectroscopy for Chemical Analysis
determine the atomic composition of a surface.
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Spectroscopy
NIRS XDS Process Analyzer
NIRS XDS Process Analyzer systems can measure a variety of sample types, such as granules, powders, liquids, slurries, or opalescent substances, among others. These analyzers provide fast, nondestructive analysis of pharmaceutical, chemical, and petrochemical products. If required, up to 9 inline measuring channels can be multiplexed with this system.
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Fiber Optic Type Chemical Concentration Monitor
CS-600F
The CS-600F achieves a higher level of functionality best suited for manufacturing, such as the ability to perform in-line measurement of high temperature chemical solutions in various applications, stable operation for reduced downtime, and compact size for improved space productivity in order to meet the precise chemical solution concentration management required in leading-edge semiconductor wet process.
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Signal Analysis
Cross-Spectrum FFT Analysis
The program Cross narrow-band spectrum is used for evaluation of the interrelation between the signals’ parameters obtained from the two primary transducers installed at various parts of the controlled object. This program can be used for detection of noise source location, for sound absorption level evaluation and the researched object acoustic properties control, for evaluation of space-time distribution of the directional energy flux (Poynting vector), for the ground cross-section FR characteristic evaluation (Nakamura method), etc.
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CS/ONH-Analysis
G4 ICARUS Series 2
The combustion analyzer G4 ICARUS Series 2 with high frequency (HF) induction furnace and HighSense™ detection sets new standards in for a rapid and precise carbon (C) and sulfur (S) analysis in inorganic solids.
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Fiber Optic Type Chemical Solution Concentration Monitor
CS-100F1 Series
The CS-100F1 Series is equipped with fiber optics cable based on the CS-100 Series. It offers real-time, in-line measurements by directly integrating the sample cell into the cleaning system piping and by using a fiber optic cable for light signal transmission. A single concentration monitor can take up to four measurements and monitoring of multiple chemical solutions in a single-bath or single-wafer cleaning system is also possible.
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Energy Dispersive X-Ray Spectroscopy (EDS)
Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
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Electronic Crockmeter
TESTEX Testing Equipment Systems Ltd.
Electronic Crockmeter, to determine the colour fastness of textiles to dry or wet rubbing. A pinned acrylic sample holder ensures rapid sample mounting and repeatability of results. Crockmeter Fitted with a pre-determined electronic counter for strokes up to 999,999 times.
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SQUID Electronics
XXF-1
It is designed to satisfy the needs of nearly all low-Tc SQUID applications. Additional integrated current sources provide e.g. bias current and calibration pulses for TES applications. These current sources together with an additional switchable feedback path make two-stage SQUID operation very convenient.
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DC Electronic Load
3310G Series（75W~400W）
Each 3310G Series module has its own control and display panel, CC / CR / CV / CP / Dynamic modes, plug in 3302G / 3305G / 3300G mainframe with 150 sets Store / Recall memory which provides load set-up more efficiently, also can be controlled via RS232、Ethernet、USB and GPIB interface.
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Electronic Tensile Tester
QT-ETT
QT-ETT tensile testing equipments are specially designed considering tensile testing requirements for flexible materials that are commonly used in product packaging to study different properties of materials. This instrument utilizes Qualitest's latest embedded control system and operating software, with user-friendly operating interface and intelligent data management system.
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Electronics Consulting
Our approach to consulting is unique. We encourage you to participate in every phase of the study. We provide you with all the information and knowledge that you need to repeat the study and perform future studies independently. Our reports are detailed and comprehensive. A consulting project may get over in a set time period but we expect our relation to continue. Our mission is to empower you through our products and services.
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Scanning Electron Microscope
Verios G4 XHR SEM
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Electronic Drum Latency
EDLM iPhone app was developed specifically for measuring latency in electronic drums. It connects to the input and output points of an e-drum system and provides automated and accurate latency measurements.
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Grease Analysis
Maintenance Reliability Group, LLC
MRG Labs follows grease sampling and analysis standards outlined in ASTM D7718 and ASTM D7918. Grease analysis is a valuable tool for determining the condition of the lubricant and discovering abnormal conditions in equipment that may otherwise lead to unexpected failures. Our customized grease test slates are designed to identify the specific failure modes that may be damaging the component.
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Auger Electron Spectroscopy (AES)
Rocky Mountain Laboratories, Inc.
Auger Analysis, Auger Electron Spectroscopy (AES or Auger) is a chemical surface analysis method. AES measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Construction Analysis
Customers of MASER Engineering that are using electronic components and materials are interested in the manufacturing quality and used materials.
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Spectroscopy Upgrade for Any Microscope
SMS
Get a simple upgrade to your existing microscope, or a turnkey microspectrophotometer system that works out-of-the-box.
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Leak Analysis
Hiden LAS
The Hiden LAS system is designed to analyze the leak rate from sealed packages, from a quality control or research and development perspective.
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Particle Size Analysis
Particle size analysis is a technical procedure to characterize the size distribution of particles in a powder or liquid sample. It is widely used in R&D and quality control in industries involved with nanotechnology, pharmaceuticals, cosmetics, food, electronic materials, sintering materials, Li-ion battery electrodes, etc.
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DC Electronic Loads
Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.
NGI DC Electronic Loads
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Signal Analysis
STA/LTA Detector
The STA/LTA Detector program is a representation of a detector of various events in triaxial or single-component time signals. The software is based on one of the STA/LTA detector types.
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Raman Spectroscopy Analysis Laboratory
Rocky Mountain Laboratories, Inc.
Raman is used to analyze organic and inorganic materials. Bulk and small particle materials can be analyzed. Raman microscopy allows for the identification of particle as small as 1 µm.
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Infrared, Near Infrared and Raman Spectroscopy
From the very compact FTIR spectrometer to the world’s highest resolution: Bruker offers the industry's largest selection for demanding routine and High End FTIR research application including the new and unique verTera cw THz functionality.Process monitoring with FTIR / FT-NIR process spectrometers.A complete line of Near Infrared Spectrometers to fit all your needs, including Process Monitoring.FTIR Microscopy and Raman Microscopy and Spectral Imaging for high sensitivity at high spatial resolution.High spectral resolution, high performance Raman and FT-Raman spectrometers for advanced routine solutions.
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Stand-Alone Type Chemical Concentration Monitor
CS-100 Series
The CS-100 Series offers a complete lineup of high precision chemical solution concentration monitors for various solutions in cleaning and etching processes during semiconductor manufacturing. In addition to the high-speed response and compact design, measurement of each component concentration is conducted in real-time and the timing of chemical solution changes and automatic supply is warned with an alarm. The ability to perform short measurement cycles allows for accurate monitoring of concentration changes.
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XRF Analysis
Elemental analysis (Be-U) from sub-ppm to 100% in solids, powders or liquids, X-ray Fluorescence.
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Natural Gas Analysis
Recently, natural gas has been recognized as a clean resournce for energy, in addition to being a raw material for chemical products. Recently a cutting-edge drilling technology has increased the use of shale gas. As the production area diversifies, the need for gas composition analysis has increased. Shimadzu addresses analytical requests with a wide system GC lineup. For analysis of liquified gas, such as LPG, a dedicated injector with a vaporizer is available. Both manual injection and online injection are available. The operation software can automatically calculate needed values, such as indexes, calorific values, etc.
