Wafer Level
-
Product
TDR System
TS9001
-
The system accurately analyzes the wiring quality of various leading-edge semiconductor packages such as Flip Chip BGA, wafer level packages, and 2.5D/3D ICs using terahertz technology. It is a TDR analysis system that has the world’s top-class signal quality.
-
Product
High Voltage 50 Ω Pulse Generator
TLP-8010C
-
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Combines TLP-8010A and TLP-4010C into one system*Can be operated together with TLP-8012A5 and TLP-3011C pulse width extenders*Ultra fast 50 Ω high voltage pulse output with typical rise time 100 ps (0-40 A) and 300 ps (> 40 A)*Up to 80 kW peak output power into 50 Ω load*Built-in HMM pulse up to ±15 kV with 50 Ω configuration*High pulse output current up to ±80 A (short circuit) with minimum 6 dB reflection suppression*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 GPIB programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns (0-40 A), 1 built-in pulse width: 100 ns (> 40 A)*The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 GPIB programmable steps (0-40 A)*Optional external pulse width extensions from 5 ns to 500 ns (> 40…80 A) using the external pulse width extender TLP-8012A5*Built-in pulse reflection suppression*Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurements of complete wafers*High performance and high quality components
-
Product
High Power Devices
-
SemiProbe configures our PS4L Adaptive Architecture into the Voltarus (TM) family of probe stations to fulfill the unique requirements of testing high power devices at wafer level prior to packaging. Voltarus probe stations are available in manual, semiautomatic, and fully automatic configurations that can test and characterize power devices up to 10 KV or 200 Amps (pulsed).
-
Product
Wafer-Level Parametric Test
-
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
-
Product
Wafer Prober
Precio octo
-
200mm wafer prober. The system adapts ultra-high speed indexing and high-speed wafer exchange functions to reduce test cost and improve overall equipment effectiveness (OEE) markedly enhancing productivity.
-
Product
Wafer Inspection System
AutoWafer Pro™
-
AutoWafer pro is our most advanced ultrasonic equipment for detecting defects in bonded wafers in a production environment, providing fast, high-resolution scanning of 200mm and 300mm bonded wafers.
-
Product
Wafer Cathodoluminescence Microscope
Säntis 300
-
Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
-
Product
Wafer Analyzer
RAMANdrive
-
RAMANdrive is the specialized Raman microscope for wafer analysis equipped with our dedicated 300 mm stage. RAMANdrive gives you an ultra-fast, highest resolution analysis of the whole wafer with unique stability and accuracy
-
Product
Wafer Testing
Trio Vertical
-
SV TCL's TrioTM is a reliable solution for advanced wafer testing challenges, specifically full array and parallel probing. We offer a complete line of vertical probe card products, each designed for your unique application.
-
Product
Wafer Prober
Prexa MS
-
The latest fully automated 300mm wafer prober for memory devices. Featuring high rigidity and exceptional thermal control, the system enables full-wafer contact testing.
-
Product
Silicon & Compound Wafers
-
Compound semiconductors are undergoing a major expansion addressing many new applications and using various materials such as SiC, GaN, GaAs and others, to improve the performance of new devices in several segments such as Power and Face Recognition.
-
-
Product
Wafer Bonder
AML
-
Wafer bonding has found many applications in the field of MST, MEMS and micro engineering. These include the fabrication of pressure sensors, accelerometers, micro-pumps and other fluid handling devices. The process is also used for first-order packaging of silicon microstructures to isolate package-induced stresses. The OAI AML Wafer Bonder facilitates both the alignment and bonding to be performed in-situ, in a high vacuum chamber. For anodic bonding the wafers are loaded cold and heated in the process chamber. For high accuracy alignment the wafers are aligned and brought into contact only after the process temperature has been reached, thus avoiding differential thermal expansion effects which can compromise alignment. The AML Wafer Bonder is excellent for anodic bonding, silicon direct and thermal compression bonding applications. These features enable the bonder to be used with virtually any processing tool.
-
Product
In-situ Wafer Temperature Monitoring
-
CI Semi's family of noncontact temperature monitors (the NTM line), offers high end pyrometry products for the measurement of wafer temperatures during process. CI Semi’s flag ship of the line, the NTM Delta, incorporates real-time, same point emissivity measurement and compensation making it the ideal solution for in situ monitoring for processes such as RTP, CVD and PVD. The NTM family is sold to leading tool manufacturers.
-
Product
Level Measurement
-
In continuous level measurement, the level of a medium in a tank or silo is detected with the help of different measuring methods and converted into an electronic signal. The level signal is either displayed directly on site or incorporated into a process control or management system.
-
Product
Wafer Inspection Machine
IV-W2000
-
The IV-W2000 is a wafer inspection machine that features on-the-fly scanning and inspection as well as automatic handling of 6/8/12-inch wafers. With the option to have a Chinese language UI, this machine is also known for being intuitive and user-friendly.
-
Product
Wafer Test Solutions
-
Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.
-
-
Product
Sound Level Meters
-
Castle Group Ltd are a long standing leading manfacturer of noise measuring equipment, particularly Sound Level Meters for industrial noise monitoring. Our equipment is ideal for performing noise at work assessments to The Control of Noise at Work Regulations 2005.
-
Product
Sound Level Meters
-
Cirrus Research offers a comprehensive range of Class 1 and Class 2 handheld sound level meters, ideal for all noise measurement applications from basic noise assessments to detailed acoustic analysis. IOur range of noise level meters spans simple instruments that provide the measurement of sound pressure level, integrating-averaging instruments that provide Leq and occupational noise functions, as well as precision data logging noise meters with 1:1 & 1:3 real time octave band filters and in-measurement audio recording. Trusted by professionals, our sound level meters deliver accurate, reliable results for workplace noise monitoring, environmental noise surveys, and industrial noise assessments.
-
Product
Wafer ESD Tester lineup
-
Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
-
Product
Signal Level Meter
HT828B
-
Hangzhou Softel Optic Co., Ltd.
The signal level meter, SE828C is able to measure EQ, C/N, V/A and trunk volt in the CATV analog system, the number keys is designed to direct input frequency so that work would be easier. It can measure 2 channels at the same time.
-
Product
Specialty Level Instruments
-
As a comprehensive provider of level measurement products, ABB offers a variety of specialty level instruments that complement field instrumentation to provide the customer with the total level solutions.
-
Product
Sound Level Meter
2310 SL
-
Standard Electric Works Co., Ltd
Max. & Min. function. Over & under range indication. 4-digit LCD with bar graph. Frequency weighting characteristic for 2 times per second. AC signal output. Low battery indication.
-
Product
Wafer Analysis Systems
Tropel®
-
Corning Specialty Materials has a long heritage of providing solutions to semiconductor equipment manufacturers. The Tropel line of wafer analysis equipment enables measurement of wafer substrates from 2” to 450mm regardless of material type and surface finish.
-
Product
Sound Level Datalogger
DSL 331
-
Auto Ranging Measurement 30dB to 130dB. Work with Window Software. 32,000 Records Data Logger. Bar graph Indication with Back Light. RS-232 Real Time Display Software for Window 95/98/2000
-
Product
Liquid Level Switch
CL-10GH
-
The Dynatrol® CL-10GH Liquid Level Detector and EC-501A(G) Control Unit is used for high, intermediate or low point level detection of liquids and slurries. A unique vibrating principle permits design and operation features not available with other types of liquid level detectors.
-
Product
Sound Level Meters
-
Larson Davis manufactures a wide range of Advanced Sound Level Meters to meet all your environmental noise monitoring application needs.
-
-
