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Product
Scanning Electron Microscope
Verios G4 XHR SEM
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The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Product
Boundary Scan Tester and Programmer
JTAGMaster
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The JTAGMaster Tester and Programmer is designed to work with ABI's bespoke software - a multiple purpose platform which enables users to freely configure test procedures and instruments. Integrated functions are also available to the user to automatically learn the device status, provide pin-to-pin comparison and information as well as use some reporting facilities.
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Product
Imaging Modules
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Teledyne e2v has developed compact MIPI modules which feature our own high performance CMOS image sensors inside a pre-focused, industrial-grade scanning optic. As a turnkey sensor/optics for imaging systems, these modules offers customers significant reduction in development time and cost savings. Only a few screws are needed to mount the module, with simple connection to the image processing system through an FPC cable connector. Software development efforts can also be reduced by using some limited API-layer Linux software drivers. This enables the module to be seamlessly interfaced to popular ISP platforms.
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Product
Signal Converters For High-accuracy Angular Measurement
EIB 1500 series
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*Interpolation and digitizing electronics for the real-time digital processing of positions from two scanning heads*Input: incremental rotatory HEIDENHAIN encoder with two scanning heads and distance-coded reference marks (relative orientation of scanning heads: 180° ± 5°)*Output: EnDat 2.2, Fanuc Serial Interface, Mitsubishi high speed serial interface*Integrated subdivision: 16 384-fold
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Product
Spectrometers
OCEAN FX
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The next innovation in miniature spectrometers from Ocean Optics — Ocean FX™ — offers high-sensitivity CMOS detector performance, acquisition speed up to 3,000 scans per second, and a robust communications module that accommodates Ethernet and Wi-Fi. The new spectrometer is ideal for UV-Vis applications in food and agriculture, where acquisition speed helps with food sorting and processing; biomedical sciences, especially for absorbance measurements requiring enhanced UV sensitivity; and security and authenticity, where added communication interfaces enable simpler point-of-use instruments. Also, the onboard buffering feature ensures data integrity during kinetics measurements.
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Product
Boundary Scan
PROGBSDL
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PROGBSDL software converts a BSDL file for an unprogrammed PLD into a BSDL file with the same pin usage as the programmed PLD.
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Product
2-CH Encoder Card With Real-time Trigger I/O
AX92352
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*Synchronizes devices via real-time I/O*Applied to area scan and line scan applications
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Product
Imaging Camera for Dynamic FLIM Studies at Real Time Video Rates
FLIMera
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The HORIBA FLIMera camera is a new concept in FLIM technology. It is a wide field imaging camera, rather than a confocal point scanning system, with the intrinsic benefit of being able to study FLIM dynamics at video rates with a simple camera technology.
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Product
Multi-Channel X-Ray Fluorescence Spectrometer
FACTORY LAB MXF-2400
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Wavelength Dispersive X-Ray Fluorescence Spectrometer The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated highly in the overseas market as well as in the Japanese market. The latest hardware designed to fully utilize the principle of X-ray fluorescence spectrometry and the data processing unit that uses various software programs to permit automatic management of analysis data combine to provide high analytical productivity both in R&D and production control. Up to 36 elements can be simultaneously determined by the fixed monochrometer and up to 48 elements can be determined sequentially by the optional scanning monochrometer. High analytical precision is provided even in high sensitivity analysis of a few ppm quantity level.
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Product
Laser Scanning FLIM Microscopes
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DCS-120 laser scanner: Compact - Flexible - Precise. As technology leader in equipment and techniques for single photon counting, Becker & Hickl offers the DCS-120 systems that are complete laser scanning microscopes for fluorescence lifetime imaging (FLIM) since 2007. The systems use bh’s multi-dimensional TCSPC FLIM technology in combination with fast laser scanning and confocal detection or multi-photon excitation.
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Product
Scanning Electrochemical Microscope
VS-SECM (DC And AC)
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The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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Product
JTAG Boundary Scan Tools
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Blackhawk has teamed with Corelis, an EWA company, to offer customer Intuitive and High Performance JTAG Boundary Scan Tools that are compatible with our JTAG emulator product line. This allows developers not only to debug code on TI devices but also leverage boundary scan testing using the same emulator hardware.
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Product
Environmental Testing
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Environmental testing capabilities include: High and Low Temperature Testing including Thermal Shock. Humidity Testing to 100% Relative Humidity at High and Low Temperatures. Altitude Testing to 100,000 Feet. Combined Vibration, Temperature and Altitude Testing. Mass Spectrometer for Leak Testing. Vibration Testing to 50 G's and 3000 Hz including Resonance Scan, Cycling, and Endurance. Free Fall Half Sine Wave Mechanical Shock Testing to 100 G's
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Product
NI-9149, 8-Slot, Zynq-7020 FPGA, Ethernet CompactRIO Chassis
783376-01
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8-Slot, Zynq-7020 FPGA, Ethernet CompactRIO Chassis - The NI‑9149 is a rugged Ethernet chassis that you can use to add C Series I/O modules to any standard Ethernet network. You can program the chassis using Scan Mode for fast expansion of your real-time system or using the onboard FPGA for inline processing and high-speed I/O and control. With the NI‑9149, you can add high-performance I/O to your PC-based application or expand your CompactRIO, PXI, or industrial controller application.
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Product
Thyratrons and Accessories
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Cargo scanning is a broad term which encompasses intelligent logistics, sniffer dogs and X-ray inspection. X-ray inspection systems offer rapid, non-invasive checking of manifests, detection of contraband, and when combined with other techniques, can be used to identify the presence of nuclear material. X-ray energies up to 10 MeV are required to penetrate fully loaded shipping containers and vehicles. These X-rays are generated through the acceleration of electrons along a linear accelerator into a target using megawatt energy microwave pulses produced by the RF sub-system.The skills for the design, manufacture and integration of specialised components for low-cost systems reside mainly in commercial companies. There is an emerging trend for linac system companies to demand higher performance from their integrated RF sub-systems.Currently, we intend not only to drive the innovation and development in this area, but also to offer integrated RF sub-systems to meet new requirements such as, portability, material discrimination and higher throughput.
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Product
Wafer Inspection System
AutoWafer Pro™
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AutoWafer pro is our most advanced ultrasonic equipment for detecting defects in bonded wafers in a production environment, providing fast, high-resolution scanning of 200mm and 300mm bonded wafers.
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Product
Mobile I/O Expander & Keypad Controller
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Analog Devices' family of mobile I/O expanders are ideal for smartphone designs and portable devices that require a large extended keypad and/or expanded I/Os such as inventory scanners, medical equipment, and meter readers. Microprocessors in portable systems are GPIO constrained due to the number of functions they must interface with and control. They are also power hungry, making them inefficient for debouncing, polling, and key press scanning algorithms. ADI’s family of mobile I/O expanders offloads key scan and GPIO functions from the CPU, freeing up the processor for higher priority functions while saving energy.
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Product
WAFERMAP
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WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
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Product
PCIe Color Industrial Camera
CMOSIS CMV4000
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2K camera Applications: In-situ optical inspection camera, fast process capturing, e.g. Golf club swings, Intelligent Transportation Systems (ITS), Open road tolling and Traffic monitoring, Industrial Automation, Machine Vision, Facial Recognition, Motion Capture, Automotive crash testing, OCR/ OCV, 3D scanning, Robotic Arms, Material and Life science Microscopy, Ophthalmology and Retinal imaging, Medical Imaging, Flat panel inspection, Dental, Kiosks, Security, Biometrics
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Product
Semiconductor
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Aerotech has a long history of engineering and manufacturing motion systems and components for high precision wafer processing, scanning electron microscopy (SEM), wafer bumping, 450 mm wafer manufacturing, lithography equipment and advanced laser micromachining. We also specialize in systems and components for vacuum applications, such as EUV lithography. So whether you need off-the-shelf wafer bumping components or a custom-engineered SEM system manufactured and tested to exacting specifications, Aerotech can provide the optimal solution for your application.
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Product
Industrial CT X-Ray Inspection System
X5000
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The X5000 is the most versatile system offered by North Star Imaging. The system boasts a large scanning envelope and excellent ergonomics for loading sizable objects while still maintaining the sensitivity to inspect even the smallest of items.
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Product
Locate and Map Underground Utilities
UtilityScan DF
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Geophysical Survey Systems, Inc.
UtilityScan DF incorporates our innovative dual-frequency digital antenna (300 and 800 MHz) and an easy-to-use touchscreen interface to view shallow and deep targets simultaneously in a single scan.
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Product
PANELMAP
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PANELMAP is a software package used to collect, edit, analyze and visualize measured physical parameters on rectangular semiconductor panels. PANELMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
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Product
6U High Performance Data Acquisition subsystem
CPCI-AD320
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The CPCI-AD320 module provides a 6U high performance data acquisition subsystem. There are 32 thirty-two 100/200 KSPS ADC’s for maximum performance. Or an opt low cost 16 channel version. The Local DSP can be usedto simply move data samples to the CPCI bus or can provide processing functions such as limit checking, FFT’s, digital filtering, etc. Software can be downloaded to the DSP via the CPCI interface. Instrumentation amplifiers provide over-voltage protection and gain on a per channel basis. The CPCI-AD8320-6U can also accept external scan and trigger signals from a front panel connector.
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Product
SF45/B MicroLiDAR Scanner – 50 M
28063
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The SF45/B is the world’s smallest, lightest, scanning microLiDAR™. This 5 Hz oscillating sensor is highly configurable, with the ability to scan to 320°. Included in the box: SF45/B LiDAR sensor, a communications cable, a USB to micro-USB cable and five screws, and 5 nuts.
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Product
OBD-II Breakout Box
PPECB
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The Power Probe OBD-II Breakout Box is a CAN Bus circuit tester compatible with 12 and 24 Volt systems. The tool connects directly into the Vehicle’s Data Link Connector (DLC) testing for any abnormalities such as shorting and reverse polarity at the pins. If shorting or reverse polarity is present, connecting the PPECB first will prevent harm before connecting a Diagnostic Scan Tool. The Breakout Box provides a live display of present communicating signals without having to use a Digital Multimeter. Additionally, you can quickly test the voltages at all 16 pins.
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Product
Universal Total Stations
SPS730 And SPS930
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Nothing else comes close. Trimble Universal Total Stations lead the industry in accuracy, range and reliability for fine grading, paving, stockpile scanning and site measurements.
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Product
3-Sensor R-G-B (Prism) Color Line Scan Cameras
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JAI's advanced product offering includes a set of 3-sensor R-G-B color line scan cameras for industrial machine vision applications. Part of the Sweep+ Series, these cameras feature state-of-the-art prism technology providing the best possible performance, precision, and versatility for line scan imaging in continuous production flows.
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Product
Energy Dispersive X-Ray Spectroscopy (EDS)
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Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
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Product
100GBASE LR4/ER4 Wavelength Selective Power Meter
KI6512
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KI6512 is an easy and economical handheld 100GBASE LR4/ER4 Wavelength Selective Power Meter for testing multi-λ single mode fiber optic systems. It scans and stores the absolute or relative power levels of all 4 channels in 0.8 seconds. Test data can be viewed in graphical or numerical form, and reference values can be stored for easy loss testing. An extra 50/125u power meter port gives additional flexibility at 850 / 1300 / 1550 nm. This port only supports basic functions, but is very handy for first-in fault finding and investigation.
