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Product
Scanning XPS/HAXPES Microprobe
PHI Quantes
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The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
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Product
MEMS-Scanner Evaluation-Kit
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The "QSDrive Scan Kit" evaluation kit enables small and medium-sized companies in particular to operate ResoLin components from the Fraunhofer IPMS in accordance with the specifications without the time-consuming in-house development of control electronics. The evaluation kit consists of a ResoLin component – a cardanic MEMS scanner with a linear axis and an optional, orthogonally oriented resonant axis – and control electronics that enable the components to be operated with an optimized trajectory supplied. The component is held by a scan head, which is also included in the scope of delivery and which, thanks to its special construction, can easily be integrated into common optical test setups. Depending on the design of the MEMS component, controlled operation of the component and synchronized operation of the resonant axis are also possible. The function is controlled by software that communicates with the electronics via USB.
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Product
Isothermal Microcalorimetry
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Isothermal Microcalorimetry is an extremely sensitive technique complementary to TA Instruments differential scanning calorimeters. TAM is a microcalorimeter system represented by TAM IV, TAM IV-48 and TAM Air.
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Product
Ultra-High Vacuum Ф4 Scanning Kelvin Probe
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The Ф4 Ultra-high Vacuum Scanning Kelvin Probe system gives the user full access to work function measurements under vacuum with the ability to alter the temperature from 77 K to 860 K. The Kelvin Probe measurement has resolution of 1 - 3 meV for a 2 mm tip on a conducting sample. The sample is mounted on a plate that is located on a motorized (x, y, z) translator attached to a stainless-steel vacuum chamber. Phi 4 also comes with a photoemission spectroscopy system with a tuneable source (3.4 - 7.0 eV). The deep ultra-violet (DUV) light spot measures approximately 3 x 4 mm. Absolute work function measurements can be obtained with this system in the range of 4.0 - 6.5 eV with an accuracy of 0.05 - 0.1 eV.
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Product
Fully Automatic Eddy Current Crack Test System
ROTO-SCAN
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Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
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Product
Production Test System
G3 Hybrid
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The G3 Hybrid is a state of the art system for fast Production test throughput in DC test applications. The system combines the most versatile offerings of features in a single system, at the lowest cost. For devices requiring DC and Continuity test capability only, G3H is a very flexible cost-effective Production Test solution. This approach provides a DC test system with the capability to add logic resources (AC/SCAN) as well as analog resources for Mixed Signal. The HILEVEL G3H embraces low cost while supporting SCAN, giving you the ability to toggle every node in your chip.
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Product
16 Channel ADC for CompactPCI
CPCI392
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The CPCI392 16-Channel Common-Mode Input ADC card is very well suited to be used in applications in which autonomous signal conversion is an issue, as well as in standard mid-range applications. Enabled channels are scanned at maximum rate and conversion results are stored in shared memory. A local DSP performs the data acquisition and calibration transparent for the host.
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Product
Line Scan Cameras
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JAI’s extensive product offering includes color line scan cameras featuring prism technology with multiple CCD or CMOS linear sensors delivering high performance color/NIR imaging solutions for high-speed web/continuous applications such as print verification, tile inspection, food/fruit sorting, and more. Also monochrome line scan cameras with ultra fast scan rates.
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Product
IP Surveillance Camera
ENVIROMUX-IPCAM
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View and control the camera from the ENVIROMUX web interface, the camera web interface, included software, or with a compatible cell phone. With the ENVIROMUX-2D/5D/16D, a triggered snapshot can be forwarded in alert e-mails. A snapshot can be triggered by any programmed event (motion detection, door open/close, glass break, smoke, liquid detection, etc.). Image sensor: 1/4" progressive scan CMOS sensor. Video Streaming: simultaneous Motion JPEG and MPEG-4. Frame rate: 30fps at 640x480 (VGA) resolution. Lens: F2.0, 4.0 mm (0.16 in). RJ45 connector. Wireless models: wireless IEEE 802.11 b/g up to 54 Mbps. Regulatory approvals: CE, FCC, RoHS.
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Product
Atomic Force Microscope
HDM Series
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The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
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Product
Electron Microscope Analyzer
QUANTAX Micro-XRF
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Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Product
Multiplexer Modules for 34980A
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The 34980A Multiplexer switches can be used to connect one of many different points to a single point. You can connect to an external instrument or switch multiple analog signals to the 34980A internal DMM. Multiple multiplexers can be connected together via the 4 analog buses to create an even larger multiplexer. The break-before-make feature also ensures that no two signals are connected to each other during a scan. All multiplexer modules also include a relay switch counter to help predict when relays need to be replaced.
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Product
Hardware Platform
SmartScan 3D
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SmartScan-3D is another hardware platform that allows 3D scan using a six axis robot and DUT holder. A DUT is placed on a 360 degree rotating DUT holding jig. Vertical scanning without rotating DUT holder is one variation of SmartScan-3D for any DUT that is standing up, rather than laying flat on X-Y plane. Any scan technology can be integrated to the SmartScan-3D.
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Product
8 SE Or 4 Diff. Input Channels, 8 Analog Output Channels, PCI Express
APCIE-3121-8-8
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Input range:?± 10 V, 0-10 V software programmable0-5 V, ± 5 V, 0-2 V, ± 2 V, 0-1 V, ± 1 V (gain)0-20 mA (option) ? software-programmable amplifier:PGA x1, x2, x5, x10 ? Conversion triggered through software,scan, timer, external event ? Onboard FIFO buffering for 256 analog values ? Data exchange through 16-bit I/Oor 32-bit memory (PCI DMA) ? Sequence RAM ? Overvoltage protection ? input filter: 160 kHz
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Product
X-Ray Photoelectron Spectrometer
AXIS Supra
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AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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Product
Battery Cell Surge Tester
Chroma 19311
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Chroma Systems Solutions, Inc.
The 19311-10 has 10 channels, which can test up to 9 battery cells via scanning test, with a single unit. It can support up to 25 channels for testing up to 24 cells in a sequence by connecting with an external scanner (A190362). The test speed of the multicell scanning test by 19311-10 is extremely efficient, saving test time, and decreasing labor costs. It also increases the production capacity of the production line.
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Product
Supported Test Systems
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TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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Product
USB Line Scan Camera
Inexpensive
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Compact USB line scan camera with high sensitivity and resolutions from 2048 to 4096 pixels. The programming interfaces, including drivers, libraries and programming examples, enable the USB line camera to be integrated into your own application. The line scan camera is supported under the following operating systems:*Windows*Linux*Linux ARM 32Bit (Raspberry PI)*Linux ARM 64Bit (NanoPi M4 & NVIDIA Jetson Nano)
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Product
Mass Spectrometry Solutions
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Discover new ways to apply mass spectrometry to today’s most pressing analytical challenges. Innovations such as Trapped Ion Mobility (TIMS), 10kHz scanning lasers for MALDI-MS Imaging that deliver true pixel fidelity (10 um spatial resolution), and eXtreme Resolution FTMS (XR) technology capable to reveal Isotopic Fine Structure (IFS) signatures are pushing scientific exploration to new heights. Our mass spectrometry solutions enable scientists to make breakthrough discoveries and gain deeper insights.Our industry leading software solutions such as SCiLs Lab for MS Imaging, FDA cleared microorganism reference library for the MALDI Biotyper, Biopharma Compass 2.0, and Toxtyper are examples our solutions doing the work for you. Bruker's product lines include the following technologies: FTMS, rapifleX MALDI-TOF/TOF, MALDI Biotyper Systems, timsTOF UHR-QTOF, Toxtyper, Triple Quadrupole, HDX Solution, ToxScreener, PesticideScreener
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Product
Signal Processor Board
MS 1532
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- Frequency coverage from 5 kHz to 30 MHz in 1-Hz steps- High dynamic range: +30 dBm 3rd-order intercept typical- Digital filtering provides 58 IFBWs from 56 Hz to 8.0 kHz with exceptional shape factors- AM, Synchronous AM, FM, CW, USB, LSB & ISB detection modes standard- Tunable notch filter- Fast, flexible scanning with 100 memory channels- Large readable LED displays & user-friendly controls- Noise blanking & pass band tuning- Internal switchable preamplifier & attenuator- Operator-selectable RS-232, RS-485, or- RS-422 remote control- Viretx 5 FPGA based design (Two virtex for image processing)- LPC2468 ARM 7 Processor based design- MIL1553B and RS485 Interface- Two High speed 14 bit ADC (125MSPS) for I & Q Sampling- Direct sampling 2-30MHz- Audio CODEC- Conduction Cooled Board
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Product
Laser Scanning Microscopes
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The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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Product
Master-Slave Distributed Motion & I/O Master Controller
PCIe-7856
Controller
The PCIe-7856 is a PCI Express interface card providing two ports for Motionnet and HSL systems for distributed motion and I/O in machine automation applications. HSL technology allows thousands of I/O points to be scanned at the millisecond-level in real time by using a master-slave architecture.
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Product
Prototype Measurement Services
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On-site measurement service for prototype parts using laser tracker for large volume parts or portable arm CMM with optional laser scanning for smaller parts. Point cloud generation and full part modelling is available. API measurement services is an ISO 17025 certified organization, accredited by A2LA, our 3rd party prototype inspection reports provide the necessary confidence demanded by your customers.
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Product
Galvo-Resonant Scan Head and Controller
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Our LSK-GR08(/M) Galvo-Resonant Scanner contains one resonant scan mirror and one galvo scan mirror that deflect an incident laser beam in X and Y, respectively. Identical to the galvo-resonant scanner used in our Bergamo® II multiphoton microscopes and complete Cerna®-based confocal systems, the 8 kHz resonant frequency of the resonant scan mirror enables much higher-speed scans than a galvo-galvo system. In our Bergamo system, the scanner can achieve 30 fps at 512 x 512 pixels image resolution.
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Product
Turret Test And Scan Handlers
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Turret platforms for semiconductor test, inspection and packaging.
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Product
2D Automated Optical Inspection Systems (2D-AOI)
BF1 Series
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Saki’s unique line scanning technology and coaxial overhead lighting enables high-speed accurate inspection.
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Product
3D Software
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Along with manufacturing professional 3D scanners, Artec develops smart 3D scanning software. Meticulously designed to meet the needs of both new and experienced users alike, it is the best choice for any application.
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Product
Line Scan Vision System
In-Sight 9902L
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The In-Sight 9902L 2K line scan smart camera is a high resolution self-contained vision system ideal for detailed inspections of large, cylindrical, or continuously moving objects. The 9902L acquires up to 16,000 lines of 2,000 pixels per line to produce a 32MP image that can used to detect even the smallest features and defects. Each pixel line is acquired at 67,000 lines per second to keep up with the fastest production lines. This standalone vision system only requires a small view of the target part, making it an ideal choice for installations with restrictive field of view or mounting space requirements.
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Product
Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Product
LED View Angle Tester
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360°rotate perspective die scanning.0.36° as the smallest test step unit.Conjunction with LED tester for electrical and optical parts test.Test data collection and perspective diagram drawing.Support 4 sets of probe socket (standard equipment with 2 sets of probe sockets)Clip structure. Easy for die positioning.
