Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Product
Drop Weight Impact Testing Machine
DWTT Series
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Jinan Testing Equipment IE Corporation
DWTT Drop Weight Impact Testing System is suitable for drop weight tear test of various kinds of ferrite, especially for the test of DWTT for pipeline steel as ASTM-E 436, API-RP 5L3, ASTM-E 208 and DIN EN 10274. DWTT has integrated mechanical, electrical, and automatic control technology, and achieved full automation of feeding, hammer lifting impact, and fracture specimen collection. The load frame has a four-column design, features in stable supporting structure, rigid, dual sliding rails. The Drop Weight Drop Weight Tester is equipped with positioning mechanism, anti-dumping mechanism, safety mechanism, hydraulic buffer devices and security guard net. The impact energy is determined by the lifting height and configuration of different net weights. DWTT Drop Weight Impact Testing System is the essential quality control equipment for pipeline manufacturers, steel mills, iron and steel enterprises, and is also widely used for research institutes.1. Buffer device is equipped to avoid the second impact and absorb the residual energy after breaking the specimen so as to prevent the weigher and anvil from destroying. The installation of safety mechanism, buffer device, and security guard net will effectively secure the testing machine and its operation to extend its life.2. Configuration of the specimen-feeding system, anti-second impact device, and specimen centering mechanism will guarantee a quick, accurate and reliable test.
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Product
PXI 2.5W Programmable Resistor Module, 4-Channel, 2Ω to 6.97kΩ
40-251-030
Programmable Resistor Module
The 40-251-030 is a programmable resistor module with 4 channels which can be set between 2Ω and 6.97kΩ with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Optics Test Systems
F Number Meter
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Optik Elektronik Gerätetechnik GmbH
The f-number of a camera lens is defined as the quotient of the focal length f' and the diameter of the entrance pupil. The f-number measuring device is a simple structure for the automatic, software-controlled measurement of the f-number of optical systems.
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Product
Charger / Quick Charger / Adapter / LED Driver Test System
6010
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6010 Charger / Quick Charger / Adapter / LED Driver Test System is able to meet multi-types power products test requirements，and its multi-U.U.T test simultaneously capability can significantly enhance the production line throughput. It also possess multi-modular combination that includes low noise analog AC source with Triac to simulate output, four sets precision power meter, two or four sets ripple noise / timing measurement module, four sets OVP DC power supply, 3310F series & 3332F/3336F Electronic Load module and unique design 3340F series for LED power driver output test.
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Product
Cable Harness Test System
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Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
NI-9222 , ±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
781397-01
Voltage Input Module
±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9222 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The NI‑9222 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the NI‑9222: a 10‑position screw terminal or a 25‑pin D‑SUB connector.
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Product
300KHz Precision LCR Meter
Model 4300R
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Aplab Precision LCR Meter Model 4300R is a new generation of impedance test equipment with high accuracy, wide measurement range and six digits resolution. Being featured with test frequency up to 300kHz, test voltage of 5mV ~ 2V, built-in -5V ~ 5V DC bias and -10V~10V DC voltage source output, it can meet all requirements for measuring components and materials and provide guarantees for production line quality assurance, incoming inspection and laboratory precision measurements. The Handler, RS232C and GPIB interfaces as well as improved command system provided by the instrument make it easier to build the test system.
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Product
PXI Very High Density Versatile 2 Amp Multiplexer
40-612A-002
Multiplexer Module
The 40-612A Very High Density Versatile Multiplexer module features a wide range of software selectable switching configurations. It is especially useful where a number of high density multiplexers are required with the option of easily altering the channel count as a test system evolves. Typical applications include signal routing in ATE and data acquisition systems. The 40-612 module uses high quality electro-mechanical relays, connections are made via a front panel 160 pin DIN41612 connector. The module can be software configured into one of a large number of different multiplexer modes. Relays allow the multiplexer banks to be set in 1 or 2 pole mode and inter-bank switching enables the channel count to be increased up to a maximum of 128
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Product
Modular Laser Diode Test System (PXI/PXIe)
LTS8620
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The LTS8620 test system is a modular PXI test system for testing and qualifying laser diodes. The system is able to generate extremely short current pulses. This minimizes the effects of heat on the laser diode.
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Product
PXI-2535, 544-Crosspoint, 1-Wire PXI Matrix Switch Module
778572-35
Matrix Switch Module
544-Crosspoint, 1-Wire PXI Matrix Switch Module—The PXI‑2535 is a high-density 4x136 PXI matrix switch module that is ideal for routing low-power DC signals in validation test systems of mass produced devices such as semiconductor chips and printed circuit boards (PCBs). Featuring field-effect transistor (FET) relays, the PXI‑2535 offers unlimited mechanical lifetime and switching speeds up to 50,000 crosspoints/s. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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Product
PCI High Density Pecision Resistor Card, 9-Channel, 2.5Ω To 1.81kΩ
50-298-022
Programmable Resistor Module
The 50-298-022 is a high density programmable resistor card with 9 channels which can be set between 2.5Ω and 1.81kΩ with 0.5Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Product
PXIe-6547, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument
781011-03
Digital Waveform
PXIe, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument—The PXIe‑6547 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 100 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6547 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Product
Meter Site Analyzer
6330
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Need an all-in-one field test kit? TESCO’s Meter Site Analyzer is the most versatile and complete tool for testing the entire functionality of transformer-rated metering installations in a convenient, portable, and ULTRA lightweight kit—only 17.8 lbs! As a utility, the vast majority of revenue comes from large customers who have transformer-rated services. At transformer rated sites the opportunity for something to go wrong is much greater than at a self-contained site. Studies have shown that at transformer-rated sites, the vast majority of issues are related to wiring, CTs, PTs and other issues. If you want to be sure that the customer is billed correctly and you are not losing revenue, you must test the whole site, not just the meter. TESCO’s all-in-one 6330 Meter Site Analyzer gives you the most versatile site testing tool available in a small, lightweight package. No other test system has the functionality of:
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Product
Automated Headlight Tester
VLT 0936/MK2
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Fully computerized controlled CCD Head-light Beam Tester, with fully automated vertical and horizontal movements, with automated searching of the hot spot of the beam. This robot type Headlight Beam Tester is connected to the Vehicle Test Lane Computer system and displays instructions and results to one of the large overhead SVGA monitors of the Test Lane.
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Vibration Testing System
F Series
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Suited to durability tests for all industrial products such as aeronautical, automobile, electronic and precision equipment.
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Product
Portable Meter Test Systems
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Zhengzhou SMS Electric Co.,Ltd
Portable energy meter calibration test devices.
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Product
Hign Speed Bare Board Test System By Non-Contact Test Technologies
SX-750SUPERⅣ
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Suitable for a wide range of applications. Can be connected to a wide range of machines: from hand press to reel mechanism and in-line mechanism. We offer docking with our customers own machines. Compact main tester simplifies integration via installation inside a mechanism. If requested, we will perform a study to decide which functions should be added.
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Product
In-line vacuum test systems
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Ensuring that products meet the highest quality standards is absolutely essential in the manufacture of food, pharmaceutical and cosmetic products in particular.Leak-tight product containers have a major role to play here. Leak-tight product containers have a major role to play here. Leakages allow the contents of a container to get out, but more importantly they also allow germs to get in, rendering the contents unusable.INDEC vacuum test systems monitor containers for leak tightness fully automatically within the production process. A wide range of containers, including bottles, jars and cans as well as tubs and trays, are tested for leak tightness by means of a non-contact inspection.The means to this end is a pre-existing vacuum or a vacuum created in the container expressly for the purpose of leakage testing. Containers which are not leak-tight are reliably identified and automatically rejected.These processor-controlled test systems are highly reliable and extremely easy to use, qualities which have played no small part in making them the first choice already for many companies throughout the world.
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Product
Multiport Coaxial Switch, DC to 20 GHz, SP4T
87204B
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The Keysight 87204B terminated multiport switch provides the life and reliability required for automated test and measurement, signal monitoring and routing applications. Innovative design and careful process control created the Keysight 87204B which meet the requirements for highly repeatable switching elements in test instruments and switching interfaces. The Keysight 87204B is designed to operate for more than 10 million cycles. The exceptional 0.03 dB insertion loss repeatability is warranted for 5 million cycles at 25° C. This reduces sources of random errors in the measurement path and improves measurement uncertainty. Switch life is a critical consideration in production test systems, satellite and antenna monitoring systems, and test instrumentation. The longevity of this switch increases system uptime, and lowers the cost of ownership by reducing calibration cycles and switch maintenance.
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Product
Test Systems
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6TL’s speciality is simplifying the architecture of test systems, so that our customer’s Total Cost Of Ownership is drastically minimized. The technology that conveys our mission is called FastATE.FastATE technology is based on using intelligent modules to build test systems.
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Product
Meter Testing
METES
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Meter test systems with high accuracies of up to 0.02% and a wide measuring range for precise measurements in single- and three-phase applications. The meter test systems of the METES series are used to test the accuracy of Ferraris meters and electronic electricity meters under any operating conditions. The impact of system perturbations such as harmonics or flicker on the meter can be taken into consideration during tests.
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Product
Functional Test System
TS-5040
Functional Test
The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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Product
CMK Mechanical Kits
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Columbia has created a unique mechanical click system using ball bearings and guiding sleeves. The UUT is connected to the spring contact pins that are connected to the testing environment in a completely linear fashion. Connecting the UUT to probes can be approached both from the top and the bottom and, optionally, even from the side. The ergonomic housing provides generous space for additional measuring electronics. The back and bottom of the housing can be adapted to the various test system interfaces.
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Product
PXI 5W Programmable Resistor Module, 2-Channel, 1.5Ω to 1.81kΩ
40-252-022
Programmable Resistor Module
The 40-252-022 is a programmable resistor module with 2 channels which can be set between 1.5Ω and 1.81kΩ with 0.5Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Modulation Distortion Up To 53 GHz
S95070B
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S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.
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Product
Modular Measurement Equipment
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Modular Measurement Equipment – These MCD measuring systems controlled by a PC offer a powerful measuring- and control unit in combination with our measurement software TestManager CE for all kinds of complex test systems.
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Product
Fault Injection and White-Box Testing
VectorCAST/Probe
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VectorCAST/Probe is integrated with the full family of VectorCAST tools allowing probes to be inserted during Unit, Integration, or System Testing. The probe insertions are controlled by the same technology that controls our code coverage instrumentation, which ensures that the probes function correctly regardless of the compiler, target processor, or run-time environment.
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Product
PSG Analog Signal Generator, 100 kHz to 67 GHz
E8257D
Signal Generator
Address your toughest requirements with metrology-grade frequency & level accuracy with excellent distortion & spurious characteristicsTest high-power devices & overcome test system losses with 1 W output powerAddress the demanding needs of Doppler radar, ADC & receiver-blocking tests with the PSG's extremely low phase noiseCharacterize devices & circuits by adding AM, FM, PM & pulse modulation to your signalMeet test system needs up to 1.1 THz with frequency extender modules
