System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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System Test
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Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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EW System Test Set
MS 1107
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PSS LRU Test Set is used to test the RWR (Radar Warning Receiver) system by simulating the input signals and testing the output signals.
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TURBO AIR SYSTEM TEST KIT WITH SMOKE ADAPTER
TPT69700A
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*Helps locate air leaks in turbo system components by plugging the output side of the turbo and the intake inlet*Air is applied through one adapter to show the presence of leaks within the system*Six pairs of stepped adapters to fit most turbo systems on cars and light trucks
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Embedded System Test Automation Software
ECU-TEST
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ECU-TEST is the software for automation tests used in the validation of embedded systems within the automotive industry. It can be used when designing, implementing, and evaluating different tests. It will generate intuitive test reports.
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System Level Test
SLT
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As technology nodes continue to evolve and with a more aggressive time to market to bring devices to their end applications, full test coverage of such chips is possible only with System Level Testing.
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Missile Warning System Test Set
Baringa™ IR/UV
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Baringa™ is a handheld, ruggedized aircraft survivability test set used to stimulate the electro-optic sensor suites on various aircraft platforms. Available in ultraviolet (UV) as well as one-color or two-color infrared (IR), Baringa simulates dynamic multi-engagement profiles and is easily reprogrammable to meet user testing needs.
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eBIRST™ – Switching System Test Tools
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Switching systems are an important part of many test systems, however, the switching system is in a vulnerable place. When accidents happen that can cause a faulty device, you need a way to get the system up and running again with a minimum of effort and operator skills.
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Test System
BMS HIL
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The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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In-Circuit Test
TestStation LH
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The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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Radio Frequency, Communications, & Navigation Test Systems
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Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
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Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Semiconductor Test System
TS-960e
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The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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True Concurrent Test
TestStation Duo
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The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Functional Test
UTS
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The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Bloomy Simulation Reference System
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The Bloomy Simulation Reference System provides a hardware in-the-loop (HIL) test environment for dynamic, closed-loop testing of many aerospace and transportation control systems. The reference system integrates the computing, I/O, and software components needed for standalone use or to form the basis of a more complex test system.
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Automotive Electronics Functional Test System
TS-5020
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The Keysight TS-5020 Automotive Functional Test System is a low cost, scalable test system designed with “just-enough-test” concept for medium complexity electronic control modules, such TPMS, RKE and body electronic modules
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Cable Harness Test System
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Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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Lifecycle Test System
Model 933
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The Model 933A Life Cycle Test System is a low cost, generic test platform used to perform cycling of keypads, keyboards, membranes, switches, or any product requiring fatigue testing.
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VLSI Test System
3380
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The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Interface Test Adapter
ITA
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Circuit Check is focused on the military and aerospace market. Our solutions are delivered according to a rigorous set of test requirements and quality metrics. The Circuit Check staff of engineers follow a defined Project Management process to control the project deliverables,manage the scope, and meet the quality needs for in-field serviceability and test system longevity.
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Cell Testing
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PEC offers a wide range of cell testers, starting from the 5A desktop test system (ACT0505), to our range of 50A cell testers for more standardized cycling (CT0550) and our advanced cell testers with capabilities up to 4000A (ACT0550). All systems support parallel switching for achieving higher currents.
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Backplane Test System
402HV
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Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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True RMS Power Sensors
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LadyBug True RMS Average Power Sensors deliver reliable, accurate power measurements for CW, Pulse, and modulated signals. These diode based sensors feature a wide dynamic range and a great VSWR. The optional external triggering input feature can be used without any external components. Recorder and Trigger outputs are also available. Our patented NoZero NoCal technology make these sensors ideal for calibration systems, automated test stations and other embedded applications.
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GPIB-ENET/1000, Ethernet GPIB Instrument Control Device - Korea 220VAC
781630-09
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The GPIB‑ENET/1000 is an IEEE 488 controller device for computers with an Ethernet port. You can use this device to share a single GPIB system among many networked users or to control several test systems from a single networked host. The GPIB‑ENET/1000 features a password-protected web interface for easy configuration. It can also control IEEE 488 devices from anywhere on an Ethernet‑based (LAN) TCP/IP network (Gigabit, 100BASE‑TX, 10BASE‑T). Each device interfaces to and shares up to 14 GPIB devices from several network hosts, and you can control up to 100 GPIB‑ENET/1000 interfaces with a single computer. The device includes a license for the NI‑488.2 driver software, providing maximum reliability for connecting to third-party instruments with GPIB.
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NTSC/PAL Color Bar Generator
CBG360
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The CBG360 is designed to provide an accurate and affordable signal source for system testing. It also provides the necessary components for aligning color monitors to the proper brightness, color and hue.
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HALT Test Service
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HALT, Highly Accelerated Life Test is a system design validation tool for maximum robustness verification. In a step stress approach a system under functional test and operational conditions is check for functional and destruct limits.
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Flying Prober Test
QTOUCH1202C
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Qmax Test Technologies Pvt. Ltd.
he Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.The V-I signature test shall be in-built in the Prober system with “ Best fit Curve “ algorithm .Provision for adding various external Test & Measurement instruments like GPIB / USB / PXI Instruments is available.
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Barometric Pressure Simulation
SimBARO
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Embedded and Integrated GPS/Inertial navigation systems require an altitude reference data input provided by a barometric pressure altimeter to reduce vertical plane errors inherent within inertial systems. Spirent’s SimBARO product offers a simulated source of barometric pressure altitude data and is available as an add on to SimINERTIAL, Spirent’s Inertial Measurement Unit (IMU) and Embedded GPS/Inertial navigation system (EGI) test tool.
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NI Vehicle Radar Test System
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VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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PCI Precision Resistor Card 9-Channel, 1.5Ω To 925Ω
50-297-021
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The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
