Product

Probing Adaptors

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Nexus Technology, Inc.

Nexus Technology, Inc.

Accessories primarily enable the connection between an industry standard logic analyzer footprint (D-Max, Mictor, P6860, etc) and an instrument probe. For example, a connection between a D-Max footprint and the digital channels of an MSO (Mixes Signal Oscilloscope). They can also enable the interconnect of a probe to a different industry standard footprint. Adding flying leads to a probe designed for a mictor footprint and a probe tester are also some of the accessories that are available.

Product

Stack Probing Sensor

L722

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Wagner Electronics

L722 - Wagner Electronics

The Model L722 Stack Probing Sensor coupled with the L612 Digital Recording Moisture Meter makes it easy to reach deep into stickered units of lumber and take accurate moisture readings without the danger of broken pins. Wagner''s electromagnetic wave technology makes it possible to take multiple readings throughout an entire stack in just minutes.

Product

Probing Solutions

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High Power Pulse Instruments GmbH

High Power Pulse Instruments GmbH

Probing Solutions and Probe Arms by HPPI GmbH

Product

Magnetic Probing Systems

MPS-C-300 and MPS-C-350

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MicroXact, Inc.

MPS-C-300 and MPS-C-350 - MicroXact, Inc.

MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement.

Product

Probing & Analysis Adapters

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Ironwood Electronics

Ironwood Electronics

No matter how well designed a circuit is, there is almost always a need to hook up test instruments to it to verify function, look for bugs, or baseline performance. As IC packages become smaller and pin counts grow this becomes harder and harder. probing adapters are required to alleviate this de-bug problem. Many different types of adapters fall into the test and debug category. The common feature is that they bring the signals of an IC out to a format that is easy to interface with test and analysis equipment.

Product

Probing Solutions

ES62X-CMPS

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ESDEMC Technology LLC

ES62X-CMPS - ESDEMC Technology LLC

The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.

Product

Topside Probing for Functional Test Fixtures

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Circuit Check, Inc.

Circuit Check, Inc.

Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.

Product

Topside Probing In-Circuit Test Fixtures

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Circuit Check, Inc.

Circuit Check, Inc.

Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.Today’s fifth generation Pneumatic drive supports as many as 8,000 test probes with centerline spacing to 25mil, and contacting test pads as small as 0.014″.